Patents-Review.com
ClassID:

206571 ⎘

H01J2237/2855 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion microscopes; Emission microscopes Photo-emission

Recent Application in this class:
#1
20240395499
2024-11-28

FIVE-DIMENSIONAL ELECTRON MICROSCOPE AND ANALYSIS METHOD THEREFOR

 #2
20230071801
2023-03-09

ELECTRON BEAM APPLICATION APPARATUS AND INSPECTION METHOD

 #3
20220020580
2022-01-20

Aperture device and analyzer arrangement

 #4
20210313141
2021-10-07

Apparatus for transmission electron microscopy cathodoluminescence

 #5
20200286711
2020-09-10

Atom probe inspection device, field ion microscope, and distortion correction method

 #6
20200020507
2020-01-16

Systems and methods for using multimodal imaging to determine structure and atomic composition of specimens

 #7
20190257855
2019-08-22

Method and apparatus for atomic probe tomography

 #8
20190074160
2019-03-07

Systems and method for using multimodal imaging to determine structure and atomic composition of specimens

 #9
20180350556
2018-12-06

Detector supplement device for spectroscopy setup

 #10
20180158645
2018-06-07

Sample chamber device for electron microscope, and electron microscope comprising same

 #11
20160307726
2016-10-20

Inspection device

 #12
20160254120
2016-09-01

Near-field optical transmission electron emission microscope

 #13
20120298861
2012-11-29

Vector Potential Photoelectron Microscope

 #14
20120235036
2012-09-20

Inspection device

 #15
20120117696
2012-05-10

INTEGRATED METALLIC MICROTIP COUPON STRUCTURE FOR ATOM PROBE TOMOGRAPHIC ANALYSIS

 #16
20120080596
2012-04-05

Laser Atom Probe and Laser Atom Probe Analysis Methods

 #17
20120049063
2012-03-01

Sample surface inspection apparatus and method

 #18
20110260054
2011-10-27

ATOM PROBE PULSE ENERGY

 #19
20110248164
2011-10-13

Combination laser and charged particle beam system

 #20
20110068267
2011-03-24

Electron beam inspection method and electron beam inspection apparatus

 #21
20110017909
2011-01-27

ELECTRON IMAGING APPARATUS WITH IMAGE PROCESSING

 #22
20090236521
2009-09-24

Method and system for ultrafast photoelectron microscope

 #23
20080315093
2008-12-25

Electron beam inspection method and electron beam inspection apparatus

 #24
20080296489
2008-12-04

Atom Probe Evaporation Processes

 #25
20080265159
2008-10-30

Sample surface inspection apparatus and method

 #26
20080017796
2008-01-24

Method and system for ultrafast photoelectron microscope

 #27
20070205358
2007-09-06

Laser atom probe

 #28
20060192145
2006-08-31

Charged particle beam apparatus and method for operating the same

 #29
20050253069
2005-11-17

Method and system for ultrafast photoelectron microscope

 #30
20050158653
2005-07-21

Sample surface inspection apparatus and method

 #31
20050017174
2005-01-27

Laser stimulated atom probe characterization of semiconductor and dielectric structures