206565 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion microscopes; Scanning microscopes Scanning tunnelling microscopes
Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software
#2Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software
#3Method for determining the shape of a sample tip for atom probe tomography
#4Tunnel current control apparatus and tunnel current control method
#5Methods and devices for examining an electrically charged specimen surface
#6Methods and devices for examining an electrically charged specimen surface
#7Three-dimensional semiconductor image reconstruction apparatus and method
#8Pump probe measuring device
#9Method of fabricating nanotips with controlled profile
#10Apparatus and method for investigating an object
#113D atomic scale imaging methods
#12Integrated circuit inspection system
#13Electric charged particle beam microscopy and electric charged particle beam microscope
#14Defining a pattern on a substrate
#15Electron microscope and scanning probe microscope calibration device
#16Integrated circuit inspection system
#17Micro-column electron beam apparatus
#18Defining a pattern on a substrate
#19Area selective deposition templated by hydrogen and halogen resists
#20Three-dimensional semiconductor image reconstruction apparatus and method