H01J2237/2626 - CPC Classification Index

ClassID:

206546 ⎘

H01J2237/2626 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion microscopes; Non-scanning techniques; Field-emission microscopes Pulsed source

Recent Application in this class:

20220254601

2022-08-11

TOMOGRAPHIC ATOM PROBE WITH TERAHERTZ PULSE GENERATOR

20220139666

2022-05-05

Automated tomography field ion microscope

20180301317

2018-10-18

Electron beam generation for transmission electron microscope

20180130636

2018-05-10

Wide field-of-view atom probe

20170271123

2017-09-21

Method and device for time-resolved pump-probe electron microscopy

20160005566

2016-01-07

Method and system for electron microscope with multiple cathodes

20150008323

2015-01-08

Device and method for electron emission and device including such an electron emission system

20070018504

2007-01-25

Short duration variable amplitude high voltage pulse generator