H01J3/20 - CPC Classification Index

ClassID:

204526 ⎘

H01J3/20 - CPC Classification

Classification description:

Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps; Arrangements for focusing or reflecting ray or beam Magnetic lenses

Sub-classes:

H01J3/22 » using electromagnetic means only 9
H01J3/24 » using permanent magnets only 4

Recent Application in this class:

20220068589

2022-03-03

CHARGED PARTICLE SOURCE

20200126753

2020-04-23

Charged particle source

20190057833

2019-02-21

Charged particle source

20170125203

2017-05-04

Charged particle source

20170125202

2017-05-04

Charged particle source

20160163500

2016-06-09

Charged particle source

20150179384

2015-06-25

Multi-axis magnetic lens for focusing a plurality of charged particle beams

20140346368

2014-11-27

Gun configured to generate charged particles

20140326895

2014-11-06

Permanent magnet based high performance multi-axis immersion electron lens array with low axial leakage field

#10

20140252245

2014-09-11

Tubular permanent magnet used in a multi-electron beam device

#11

20130248730

2013-09-26

Multi-axis magnetic lens for focusing a plurality of charged particle beams

#12

20130181138

2013-07-18

Multi-axis magnetic lens for focusing a plurality of charged particle beams

#13

20130153782

2013-06-20

Multi-axis magnetic lens for focusing a plurality of charged particle beams

#14

20130134322

2013-05-30

ELECTRON LENS AND THE ELECTRON BEAM DEVICE

#15

20080191629

2008-08-14

Focused anode layer ion source with converging and charge compensated beam (falcon)

#16

20080191144

2008-08-14

Non-axisymmetric charged-particle beam system

#17

20060017002

2006-01-26

Non-axisymmetric charged-particle beam system

#18

20050167608

2005-08-04

Method and apparatus for magnetic focusing of off-axis electron beam