ClassID:

205214

H01J37/143 - CPC Classification

Classification description:

Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof; Details; Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement; Lenses magnetic Permanent magnetic lenses

Recent Application in this class:
#1
20250385066
2025-12-18

HIGH-VOLTAGE COLUMN WITH PERMANENT MAGNET LENS AND POSITIVE WAFER BIAS FOR OVERLAY

#2
20240242923
2024-07-18

Electron Microscope

#3
20240212969
2024-06-27

CHARGED PARTICLE OPTICAL SYSTEM AND CHARGED PARTICLE APPARATUS

#4
20240021403
2024-01-18

Adjustable Permanent Magnetic Lens Having Thermal Control Device

#5
20230360878
2023-11-09

Adjustable Permanent Magnetic Lens Having Shunting Device

#6
20230207251
2023-06-29

MULTIPLE PARTICLE BEAM SYSTEM WITH A CONTRAST CORRECTION LENS SYSTEM

#7
20220199354
2022-06-23

Counter pole with permanent magnets

#8
20220068589
2022-03-03

CHARGED PARTICLE SOURCE

#9
20200126753
2020-04-23

Charged particle source

#10
20200013579
2020-01-09

Magnetically microfocused electron emission source

#11
20190247863
2019-08-15

Apparatus and methods for selectively transmitting objects

#12
20190057833
2019-02-21

Charged particle source

#13
20170125204
2017-05-04

Charged particle source

#14
20170125203
2017-05-04

Charged particle source

#15
20170125202
2017-05-04

Charged particle source

#16
20160189914
2016-06-30

Device and method for optimizing diffusion section of electron beam

#17
20160163500
2016-06-09

Charged particle source

#18
20140326895
2014-11-06

Permanent magnet based high performance multi-axis immersion electron lens array with low axial leakage field

#19
20140252245
2014-09-11

Tubular permanent magnet used in a multi-electron beam device

#20
20120211654
2012-08-23

Scanning electron microscope

#21
20110204250
2011-08-25

Magnet for ion beam irradiation apparatus equipped with protective member that covers plurality of magnetic field concentrating members

#22
20110148297
2011-06-23

Multi-column electron beam exposure apparatus and magnetic field generation device

#23
20100090579
2010-04-15

Device for the field emission of particles and production method

#24
20100084566
2010-04-08

Electron Column Using A Magnetic Lens Layer Having Permanent Magnets

#25
20090057558
2009-03-05

SCANNING ELECTRON MICROSCOPE

#26
20080067396
2008-03-20

Electron lens and charged particle beam apparatus

#27
20070057617
2007-03-15

Electron beam source having an extraction electrode provided with a magnetic disk element

#28
20060197030
2006-09-07

Apparatus with permanent magnetic lenses

#29
20060033035
2006-02-16

Electron microscope array for inspection and lithography

#30
20050236568
2005-10-27

Apparatus with permanent magnetic lenses