H01J2237/31 - CPC Classification Index

ClassID:

206593 ⎘

H01J2237/31 - CPC Classification

Classification description:

Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion beam tubes for processing objects Processing objects on a macro-scale

Sub-classes:

H01J2237/3104 » Welding 8
H01J2237/3109 » Cutting 12
H01J2237/3114 » Machining 43
H01J2237/3118 » Drilling 7
H01J2237/3123 » Casting 0
H01J2237/3128 » Melting 24
H01J2237/3132 » Evaporating 28
H01J2237/3142 » Ion plating 21
H01J2237/3151 » Etching 97
H01J2237/3156 » Curing 14
H01J2237/316 » Changing physical properties 33
H01J2237/3165 » Changing chemical properties 47

Recent Application in this class:

20200156039

2020-05-21

UPGRADING PROCESS STREAMS

20200086273

2020-03-19

PROCESSING MATERIALS

20200038811

2020-02-06

ENCLOSURES FOR TREATING MATERIALS

20190316294

2019-10-17

RECONFIGURABLE PROCESSING ENCLOSURES

20190232228

2019-08-01

CONTROLLING PROCESS GASES

20190039023

2019-02-07

Processing materials

20190027367

2019-01-24

Workpiece processing technique

20190010662

2019-01-10

Array for processing materials

20180339270

2018-11-29

Processing materials

#10

20180038048

2018-02-08

Processing materials

#11

20180016745

2018-01-18

Reconfigurable processing enclosures

#12

20170268169

2017-09-21

Array for processing materials

#13

20170213690

2017-07-27

Charged particle system and methods for irradiating a planning target volume

#14

20170178869

2017-06-22

Hollow cathode ion source

#15

20170165628

2017-06-15

Controlling process gases

#16

20170077001

2017-03-16

Method for high throughput using beam scan size and beam position in gas cluster ion beam processing system

#17

20170044713

2017-02-16

Array for processing materials

#18

20170036186

2017-02-09

Processing materials

#19

20170036185

2017-02-09

Reconfigurable processing enclosures

#20

20170011885

2017-01-12

Method for preparing cross-sections by ion beam milling

#21

20160222476

2016-08-04

Array for processing materials

#22

20150318140

2015-11-05

Multi-source plasma focused ion beam system

#23

20150144808

2015-05-28

Plasma source apparatus and methods for generating charged particle beams

#24

20150060416

2015-03-05

Electron-beam-supported production of electrical components

#25

20150041454

2015-02-12

Plasma whirl reactor apparatus and methods of use

#26

20140318969

2014-10-30

Upgrading process streams

#27

20140312245

2014-10-23

Multi-source plasma focused ion beam system

#28

20140284501

2014-09-25

Processing materials

#29

20140284495

2014-09-25

Array for processing materials

#30

20140284494

2014-09-25

Reconfigureable processing enclosures

#31

20140284205

2014-09-25

Enclosures for treating materials

#32

20140284203

2014-09-25

Controlling process gases

#33

20130108504

2013-05-02

Apparatus for the sterilization of plastics material containers by means of medium-controlled electron beams

#34

20130084211

2013-04-04

Apparatus and method of sterilizing containers with a charge carrier source introduced into the containers

#35

20130040055

2013-02-14

Surface processing method

#36

20120167962

2012-07-05

SYSTEM AND METHOD FOR GENERATING A BEAM OF PARTICLES

#37

20120125889

2012-05-24

CLUSTER BEAM GENERATING APPARATUS, SUBSTRATE PROCESSING APPARATUS, CLUSTER BEAM GENERATING METHOD, AND SUBSTRATE PROCESSING METHOD

#38

20120091633

2012-04-19

Method to minimize chain scission and monomer generation in processing of poly(L-lactide) stent

#39

20120080407

2012-04-05

Multi-source plasma focused ion beam system

#40

20120068058

2012-03-22

Apparatus and method for processing substrate using neutralized beams including applying a voltage to a substrate support

#41

20120025710

2012-02-02

Hall-current ion source with improved ion beam energy distribution

#42

20110155897

2011-06-30

Gas-cluster-jet generator and gas-cluster ion-beam apparatus utilizing an improved gas-cluster-jet generator

#43

20110006037

2011-01-13

Surface processing method

#44

20100207529

2010-08-19

Closed drift ion source

#45

20100187970

2010-07-29

Apparatus for producing a charged particle beam

#46

20090309018

2009-12-17

Multi-source plasma focused ion beam system

#47

20090272228

2009-11-05

Apparatus and method for clean, rapidly solidified alloys

#48

20090140176

2009-06-04

Non-ambipolar radio-frequency plasma electron source and systems and methods for generating electron beams

#49

20090140132

2009-06-04

Apparatus and method for processing substrate using neutralized beams including applying a voltage to a substrate support

#50

20080293832

2008-11-27

SOLID SAMPLE, SOLID SAMPLE FABRICATING METHOD, AND SOLID SAMPLE FABRICATING APPARATUS

#51

20080136309

2008-06-12

Ion source with upstream inner magnetic pole piece

#52

20080129209

2008-06-05

Adaptive controller for ion source

#53

20080067430

2008-03-20

Non-ambipolar radio-frequency plasma electron source and systems and methods for generating electron beams

#54

20080067406

2008-03-20

Irradiating device and method for controlling the same

#55

20080038908

2008-02-14

Method and system for continuous large-area scanning implantation process

#56

20080017112

2008-01-24

Ion source with recess in electrode

#57

20070062332

2007-03-22

Apparatus and method for clean, rapidly solidified alloys

#58

20060219953

2006-10-05

Subsurface imaging using an electron beam

#59

20060022136

2006-02-02

Multiple gas injection system for charged particle beam instruments

#60

20050285047

2005-12-29

Electron beam diagnostic for profiling high power beams

#61

20050082493

2005-04-21

Floating mode ion source