ClassID:

206997

H01L21/02054 - CPC Classification

Classification description:

Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof; Manufacture or treatment of semiconductor devices or of parts thereof; Cleaning; Cleaning before device manufacture, i.e. Begin-Of-Line process combining dry and wet cleaning steps

Recent Application in this class:
#1
20260005009
2026-01-01

SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS

#2
20250357099
2025-11-20

WAFER CLEANING METHOD AND SYSTEM

#3
20250201547
2025-06-19

METHOD FOR CLEANING A SEMICONDUCTOR WAFER

#4
20250196199
2025-06-19

ELECTRONIC COMPONENT CLEANING METHOD

#5
20240387162
2024-11-21

METHOD FOR WAFER BACKSIDE POLISHING

#6
20240290608
2024-08-29

SUBSTRATE PROCESSING METHOD AND SUBLIMATION DRYING PROCESSING AGENT

#7
20230335622
2023-10-19

RINSE PROCESS AFTER FORMING FIN-SHAPED STRUCTURE

#8
20230064958
2023-03-02

Method for wafer backside polishing

#9
20220190139
2022-06-16

Method for forming semiconductor structure

#10
20220028682
2022-01-27

Gallium arsenide substrate comprising a surface oxide layer with improved surface homogeneity

#11
20220013367
2022-01-13

PLASMA TREATMENT APPARATUS, SEMICONDUCTOR MANUFACTURING APPARATUS, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

#12
20210313443
2021-10-07

Method for forming fin field effect transistor device structure

#13
20210265180
2021-08-26

Substrate cleaning method, substrate cleaning system, and storage medium

#14
20210151334
2021-05-20

Substrate processing method and substrate processing device

#15
20210057551
2021-02-25

Rinse process after forming fin-shaped structure

#16
20200365425
2020-11-19

Drying apparatus, substrate processing system, and drying method

#17
20200194259
2020-06-18

Method for fabricating a monocrystalline structure

#18
20200135899
2020-04-30

Rinse process after forming fin-shaped structure

#19
20190371629
2019-12-05

Sub-nanometer-level substrate cleaning mechanism

#20
20190276740
2019-09-12

Composition for semiconductor process and semiconductor process

#21
20190237540
2019-08-01

Insulating layer structure for semiconductor product, and preparation method of insulating layer structure

#22
20190237322
2019-08-01

Substrate processing method and substrate processing apparatus

#23
20190206676
2019-07-04

Method and device for reducing contamination for reliable bond pads

#24
20190172732
2019-06-06

Determination method and substrate processing equipment

#25
20190108996
2019-04-11

METHOD OF PRODUCING LIQUID CRYSTAL PANEL

#26
20190096706
2019-03-28

Substrate processing method, substrate processing apparatus and recording medium

#27
20190035652
2019-01-31

Substrate processing method and substrate processing device

#28
20180330982
2018-11-15

METHOD OF MANUFACTURING A HYBRID SUBSTRATE

#29
20180264504
2018-09-20

Substrate processing apparatus and substrate processing method

#30
20180158673
2018-06-07

Gallium arsenide substrate comprising a surface oxide layer with improved surface homogeneity

#31
20180138052
2018-05-17

Backside polisher with dry frontside design and method using the same

#32
20180138030
2018-05-17

Method for cleaning, passivation and functionalization of Si—Ge semiconductor surfaces

#33
20180019119
2018-01-18

Drying high aspect ratio features

#34
20170278725
2017-09-28

Substrate processing apparatus, substrate processing method and memory medium

#35
20170256398
2017-09-07

Substrate processing apparatus having cooling member

#36
20170243733
2017-08-24

Backside polisher with dry frontside design and method using the same

#37
20160214148
2016-07-28

Substrate processing method

#38
20160181086
2016-06-23

Systems and methods for rinsing and drying substrates

#39
20160079096
2016-03-17

Wet clean process for cleaning plasma processing chamber components

#40
20160035595
2016-02-04

Processing apparatus, processing method, and manufacturing method of electronic device

#41
20150371844
2015-12-24

Process for producing a gallium arsenide substrate which includes marangoni drying

#42
20150364573
2015-12-17

Method for semiconductor device fabrication

#43
20150325456
2015-11-12

Method for cleaning base, heat process method for semiconductor wafer, and method for manufacturing solid-state image capturing apparatus

#44
20150262830
2015-09-17

Mechanisms for forming patterns using multiple lithography processes

#45
20150243495
2015-08-27

Apparatus and process for wafer cleaning

#46
20150194301
2015-07-09

Substrate cleaning method, substrate cleaning apparatus, and computer-readable storage medium

#47
20150122291
2015-05-07

Wafer cleaning module

#48
20140259728
2014-09-18

Substrate drying apparatus, substrate drying method and control program

#49
20140174465
2014-06-26

Cleaning agent for silicon wafer

#50
20140141616
2014-05-22

Etching composition and method of manufacturing semiconductor device using the same

#51
20140130825
2014-05-15

Substrate cleaning method and system using atmospheric pressure atomic oxygen

#52
20140113459
2014-04-24

Method for in-situ dry cleaning, passivation and functionalization of Ge semiconductor surfaces

#53
20140109930
2014-04-24

Method for in-situ dry cleaning, passivation and functionalization of Si—Ge semiconductor surfaces

#54
20140096793
2014-04-10

UV TREATMENT OF POLISHED WAFERS

#55
20140065757
2014-03-06

Method for manufacturing solar cell

#56
20130255718
2013-10-03

Substrate processing method and substrate processing apparatus

#57
20120122316
2012-05-17

METHOD FOR SURFACE TREATMENT OF A WAFER

#58
20110309376
2011-12-22

METHOD OF CLEANING SILICON CARBIDE SEMICONDUCTOR, SILICON CARBIDE SEMICONDUCTOR, AND SILICON CARBIDE SEMICONDUCTOR DEVICE

#59
20110289795
2011-12-01

SUBSTRATE DRYING APPARATUS, SUBSTRATE DRYING METHOD AND CONTROL PROGRAM

#60
20110214697
2011-09-08

Substrate clean solution for copper contamination removal

#61
20110214685
2011-09-08

Cleaning agent for silicon wafer

#62
20110155180
2011-06-30

WAFER CLEANING APPARATUS AND WAFER CLEANING METHOD USING THE SAME

#63
20110034037
2011-02-10

Method for manufacturing semiconductor device and method for cleaning semiconductor substrate

#64
20100261332
2010-10-14

Wafer cleaning method and wafer bonding method using the same

#65
20100140756
2010-06-10

APPARATUS FOR MANUFACTURING SILICON OXIDE THIN FILM AND METHOD FOR FORMING THE SILICON OXIDE THIN FILM

#66
20100093177
2010-04-15

Method of cleaning semiconductor wafer and semiconductor wafer

#67
20100071728
2010-03-25

Washing device and method for fabricating the same

#68
20090188534
2009-07-30

Apparatus and method for cleaning glass substrates using a cool hydrogen flame

#69
20090029529
2009-01-29

METHOD FOR CLEANING SEMICONDUCTOR DEVICE

#70
20080280110
2008-11-13

Method of activating a silicon surface for subsequent patterning of molecules onto said surface

#71
20080274626
2008-11-06

METHOD FOR DEPOSITING A HIGH QUALITY SILICON DIELECTRIC FILM ON A GERMANIUM SUBSTRATE WITH HIGH QUALITY INTERFACE

#72
20080210664
2008-09-04

Method of Surface Treatment and Surface-Treated Article

#73
20080092918
2008-04-24

Method for removing foreign matter from substrate surface

#74
20070158302
2007-07-12

Systems and methods for gas assisted resist removal

#75
20060231125
2006-10-19

Apparatus and method for cleaning a semiconductor wafer

#76
20060191556
2006-08-31

Substrate processing apparatus and substrate processing method

#77
20060137723
2006-06-29

Workpiece processing using ozone gas and solvents

#78
20060005857
2006-01-12

Apparatus and method for cleaning glass substrates using a cool hydrogen flame

#79
20050231719
2005-10-20

Optical inspection equipment for semiconductor wafers with precleaning

#80
20050194356
2005-09-08

Removing photoresist from a workpiece using water and ozone and a photoresist penetrating additive

#81
20050153074
2005-07-14

Method of activating a silicon surface for subsequent patterning of molecules onto said surface

#82
20050133067
2005-06-23

Processing a workpiece using water, a base, and ozone

#83
20050118831
2005-06-02

Gas assisted method for applying resist stripper and gas-resist stripper combinations

#84
20050093063
2005-05-05

Method for forming multiple gate oxide thickness utilizing ashing and cleaning

#85
20050090115
2005-04-28

Post plasma clean process for a hardmask

#86
20050085082
2005-04-21

Method of forming a low K dielectric in a semiconductor manufacturing process

#87
20050072446
2005-04-07

Process and apparatus for treating a workpiece

#88
20050045590
2005-03-03

FRAM capacitor stack clean

#89
20050034745
2005-02-17

Processing a workpiece with ozone and a halogenated additive