206394 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Sources Beam forming
Sub-classes:ULTRA FAST PULSER FOR LOW ENERGY ELECTRON BEAMS
#2Beam Plasma Source
#3LINEAR TCP SOURCE, A CHARGED PARTICLE BEAM SOURCE USING THE LINEAR TCP SOURCE AND A GRID FOR THE CHARGED PARTICLE BEAM SOURCE
#4SYSTEM AND METHOD FOR PLASMA TREATMENT WITH INDEPENDENT CONTROL OF NEUTRAL PARTICLE AND ION FLUXES
#5APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS
#6ION BEAM PROCESSING APPARATUS, ELECTRODE ASSEMBLY, AND METHOD OF CLEANING ELECTRODE ASSEMBLY
#7OPTICAL SYSTEM ADJUSTMENT METHOD FOR MULTI CHARGED PARTICLE BEAM APPARATUS AND COMPUTER READABLE RECORDING MEDIUM
#8Apparatus and Method for Milling Sample
#9SURFACE ANALYSIS SYSTEM COMPRISING A PULSED ELECTRON SOURCE
#10Ion extraction assembly having variable electrode thickness for beam uniformity control
#11Charge carrier generation source
#12Automatic adjustment method and automatic adjustment device of beam of semiconductor apparatus, and training method of parameter adjustment model
#13Ion beam processing apparatus, electrode assembly, and method of cleaning electrode assembly
#14Apparatus for multiple charged-particle beams
#15Charged particle beam source, surface processing apparatus and surface processing method
#16Apparatus of plural charged-particle beams
#17CHARGED PARTICLE SOURCE
#18Apparatus of plural charged-particle beams
#19Apparatus and system including extraction optics having movable blockers
#20Ion beam processing apparatus, electrode assembly, and method of cleaning electrode assembly
#21Apparatus of plural charged-particle beams
#22Ion implantation system and source bushing thereof
#23Particle-optical apparatus and particle beam system
#24Apparatus of plural charged-particle beams
#25Multi-electron beam device
#26CHARGED PARTICLE BEAM SOURCE, SURFACE PROCESSING APPARATUS AND SURFACE PROCESSING METHOD
#27Charged particle source
#28Ion implantation system and source bushing thereof
#29Extraction apparatus and system for high throughput ion beam processing
#30Apparatus for multiple charged-particle beams
#31Charged particle beam system and method
#32METHOD OF PROCESSING A SUBSTRATE USING AN ION BEAM AND APPARATUS FOR PERFORMING THE SAME
#33Apparatus of plural charged-particle beams
#34Ion beam apparatus including slit structure for extracting ion beam
#35Ion beam processing apparatus, electrode assembly, and method of cleaning electrode assembly
#36SYSTEMS AND METHODS FOR PROVIDING AN ION BEAM
#37CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND METHOD FOR REDUCING ELECTRIFICATION OF SUBSTRATE
#38Apparatus of plural charged-particle beams
#39Apparatus of plural charged-particle beams
#40Charged particle source
#41Electron beam generation for transmission electron microscope
#42Device for the Extraction of Electrical Charge Carriers from a Charge Carrier Generation Space and Method for Operating Such a Device
#43Particle-optical apparatus and particle beam system
#44Method of processing a substrate using an ion beam and apparatus for performing the same
#45Ion beam apparatus including slit structure for extracting ion beam, etching method using the same, and method for manufacturing magnetic memory device using the ion beam apparatus
#46Apparatus of plural charged-particle beams
#47Electron-beam spot optimization
#48Beam position monitors for medical radiation machines
#49Ion beam apparatus generating ion beams of bilateral symmetry
#50Apparatus of plural charged-particle beams
#51Apparatus of plural charged-particle beams
#52Radical generator and molecular beam epitaxy apparatus
#53Apparatus of plural charged-particle beams
#54SiC coating in an ion implanter
#55Apparatus of plural charged-particle beams
#56Micro-electron column having an electron emitter improving the density of an electron beam emitted from a nano structure tip
#57Device manufacturing apparatus and manufacturing method of magnetic device using structure to pass ion beam
#58Method of forming a pattern using ion beams of bilateral symmetry, a method of forming a magnetic memory device using the same, and an ion beam apparatus generating ion beams of bilateral symmetry
#59Beam extraction slit structure and ion source
#60Ion beam processing apparatus, electrode assembly, and method of cleaning electrode assembly
#61Plasma-based material modification using a plasma source with magnetic confinement
#62Plasma source apparatus and methods for generating charged particle beams
#63SiC coating in an ion implanter
#64Charged particle beam applied apparatus, and irradiation method
#65Plasma potential modulated ion implantation system
#66Double ended electrode manipulator
#67Inductive modulation of focusing voltage in charged beam system
#68Ion sources and methods for generating an ion beam with controllable ion current density distribution
#69Charged particle source with multiple selectable particle emitters
#70Ion beam irradiation device and method for suppressing ion beam divergence
#71ION BEAM DISTRIBUTION
#72UNIFORMITY CONTROL USING ION BEAM BLOCKERS
#73Ion beam extraction by discrete ion focusing
#74Distributed ion source acceleration column
#75Focused ion beam apparatus
#76Ion source
#77Gas-cluster-jet generator and gas-cluster ion-beam apparatus utilizing an improved gas-cluster-jet generator
#78Ion beam generator, and substrate processing apparatus and production method of electronic device using the ion beam generator
#79Charged particle extraction device and method of design there for
#80Electron gun with magnetic immersion double condenser lenses
#81Ion source assembly for ion implantation apparatus and a method of generating ions therein
#82Front plate for an ion source
#83Techniques for improving extracted ion beam quality using high-transparency electrodes
#84Ion implantation ion source, system and method
#85Mass analysis magnet for a ribbon beam
#86Method and apparatus for extracting ions from an ion source for use in ion implantation
#87Extraction electrode manipulator
#88Charged particle extraction device and method of design there for
#89PLASMA GENERATING APPARATUS AND FILM FORMING APPARATUS USING PLASMA GENERATING APPARATUS
#90Method and apparatus for controlling beam current uniformity in an ion implanter
#91Ion source including separate support systems for accelerator grids
#92Ion implanting apparatus
#93PLASMA GENERATING APPARATUS, DEPOSITION APPARATUS, AND DEPOSITION METHOD
#94Extraction electrode system for high current ion implanter
#95Apparatus and methods for ion beam implantation using ribbon and spot beams
#96TECHNIQUES FOR SHAPING AN ION BEAM
#97PLASMA TREATMENT APPARATUS
#98Method and device for adjusting a beam property in a gas cluster ion beam system
#99Ion source, ion implantation apparatus, and ion implantation method
#100Ion implanting apparatus
#101Symmetrical shaper for an ion beam deposition and etching apparatus
#102Methods of operating an electromagnet of an ion source
#103Methods and apparatuses for directing an ion beam source
#104Electron beam apparatus and an aberration correction optical apparatus
#105Front plate for an ion source
#106Apparatus and method for ion beam implantation using ribbon and spot beams
#107Ion implantation ion source, system and method
#108Ion sources and methods for generating an ion beam with a controllable ion current density distribution
#109Method and apparatus for extracting ions from an ion source for use in ion implantation
#110Dual mode ion source for ion implantation
#111Technique for shaping a ribbon-shaped ion beam
#112Ion source element, ion implanter having the same and method of modifying the same
#113Method and apparatus for extracting ions from an ion source for use in ion implantation
#114Method and apparatus for extracting ions from an ion source for use in ion implantation
#115Ion source with multi-piece outer cathode
#116Ion source section for ion implantation equipment
#117Ion implanter and method of manufacturing semiconductor device
#118Ion implantation ion source, system and method
#119System and method for performing SIMOX implants using an ion shower
#120Ion implantation ion source, system and method
#121Charged particle beam exposure method, charged particle beam exposure apparatus, and device manufacturing method
#122High performance inspection scanning electron microscope device and method of operating the same