H01J2237/24425 - CPC Classification Index

ClassID:

206486 ⎘

H01J2237/24425 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Detection characterized by the detecting means; Semiconductor detectors, e.g. diodes; X-ray Wavelength-dispersive spectrometer

Recent Application in this class:

20190006146

2019-01-03

Electron probe microanalyzer and storage medium

20140117231

2014-05-01

Automated mineral classification

20120292508

2012-11-22

X-ray detection system

20100284513

2010-11-11

Wavelength-dispersive X-ray spectrometer

20080111072

2008-05-15

Method and apparatus for analyzing sample

20080067379

2008-03-20

X-ray analyzer using electron beam