Patents-Review.com
ClassID:

206484 ⎘

H01J2237/24415 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Detection characterized by the detecting means; Semiconductor detectors, e.g. diodes X-ray

Sub-classes:
Recent Application in this class:
#1
20250020818
2025-01-16

High Resolution Light Valve Detector for Detecting X-Ray

 #2
20230230800
2023-07-20

SENSOR MODULE FOR SCANNING ELECTRON MICROSCOPY APPLICATIONS

 #3
20220084783
2022-03-17

Charged particle beam device

 #4
20210311211
2021-10-07

High resolution light valve detector for detecting x-ray

 #5
20210066035
2021-03-04

Sensor module for scanning electron microscopy applications

 #6
20210066031
2021-03-04

Scanning electron microscope with composite detection system and specimen detection method

 #7
20190204245
2019-07-04

Scanning electron microscope and method for determining crystal orientations

 #8
20170271125
2017-09-21

X-ray analysis in air

 #9
20170229206
2017-08-10

Radiolucent window, radiation detector and radiation detection apparatus

 #10
20160233051
2016-08-11

X-ray analysis in air

 #11
20160172156
2016-06-16

Source for selectively providing positively or negatively charged particles for a focusing column

 #12
20160020062
2016-01-21

Charged-particle lens that transmits emissions from sample

 #13
20150235726
2015-08-20

Radiolucent window, radiation detector and radiation detection apparatus

 #14
20140339436
2014-11-20

Back scattered electron detector

 #15
20140326877
2014-11-06

Source for selectively providing positively or negatively charged particles for a focusing column

 #16
20140042316
2014-02-13

X-ray detector including integrated electron detector

 #17
20130299698
2013-11-14

Electron microscope with integrated detector(s)

 #18
20130134307
2013-05-30

Inductively coupled plasma source as an electron beam source for spectroscopic analysis

 #19
20130099114
2013-04-25

Silicon drift diode detector configured to switch between pulse height measurement mode and current measurement mode

 #20
20120241611
2012-09-27

Electron microscope

 #21
20120025074
2012-02-02

Electron detector including an intimately-coupled scintillator-photomultiplier combination, and electron microscope and X-ray detector employing same

 #22
20110204229
2011-08-25

Electron microscope with integrated detector(s)

 #23
20110168887
2011-07-14

Charged particle filter

 #24
20100163742
2010-07-01

Silicon drift X-ray detector

 #25
20100163725
2010-07-01

Charged particle analyser and method using electrostatic filter grids to filter charged particles

 #26
20080172206
2008-07-17

Methods for detecting and analyzing piled-up X-rays in an X-ray spectrometry system

 #27
20070152150
2007-07-05

Charged particle beam apparatus

 #28
20060289754
2006-12-28

Charged particle beam apparatus

 #29
20060289753
2006-12-28

Charged particle beam apparatus

 #30
20060226340
2006-10-12

Optical axis adjusting mechanism for X-ray lens, X-ray analytical instrument, and method of adjusting optical axis of X-ray lens

 #31
20060060782
2006-03-23

Scanning electron microscope

 #32
20050045822
2005-03-03

Charged particle beam apparatus