H01J2237/2852 - CPC Classification Index

ClassID:

206570 ⎘

H01J2237/2852 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion microscopes; Emission microscopes Auto-emission (i.e. field-emission)

Recent Application in this class:

20250166964

2025-05-22

AUTOMATIC GRID FINGER DETECTION

20220139666

2022-05-05

Automated tomography field ion microscope

20200286711

2020-09-10

Atom probe inspection device, field ion microscope, and distortion correction method

20190257855

2019-08-22

Method and apparatus for atomic probe tomography

20170372868

2017-12-28

Atom probe with vacuum differential

20150371818

2015-12-24

Characterization method for a reservoir micro pore structure and a system thereof

20150253353

2015-09-10

Fabrication of a malleable lamella for correlative atomic-resolution tomographic analyses

20110260054

2011-10-27

ATOM PROBE PULSE ENERGY

20080296489

2008-12-04

Atom Probe Evaporation Processes

#10

20080067407

2008-03-20

Conductive probe and method for producing the same

#11

20070018504

2007-01-25

Short duration variable amplitude high voltage pulse generator

#12

20050017174

2005-01-27

Laser stimulated atom probe characterization of semiconductor and dielectric structures