H01J2237/2605 - CPC Classification Index

ClassID:

206539 ⎘

H01J2237/2605 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion microscopes; Details operating at elevated pressures, e.g. atmosphere

Sub-classes:

H01J2237/2608 » with environmental specimen chamber 58

Recent Application in this class:

20200144022

2020-05-07

Diffraction pattern detection in a transmission charged particle microscope

20200035448

2020-01-30

Vacuum condition controlling apparatus, system and method for specimen observation

20180226221

2018-08-09

Wide field atmospheric scanning electron microscope

20180122617

2018-05-03

Electron scanning microscope and image generation method

20160343538

2016-11-24

Electron scanning microscope and image generation method

20160343537

2016-11-24

Electron beam microscope with improved imaging gas and method of use

20160203941

2016-07-14

Diaphragm mounting member and charged particle beam device

20160025659

2016-01-28

Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member

20150380207

2015-12-31

Scanning electron microscope

#10

20150348742

2015-12-03

Charged particle optical apparatus having a selectively positionable differential pressure module

#11

20150243475

2015-08-27

Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment

#12

20150235803

2015-08-20

Charged particle beam device and sample observation method

#13

20150228448

2015-08-13

Observation apparatus and optical axis adjustment method

#14

20150228447

2015-08-13

Charged particle beam device and sample observation method

#15

20150221470

2015-08-06

Charged particle beam apparatus and sample observation method

#16

20150137001

2015-05-21

Charged particle beam instrument

#17

20150129763

2015-05-14

Charged particle beam device

#18

20150041647

2015-02-12

Method of using an environmental transmission electron microscope

#19

20140374593

2014-12-25

Detection method for use in charged-particle microscopy

#20

20140361166

2014-12-11

Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope

#21

20140117232

2014-05-01

Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment

#22

20130320211

2013-12-05

Inspection system using scanning electron microscope

#23

20130213439

2013-08-22

Holder assembly for cooperating with an environmental cell and an electron microscope

#24

20130026363

2013-01-31

Charged particle radiation device

#25

20120241608

2012-09-27

Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope

#26

20120205539

2012-08-16

Detector for use in charged-particle microscopy

#27

20120199740

2012-08-09

Particle beam system

#28

20110291010

2011-12-01

Charged particle radiation device

#29

20110139986

2011-06-16

Electron microscope

#30

20110031394

2011-02-10

High pressure charged particle beam system

#31

20110006209

2011-01-13

Electron beam apparatus

#32

20100314540

2010-12-16

Electron microscope with an emitter operating in medium vacuum

#33

20100224778

2010-09-09

Layered scanning charged particle apparatus package having an embedded heater

#34

20100224777

2010-09-09

Layered scanning charged particle microscope with differential pumping aperture

#35

20100140470

2010-06-10

Interface, a method for observing an object within a non-vacuum environment and a scanning electron microscope

#36

20100108881

2010-05-06

Scanning transmission electron microscope using gas amplification

#37

20100090109

2010-04-15

SCANNING ELECTRON MICROSCOPE

#38

20090288603

2009-11-26

PLASMA AND ELECTRON BEAM ETCHING DEVICE AND METHOD

#39

20090242758

2009-10-01

Multistage gas cascade amplifier

#40

20090230304

2009-09-17

Scanning electron microscope

#41

20090159797

2009-06-25

Transmission electron microscope

#42

20090045337

2009-02-19

Charged-particle beam instrument

#43

20080038933

2008-02-14

Plasma and electron beam etching device and method

#44

20080035843

2008-02-14

Scanning electron microscope

#45

20060284108

2006-12-21

Apparatus for evacuating a sample

#46

20060249686

2006-11-09

Method and system for the directional detection of electrons in a scanning electron microscope

#47

20060186337

2006-08-24

Scanning electron microscope

#48

20060138324

2006-06-29

Scanning electron microscope

#49

20060027748

2006-02-09

Secondary electron detector unit for a scanning electron microscope

#50

20050244821

2005-11-03

Method of identification and quantification of biological molecules and apparatus therefore

#51

20050045820

2005-03-03

Absorption current image apparatus in electron microscope