ClassID:

205200

H01J37/065 - CPC Classification

Classification description:

Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof; Details; Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement; Electron sources; Electron guns Construction of guns or parts thereof

Recent Application in this class:
#1
20260135014
2026-05-14

ELECTRON BEAM IRRADIATION DEVICE

#2
20250308832
2025-10-02

STABILIZING A TIP WIRE OF AN ELECTRON SOURCE

#3
20240363303
2024-10-31

CATHODE ASSEMBLY FOR ELECTRON GUN

#4
20240347311
2024-10-17

SYSTEM AND APPARATUS FOR STABILIZING ELECTRON SOURCES IN CHARGED PARTICLE SYSTEMS

#5
20240312758
2024-09-19

SYSTEM AND METHOD FOR ADJUSTING BEAM CURRENT USING A FEEDBACK LOOP IN CHARGED PARTICLE SYSTEMS

#6
20240242917
2024-07-18

High-Voltage Insulating Structure, Charged Particle Gun, and Charged Particle Beam Device

#7
20240153740
2024-05-09

FILAMENT ALIGNMENT DEVICE

#8
20240128042
2024-04-18

Electron gun cathode mount

#9
20240079198
2024-03-07

Emitter, electron gun in which same is used, electronic device in which same is used, and method for manufacturing same

#10
20240029989
2024-01-25

Electron source, method for manufacturing same, and device provided with electron source

#11
20230352262
2023-11-02

ELECTRON SOURCE, ELECTRON GUN, AND CHARGED PARTICLE BEAM DEVICE

#12
20230335368
2023-10-19

ELECTROMAGNETIC LENS AND ELECTRON SOURCE MECHANISM

#13
20230132046
2023-04-27

Cathode mechanism of electron emission source, and method for manufacturing cathode mechanism of electron emission source

#14
20220285124
2022-09-08

ABERRATION CORRECTION IN CHARGED PARTICLE SYSTEM

#15
20220262592
2022-08-18

Charged particle beam apparatus, scanning electron microscope, and method of operating a charged particle beam apparatus

#16
20220189725
2022-06-16

Electron emitter and method of fabricating same

#17
20220068589
2022-03-03

CHARGED PARTICLE SOURCE

#18
20220051866
2022-02-17

Electron gun device

#19
20210327770
2021-10-21

Electron beam system for inspection and review of 3D devices

#20
20210327674
2021-10-21

Electron source, method for manufacturing the same, and electron beam device using the same

#21
20210272771
2021-09-02

Broad-energy spectrum electron gun

#22
20210142975
2021-05-13

Electron emitter and method of fabricating same

#23
20210050176
2021-02-18

Method of manufacturing electron source

#24
20210050175
2021-02-18

Electron source and electron gun

#25
20210050174
2021-02-18

Cathode assembly for electron gun

#26
20200395191
2020-12-17

Multibeam inspection apparatus

#27
20200249181
2020-08-06

Inspection tool, lithographic apparatus, electron beam source and an inspection method

#28
20200161086
2020-05-21

ELECTRON MICROSCOPE EQUIPPED WITH AUTOMATIC BEAM ALIGNMENT

#29
20200126753
2020-04-23

Charged particle source

#30
20190371564
2019-12-05

Space charge insensitive electron gun designs

#31
20190237288
2019-08-01

Charged-particle source and method for cleaning a charged-particle source using back-sputtering

#32
20190214220
2019-07-11

Axial electron gun

#33
20190198285
2019-06-27

Accelerator system for mineral component analysis, system and method for mineral component analysis

#34
20190172674
2019-06-06

Electron emitter and method of fabricating same

#35
20190088441
2019-03-21

ELECTRON EMISSION TUBE, ELECTRON IRRADIATION DEVICE, AND METHOD OF MANUFACTURING ELECTRON EMISSION TUBE

#36
20190057833
2019-02-21

Charged particle source

#37
20180323036
2018-11-08

Gun lens design in a charged particle microscope

#38
20180277334
2018-09-27

Aberration correction in charged particle system

#39
20180269024
2018-09-20

Low work function electron beam filament assembly

#40
20180240640
2018-08-23

Electron source architecture for a scanning electron microscopy system

#41
20180233316
2018-08-16

ELECTRON BEAM PROJECTOR WITH LINEAR THERMAL CATHODE

#42
20180218874
2018-08-02

Electron microscope electron gun for facilitating position adjustment and electron microscope including same

#43
20180169784
2018-06-21

Additive manufacturing of three-dimensional articles

#44
20180033581
2018-02-01

X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target, and rotary vacuum seal

#45
20180019096
2018-01-18

Charged particle beam device, and method of manufacturing component for charged particle beam device

#46
20180019092
2018-01-18

X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target, and rotary vacuum seal

#47
20170309436
2017-10-26

Electron-beam spot optimization

#48
20170229285
2017-08-10

Exposure apparatus

#49
20170229276
2017-08-10

High voltage feedthrough assembly, time-resolved transmission electron microscope and method of electrode manipulation in a vacuum environment

#50
20170162361
2017-06-08

Ultra broad band continuously tunable electron beam pulser

#51
20170154750
2017-06-01

Electron gun, control method and control program thereof, and three-dimensional shaping apparatus

#52
20170040139
2017-02-09

Electron beam device

#53
20160358741
2016-12-08

System and method for providing a clean environment in an electron-optical system

#54
20160247658
2016-08-25

Micro-electron column having an electron emitter improving the density of an electron beam emitted from a nano structure tip

#55
20160247657
2016-08-25

MICRO-ELECTRON COLUMN HAVING NANO STRUCTURE TIP WITH EASILY ALIGNING

#56
20160240345
2016-08-18

Charged particle source arrangement for a charged particle beam device, charged particle beam device for sample inspection, and method for providing a primary charged particle beam for sample inspection in a charged particle beam

#57
20160064174
2016-03-03

Electron gun supporting member and electron gun apparatus

#58
20160020058
2016-01-21

X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target, and rotary vacuum seal

#59
20150371810
2015-12-24

Individually switched field emission arrays

#60
20150255240
2015-09-10

Method for manufacturing electron source

#61
20150137010
2015-05-21

Multi-electrode stack arrangement

#62
20150137009
2015-05-21

Multi-electrode cooling arrangement

#63
20150136995
2015-05-21

Multi-electrode electron optics

#64
20150124931
2015-05-07

Cathode filament assembly

#65
20150117617
2015-04-30

X-ray tube

#66
20150028221
2015-01-29

Methods of ion source fabrication

#67
20140346355
2014-11-27

Electron microscope

#68
20140197336
2014-07-17

Electron gun and charged particle beam device having an aperture with flare-suppressing coating

#69
20140139100
2014-05-22

Thermionic cathode with even electric field distribution on electron emitting surface

#70
20140097736
2014-04-10

High-brightness, long life thermionic cathode and methods of its fabrication

#71
20140065918
2014-03-06

Method of producing rapid heating of a cathode installed in a thermionic emission assembly

#72
20140055025
2014-02-27

Electron gun and electron beam device

#73
20140000104
2014-01-02

Enclosure and method for handling electron gun or ion gun

#74
20130134324
2013-05-30

Compact high-voltage electron gun

#75
20120145919
2012-06-14

Charged particle source from a photoionized cold atom beam

#76
20120131785
2012-05-31

Electron beam source and method of manufacturing the same

#77
20120126697
2012-05-24

Crossover point regulation method for electro-static focusing systems

#78
20120098409
2012-04-26

Filament for electron source

#79
20120085925
2012-04-12

Charged particle radiation device

#80
20110294071
2011-12-01

ELECTRON GUN, LITHOGRAPHY APPARATUS, METHOD OF MANUFACTURING ARTICLE, AND ELECTRON BEAM APPARATUS

#81
20110240855
2011-10-06

Electron beam device and electron beam application device using the same

#82
20110180721
2011-07-28

System, method and apparatus for multi-beam lithography including a dispenser cathode for homogeneous electron emission

#83
20110104976
2011-05-05

Carbon nanotube electron gun

#84
20110101245
2011-05-05

EVAPORATION SYSTEM

#85
20110084591
2011-04-14

THERMAL FIELD EMISSION CATHODE

#86
20110068675
2011-03-24

Multiple device shaping uniform distribution of current density in electro-static focusing systems

#87
20110001058
2011-01-06

Gas field ion source with coated tip

#88
20100301736
2010-12-02

Electron emitting source and manufacturing method of electron emitting source

#89
20100277053
2010-11-04

Multiple device shaping uniform distribution of current density in electro-static focusing systems

#90
20100258724
2010-10-14

Tip-sharpened carbon nanotubes and electron source using thereof

#91
20100237762
2010-09-23

Electron source and electron beam apparatus

#92
20100219357
2010-09-02

System, method and apparatus for multi-beam lithography including a dispenser cathode for homogeneous electron emission

#93
20100200766
2010-08-12

ELECTRON EMITTER HAVING NANO-STRUCTURE TIP AND ELECTRON COLUMN USING THE SAME

#94
20100194262
2010-08-05

Electron source

#95
20100187433
2010-07-29

IMPROVED PARTICLE BEAM GENERATOR

#96
20100127170
2010-05-27

Electron beam control method, electron beam generating apparatus, apparatus using the same, and emitter

#97
20100078557
2010-04-01

Electron beam source and method of manufacturing the same

#98
20100038556
2010-02-18

Hot cathode and ion source including the same

#99
20100026160
2010-02-04

ELECTRON SOURCE

#100
20100019649
2010-01-28

Electron source

#101
20090315444
2009-12-24

Thermal field emission cathode

#102
20090236521
2009-09-24

Method and system for ultrafast photoelectron microscope

#103
20090160307
2009-06-25

DIAMOND ELECTRON SOURCE AND METHOD FOR MANUFACTURING THE SAME

#104
20090134127
2009-05-28

Electron beam heating system having carbon nanotubes

#105
20090057558
2009-03-05

SCANNING ELECTRON MICROSCOPE

#106
20080283745
2008-11-20

EMITTER CHAMBER, CHARGED PARTICAL APPARATUS AND METHOD FOR OPERATING SAME

#107
20080251736
2008-10-16

Charged particle gun

#108
20080237483
2008-10-02

Carbon nanotube electron gun

#109
20080173829
2008-07-24

Ultra-bright pulsed electron beam with low longitudinal emittance

#110
20080135756
2008-06-12

Charged beam gun

#111
20080067407
2008-03-20

Conductive probe and method for producing the same

#112
20080067377
2008-03-20

Electron beam apparatus and an aberration correction optical apparatus

#113
20080023642
2008-01-31

Electron gun assembly

#114
20080017796
2008-01-24

Method and system for ultrafast photoelectron microscope

#115
20070210691
2007-09-13

Electron beam gun

#116
20070182303
2007-08-09

System, method and apparatus for multi-beam lithography including a dispenser cathode for homogeneous electron emission

#117
20070096620
2007-05-03

Electron gun

#118
20070057617
2007-03-15

Electron beam source having an extraction electrode provided with a magnetic disk element

#119
20060231772
2006-10-19

Charged particle beam device with cleaning unit and method of operation thereof

#120
20060145585
2006-07-06

Electron gun

#121
20060061285
2006-03-23

High power, long focus electron source for beam processing

#122
20060028114
2006-02-09

System, method and apparatus for multi-beam lithography including a dispenser cathode for homogeneous electron emission

#123
20050253069
2005-11-17

Method and system for ultrafast photoelectron microscope

#124
20050247876
2005-11-10

Sample dimension measuring method and scanning electron microscope

#125
20050092929
2005-05-05

Integrated sub-nanometer-scale electron beam systems

#126
20050001178
2005-01-06

Multi-column charged particle optics assembly

#127
18178249
2024-02-13

Conical heat shield for electron emitting cathode

#128
16203524
2020-03-17

Low temperature, high-brightness, cathode

#129
15593900
2018-04-03

Extractor electrode for electron source