206432 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging Vessels
Sub-classes:Concentrated Solar Irradiation of Targets in Plasmas
#2Vacuum chamber arrangement for charged particle beam generator
#3Vacuum chamber arrangement for charged particle beam generator
#4Vacuum chamber arrangement for charged particle beam generator
#5Charged-particle beam apparatus
#6Examination container and electron microscope
#7SUBSTRATE PROCESSING APPARATUS
#8XRF analyzer with separate source and detector heat sinks
#9XRF analyzer with a hand shield
#10High voltage shielding and cooling in a charged particle beam generator
#11High voltage feedthrough assembly, time-resolved transmission electron microscope and method of electrode manipulation in a vacuum environment
#12Vacuum chamber arrangement for charged particle beam generator
#13Loading station for transferring frozen samples at low temperatures
#14Universal liquid sample device and process for high resolution transmission electron microscope imaging and multimodal analyses of liquid sample materials
#15Time varying segmented pressure control
#16Substrate processing apparatus
#17Process gas enhancement for beam treatment of a substrate
#18High-energy ion implanter, beam collimator, and beam collimation method
#19Top opening-closing mechanism and inspection apparatus
#20Charged particle beam generating apparatus, charged particle beam apparatus, high voltage generating apparatus, and high potential apparatus
#21Multi-electrode stack arrangement
#22Multi-electrode cooling arrangement
#23Multi-electrode electron optics
#24Rotating-anode X-ray tube assembly with cooling system
#25Charged particle lithography system and beam generator
#26Charged particle beam apparatus
#27Radiation generating tube, and radiation generating apparatus and radiation imaging system using the same
#28Charged particle beam apparatus
#29Target positioning device, method for driving a target positioning device, and a lithography system comprising such a target positioning device
#30Titanium diboride coating for plasma processing apparatus
#31Ion implantation system and ion implantation method using the same
#32CHARGED PARTICLE LITHOGRAPHY APPARATUS AND METHOD OF GENERATING VACUUM IN A VACUUM CHAMBER
#33Cleaning device for transmission electron microscopes
#34Self-aligning floating ion-optics components
#35Method and apparatus for producing large diameter superalloy ingots
#36CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR GENERATING CHARGED PARTICLE BEAM IMAGE
#37Plasma immersion ion implantation process with chamber seasoning and seasoning layer plasma discharging for wafer dechucking
#38Ion source and plasma processing apparatus
#39Plasma immersion ion implantation process with chamber seasoning and seasoning layer plasma discharging for wafer dechucking
#40Methods for in situ surface treatment in an ion implantation system
#41DETACHABLE INNER SHIELD
#42Carbon tube for electron beam application
#43APPARATUS HAVING VACUUM VESSEL
#44Method and apparatus for producing large diameter superalloy ingots
#45Multivalent ion generating source and charged particle beam apparatus using such ion generating source
#46Deposition reduction system for an ion implanter
#47Electron beam apparatus and method for production of its specimen chamber
#48Charged particle beam apparatus
#49Apparatus and method for selected site backside unlayering of si, GaAs, GaAlAsof SOI technologies for scanning probe microscopy and atomic force probing characterization
#50Charged particle beam apparatus
#51Charged particle beam apparatus
#52Electron beam apparatus and method for production of its specimen chamber
#53Electron beam apparatus and method for production of its specimen chamber
#54Ion beam system
#55Light weight portable scanning electron microscope
#56Charged particle beam apparatus