Patents-Review.com
ClassID:

206445 ⎘

H01J2237/2003 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated; Controlling environment of sample Environmental cells

Sub-classes:
Recent Application in this class:
#1
20250253117
2025-08-07

Sample Holding Tool, Electron Ray Device, and Manufacturing Method for Sample Holding Tool

 #2
20250022678
2025-01-16

ENVIRONMENTAL CELL AND ELECTRON MICROSCOPE

 #3
20240404781
2024-12-05

SAMPLE HOLDER AND ELECTRON MICROSCOPE

 #4
20240131783
2024-04-25

BUILD MATERIAL HANDLING UNIT FOR A POWDER MODULE FOR AN APPARATUS FOR ADDITIVELY MANUFACTURING THREE-DIMENSIONAL OBJECTS

 #5
20240112879
2024-04-04

Systems And Methods For Transferring A Sample

 #6
20230187170
2023-06-15

Fabrication of in situ HR-LCTEM nanofluidic cell for nanobubble interactions during EOR processes in carbonate rocks

 #7
20230025535
2023-01-26

Fabricating thin film liquid cells

 #8
20220258425
2022-08-18

Build material handling unit for a powder module for an apparatus for additively manufacturing three-dimensional objects

 #9
20210285899
2021-09-16

SPECIMEN CONTROL MEANS FOR PARTICLE BEAM MICROSCOPY

 #10
20210031150
2021-02-04

Multidimensional printer

 #11
20200411277
2020-12-31

MEMS frame heating platform for electron imagable fluid reservoirs or larger conductive samples

 #12
20200043697
2020-02-06

MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples

 #13
20200027691
2020-01-23

Transmission electron microscope specimen and method of manufacturing the same

 #14
20190107504
2019-04-11

Cell for electrochemical measurement

 #15
20190080882
2019-03-14

MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples

 #16
20190080881
2019-03-14

Examination container and electron microscope

 #17
20190013177
2019-01-10

Observation support unit for charged particle microscope and sample observation method using same

 #18
20180330915
2018-11-15

Method for enabling modular part replacement within an electron microscope sample holder

 #19
20180294138
2018-10-11

Method for optimizing fluid flow across a sample within an electron microscope sample holder

 #20
20180226221
2018-08-09

Wide field atmospheric scanning electron microscope

 #21
20180097307
2018-04-05

Method for forming an electrical connection to a sample support in an electron microscope holder

 #22
20170278670
2017-09-28

Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices

 #23
20170236685
2017-08-17

Microreactor for use in microscopy

 #24
20170229284
2017-08-10

Ion beam device and sample observation method

 #25
20170221675
2017-08-03

Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope

 #26
20170062177
2017-03-02

MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples

 #27
20170054239
2017-02-23

Method for forming an electrical connection to a sample support in an electron microscope holder

 #28
20170032928
2017-02-02

Micro-chamber for inspecting sample material

 #29
20170025245
2017-01-26

Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices

 #30
20170003243
2017-01-05

Analytical cell and method of producing the same

 #31
20160351374
2016-12-01

Thin-ice grid assembly for cryo-electron microscopy

 #32
20160336144
2016-11-17

Method for enabling modular part replacement within an electron microscope sample holder

 #33
20160293380
2016-10-06

Charged particle beam processing using process gas and cooled surface

 #34
20160217971
2016-07-28

Charged particle beam device and sample holder for charged particle beam device

 #35
20160211109
2016-07-21

Sample holder and charged particle device

 #36
20160189920
2016-06-30

Localized, in-vacuum modification of small structures

 #37
20160172153
2016-06-16

Microscopy support structures

 #38
20160126056
2016-05-05

Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices

 #39
20160071685
2016-03-10

Charged particle beam device and filter member

 #40
20160056012
2016-02-25

Sample holder for scanning electron microscope, scanning electron microscope image observation system, and scanning electron microscope image observation method

 #41
20160042912
2016-02-11

Liquid flow cells having graphene on nitride for microscopy

 #42
20160025659
2016-01-28

Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member

 #43
20150348745
2015-12-03

Method for optimizing fluid flow across a sample within an electron microscope sample holder

 #44
20150332891
2015-11-19

User interface for an electron microscope

 #45
20150318143
2015-11-05

Sample base, charged particle beam device and sample observation method

 #46
20150311033
2015-10-29

Charged particle beam device, sample stage unit, and sample observation method

 #47
20150255244
2015-09-10

Sample storage container, charged particle beam apparatus, and image acquiring method

 #48
20150214003
2015-07-30

Sample holder and method for observing electron microscopic image

 #49
20150179397
2015-06-25

Microscopy support structures

 #50
20150179396
2015-06-25

Electron microscope and electron microscope sample retaining device

 #51
20150162164
2015-06-11

Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices

 #52
20150129763
2015-05-14

Charged particle beam device

 #53
20150118126
2015-04-30

Transmission electron microscope cells for use with liquid samples

 #54
20140346352
2014-11-27

Sample supporting member for observing scanning electron microscopic image and method for observing scanning electron microscopic image

 #55
20140138558
2014-05-22

Method for forming an electrical connection to an sample support in an electron microscope holder

 #56
20140042318
2014-02-13

Sample holding apparatus for electron microscope, and electron microscope apparatus

 #57
20140014835
2014-01-16

Electron microscope sample holder and sample observation method

 #58
20140007709
2014-01-09

Specimen preparation for transmission electron microscopy

 #59
20130213439
2013-08-22

Holder assembly for cooperating with an environmental cell and an electron microscope

 #60
20130068611
2013-03-21

Localized, in-vacuum modification of small structures

 #61
20130040400
2013-02-14

Method of studying a sample in an ETEM

 #62
20130009072
2013-01-10

Specimen box for electron microscope

 #63
20130009071
2013-01-10

Specimen box for electron microscope

 #64
20120305769
2012-12-06

Electron microscope and sample holder

 #65
20120298883
2012-11-29

Flow cells for electron microscope imaging with multiple flow streams

 #66
20120292505
2012-11-22

Methods of using temperature control devices in electron microscopy

 #67
20120212583
2012-08-23

Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus

 #68
20120182548
2012-07-19

NANOFLUIDIC CELL

 #69
20120120226
2012-05-17

Transmission electron microscopy for imaging live cells

 #70
20120112062
2012-05-10

Environmental cell for charged particle beam system

 #71
20120091338
2012-04-19

Environmental cell for a particle-optical apparatus

 #72
20120025103
2012-02-02

In situ holder assembly

 #73
20110303845
2011-12-15

Electron beam device and sample holding device for electron beam device

 #74
20110293847
2011-12-01

Particle-Beam Induced Processing Using Liquid Reactants

 #75
20110284745
2011-11-24

Sample Holder, Inspection Apparatus, and Inspection Method

 #76
20110198512
2011-08-18

CHARGED CORPUSCULAR BEAM APPARATUS

 #77
20110133083
2011-06-09

Compact scanning electron microscope

 #78
20110079712
2011-04-07

Optical microscope

 #79
20110079710
2011-04-07

Microscopy support structures

 #80
20110031394
2011-02-10

High pressure charged particle beam system

 #81
20110006208
2011-01-13

Method for inspecting a sample

 #82
20100243888
2010-09-30

Apparatus and Method for Inspecting Samples

 #83
20100230590
2010-09-16

Compact Scanning Electron Microscope

 #84
20100224780
2010-09-09

Beam device system comprising a particle beam device and an optical microscope

 #85
20100194874
2010-08-05

User interface for an electron microscope

 #86
20100171037
2010-07-08

Compact scanning electron microscope

 #87
20100140497
2010-06-10

Membrane supports with reinforcement features

 #88
20090242795
2009-10-01

Cryo-charging specimen holder for electron microscope

 #89
20090242763
2009-10-01

Environmental cell for a particle-optical apparatus

 #90
20080135778
2008-06-12

Specimen kit and fabricating method thereof

 #91
20080135751
2008-06-12

Sample inspection method, sample inspection apparatus, and sample holder

 #92
20080035861
2008-02-14

Detector for charged particle beam instrument

 #93
20070210253
2007-09-13

Methods for SEM inspection of fluid containing samples

 #94
20070145268
2007-06-28

Ultra-thin liquid control plate and combination of box-like member and the control plate

 #95
20070125947
2007-06-07

Sample enclosure for a scanning electron microscope and methods of use thereof

 #96
20070045559
2007-03-01

Method of operating liquid in the vacuum or low-pressure environment and observing the operation and device for the operation and observation

 #97
20060284108
2006-12-21

Apparatus for evacuating a sample

 #98
20060261284
2006-11-23

Method of operating liquid in the vacuum or low-pressure environment and observing the operation and device for the operation and observation

 #99
20060249677
2006-11-09

Device for operating gas in vacuum or low-pressure environment and for observation of the operation

 #100
20060138324
2006-06-29

Scanning electron microscope

 #101
20060033038
2006-02-16

Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope

 #102
20050279938
2005-12-22

Low-pressure chamber for scanning electron microscopy in a wet environment

 #103
20050173632
2005-08-11

Methods for SEM inspection of fluid containing samples