H01J3/22 - CPC Classification Index

ClassID:

204527 ⎘

H01J3/22 - CPC Classification

Classification description:

Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps; Arrangements for focusing or reflecting ray or beam; Magnetic lenses using electromagnetic means only

Recent Application in this class:

20250253141

2025-08-07

PHOTOELECTRON SOURCE, MULTI-PHOTOELECTRON SOURCE AND MULTI-BEAM IRRADIATION APPARATUS

20150303019

2015-10-22

Method and device for generating a focused strong-current charged-particle beam

20140197734

2014-07-17

Spin rotation device

20140034845

2014-02-06

Charged Particle Optics with Azimuthally-Varying Third-Order Aberrations for Generation of Shaped Beams

20130264477

2013-10-10

Particle-beam column corrected for both chromatic and spherical aberration

20130181138

2013-07-18

Multi-axis magnetic lens for focusing a plurality of charged particle beams

20130105703

2013-05-02

Particle beam therapy system and adjustment method for particle beam therapy system

20120235053

2012-09-20

Mass analyzer apparatus and systems operative for focusing ribbon ion beams and for separating desired ion species from unwanted ion species in ribbon ion beams

20110121195

2011-05-26

Particle beam therapy system and adjustment method for particle beam therapy system

#10

20060151712

2006-07-13

Focusing apparatus and lithography system using the same