ClassID:

205315

H01J37/3233 - CPC Classification

Classification description:

Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof; Gas-filled discharge tubes; Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources; Discharge generated by other radiation using charged particles

Recent Application in this class:
#1
20260018388
2026-01-15

PLASMA TREATMENT DEVICE

#2
20230343557
2023-10-26

VIRTUAL SHUTTER IN ION BEAM SYSTEM

#3
20230290617
2023-09-14

Plasma treatment device

#4
20220328322
2022-10-13

Plasma-based process for production of F and HF from benign precursors and use of the same in room-temperature plasma processing

#5
20220301820
2022-09-22

Charged particle emission device, system, method, and program

#6
20220301819
2022-09-22

Charged particle emission device, system, method, and program

#7
20220301809
2022-09-22

Method of manufacturing semiconductor device and ion beam irradiation apparatus

#8
20210082687
2021-03-18

Plasma-based process for production of F and HF from benign precursors and use of the same in room-temperature plasma processing

#9
20200365369
2020-11-19

Apparatuses and methods for plasma processing

#10
20200365368
2020-11-19

Charged particle beam apparatus

#11
20200303165
2020-09-24

Charged particle beam treatment apparatus

#12
20200152420
2020-05-14

Confocal imaging technique in a charged particle microscope

#13
20200035454
2020-01-30

Ion-ion plasma atomic layer etch process

#14
20190378691
2019-12-12

Plasma-based process for production of F and HF from benign precursors and use of the same in room-temperature plasma processing

#15
20190279846
2019-09-12

Plasma processing system, electron beam generator, and method of fabricating semiconductor device

#16
20190228970
2019-07-25

DIAMOND LIKE CARBON LAYER FORMED BY AN ELECTRON BEAM PLASMA PROCESS

#17
20190172681
2019-06-06

X-ray spectroscopy in a charged-particle microscope

#18
20190148155
2019-05-16

Substrate processing method and substrate processing apparatus

#19
20190122851
2019-04-25

Ion source for enhanced ionization

#20
20190088450
2019-03-21

Beam intensity converting film, and method of manufacturing beam intensity converting film

#21
20190080891
2019-03-14

COATER

#22
20180286637
2018-10-04

Ion implanter and ion implantation method

#23
20180274089
2018-09-27

Deposition or treatment of diamond-like carbon in a plasma reactor

#24
20180269041
2018-09-20

Self-sustained non-ambipolar direct current (DC) plasma at low power

#25
20180261429
2018-09-13

ION-ION PLASMA ATOMIC LAYER ETCH PROCESS AND REACTOR

#26
20180223410
2018-08-09

Plasma spray coating for sealing a defect area in a workpiece

#27
20180068854
2018-03-08

Substrate bonding apparatus and substrate bonding method

#28
20180053631
2018-02-22

Low Electron Temperature Etch Chamber with Independent Control Over Plasma Density, Radical Composition Ion Energy for Atomic Precision Etching

#29
20170372899
2017-12-28

Diamond like carbon layer formed by an electron beam plasma process

#30
20170365448
2017-12-21

Coil filament for plasma enhanced chemical vapor deposition source

#31
20170338080
2017-11-23

APPARATUS AND METHOD FOR PROGRAMMABLE SPATIALLY SELECTIVE NANOSCALE SURFACE FUNCTIONALIZATION

#32
20170338079
2017-11-23

Apparatus and method for programmable spatially selective nanoscale surface functionalization

#33
20170333894
2017-11-23

Stand alone microfluidic analytical chip device

#34
20170247789
2017-08-31

Virtual cathode deposition (VCD) for thin film manufacturing

#35
20170236692
2017-08-17

Coaxial Hollow Cathode Plasma Assisted Directed Vapor Deposition and Related Method Thereof

#36
20170047225
2017-02-16

Substrate bonding apparatus and substrate bonding method

#37
20160299103
2016-10-13

APPLICATION OF ELECTRON-BEAM INDUCED PLASMA PROBES TO INSPECTION, TEST, DEBUG AND SURFACE MODIFICATIONS

#38
20160276134
2016-09-22

Ion-ion plasma atomic layer etch process and reactor

#39
20160163517
2016-06-09

Filament holder for hot cathode PECVD source

#40
20160042961
2016-02-11

ELECTRON BEAM PLASMA SOURCE WITH ROTATING CATHODE, BACKSIDE HELIUM COOLING AND LIQUID COOLED PEDESTAL FOR UNIFORM PLASMA GENERATION

#41
20150318151
2015-11-05

Plasma source

#42
20150294885
2015-10-15

Gas injection system with precursor for planar deprocessing of semiconductor devices using a focused ion beam

#43
20150181685
2015-06-25

Thermal plasma treatment method

#44
20150170698
2015-06-18

CARBON FILM FORMING APPARATUS, CARBON FILM FORMING METHOD, AND MAGNETIC RECORDING MEDIUM MANFACTURING METHOD

#45
20150093862
2015-04-02

Interface treatment of semiconductor surfaces with high density low energy plasma

#46
20150041432
2015-02-12

Self-sustained non-ambipolar direct current (DC) plasma at low power

#47
20140370708
2014-12-18

Photoresist treatment method by low bombardment plasma

#48
20140339980
2014-11-20

Electron beam plasma source with remote radical source

#49
20140338835
2014-11-20

Electron beam plasma source with reduced metal contamination

#50
20140265855
2014-09-18

Electron beam plasma source with segmented suppression electrode for uniform plasma generation

#51
20140102370
2014-04-17

Machine for implanting ions in plasma immersion mode for a low-pressure method

#52
20140035458
2014-02-06

Plasma reactor with electron beam plasma source having a uniform magnetic field

#53
20130098883
2013-04-25

Electron beam plasma source with profiled magnet shield for uniform plasma generation

#54
20130098882
2013-04-25

Electron beam plasma source with segmented beam dump for uniform plasma generation

#55
20130098872
2013-04-25

SWITCHED ELECTRON BEAM PLASMA SOURCE ARRAY FOR UNIFORM PLASMA PRODUCTION

#56
20130098555
2013-04-25

ELECTRON BEAM PLASMA SOURCE WITH PROFILED CONDUCTIVE FINS FOR UNIFORM PLASMA GENERATION

#57
20130098553
2013-04-25

ELECTRON BEAM PLASMA SOURCE WITH PROFILED CHAMBER WALL FOR UNIFORM PLASMA GENERATION

#58
20130098552
2013-04-25

E-BEAM PLASMA SOURCE WITH PROFILED E-BEAM EXTRACTION GRID FOR UNIFORM PLASMA GENERATION

#59
20130098551
2013-04-25

Electron beam plasma source with arrayed plasma sources for uniform plasma generation

#60
20120135157
2012-05-31

Coating and ion beam mixing apparatus and method to enhance the corrosion resistance of the materials at the elevated temperature using the same

#61
20110318498
2011-12-29

Coaxial hollow cathode plasma assisted directed vapor deposition and related method thereof

#62
20110308461
2011-12-22

Electron Beam Enhanced Nitriding System (EBENS)

#63
20110174606
2011-07-21

Apparatus and method for improving photoresist properties using a quasi-neutral beam

#64
20100032288
2010-02-11

COATING AND ION BEAM MIXING APPARATUS AND METHOD TO ENHANCE THE CORROSION RESISTANCE OF THE MATERIALS AT THE ELEVATED TEMPERATURE USING THE SAME

#65
20090288603
2009-11-26

PLASMA AND ELECTRON BEAM ETCHING DEVICE AND METHOD

#66
20090255803
2009-10-15

PLASMA GENERATING APPARATUS, DEPOSITION APPARATUS, AND DEPOSITION METHOD

#67
20090114154
2009-05-07

PLASMA TREATMENT APPARATUS

#68
20090090619
2009-04-09

Thin-film deposition system

#69
20090065026
2009-03-12

Methods for treating surfaces, and methods for removing one or more materials from surfaces

#70
20090032143
2009-02-05

ELECTRON BEAM ENHANCED NITRIDING SYSTEM

#71
20080305277
2008-12-11

METHOD AND APPARATUS FOR MAKING DIAMOND-LIKE CARBON FILMS

#72
20080268170
2008-10-30

Method and apparatus for making diamond-like carbon films

#73
20080245478
2008-10-09

Surface treatment apparatus

#74
20080156771
2008-07-03

ETCHING APPARATUS USING NEUTRAL BEAM AND METHOD THEREOF

#75
20080135518
2008-06-12

Method and system for uniformity control in ballistic electron beam enhanced plasma processing system

#76
20080111490
2008-05-15

System and method for generating ions and radicals

#77
20080087539
2008-04-17

Apparatus and Method for Materials Processing with Ion-Ion Plasma

#78
20080078957
2008-04-03

Methods for beam current modulation by ion source parameter modulation

#79
20080060759
2008-03-13

Electron beam enhanced surface wave plasma source

#80
20080038933
2008-02-14

Plasma and electron beam etching device and method

#81
20080029483
2008-02-07

Method of treating a mask layer prior to performing an etching process

#82
20080023440
2008-01-31

Method and system for controlling the uniformity of a ballistic electron beam by RF modulation

#83
20070272663
2007-11-29

Microwave plasma generator

#84
20070243713
2007-10-18

Apparatus and method for generating activated hydrogen for plasma stripping

#85
20070158178
2007-07-12

Method and apparatus for deposition of low-k dielectric materials

#86
20070151842
2007-07-05

APPARATUS FOR REACTIVE SPUTTERING

#87
20070026160
2007-02-01

Apparatus and method utilizing high power density electron beam for generating pulsed stream of ablation plasma

#88
20070017804
2007-01-25

Device for improving plasma activity PVD-reactors

#89
20060225998
2006-10-12

Direct ion beam deposition method and system

#90
20060208649
2006-09-21

Method and system for discretely controllable plasma processing

#91
20060030134
2006-02-09

Ion sources and ion implanters and methods including the same

#92
20060021968
2006-02-02

Time continuous ion-ion plasma

#93
20050281958
2005-12-22

Electron beam enhanced nitriding system (EBENS)

#94
20050067099
2005-03-31

Method and apparatus for producing an ion-ion plasma continuous in time

#95
20050034667
2005-02-17

Method for forming silicon-containing insulation film having low dielectric constant treated with electron beam radiation

#96
20050006226
2005-01-13

System and method for performing sputter etching using independent ion and electron sources and a substrate biased with an a-symmetric bi-polar DC pulse signal

#97
15198723
2017-06-27

Ion source for enhanced ionization