209340 ⎘
Details relating to semiconductor or other solid state devices covered by the group
Sub-classes:Integrated circuit fabrication with boron etch-stop layer
#2Method and apparatus for reducing acoustic noise in a synthetic jet
#3Voltage detecting circuit and method for measuring characteristic of transistor
#4Method for detecting the bright point in the liquid crystal display panel
#5Method of detecting volatile organic compounds
#6Self test of MEMS accelerometer with ASICS integrated capacitors
#7Magnetic nano-multilayers for magnetic sensors and manufacturing method thereof
#8Method and apparatus for reducing acoustic noise in a synthetic jet