205200 ⎘
Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof; Details; Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement; Electron sources; Electron guns Construction of guns or parts thereof
ELECTRON BEAM IRRADIATION DEVICE
#2STABILIZING A TIP WIRE OF AN ELECTRON SOURCE
#3CATHODE ASSEMBLY FOR ELECTRON GUN
#4SYSTEM AND APPARATUS FOR STABILIZING ELECTRON SOURCES IN CHARGED PARTICLE SYSTEMS
#5SYSTEM AND METHOD FOR ADJUSTING BEAM CURRENT USING A FEEDBACK LOOP IN CHARGED PARTICLE SYSTEMS
#6High-Voltage Insulating Structure, Charged Particle Gun, and Charged Particle Beam Device
#7FILAMENT ALIGNMENT DEVICE
#8Electron gun cathode mount
#9Emitter, electron gun in which same is used, electronic device in which same is used, and method for manufacturing same
#10Electron source, method for manufacturing same, and device provided with electron source
#11ELECTRON SOURCE, ELECTRON GUN, AND CHARGED PARTICLE BEAM DEVICE
#12ELECTROMAGNETIC LENS AND ELECTRON SOURCE MECHANISM
#13Cathode mechanism of electron emission source, and method for manufacturing cathode mechanism of electron emission source
#14ABERRATION CORRECTION IN CHARGED PARTICLE SYSTEM
#15Charged particle beam apparatus, scanning electron microscope, and method of operating a charged particle beam apparatus
#16Electron emitter and method of fabricating same
#17CHARGED PARTICLE SOURCE
#18Electron gun device
#19Electron beam system for inspection and review of 3D devices
#20Electron source, method for manufacturing the same, and electron beam device using the same
#21Broad-energy spectrum electron gun
#22Electron emitter and method of fabricating same
#23Method of manufacturing electron source
#24Electron source and electron gun
#25Cathode assembly for electron gun
#26Multibeam inspection apparatus
#27Inspection tool, lithographic apparatus, electron beam source and an inspection method
#28ELECTRON MICROSCOPE EQUIPPED WITH AUTOMATIC BEAM ALIGNMENT
#29Charged particle source
#30Space charge insensitive electron gun designs
#31Charged-particle source and method for cleaning a charged-particle source using back-sputtering
#32Axial electron gun
#33Accelerator system for mineral component analysis, system and method for mineral component analysis
#34Electron emitter and method of fabricating same
#35ELECTRON EMISSION TUBE, ELECTRON IRRADIATION DEVICE, AND METHOD OF MANUFACTURING ELECTRON EMISSION TUBE
#36Charged particle source
#37Gun lens design in a charged particle microscope
#38Aberration correction in charged particle system
#39Low work function electron beam filament assembly
#40Electron source architecture for a scanning electron microscopy system
#41ELECTRON BEAM PROJECTOR WITH LINEAR THERMAL CATHODE
#42Electron microscope electron gun for facilitating position adjustment and electron microscope including same
#43Additive manufacturing of three-dimensional articles
#44X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target, and rotary vacuum seal
#45Charged particle beam device, and method of manufacturing component for charged particle beam device
#46X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target, and rotary vacuum seal
#47Electron-beam spot optimization
#48Exposure apparatus
#49High voltage feedthrough assembly, time-resolved transmission electron microscope and method of electrode manipulation in a vacuum environment
#50Ultra broad band continuously tunable electron beam pulser
#51Electron gun, control method and control program thereof, and three-dimensional shaping apparatus
#52Electron beam device
#53System and method for providing a clean environment in an electron-optical system
#54Micro-electron column having an electron emitter improving the density of an electron beam emitted from a nano structure tip
#55MICRO-ELECTRON COLUMN HAVING NANO STRUCTURE TIP WITH EASILY ALIGNING
#56Charged particle source arrangement for a charged particle beam device, charged particle beam device for sample inspection, and method for providing a primary charged particle beam for sample inspection in a charged particle beam
#57Electron gun supporting member and electron gun apparatus
#58X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target, and rotary vacuum seal
#59Individually switched field emission arrays
#60Method for manufacturing electron source
#61Multi-electrode stack arrangement
#62Multi-electrode cooling arrangement
#63Multi-electrode electron optics
#64Cathode filament assembly
#65X-ray tube
#66Methods of ion source fabrication
#67Electron microscope
#68Electron gun and charged particle beam device having an aperture with flare-suppressing coating
#69Thermionic cathode with even electric field distribution on electron emitting surface
#70High-brightness, long life thermionic cathode and methods of its fabrication
#71Method of producing rapid heating of a cathode installed in a thermionic emission assembly
#72Electron gun and electron beam device
#73Enclosure and method for handling electron gun or ion gun
#74Compact high-voltage electron gun
#75Charged particle source from a photoionized cold atom beam
#76Electron beam source and method of manufacturing the same
#77Crossover point regulation method for electro-static focusing systems
#78Filament for electron source
#79Charged particle radiation device
#80ELECTRON GUN, LITHOGRAPHY APPARATUS, METHOD OF MANUFACTURING ARTICLE, AND ELECTRON BEAM APPARATUS
#81Electron beam device and electron beam application device using the same
#82System, method and apparatus for multi-beam lithography including a dispenser cathode for homogeneous electron emission
#83Carbon nanotube electron gun
#84EVAPORATION SYSTEM
#85THERMAL FIELD EMISSION CATHODE
#86Multiple device shaping uniform distribution of current density in electro-static focusing systems
#87Gas field ion source with coated tip
#88Electron emitting source and manufacturing method of electron emitting source
#89Multiple device shaping uniform distribution of current density in electro-static focusing systems
#90Tip-sharpened carbon nanotubes and electron source using thereof
#91Electron source and electron beam apparatus
#92System, method and apparatus for multi-beam lithography including a dispenser cathode for homogeneous electron emission
#93ELECTRON EMITTER HAVING NANO-STRUCTURE TIP AND ELECTRON COLUMN USING THE SAME
#94Electron source
#95IMPROVED PARTICLE BEAM GENERATOR
#96Electron beam control method, electron beam generating apparatus, apparatus using the same, and emitter
#97Electron beam source and method of manufacturing the same
#98Hot cathode and ion source including the same
#99ELECTRON SOURCE
#100Electron source
#101Thermal field emission cathode
#102Method and system for ultrafast photoelectron microscope
#103DIAMOND ELECTRON SOURCE AND METHOD FOR MANUFACTURING THE SAME
#104Electron beam heating system having carbon nanotubes
#105SCANNING ELECTRON MICROSCOPE
#106EMITTER CHAMBER, CHARGED PARTICAL APPARATUS AND METHOD FOR OPERATING SAME
#107Charged particle gun
#108Carbon nanotube electron gun
#109Ultra-bright pulsed electron beam with low longitudinal emittance
#110Charged beam gun
#111Conductive probe and method for producing the same
#112Electron beam apparatus and an aberration correction optical apparatus
#113Electron gun assembly
#114Method and system for ultrafast photoelectron microscope
#115Electron beam gun
#116System, method and apparatus for multi-beam lithography including a dispenser cathode for homogeneous electron emission
#117Electron gun
#118Electron beam source having an extraction electrode provided with a magnetic disk element
#119Charged particle beam device with cleaning unit and method of operation thereof
#120Electron gun
#121High power, long focus electron source for beam processing
#122System, method and apparatus for multi-beam lithography including a dispenser cathode for homogeneous electron emission
#123Method and system for ultrafast photoelectron microscope
#124Sample dimension measuring method and scanning electron microscope
#125Integrated sub-nanometer-scale electron beam systems
#126Multi-column charged particle optics assembly
#127Conical heat shield for electron emitting cathode
#128Low temperature, high-brightness, cathode
#129Extractor electrode for electron source