H01J2237/3109 - CPC Classification Index

ClassID:

206595 ⎘

H01J2237/3109 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion beam tubes for processing objects; Processing objects on a macro-scale Cutting

Recent Application in this class:

20160319462

2016-11-03

APPARATUS AND METHOD OF CLEAVING THIN LAYER FROM BULK MATERIAL

20150311034

2015-10-29

Method and apparatus for sample extraction and handling

20130153785

2013-06-20

Method and apparatus for sample extraction and handling

20110151597

2011-06-23

Analysis method for semiconductor device

20100305747

2010-12-02

Method and apparatus for sample extraction and handling

20100072401

2010-03-25

Hydrogen ion implanter using a broad beam source

20080289954

2008-11-27

Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same

20070283578

2007-12-13

Atomically sharp edged cutting blades and methods for making same

20070176099

2007-08-02

Atom probe apparatus and method for working sample preliminary for the same

#10

20070152174

2007-07-05

Focused ion beam apparatus and liquid metal ion source

#11

20060054840

2006-03-16

Focused ion beam apparatus and aperture

#12

20050210684

2005-09-29

Atomically sharp edged cutting blades and methods for making same

#13

16052788

2019-12-31

Method of producing lift out specimens for teaching, practice, and training