206540 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion microscopes; Details operating at elevated pressures, e.g. atmosphere with environmental specimen chamber
BUILD MATERIAL HANDLING UNIT FOR A POWDER MODULE FOR AN APPARATUS FOR ADDITIVELY MANUFACTURING THREE-DIMENSIONAL OBJECTS
#2Build material handling unit for a powder module for an apparatus for additively manufacturing three-dimensional objects
#3SPECIMEN CONTROL MEANS FOR PARTICLE BEAM MICROSCOPY
#4Light guide assembly for an electron microscope
#5Charged particle optical apparatus for through-the-lens detection of particles
#6Multidimensional printer
#7Charged particle optical apparatus for through-the-lens detection of particles
#8Membrane assembly, examination container and electron microscope
#9Charged particle optical apparatus for through-the-lens detection of particles
#10Wide field atmospheric scanning electron microscope
#11Imaging device for imaging an object and for imaging a structural unit in a particle beam apparatus
#12X-ray analysis in air
#13Ion beam device and sample observation method
#14Electron beam microscope with improved imaging gas and method of use
#15Charged-particle-beam device, specimen-image acquisition method, and program recording medium
#16Charged particle beam device, image generation method, observation system
#17X-ray analysis in air
#18Sample holder for scanning electron microscope, scanning electron microscope image observation system, and scanning electron microscope image observation method
#19Electron beam-induced etching
#20Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample
#21Charged particle optical apparatus having a selectively positionable differential pressure module
#22Sample base, charged particle beam device and sample observation method
#23Charged particle beam device, sample stage unit, and sample observation method
#24Charged particle beam device, position adjusting method for diaphragm, and diaphragm position adjusting jig
#25Inspection or observation apparatus and sample inspection or observation method
#26Charged particle beam apparatus
#27Methods for observing samples and preprocessing thereof
#28Electron beam-induced etching
#29Inspection or observation apparatus and sample inspection or observation method
#30Charged particle beam apparatus
#31Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample
#32Charged particle beam device
#33Compound microscope device
#34Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus
#35Environmental cell for a particle-optical apparatus
#36Charged particle beam devices
#37Scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment
#38AMBIENT PRESSURE PHOTOELECTRON MICROSCOPE
#39Beam device system comprising a particle beam device and an optical microscope
#40Sample inspection apparatus, sample inspection method and sample inspection system
#41Particle beam system
#42Specimen holder, specimen inspection apparatus, and specimen inspection method
#43Method and apparatus for simultaneous SEM and optical examination
#44Inspection method and reagent solution
#45Environmental cell for a particle-optical apparatus
#46Specimen holder, specimen inspection apparatus, specimen inspection method, and method of fabricating specimen holder
#47Particle-optical apparatus for simultaneous observing a sample with particles and photons
#48Scanning electron microscope
#49Observational liquid/gas environment combined with specimen chamber of electron microscope
#50Detector for charged particle beam instrument
#51Methods for SEM inspection of fluid containing samples
#52Particle optical apparatus with a predetermined final vacuum pressure
#53Ultra-thin liquid control plate and combination of box-like member and the control plate
#54Sample enclosure for a scanning electron microscope and methods of use thereof
#55Detector system of secondary and backscattered electrons for a scanning electron microscope
#56Environmental scanning electron microcope
#57Low vacuum scanning electron microscope
#58Low-pressure chamber for scanning electron microscopy in a wet environment
#59Methods for SEM inspection of fluid containing samples