204528 ⎘
Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps; Arrangements for focusing or reflecting ray or beam; Magnetic lenses using permanent magnets only
Magnetically microfocused electron emission source
#2Charged particle source
#3Tubular permanent magnet used in a multi-electron beam device
#4Mass analyzer apparatus and systems operative for focusing ribbon ion beams and for separating desired ion species from unwanted ion species in ribbon ion beams