ClassID:

206446

H01J2237/2004 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated; Controlling environment of sample; Environmental cells Biological samples

Recent Application in this class:
#1
20250123223
2025-04-17

Method for investigating a nanoscale biological specimen in an electron beam instrument, with reduced radiation damage

#2
20230073506
2023-03-09

WORKSTATION, PREPARATION STATION AND METHOD FOR MANIPULATING AN ELECTRON MICROSCOPY GRID ASSEMBLY

#3
20220102121
2022-03-31

Depth reconstruction for 3D images of samples in a charged particle system

#4
20210249219
2021-08-12

Electrochemical measurement of electron beam-induced pH change during liquid cell electron microscopy

#5
20210151288
2021-05-20

Apparatus and method for nanoscale X-ray imaging

#6
20210055534
2021-02-25

Vacuum transfer assembly

#7
20200064241
2020-02-27

Freezable fluid cell for cryo-electron microscopy

#8
20190080881
2019-03-14

Examination container and electron microscope

#9
20170221676
2017-08-03

Charged particle beam device, electron microscope and sample observation method

#10
20160351374
2016-12-01

Thin-ice grid assembly for cryo-electron microscopy

#11
20160189919
2016-06-30

Electron microscopy sample support including porous metal foil

#12
20160172152
2016-06-16

Electron microscope having a carrier

#13
20150318143
2015-11-05

Sample base, charged particle beam device and sample observation method

#14
20150311033
2015-10-29

Charged particle beam device, sample stage unit, and sample observation method

#15
20140346352
2014-11-27

Sample supporting member for observing scanning electron microscopic image and method for observing scanning electron microscopic image

#16
20140227734
2014-08-14

Electron microscopic observation method for observing biological sample in shape as it is, and composition for evaporation suppression under vacuum, scanning electron microscope, and transmission electron microscope used in the method

#17
20140007709
2014-01-09

Specimen preparation for transmission electron microscopy

#18
20120182548
2012-07-19

NANOFLUIDIC CELL

#19
20120120226
2012-05-17

Transmission electron microscopy for imaging live cells

#20
20120017415
2012-01-26

Method of use of reusable sample holding device permitting ready loading of very small wet samples

#21
20110303845
2011-12-15

Electron beam device and sample holding device for electron beam device

#22
20110284745
2011-11-24

Sample Holder, Inspection Apparatus, and Inspection Method

#23
20110284744
2011-11-24

Method and system for 4D tomography and ultrafast scanning electron microscopy

#24
20110097706
2011-04-28

Micro-reactor for observing particles in a fluid

#25
20100276277
2010-11-04

Electrochemical liquid cell apparatus

#26
20100243888
2010-09-30

Apparatus and Method for Inspecting Samples

#27
20100193398
2010-08-05

Reusable sample holding device permitting ready loading of very small wet samples

#28
20100051803
2010-03-04

Particle beam system

#29
20100019146
2010-01-28

Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspection Method

#30
20090283696
2009-11-19

Pre-Cryogenic Electron Microscope Specimen Holder

#31
20090250609
2009-10-08

Inspection method and reagent solution

#32
20090242795
2009-10-01

Cryo-charging specimen holder for electron microscope

#33
20090242762
2009-10-01

Apparatus and method for inspecting sample

#34
20090173882
2009-07-09

Liquid medium for preventing charge-up in electron microscope and method of observing sample using the same

#35
20090166536
2009-07-02

Sample holder, method for observation and inspection, and apparatus for observation and inspection

#36
20090045349
2009-02-19

Sample enclosure for inspection and methods of use thereof

#37
20080308731
2008-12-18

Specimen holder, specimen inspection apparatus, specimen inspection method, and method of fabricating specimen holder

#38
20070145289
2007-06-28

Closed observational device for electron microscope

#39
20070145288
2007-06-28

Semi-closed observational environment for electron microscope

#40
20070145287
2007-06-28

Specimen box for electron microscope capable of observing general specimen and live cell

#41
20070134699
2007-06-14

Nano-scale ligand arrays on substrates for particle beam instruments and related methods

#42
20070114434
2007-05-24

Multi-pixel electron microbeam irradiator systems and methods for selectively irradiating predetermined locations

#43
20070090289
2007-04-26

Method of observing live unit under electron microscope