206485 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Detection characterized by the detecting means; Semiconductor detectors, e.g. diodes; X-ray Energy-dispersive (Si-Li type) spectrometer
NOTCH FILTER FOR HIGH THROUGHPUT X-RAY PHOTON SPECTROSCOPY
#2CLASSIFYING MICROSCOPIC COMPONENTS OF PHYSICAL SAMPLES
#3A MULTI-MODE LOW-VOLTAGE ELECTRON MICROSCOPE
#4ARRAY SUBSTRATE
#5METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INVESTIGATION DEVICE TO PERFORM SUCH METHOD
#6High-resolution x-ray spectroscopy surface material analysis
#7Semiconductor device
#8Radiation detector and radiation detection apparatus
#9Handheld material analyser
#10Method of examining a sample using a charged particle microscope
#11Charged particle beam apparatus, observation method using charged particle beam apparatus, and program
#12Apparatus for combined stem and EDS tomography
#13Nanostructured carbon materials and methods of making and use thereof
#14Systems and methods for in situ high temperature X-ray spectroscopy in electron microscopes
#15Systems and methods for high energy X-ray detection in electron microscopes
#16Electron probe microanalyzer and storage medium
#17Radiation detector and radiation detection apparatus
#18Multi-module photon detector and use thereof
#19Control device, control method, and analysis system
#20Radiation detector and radiation detection apparatus
#21Electron microscope and elemental mapping image generation method
#22Method of acquiring EBSP patterns
#23Spectroscopic element and charged particle beam device using the same
#24Multi-module photon detector and use thereof
#25Semiconductor radiation detector with large active area, and method for its manufacture
#26Sub-pixel analysis and display of fine grained mineral samples
#27Semiconductor drift detector and corresponding operating method
#28Mounting structures for multi-detector electron microscopes
#29Automated mineral classification
#30METHOD AND APPARATUS FOR MATERIAL ANALYSIS BY A FOCUSED ELECTRON BEAM USING CHARACTERISTIC X-RAYS AND BACK-SCATTERED ELECTRONS
#31Charged-particle microscopy with occlusion detection
#32X-RAY ANALYSER
#33High collection efficiency X-ray spectrometer system with integrated electron beam stop, electron detector and X-ray detector for use on electron-optical beam lines and microscopes
#34Low-interference sensor head for a radiation detector, as well as a radiation detector which contains this low-interference sensor head
#35X-ray detector for electron microscope
#36Sensor head for an x-ray detector and x-ray detector containing said sensor head
#37Microcalorimetry for X-ray spectroscopy
#38Particle beam systems and methods
#39X-ray detector for electron microscope
#40Device and method for analyzing a sample
#41Digital pulse processor slope correction
#42X-ray analyzer using electron beam
#43X-RAY DETECTOR AND METHOD