206596 ⎘
Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging; Electron or ion beam tubes for processing objects; Processing objects on a macro-scale Machining
Milling a multi-layered object
#2Method for removal of matter
#3System and method for performing nano beam diffraction analysis
#4Assessment and calibration of a high energy beam
#5System and method for performing nano beam diffraction analysis
#6Tomography sample preparation systems and methods with improved speed, automation, and reliability
#7System and method for performing nano beam diffraction analysis
#8Method for preparing cross-sections by ion beam milling
#9Assessment and calibration of a high energy beam
#10Method of Producing a Freestanding Thin Film of Nano-Crystalline Carbon
#11Method and apparatus for sample extraction and handling
#12Method of producing a freestanding thin film of nano-crystalline graphite
#13Method and apparatus for sample extraction and handling
#14METHOD OF MANUFACTURING WORKPIECE
#15Ion Milling Device, Sample Processing Method, Processing Device, and Sample Drive Mechanism
#16Apparatus and method for forming a solid immersion lens using a binary bitmap milling pattern
#17Method and apparatus for controlling topographical variation on a milled cross-section of a structure
#18METHOD AND APPARATUS FOR PRODUCING THREE DIMENSIONAL NANO AND MICRO SCALE STRUCTURES
#19Method and apparatus for specimen fabrication
#20Method and apparatus for sample extraction and handling
#21Charged particle beam processing method
#22Method and apparatus for controlling topographical variation on a milled cross-section of a structure
#23FIB milling of copper over organic dielectrics
#24Atomically sharp iridium tip
#25Semiconductor device surface roughness reduction
#26Method and apparatus for specimen fabrication
#27Backside unlayering of MOSFET devices for electrical and physical characterization
#28Directed Multi-Deflected Ion Beam Milling of a Work Piece and Determining and Controlling Extent Thereof
#29Atomically sharp edged cutting blades and methods for making same
#30FIB MILLING OF COPPER OVER ORGANIC DIELECTRICS
#31Sample holder and ion-beam processing system
#32Object-moving method, object-moving apparatus, production process and produced apparatus
#33Apparatus and method for polishing gemstones and the like
#34System, method, and apparatus for ion beam etching process stability using a reference for time scaling subsequent steps
#35Backside unlayering of MOSFET devices for electrical and physical characterization
#36Dual angle milling for current perpendicular to plane (CPP) magnetoresistive sensor definition
#37Atomically sharp edged cutting blades and methods for making same
#38Method of processing backside unlayering of MOSFET devices for electrical and physical characterization including a collimated ion plasma
#39Method and apparatus for controlling topographical variation on a milled cross-section of a structure
#40Ion beam apparatus and sample processing method
#41FIB milling of copper over organic dielectrics
#42Method of fabricating electronic component using resist structure with no undercut
#43Method and apparatus for specimen fabrication