Patents-Review.com
ClassID:

204523 ⎘

H01J3/14 - CPC Classification

Classification description:

Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps Arrangements for focusing or reflecting ray or beam

Sub-classes:
Recent Application in this class:
#1
20260155644
2026-06-04

ARC FLASH MITIGATION DEVICE

 #2
20230015939
2023-01-19

ARC FLASH MITIGATION DEVICE

 #3
20220115857
2022-04-14

Arc flash mitigation device

 #4
20210134551
2021-05-06

Electron gun, electron beam applicator, method for releasing electrons using electron gun, and method for adjusting focal position of electron beam

 #5
20200319356
2020-10-08

Ion filter using aperture plate with plurality of zones

 #6
20200126777
2020-04-23

Ion guiding device and guiding method

 #7
20190189383
2019-06-20

Devices having an electron emitting structure

 #8
20180143332
2018-05-24

Ion Filter

 #9
20170302498
2017-10-19

Phase modulation device and laser microscope

 #10
20170076906
2017-03-16

Ebeam staggered beam aperture array

 #11
20160225573
2016-08-04

Focusing structures with non-rectilinear focusing apertures

 #12
20150092923
2015-04-02

Devices having an electron emitting structure

 #13
20140346327
2014-11-27

Electro-optical radiation collector for arc flash detection

 #14
20140224997
2014-08-14

Ultra-miniaturized electron optical microcolumn

 #15
20140197328
2014-07-17

Ion beam system and method of operating an ion beam system

 #16
20140021366
2014-01-23

Charged particle beam apparatus

 #17
20130336459
2013-12-19

Field emission X-ray tube and method of focusing electron beam using the same

 #18
20130334410
2013-12-19

Monolayer and/or few-layer graphene on metal or metal-coated substrates

 #19
20130303824
2013-11-14

System and method for automated cyclotron procedures

 #20
20130277569
2013-10-24

System and method for layer-wise proton beam current variation

 #21
20130240720
2013-09-19

Focused ion beam apparatus and method of adjusting ion beam optics

 #22
20130175440
2013-07-11

Radio frequency (RF) ion guide for improved performance in mass spectrometers

 #23
20130134323
2013-05-30

Electron beam profile measurement system and method with optional Faraday cup

 #24
20130099131
2013-04-25

Method and apparatus for improved uniformity control with dynamic beam shaping

 #25
20130075623
2013-03-28

Multi-ion beam implantation apparatus and method

 #26
20130032701
2013-02-07

Inputting module and submount thereof and manufacturing method of the submount

 #27
20120312971
2012-12-13

Electro-optical radiation collector for arc flash detection

 #28
20120299681
2012-11-29

FLAT BAND WINDING FOR AN INDUCTOR CORE

 #29
20120299680
2012-11-29

Multi gap inductor core

 #30
20120256098
2012-10-11

Ion beam system and method of operating ion beam system

 #31
20120248325
2012-10-04

Charged particle cancer therapy patient positioning method and apparatus

 #32
20120248324
2012-10-04

Method and apparatus for improved uniformity control with dynamic beam shaping

 #33
20120223246
2012-09-06

System and method for automated cyclotron procedures

 #34
20120193551
2012-08-02

Apparatus systems and methods of sensing chemical bio-chemical and radiological agents using electrophoretic displays

 #35
20120161029
2012-06-28

Efficient atmospheric pressure interface for mass spectrometers and method

 #36
20120056099
2012-03-08

System and method for layer-wise proton beam current variation

 #37
20110218430
2011-09-08

Charged particle cancer therapy patient positioning method and apparatus

 #38
20110215256
2011-09-08

Focused ion beam apparatus

 #39
20110186744
2011-08-04

CHARGED PARTICLE BEAM APPARATUS AND METHOD

 #40
20100303123
2010-12-02

Compact optical resonators

 #41
20100255984
2010-10-07

Monolayer and/or Few-Layer Graphene On Metal or Metal-Coated Substrates

 #42
20100195073
2010-08-05

Scanned writing of an exposure pattern on a substrate having a spot size modulator and dual motor for moving the substrate table and a laser spot relative to each other

 #43
20100193681
2010-08-05

Quantitative measurement of isotope ratios by time-of-flight mass spectrometry

 #44
20100072352
2010-03-25

Electro-optical radiation collector for arc flash detection

 #45
20100059687
2010-03-11

Proton beam positioning verification method and apparatus used in conjunction with a charged particle cancer therapy system

 #46
20100059686
2010-03-11

Tandem accelerator method and apparatus used in conjunction with a charged particle cancer therapy system

 #47
20100038533
2010-02-18

Ion transfer arrangement with spatially alternating DC and viscous ion flow

 #48
20100038532
2010-02-18

Efficient atmospheric pressure interface for mass spectrometers and method

 #49
20100019166
2010-01-28

Method for controlling electron beam in multi-microcolumn and multi-microcolumn using the same

 #50
20100008469
2010-01-14

Elongated lifetime X-ray method and apparatus used in conjunction with a charged particle cancer therapy system

 #51
20100006770
2010-01-14

Charged particle beam acceleration and extraction method and apparatus used in conjunction with a charged particle cancer therapy system

 #52
20090283674
2009-11-19

Efficient Atmospheric Pressure Interface for Mass Spectrometers and Method

 #53
20090045062
2009-02-19

Ion transport device and modes of operation thereof

 #54
20090026361
2009-01-29

Microengineered electrode assembly

 #55
20080308721
2008-12-18

Ion transport device

 #56
20080121826
2008-05-29

Laser source detection system and method

 #57
20070029497
2007-02-08

Electron beam directed energy device and methods of using same

 #58
20060022598
2006-02-02

Field emission cathode gating for RF electron guns and planar focusing cathodes

 #59
20060006807
2006-01-12

Field emission cathode gating for RF electron guns and planar focusing cathodes

 #60
20050133708
2005-06-23

Method and system for three dimensional tomosynthesis imaging

 #61
20050017193
2005-01-27

Particle beam processing system

 #62
17443684
2022-02-15

Shaped repeller for an indirectly heated cathode ion source

 #63
14459497
2015-07-14

Adjustment method for electron beam device, and the electron beam device thus adjusted