205368 ⎘
Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof; Gas-filled discharge tubes; Constructional details of the reactor; Further details of plasma apparatus not provided for in groups - ; special provisions for cleaning or maintenance of the apparatus Pressure
Sub-classes:METHOD OF MANUFACTURING PACKAGING SUBSTRATE
#2PRESSURE CONTROL SYSTEM FOR A BEVEL EDGE ETCH CHAMBER IMPLEMENTING SUBSTRATE FRONTSIDE AND BACKSIDE PRESSURE CONTROL
#3Plasma Processing Apparatus and Plasma Processing Method
#4PLASMA PROCESSING SYSTEM
#5System and Method for Enhanced Atomic Layer Etching Process for High Aspect Ratio Structures
#6IMPROVING CHEMISTRY UTILIZATION BY INCREASING PRESSURE DURING SUBSTRATE PROCESSING
#7Simplified Gas Delivery System for Atomic Layer Etching
#8PLASMA PROCESSING DEVICE AND A METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
#9APPARATUS TO DETECT AND QUANTIFY RADICAL CONCENTRATION IN SEMICONDUCTOR PROCESSING SYSTEMS
#10INTEGRATION OF DRY DEVELOPMENT AND ETCH PROCESSES FOR EUV PATTERNING IN A SINGLE PROCESS CHAMBER
#11SUBSTRATE PROCESSING APPARATUS AND CONTROL METHOD OF SUBSTRATE PROCESSING APPARATUS
#12IN SITU DECLOGGING IN PLASMA ETCHING
#13DUAL PRESSURE OXIDATION METHOD FOR FORMING AN OXIDE LAYER IN A FEATURE
#14GAS FLOW ACCELERATOR TO PREVENT BUILDUP OF PROCESSING BYPRODUCT IN A MAIN PUMPING LINE OF A SEMICONDUCTOR PROCESSING TOOL
#15PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
#16PLASMA PROCESSING DEVICE
#17Vacuum arrangement and method
#18HYDROGEN REDUCTION IN AMORPHOUS CARBON FILMS
#19HIGH-PERFORMANCE ADAPTABLE SAMPLING SYSTEM
#20REMOTE PLASMA ULTRAVIOLET ENHANCED DEPOSITION
#21SEMICONDUCTOR CHAMBER COMPONENTS WITH ADVANCED COATING TECHNIQUES
#22LARGE-AREA/WAFER-SCALE CMOS-COMPATIBLE 2D-MATERIAL INTERCALATION DOPING TOOLS, PROCESSES, AND METHODS, INCLUDING INTERCALATION DOPING OF SYNTHESIZED AND PATTERNED GRAPHENE
#23SUBSTRATE PROCESSING METHOD
#24INTEGRATION OF DRY DEVELOPMENT AND ETCH PROCESSES FOR EUV PATTERNING IN A SINGLE PROCESS CHAMBER
#25PLASMA PRECLEAN SYSTEM FOR CLUSTER TOOL
#26METHOD AND DEVICE FOR THIN FILM PROCESS INCLUDING ACTIVATED PROTON ASSIST PLASMA ETCHING
#27SUPERCONDUCTING DEVICE WITH MULTIPLE WIRING
#28METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING METHOD, NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM AND SUBSTRATE PROCESSING APPARATUS
#29SUBSTRATE SUPPORT DEVICE AND METHOD OF PREVENTING OCCURRENCE OF ARCING
#30ATOMIC LAYER ETCHING OF SILICON OXIDE AT CRYOGENIC TEMPERATURE
#31METHODS OF TREATING A SEMICONDUCTOR SUBSTRATE AND APPARATUS
#32PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS
#33PROCESS GAS PROVIDING APPARATUS AND SUBSTRATE TREATING APPARATUS INCLUDING THE SAME
#34PLASMA CHAMBER FOR WAFER ETCHING AND WAFER ETCHING METHOD USING PLASMA CHAMBER
#35APPARATUS AND METHOD OF DAMAGE MITIGATION AND STEP COVERAGE ENHANCEMENT
#36SEMICONDUCTOR MANUFACTURING APPARATUS AND METHOD OF CONTROLLING PHYSICAL QUANTITY OF SEMICONDUCTOR MANUFACTURING APPARATUS
#37MODEL-DRIVEN PRESSURE ESTIMATION
#38IN-SITU BACK SIDE PLASMA TREATMENT FOR RESIDUE REMOVAL FROM SUBSTRATES
#39METHODS FOR FORMING EUV RESIST UNDERLAYER
#40APPARATUS FOR TESTING RING ASSEMBLY OF SUBSTRATE PROCESSING APPARATUS
#41SELECTIVE DEPOSITION OF MATERIAL COMPRISING SILICON AND OXYGEN USING PLASMA
#42SUBSTRATE PROCESSING APPARATUS AND ELECTROSTATIC CHUCK
#43ONE CHAMBER MULTI-STATION SELECTIVE METAL REMOVAL
#44METHOD FOR PLASMA ETCHING A LAYER BASED ON A III-N MATERIAL
#45PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS
#46HIGH PRESSURE PLASMA INHIBITION
#47SELF-ASSEMBLED MONOLAYER DEPOSITION FROM LOW VAPOR PRESSURE ORGANIC MOLECULES
#48SUBSTRATE PROCESSING SYSTEM AND TRANSFER METHOD
#49CONTINUOUS PROCESSING MECHANISM FOR DUAL EFFECT PLASMA ETCHING
#50DIRECTIONAL SELECTIVE FILL OF SILICON OXIDE MATERIALS
#51APPARATUS FOR IMPROVED INJECTION FOR A PLASMA REACTOR
#52INCREASED ETCH RATES OF SILICON-CONTAINING MATERIALS
#53SELECTIVE SELF-ASSEMBLED MONOLAYER (SAM) REMOVAL
#54MODIFICATION OF METAL-CONTAINING SURFACES IN HIGH ASPECT RATIO PLASMA ETCHING
#55METHODS OF SELECTIVELY ETCHING SILICON NITRIDE
#56SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#57IN-SITU ETCH AND INHIBITION IN PLASMA ENHANCED ATOMIC LAYER DEPOSITION
#58MICRO-CAPILLARY HIGH VOLTAGE ISOLATOR FOR GAS DELIVERY TO VACUUM
#59PARALLEL PLASMA TREATMENT AND THERMOCOMPRESSION BONDING AND APPARATUS FOR EFFECTING THE SAME
#60FLUXLESS DIE BONDING USING IN-SITU PLASMA TREATMENT AND APPARATUS FOR EFFECTING THE SAME
#61HALOGEN-FREE ETCHING OF SILICON NITRIDE
#62MULTI-CHAMBER PROCESSING TOOL WITH ENHANCED THROUGHPUT
#63WAFER PROCESSING APPARATUS AND WAFER PROCESSING METHOD
#64Topographic selective deposition
#65METHOD FOR MANUFACTURING CAPACITOR STRUCTURE
#66Electrostatic Chuck Sidewall Gas Curtain
#67REMOTE PLASMA DEPOSITION WITH ELECTROSTATIC CLAMPING
#68METHODS AND SYSTEMS FOR INHIBITING PRECURSOR INTERACTIONS DURING RADICAL-ENHANCED ATOMIC LAYER DEPOSITION
#69METHOD OF PLASMA CLEANING OF FUSED SILICA TUBES
#70Program, Information Processing Method, Information Processing Device and Model Generation Method
#71LOW PARAMETER PLASMA ASHING TECHNIQUES
#72COMPRESSIVE FILMS FOR LARGE AREA GAPFILL
#73DENSIFIED SEAM-FREE SILICON GAP FILL PROCESSES
#74INSULATING FILM FORMING METHOD AND SUBSTRATE PROCESSING SYSTEM
#75SUBSTRATE PROCESSING APPARATUS, METHOD OF PROCESSING SUBSTRATE, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND RECORDING MEDIUM
#76METHOD FOR REDUCING INCUBATION PERIOD OF SILICON NITRIDE LAYER DEPOSITION, STRUCTURE FORMED USING THE METHOD, AND SYSTEM FOR PERFORMING THE METHOD
#77ETCHING PROCESSING METHOD
#78SEMICONDUCTOR CHAMBER COMPONENTS WITH ADVANCED COATING TECHNIQUES
#79PROCESSING METHODS TO IMPROVE ETCHED SILICON-AND-GERMANIUM-CONTAINING MATERIAL SURFACE ROUGHNESS
#80SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
#81PLASMA PROCESSING APPARATUS
#82GAS FLOW ACCELERATOR TO PREVENT BUILDUP OF PROCESSING BYPRODUCT IN A MAIN PUMPING LINE OF A SEMICONDUCTOR PROCESSING TOOL
#83LARGE-AREA WAFER-SCALE CMOS-COMPATIBLE 2D-MATERIAL INTERCALATION DOPING TOOLS, PROCESSES, AND METHODS, INCLUDING DOPING OF SYNTHESIZED GRAPHENE
#84DRY ETCH OF BORON-CONTAINING MATERIAL
#85CARBON HARD MASK, FILM FORMING APPARATUS, AND FILM FORMING METHOD
#86Ceramic susceptor
#87Method for Etching Features in a Layer in a Substrate
#88PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
#89SUBSTRATE PROCESSING APPARATUS, PLASMA GENERATING APPARATUS, SUBSTRATE PROCESSING METHOD, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM
#90SUBSTRATE PROCESSING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM
#91PLASMA-ENHANCED MOLYBDENUM DEPOSITION
#92ETCHING METHOD AND PLASMA PROCESSING APPARATUS
#93DRY ETCHING METHODS FOR REDUCING FLUOROCARBON-CONTAINING GAS EMISSIONS
#94ALD PROCESS WITH PLASMA TREATMENT
#95ETCHING METHOD AND ETCHING APPARATUS
#96MANUFACTURING METHOD FOR GRAPHENE FILM
#97DEPOSITION METHOD AND DEPOSITION APPARATUS
#98METHOD OF FABRICATING A CAPACITOR
#99DYNAMIC PRESSURE CONTROL FOR PROCESSING CHAMBERS IMPLEMENTING REAL-TIME LEARNING
#100ETCHING METHOD AND PLASMA PROCESSING APPARATUS
#101PLASMA ETCHING APPARATUS AND OPERATING METHOD THEREOF
#102SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
#103GROUP III-V SEMICONDUCTOR DEVICE AND METHOD OF FABRICATION OF SAME INCLUDING IN-SITU SURFACE PASSIVATION
#104IN-SITU CARBON LINER FOR HIGH ASPECT RATIO FEATURES
#105SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
#106SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
#107HTCC antenna for generation of microplasma
#108METHODS, SYSTEMS, AND APPARATUS FOR FORMING LAYERS HAVING SINGLE CRYSTALLINE STRUCTURES
#109CONTROL DEVICE, SUBSTRATE PROCESSING SYSTEM, AND METHOD OF CONTROLLING VACUUM VALVE DEVICE
#110NEUTRAL BEAM ANNEALING APPARATUS AND METHOD OF MANUFACTURING DISPLAY APPARATUS USING THE SAME
#111ETCHING METHOD AND PLASMA PROCESSING APPARATUS
#112SEMICONDUCTOR WAFER MANUFACTURING APPARATUS
#113NITROGEN PLASMA TREATMENT FOR BOTTOM-UP GROWTH
#114METHOD FOR SELECTIVE DEPOSITION OF SILICON NITRIDE AND STRUCTURE INCLUDING SELECTIVELY-DEPOSITED SILICON NITRIDE LAYER
#115INTEGRATED METHOD AND TOOL FOR HIGH QUALITY SELECTIVE SILICON NITRIDE DEPOSITION
#116PLASMA TREATMENT DEVICE
#117PLASMA PRECLEAN SYSTEM FOR CLUSTER TOOL
#118PLASMA PROCESSING APPARATUS, PLASMA PROCESSING METHOD, PRESSURE VALVE CONTROL DEVICE, PRESSURE VALVE CONTROL METHOD, AND PRESSURE REGULATION SYSTEM
#119OXIDATION RESISTANT PROTECTIVE LAYER IN CHAMBER CONDITIONING
#120METHODS AND APPARATUS FOR PROCESSING A SUBSTRATE
#121PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
#122INTEGRATED METHOD AND TOOL FOR HIGH QUALITY SELECTIVE SILICON NITRIDE DEPOSITION
#123COATINGS FOR USE IN REMOTE PLASMA SOURCE APPLICATIONS AND METHOD OF THEIR MANUFACTURE
#124FILM FORMING METHOD AND FILM FORMING APPARATUS
#125METHOD AND DEVICE FOR THE OUTER-WALL AND/OR INNER-WALL COATING OF HOLLOW BODIES
#126CARRIER FOR END EFFECTOR, TRANSPORTATION APPARATUS INCLUDING THE SAME AND THE SUBSTRATE PROCESSING APPARATUS
#127Device and method for sputtering and depositing metal on surface of magnetic powder materials
#128SUBTRACTIVE COPPER ETCH
#129PLASMA TREATMENT APPARATUS AND PLASMA TREATMENT METHOD
#130ETCHING METHOD AND SEMICONDUCTOR ELEMENT MANUFACTURING METHOD
#131SEMICONDUCTOR PROCESSING SYSTEM WITH GAS LINE FOR TRANSPORTING EXCITED SPECIES AND RELATED METHODS
#132REMOTE PLASMA SOURCE SHOWERHEAD ASSEMBLY WITH ALUMINUM FLUORIDE PLASMA EXPOSED SURFACE
#133SUBSTRATE PROCESSING APPARATUS, AND WATERPROOFING DEVICE FOR ACOUSTIC SENSOR
#134THIN FILM DEPOSITION METHOD AND MANUFACTURING METHOD OF ELECTRONIC DEVICE APPLYING THE SAME
#135INTEGRATION OF VAPOR DEPOSITION PROCESS INTO PLASMA ETCH REACTOR
#136CONFORMAL THERMAL CVD WITH CONTROLLED FILM PROPERTIES AND HIGH DEPOSITION RATE
#137SUBSTRATE PROCESSING SYSTEM AND PARTICLE REMOVAL METHOD
#138ETCHING METHOD AND PLASMA PROCESSING APPARATUS
#139SUBSTRATE TREATMENT APPARATUS AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING THE SAME
#140DIFFUSION BONDING OF PURE METAL BODIES
#141ETCHING METHOD AND PLASMA PROCESSING SYSTEM
#142INTERMITTENT STAGNANT FLOW
#143Gas supply system, plasma processing apparatus, and gas supply method
#144SURFACE MODIFICATION FOR METAL-CONTAINING PHOTORESIST DEPOSITION
#145SEMICONDUCTOR MACHINE SYSTEM AND MANUFACTURING METHOD USING THEREOF
#146DEPOSITION APPARATUS AND METHOD OF CLEANSING THE SAME
#147HIGH DIELECTRIC FILMS AND SEMICONDUCTOR OR CAPACITOR DEVICES COMPRISING SAME
#148Plasma enhanced chemical vapor deposition of graphene on optical fibers
#149SUBSTRATE PROCESSING SYSTEM
#150Dual pressure oxidation method for forming an oxide layer in a feature
#151SEMICONDUCTOR PROCESS METHOD AND MULTI-CHAMBER APPARATUS THEREWITH
#152PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
#153SCALED LINER LAYER FOR ISOLATION STRUCTURE
#154Method of Plasma Etching
#155Support unit, and apparatus for treating substrate with the same
#156SUBSTRATE PROCESSING SYSTEM
#157FRONTSIDE AND BACKSIDE PRESSURE MONITORING FOR SUBSTRATE MOVEMENT PREVENTION
#158Selective deposition of material comprising silicon and oxygen using plasma
#159Carrier device, semiconductor apparatus, and residual charge detection method
#160Substrate joining method, substrate joining system and method for controlling hydrophilic treatment device
#161TECHNIQUES AND APPARATUS FOR SELECTIVE SHAPING OF MASK FEATURES USING ANGLED BEAMS
#162FILM FORMING METHOD AND FILM FORMING SYSTEM
#163PLASMA PROCESSING WITH TUNABLE NITRIDATION
#164SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
#165COOLING PLATE FOR SEMICONDUCTOR PROCESSING CHAMBER WINDOW
#166HIGH MODULUS BORON-BASED CERAMICS FOR SEMICONDUCTOR APPLICATIONS
#167Method for Etching of Metal
#168WATER VAPOR PLASMA TO ENHANCE SURFACE HYDROPHILICITY
#169Methods for selective removal of contact oxides
#170HIGH ASPECT RATIO ETCH WITH INFINITE SELECTIVITY
#171Method of Deposition
#172Electrostatic chuck sidewall gas curtain
#173WORKPIECE SUPPORT SYSTEM FOR PLASMA TREATMENT AND METHOD OF USING THE SAME
#174Pressure Control System for a Multi-Head Processing Chamber of a Plasma Processing Apparatus
#175Electrically and Magnetically Enhanced Ionized Physical Vapor Deposition Unbalanced Sputtering Source
#176PRESSURE BATCH COMPENSATION TO STABILIZE CD VARIATION FOR TRIM AND DEPOSITION PROCESSES
#177Substrate processing apparatus and electrostatic chuck
#178APPARATUS TO DETECT AND QUANTIFY RADICAL CONCENTRATION IN SEMICONDUCTOR PROCESSING SYSTEMS
#179Atomic layer etching of Ru metal
#180Metal-doped carbon hardmasks
#181Processing apparatus and processing method, and gas cluster generating apparatus and gas cluster generating method
#182GAS FLOW CONTROL DURING SEMICONDUCTOR FABRICATION
#183METHODS AND SYSTEMS FOR TOPOGRAPHY-SELECTIVE DEPOSITIONS
#184High-frequency grounding device and vacuum valve having high-frequency grounding device
#185SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
#186APPARATUS FOR IMPROVED HIGH PRESSURE PLASMA PROCESSING
#187DRY CHAMBER CLEAN OF PHOTORESIST FILMS
#188REMOTE PLASMA ULTRAVIOLET ENHANCED DEPOSITION
#189Sorption chamber walls for semiconductor equipment
#190PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
#191PLASMA PROCESSING APPARATUS AND METHOD THEREFOR
#192SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS
#193REDUCED SUBSTRATE PROCESS CHAMBER CAVITY VOLUME
#194Method of manufacturing semiconductor device, substrate processing method, non-transitory computer-readable recording medium and substrate processing apparatus
#195Plasma processing apparatus
#196Method of Manufacturing Semiconductor Device, Substrate Processing Method, Non-transitory Computer-readable Recording Medium and Substrate Processing Apparatus
#197SUBSTRATE TREATING APPARATUS
#198Method for efficiently eliminating graphene wrinkles formed by chemical vapor deposition
#199Silicon dry etching method
#200Carbon hard mask, film forming apparatus, and film forming method
#201Substrate processing apparatus and method of driving relay member
#202Device and method for plasma treatment of containers
#203Methods and apparatus for processing a substrate
#204METHOD FOR COATING METAL
#205Measuring device and method of obtaining thickness of sheath
#206Self-assembled monolayer deposition from low vapor pressure organic molecules
#207Techniques and apparatus for selective shaping of mask features using angled beams
#208PLASMA PROCESSING APPARATUS
#209Substrate processing apparatus
#210OBJECT PROCESSING APPARATUS
#211Semiconductor etching methods
#212Plasma processing apparatus and operating method of plasma processing apparatus
#213Systems and methods for stabilizing reaction chamber pressure
#214Ribbon beam plasma enhanced chemical vapor deposition system for anisotropic deposition of thin films
#215Plasma processor
#216Substrate processing method
#217Electrostatically clamped edge ring
#218Flim forming method of carbon-containing film by microwave plasma
#219Oxidation resistant protective layer in chamber conditioning
#220SURFACE ENCASING MATERIAL LAYER
#221Multi-function equipment implementing fabrication of high-k dielectric layer
#222Processing method
#223Processing method of workpiece
#224Processing System For Small Substrates
#225Plasma processing apparatus
#226Dynamic pressure control for processing chambers implementing real-time learning
#227Plasma processing apparatus and method for venting a processing chamber to atmosphere
#228Low temperature high-quality dielectric films
#229Method and apparatus for controlling a processing reactor
#230Shaped electrodes for improved plasma exposure from vertical plasma source
#231LOW PRESSURE PLASMA MODE
#232RF capacitive coupled dual frequency etch reactor
#233Fabrication of optical metasurfaces
#234System and method of low temperature thin film deposition and in-situ annealing
#235Control circuitry for 2D optical metasurfaces
#236Method for manufacturing semiconductor device and film forming apparatus
#237Substrate processing apparatus
#238Substrate processing apparatus and substrate processing method
#239SCALED LINER LAYER FOR ISOLATION STRUCTURE
#240Plasma processing apparatus
#241Device for providing gas to a plasma chamber and a plasma processing device including the same
#242Substrate processing apparatus, method of controlling the same, and storage medium having stored therein program thereof
#243Systems and methods for improved semiconductor etching and component protection
#244METHOD AND DEVICE FOR FORMING A LAYER ON A SEMICONDUCTOR SUBSTRATE, AND SEMICONDUCTOR SUBSTRATE
#245Plasma processing apparatus
#246Cleaning method
#247Lift pin assembly, an electrostatic chuck and a processing apparatus where the electrostatic chuck is located
#248Plasma processing apparatus
#249Low temperature high-quality dielectric films
#250Resonant structure for electron cyclotron resonant (ECR) plasma ionization
#251Electrostatic chuck sidewall gas curtain
#252Chamber with vertical support stem for symmetric conductance and RF delivery
#253Plasma generation apparatus
#254Vacuum plasma workpiece treatment apparatus
#255SEMICONDUCTOR SUBSTRATE PROCESSING APPARATUS AND METHOD
#256RF capacitive coupled etch reactor
#257Processing system and processing method
#258Low-pressure plasma chamber, low-pressure plasma installation and method for producing a low-pressure plasma chamber
#259Cleaning method and plasma processing apparatus
#260Holding arrangement for holding a substrate, carrier including the holding arrangement, processing system employing the carrier, and method for releasing a substrate from a holding arrangement
#261Fabrication of optical metasurfaces
#262Circuit assembly for providing high-frequency energy, and system for generating an electric discharge
#263Shaped electrodes for improved plasma exposure from vertical plasma source
#264Method for neutral beam processing based on gas cluster ion beam technology and articles produced thereby
#265Textured processing chamber components and methods of manufacturing same
#266Using bias RF pulsing to effectively clean electrostatic chuck (ESC)
#267Method and Apparatus for Anisotropic Pattern Etching and Treatment
#268PLASMA PROCESSING APPARATUS
#269Drawing apparatus and control method thereof
#270Film formation apparatus
#271SYSTEM AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#272Methods for high precision plasma etching of substrates
#273System and method for plasma ignition
#274High-k dielectric layer, fabricating method thereof and multi-function equipment implementing such fabricating method
#275Plasma processing device
#276Plasma processing apparatus and method for venting a processing chamber to atmosphere
#277Ion beam etching apparatus
#278Electrically and magnetically enhanced ionized physical vapor deposition unbalanced sputtering source
#279Plasma strip tool with uniformity control
#280QUALITY IMPROVEMENT OF FILMS DEPOSITED ON A SUBSTRATE
#281MANUFACTURING METHODS TO REDUCE SURFACE PARTICLE IMPURITIES AFTER A PLASMA PROCESS
#282Chamber with vertical support stem for symmetric conductance and RF delivery
#283Plasma processing devices having multi-port valve assemblies
#284Plasma reactor with electrode filaments extending from ceiling
#285Wafer unloading method
#286Enhanced high aspect ratio etch performance using accelerated neutral beams derived from gas-cluster ion beams
#287Gas supply member and gas processing apparatus
#288PLASMA GENERATING APPARATUS AND METHOD OF MANUFACTURING PATTERNED DEVICES USING SPATIALLY RESOLVED PLASMA PROCESSING
#289Optical beam-steering devices and methods utilizing surface scattering metasurfaces
#290Film deposition method and plasma processing apparatus
#291Reactors for plasma-assisted processes and associated methods
#292Optical surface-scattering elements and metasurfaces
#293Plasma processing apparatus and plasma processing method
#294Fabrication of optical metasurfaces
#295Control circuitry for 1D optical metasurfaces
#296Control circuitry for 2D optical metasurfaces
#297Distributed, Non-Concentric Multi-Zone Plasma Source Systems, Methods and Apparatus
#298Dual PVD Chamber And Hybrid PVD-CVD Chambers
#299Electrostatically clamped edge ring
#300Method of operating semiconductor manufacturing apparatus and semiconductor devices