Patents-Review.com
ClassID:

205245 ⎘

H01J37/261 - CPC Classification

Classification description:

Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof; Electron or ion microscopes; Electron or ion diffraction tubes Details

Sub-classes:
Recent Application in this class:
#1
20260122730
2026-04-30

CARBON NANOTUBE MICRO-HEATING CHIP AND PREPARATION METHOD THEREOF

 #2
20260031301
2026-01-29

PATTERN INSPECTION SYSTEM AND METHOD OF PATTERN INSPECTION USING THE SAME

 #3
20260024718
2026-01-22

HIGH TEMPERATURE NV CENTER SENSING UP TO 1400K

 #4
20250385071
2025-12-18

DEVICE FOR PREPARING SAMPLES FOR USE IN A CRYO-ELECTRON MICROSCOPE

 #5
20250379025
2025-12-11

Optical Probe System for the Electron Microscope

 #6
20250372340
2025-12-04

MAGNETIC SHIELDING OF THE PHOTOMULTIPLIER IN THE MAGNETIC IMMERSION FIELD

 #7
20250348670
2025-11-13

LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION

 #8
20250348669
2025-11-13

LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION

 #9
20250348668
2025-11-13

LARGE LANGUAGE MODEL ASSISTANCE FOR CHARGED-PARTICLE MICROSCOPE OPERATION

 #10
20250308832
2025-10-02

STABILIZING A TIP WIRE OF AN ELECTRON SOURCE

 #11
20250232943
2025-07-17

MULTIPLE PARTICLE BEAM SYSTEM WITH PROLONGED MAINTENANCE INTERVAL

 #12
20250210300
2025-06-26

PARTICLE-OPTICAL ARRANGEMENT, IN PARTICULAR MULTI-BEAM PARTICLE MICROSCOPE, WITH A MAGNET ARRANGEMENT FOR SEPARATING A PRIMARY AND A SECONDARY PARTICLE-OPTICAL BEAM PATH

 #13
20250207827
2025-06-26

Cooling Apparatus and Cooling Preparation Method

 #14
20250183001
2025-06-05

CALIBRATION OF AN EXAMINATION SYSTEM

 #15
20250112021
2025-04-03

CRYO-ELECTRON MICROSCOPY IMAGE PROCESSING METHOD AND APPARATUS, TERMINAL, AND STORAGE MEDIUM

 #16
20250003845
2025-01-02

VIBRATION-FREE CRYOGENIC COOLING

 #17
20240429020
2024-12-26

SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION METHOD

 #18
20240249905
2024-07-25

TECHNIQUES FOR NARROWING ZERO LOSS PEAKS IN MONOCHROMATED CHARGED PARTICLES SOURCES

 #19
20240222068
2024-07-04

CONDENSATE PRECURSORS AND CONTAMINANT PURGE APPARATUS AND METHODS

 #20
20240203685
2024-06-20

POLE PIECE INCORPORATING OPTICAL CAVITY FOR IMPROVED PHASE-CONTRAST IN ELECTRON MICROSCOPE IMAGING

 #21
20240170250
2024-05-23

Charged Particle Beam Device and Sample Analysis Method

 #22
20240153737
2024-05-09

Tilt-column multi-beam electron microscopy system and method

 #23
20240128050
2024-04-18

METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MICROSCOPE

 #24
20240128048
2024-04-18

METHOD FOR OPERATING A MULTI-BEAM PARTICLE MICROSCOPE WITH FAST CLOSED-LOOP BEAM CURRENT CONTROL, COMPUTER PROGRAM PRODUCT AND MULTI-BEAM PARTICLE MICROSCOPE

 #25
20240105417
2024-03-28

SAMPLE HOLDER OF TRANSMISSION ELECTRON MICROSCOPE AND SEMICONDUCTOR DEVICE INSPECTION METHOD USING THE SAMPLE HOLDER

 #26
20240038488
2024-02-01

CRYOGENIC ELECTRON MICROSCOPY FULLY AUTOMATED ACQUISITION FOR SINGLE PARTICLE AND TOMOGRAPHY

 #27
20240038487
2024-02-01

LIQUID CELL FOR ELECTRON MICROSCOPE AND MANUFACTURING METHOD THEREOF

 #28
20230402251
2023-12-14

GAS INJECTION SUBSYSTEM FOR USE IN AN INSPECTION SYSTEM TO INSPECT A SAMPLE BY USE OF CHARGED PARTICLES AND INSPECTION SYSTEM HAVING SUCH GAS INJECTION SUBSYSTEM

 #29
20230238213
2023-07-27

APPARATUS FOR ANALYZING AND/OR PROCESSING A SAMPLE WITH A PARTICLE BEAM AND METHOD

 #30
20230215687
2023-07-06

Methods And Systems For Tomographic Microscopy Imaging

 #31
20230187170
2023-06-15

Fabrication of in situ HR-LCTEM nanofluidic cell for nanobubble interactions during EOR processes in carbonate rocks

 #32
20230135601
2023-05-04

Phase Analyzer, Sample Analyzer, and Analysis Method

 #33
20230089136
2023-03-23

MAGNETIC FIELD GENERATION DEVICE, AND TRANSMISSION ELECTRON MICROSCOPE SAMPLE HOLDER CAPABLE OF APPLYING MAGNETIC FIELD

 #34
20230076908
2023-03-09

TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHOD THEREFOR

 #35
20230073472
2023-03-09

Method for tilting characterization by microscopy

 #36
20230072075
2023-03-09

TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHOD THEREFOR

 #37
20230043003
2023-02-09

Method of detecting measurement error of SEM equipment and method of aligning SEM equipment

 #38
20230035686
2023-02-02

Charged Particle Beam Device and Vibration-Suppressing Mechanism

 #39
20230028903
2023-01-26

Electron microscope

 #40
20220415609
2022-12-29

Scanning Electron Microscope

 #41
20220404247
2022-12-22

Vibration-free cryogenic cooling

 #42
20220359154
2022-11-10

Machine learning on wafer defect review

 #43
20220301196
2022-09-22

Image generation for examination of a semiconductor specimen

 #44
20220254596
2022-08-11

ELECTRON GUN AND ELECTRON BEAM IRRADIATION DEVICE

 #45
20220238301
2022-07-28

Electron detector

 #46
20220223371
2022-07-14

Charged particle beam system

 #47
20220181116
2022-06-09

3D mapping of samples in charged particle microscopy

 #48
20220157559
2022-05-19

Electron microscopy grid

 #49
20220122803
2022-04-21

Image contrast enhancement in sample inspection

 #50
20220115204
2022-04-14

Apparatus of charged-particle beam such as electron microscope comprising plasma generator, and method thereof

 #51
20220102110
2022-03-31

Nanofluidic cell and loading platform

 #52
20220084781
2022-03-17

Stage anti-fretting mechanism for roller bearing lifetime improvement

 #53
20220076918
2022-03-10

Ventilated semiconductor processing apparatus

 #54
20220068600
2022-03-03

Method for preparing a TEM sample

 #55
20220068596
2022-03-03

Graphene based substrates for imaging

 #56
20220065727
2022-03-03

Coolant Microleak Sensor for a Vacuum System

 #57
20220028648
2022-01-27

Stage apparatus suitable for a particle beam apparatus

 #58
20210391144
2021-12-16

Method for preparing a sample for transmission electron microscopy

 #59
20210366688
2021-11-25

Super-resolution microscopy

 #60
20210351000
2021-11-11

Imaging device capturing images of a sample including a plurality of sections

 #61
20210319970
2021-10-14

ELECTRON BEAM APPLICATION DEVICE

 #62
20210305010
2021-09-30

Methods and systems for acquiring 3D diffraction data

 #63
20210183613
2021-06-17

Beam position monitor for charged particles passing through a chamber

 #64
20210166912
2021-06-03

Grid sample production apparatus for electron microscope

 #65
20210151289
2021-05-20

Method, device and system for remote deep learning for microscopic image reconstruction and segmentation

 #66
20210151286
2021-05-20

Transmission electron microscope and method of controlling same

 #67
20210110993
2021-04-15

Cooling apparatus for charged particle beam device

 #68
20210104376
2021-04-08

DEVICE FOR PROVIDING ELECTRONS AND METHOD FOR MAKING THE SAME

 #69
20210043418
2021-02-11

Image generation method, non-transitory computer-readable medium, and system

 #70
20210027984
2021-01-28

Machine learning on wafer defect review

 #71
20210005420
2021-01-07

Methods and systems for acquiring electron backscatter diffraction patterns

 #72
20200343013
2020-10-29

Broad band tunable energy electron beam pulser

 #73
20200303162
2020-09-24

System and method for preparing cryo-em grids

 #74
20200273659
2020-08-27

Sample holder for a charged particle microscope

 #75
20200273657
2020-08-27

Interferometric electron microscope

 #76
20200251305
2020-08-06

CHARGED PARTICLE BEAM APPARATUS

 #77
20200234915
2020-07-23

Image contrast enhancement in sample inspection

 #78
20200185189
2020-06-11

Charged-particle beam apparatus

 #79
20200184372
2020-06-11

Loosely-coupled inspection and metrology system for high-volume production process monitoring

 #80
20200176219
2020-06-04

Systems and methods for charged particle beam modulation

 #81
20200161080
2020-05-21

ELECTRON MICROSCOPE SPECIMEN MOUNT

 #82
20200152420
2020-05-14

Confocal imaging technique in a charged particle microscope

 #83
20200132574
2020-04-30

TEM electromechanical in-situ testing method of one-dimensional materials

 #84
20200105500
2020-04-02

Machine learning on wafer defect review

 #85
20200083019
2020-03-12

Contour extraction method, contour extraction device, and non-volatile recording medium

 #86
20200035448
2020-01-30

Vacuum condition controlling apparatus, system and method for specimen observation

 #87
20200011999
2020-01-09

Superconducting element, particle detection device, and particle detection method

 #88
20190362935
2019-11-28

Reflection-mode electron-beam inspection using ptychographic imaging

 #89
20190362933
2019-11-28

Electron microscope device and inclined hole measurement method using same

 #90
20190355550
2019-11-21

Volume scanning electron microscopy of serial thick tissue sections with gas cluster milling

 #91
20190353538
2019-11-21

Stress measurement method, stress measurement device, and stress measurement system

 #92
20190348257
2019-11-14

Cathodoluminescence optical hub

 #93
20190348256
2019-11-14

Charge reduction by digital image correlation

 #94
20190311882
2019-10-10

Studying dynamic specimens in a transmission charged particle microscope

 #95
20190295812
2019-09-26

Microscope

 #96
20190287761
2019-09-19

Method, device and system for remote deep learning for microscopic image reconstruction and segmentation

 #97
20190287755
2019-09-19

Ion milling apparatus and sample holder

 #98
20190279839
2019-09-12

Vacuum connection mechanism and electron optical device

 #99
20190272972
2019-09-05

Sample chip for electron microscope and its related application

 #100
20190228949
2019-07-25

Innovative imaging technique in transmission charged particle microscopy

 #101
20190228946
2019-07-25

Aberration correcting device for an electron microscope and an electron microscope comprising such a device

 #102
20190228945
2019-07-25

Aberration corrector and electron microscope

 #103
20190214225
2019-07-11

Load lock system for charged particle beam imaging

 #104
20190198288
2019-06-27

Combined SEM-CL and FIB-IOE microscopy

 #105
20190180974
2019-06-13

Preparation of cryogenic sample, e.g. for charged particle microscopy

 #106
20190172681
2019-06-06

X-ray spectroscopy in a charged-particle microscope

 #107
20190164721
2019-05-30

Systems and methods for charged particle beam modulation

 #108
20190139734
2019-05-09

Electron microscope and method of controlling same

 #109
20190115187
2019-04-18

Electron microscope and specimen tilt angle adjustment method

 #110
20190103246
2019-04-04

Stage device and charged particle beam device

 #111
20190080881
2019-03-14

Examination container and electron microscope

 #112
20190066969
2019-02-28

Charged particle beam apparatus

 #113
20190035599
2019-01-31

System and method for performing nano beam diffraction analysis

 #114
20190017948
2019-01-17

Substitution site measuring equipment and substitution site measuring method

 #115
20180294138
2018-10-11

Method for optimizing fluid flow across a sample within an electron microscope sample holder

 #116
20180286627
2018-10-04

Charged particle beam apparatus

 #117
20180277335
2018-09-27

Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling device

 #118
20180240645
2018-08-23

Load lock system for charged particle beam imaging

 #119
20180240640
2018-08-23

Electron source architecture for a scanning electron microscopy system

 #120
20180218875
2018-08-02

Innovative source assembly for ion beam production

 #121
20180211814
2018-07-26

Method and device for manipulating particle beam

 #122
20180209881
2018-07-26

Lossless cryo-grid preparation stage for high-resolution electron microscopy

 #123
20180190470
2018-07-05

System and method for performing nano beam diffraction analysis

 #124
20180114671
2018-04-26

Cryogenic specimen processing in a charged particle microscope

 #125
20180108510
2018-04-19

Stable support films for electron microscopy

 #126
20180068827
2018-03-08

Method for monitoring environmental states of a microscope sample with an electron microscope sample holder

 #127
20180061613
2018-03-01

CHARGED-PARTICLE MICROSCOPE WITH EXCHANGEABLE POLE PIECE EXTENDING ELEMENT

 #128
20180061612
2018-03-01

Probe landing detection

 #129
20180012726
2018-01-11

Ion beam system

 #130
20180010988
2018-01-11

Packaging unit for liquid sample loading devices applied in electron microscope and packaging method

 #131
20180005798
2018-01-04

System and method for performing nano beam diffraction analysis

 #132
20180005363
2018-01-04

Pattern matching device and computer program for pattern matching

 #133
20170350798
2017-12-07

Apparatus and method for producing specimens for electron microscopy

 #134
20170323762
2017-11-09

CHARGED PARTICLE BEAM APPARATUS, ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD

 #135
20170309444
2017-10-26

Detection module, inspection system and a method for obtaining multiple sensing results

 #136
20170309441
2017-10-26

System for orienting a sample using a diffraction pattern

 #137
20170278669
2017-09-28

Three-dimensional image reconstruction method, image processor, and transmission electron microscope, using image obtained by tilted electron beam conditions

 #138
20170269011
2017-09-21

Method for measuring the mass thickness of a target sample for electron microscopy

 #139
20170250054
2017-08-31

Charged particle beam apparatus and vibration damper for charged particle beam apparatus

 #140
20170229276
2017-08-10

High voltage feedthrough assembly, time-resolved transmission electron microscope and method of electrode manipulation in a vacuum environment

 #141
20170213695
2017-07-27

Charged particle beam device, simulation method, and simulation device

 #142
20170098526
2017-04-06

Method for optimizing fluid flow across a sample within an electron microscope sample holder

 #143
20170062177
2017-03-02

MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples

 #144
20170061947
2017-03-02

Charged particle radiation apparatus

 #145
20170059465
2017-03-02

Method and apparatus for chemical mapping by selective dissolution

 #146
20170047192
2017-02-16

Charged particle beam device and method for inspecting and/or imaging a sample

 #147
20170025250
2017-01-26

Preparation of specimen arrays on an EM grid

 #148
20170018402
2017-01-19

Method of reducing coma and chromatic aberration in a charged particle beam device, and charged particle beam device

 #149
20160372302
2016-12-22

Workpiece transport and positioning apparatus

 #150
20160351374
2016-12-01

Thin-ice grid assembly for cryo-electron microscopy

 #151
20160343536
2016-11-24

Method and device for manipulating particle beam

 #152
20160268929
2016-09-15

Micro stage for particle beam column using piezo elements as actuator

 #153
20160258869
2016-09-08

WATER SOLUBLE PH RESPONSIVE FLUORESCENT NANOPARTICLES

 #154
20160240345
2016-08-18

Charged particle source arrangement for a charged particle beam device, charged particle beam device for sample inspection, and method for providing a primary charged particle beam for sample inspection in a charged particle beam

 #155
20160225582
2016-08-04

Method and system for imaging of a photomask through a pellicle

 #156
20160225581
2016-08-04

Electron microscope

 #157
20160225579
2016-08-04

Particle beam microscope and method for operating a particle beam microscope

 #158
20160211113
2016-07-21

Differential imaging with pattern recognition for process automation of cross sectioning applications

 #159
20160196952
2016-07-07

Electron microscope

 #160
20160172153
2016-06-16

Microscopy support structures

 #161
20160155605
2016-06-02

Method and system for adaptively scanning a sample during electron beam inspection

 #162
20160133436
2016-05-12

Contactless temperature measurement in a charged particle microscope

 #163
20160126058
2016-05-05

Charged particle-beam device and specimen observation method

 #164
20160104596
2016-04-14

Aligning a featureless thin film in a TEM

 #165
20160099139
2016-04-07

MASS MICROSCOPE APPARATUS

 #166
20160084742
2016-03-24

Sample stack structure and method for preparing the same

 #167
20160071689
2016-03-10

Method of performing spectroscopy in a transmission charged-particle microscope

 #168
20160069929
2016-03-10

Calibration standard with pre-determined features

 #169
20160035540
2016-02-04

Total release method for sample extraction in an energetic-beam instrument

 #170
20160035536
2016-02-04

Particle beam detector

 #171
20160035535
2016-02-04

Sample holder, charged particle beam apparatus, and observation method

 #172
20160027609
2016-01-28

Hybrid electron microscope

 #173
20160020069
2016-01-21

TEM sample preparation

 #174
20160020062
2016-01-21

Charged-particle lens that transmits emissions from sample

 #175
20150380209
2015-12-31

Dimension measurement apparatus calibration standard and method for forming the same

 #176
20150371820
2015-12-24

Charged particle beam apparatus

 #177
20150369760
2015-12-24

Method of electron beam diffraction analysis

 #178
20150364295
2015-12-17

Identification of Trace Constituent Phases in Nuclear Power Plant Deposits Using Electron Backscatter Diffraction (EBSD)

 #179
20150348749
2015-12-03

Multi-beam particle microscope and method for operating same

 #180
20150332891
2015-11-19

User interface for an electron microscope

 #181
20150294834
2015-10-15

High capacity TEM grid

 #182
20150287568
2015-10-08

Focusing a charged particle system

 #183
20150279615
2015-10-01

Imaging a Sample with Multiple Beams and Multiple Detectors

 #184
20150279613
2015-10-01

Positioning control device

 #185
20150255246
2015-09-10

Sample micromotion mechanism, method of using the same, and charged particle device

 #186
20150243473
2015-08-27

Workpiece transport and positioning apparatus

 #187
20150235805
2015-08-20

Device for monitoring environmental states of a microscope sample with an electron microscope sample holder

 #188
20150235803
2015-08-20

Charged particle beam device and sample observation method

 #189
20150235802
2015-08-20

Holder device for electron microscope

 #190
20150228451
2015-08-13

Charged particle beam apparatus having improved needle movement control

 #191
20150228448
2015-08-13

Observation apparatus and optical axis adjustment method

 #192
20150228443
2015-08-13

Charged particle beam apparatus

 #193
20150221471
2015-08-06

Charged particle beam apparatus and image forming method

 #194
20150221470
2015-08-06

Charged particle beam apparatus and sample observation method

 #195
20150221469
2015-08-06

Top opening-closing mechanism and inspection apparatus

 #196
20150221468
2015-08-06

Scanning electron microscope

 #197
20150214003
2015-07-30

Sample holder and method for observing electron microscopic image

 #198
20150214001
2015-07-30

Correlative optical and charged particle microscope

 #199
20150206706
2015-07-23

Charged particle beam apparatus and sample observation method

 #200
20150206702
2015-07-23

Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatus

 #201
20150194288
2015-07-09

Specimen preparation for transmission electron microscopy

 #202
20150179400
2015-06-25

Defect discovery and inspection sensitivity optimization using automated classification of corresponding electron beam images

 #203
20150179397
2015-06-25

Microscopy support structures

 #204
20150179396
2015-06-25

Electron microscope and electron microscope sample retaining device

 #205
20150170875
2015-06-18

Charged particle beam apparatus

 #206
20150170874
2015-06-18

Specimen sample holder for workpiece transport apparatus

 #207
20150170873
2015-06-18

Specimen holder tip part, specimen holder having said specimen holder tip part, gonio stage, and electron microscope having said gonio stage

 #208
20150166273
2015-06-18

Workpiece holder for workpiece transport apparatus

 #209
20150155133
2015-06-04

Charged particle beam apparatus

 #210
20150155132
2015-06-04

Mass spectrometer and mass image analyzing system

 #211
20150144804
2015-05-28

Charged particle beam apparatus

 #212
20150144789
2015-05-28

Vacuum chamber with a thick aluminum base plate

 #213
20150144788
2015-05-28

Charged particle beam apparatus

 #214
20150137000
2015-05-21

Charged particle beam instrument and sample container

 #215
20150136977
2015-05-21

Differential imaging with pattern recognition for process automation of cross sectioning applications

 #216
20150129778
2015-05-14

Specimen holder used for mounting samples in electron microscopes

 #217
20150129763
2015-05-14

Charged particle beam device

 #218
20150114294
2015-04-30

Processing System

 #219
20150102220
2015-04-16

Method and system for inspecting an EUV mask

 #220
20150090899
2015-04-02

Preparation of specimen arrays on an EM grid

 #221
20150090879
2015-04-02

Charged particle multi-beam inspection system and method of operating the same

 #222
20150090877
2015-04-02

Enhanced defect detection in electron beam inspection and review

 #223
20150083912
2015-03-26

Charged particle beam apparatus

 #224
20150083908
2015-03-26

Inspection or observation apparatus and sample inspection or observation method

 #225
20150076364
2015-03-19

Adjustable cathodoluminescence detection system and microscope employing such a system

 #226
20150076346
2015-03-19

System and process for measuring strain in materials at high spatial resolution

 #227
20150069232
2015-03-12

Hot spot identification, inspection, and review

 #228
20150053856
2015-02-26

Protein layers and their use in electron microscopy

 #229
20150053548
2015-02-26

TEM sample preparation

 #230
20150041647
2015-02-12

Method of using an environmental transmission electron microscope

 #231
20150041644
2015-02-12

Electronic microscope, setting method of observation condition of electronic microscope, and observation method using electronic microscope

 #232
20150022807
2015-01-22

UNIVERSAL SAMPLE HOLDER

 #233
20150009489
2015-01-08

Charged-particle microscope with Raman spectroscopy capability

 #234
20150001393
2015-01-01

Charged particle beam device and inclined observation image display method

 #235
20140361194
2014-12-11

Sample holder for electron microscopy for low-current, low-noise analysis

 #236
20140360286
2014-12-11

Apparatus and method for producing specimens for electron microscopy

 #237
20140346353
2014-11-27

Charged particle vortex wave generation

 #238
20140319341
2014-10-30

Charged particle microscope apparatus and image acquisition method of charged particle microscope apparatus utilizing image correction based on estimated diffusion of charged particles

 #239
20140319339
2014-10-30

Nanopore fabrication and applications thereof

 #240
20140312226
2014-10-23

Charged-particle microscope providing depth-resolved imagery

 #241
20140306108
2014-10-16

Method of collecting and processing electron diffraction data

 #242
20140291514
2014-10-02

System for inspecting flat panel display using scanning electron microscope

 #243
20140291510
2014-10-02

Charged particle beam apparatus

 #244
20140284477
2014-09-25

Charged-particle radiation apparatus

 #245
20140264018
2014-09-18

Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen

 #246
20140264017
2014-09-18

Transmission electron microscope, and method of observing specimen

 #247
20140252228
2014-09-11

Device and method for creating Gaussian aberration-corrected electron beams

 #248
20140246583
2014-09-04

Inspection or observation apparatus and sample inspection or observation method

 #249
20140224986
2014-08-14

Pattern measurement device and pattern measurement method

 #250
20140224985
2014-08-14

Focusing a charged particle imaging system

 #251
20140217283
2014-08-07

TEM sample preparation

 #252
20140191126
2014-07-10

Method of depositing protective structures

 #253
20140175277
2014-06-26

SECONDARY ELECTRON OPTICS AND DETECTION DEVICE

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20140151554
2014-06-05

System and method for controlling charge-up in an electron beam apparatus

 #255
20140131563
2014-05-15

Method for detecting electron beam of scanning electron microscope and for detecting fine patterns

 #256
20140117235
2014-05-01

Standard wafer and its fabrication method

 #257
20140054458
2014-02-27

Scanning transmission electron microscopy for imaging extended areas

 #258
20140042317
2014-02-13

Parallel radial mirror analyser with an angled zero-volt equipotential exit grid for scanning electron microscopes

 #259
20140007709
2014-01-09

Specimen preparation for transmission electron microscopy

 #260
20130320209
2013-12-05

ION BEAM PROCESSING APPARATUS

 #261
20130319328
2013-12-05

APPARATUS FOR PREPARING, IN PARTICULAR COATING, SAMPLES

 #262
20130313432
2013-11-28

Interference electron microscope

 #263
20130313430
2013-11-28

Charged particle beam device

 #264
20130299699
2013-11-14

Standard member for calibration and method of manufacturing the same and scanning electron microscope using the same

 #265
20130284922
2013-10-31

Charged-Particle Beam Apparatus Having Micro Scale Management Function

 #266
20130277554
2013-10-24

Charged particle beam apparatus

 #267
20130277553
2013-10-24

Method and apparatus for observing defects

 #268
20130248710
2013-09-26

Cross-section processing and observation apparatus

 #269
20130248707
2013-09-26

Sample observation method, sample preparation method, and charged particle beam apparatus

 #270
20130245989
2013-09-19

Signal processing method and signal processing apparatus

 #271
20130241091
2013-09-19

Sample preparation apparatus and sample preparation method

 #272
20130228686
2013-09-05

Charged particle beam apparatus having noise absorbing arrangements

 #273
20130228684
2013-09-05

Detector and inspecting apparatus

 #274
20130221218
2013-08-29

ELECTRON MICROSCOPE SYSTEM USING AUGMENTED REALITY

 #275
20130175446
2013-07-11

Method for preparing lamella

 #276
20130174301
2013-07-04

Method and apparatus for in situ preparation of serial planar surfaces for microscopy

 #277
20130161511
2013-06-27

Sample observing device and sample observing method

 #278
20130146766
2013-06-13

Electron beam apparatus for visualizing a displacement of an electric field

 #279
20130146765
2013-06-13

Charged particle beam device and sample observation method using a rotating detector

 #280
20130146764
2013-06-13

Incoherent transmission electron microscopy

 #281
20130126732
2013-05-23

Charged particle beam device

 #282
20130126731
2013-05-23

Charged Particle Microscope and Ion Microscope

 #283
20130126729
2013-05-23

Scanning transmission electron microscopy

 #284
20130119252
2013-05-16

Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same

 #285
20130112871
2013-05-09

Inspection method and device

 #286
20130099117
2013-04-25

Scanning transmission type electron microscope

 #287
20130099114
2013-04-25

Silicon drift diode detector configured to switch between pulse height measurement mode and current measurement mode

 #288
20130087703
2013-04-11

ELECTRON MICROSCOPE

 #289
20130075606
2013-03-28

Composite charged particle beam apparatus

 #290
20130068966
2013-03-21

Adjustable cathodoluminescence detection system and microscope employing such a system

 #291
20120187291
2012-07-26

Method of Depositing Protective Structures

 #292
20110233403
2011-09-29

Incoherent transmission electron microscopy

 #293
20110207232
2011-08-25

WATER SOLUBLE PH RESPONSIVE FLUORESCENT NANOPARTICLES

 #294
20110133083
2011-06-09

Compact scanning electron microscope

 #295
20110079710
2011-04-07

Microscopy support structures

 #296
20110057100
2011-03-10

Transmission electron microscope, and method of observing specimen

 #297
20110024623
2011-02-03

Detector and inspecting apparatus

 #298
20100276607
2010-11-04

Method of depositing protective structures

 #299
20100230590
2010-09-16

Compact Scanning Electron Microscope

 #300
20100224792
2010-09-09

Method for characterizing vibrational performance of charged particle beam microscope system and application thereof