ClassID:

207009

H01L21/02087 - page 2 - CPC Classification

Classification description:

Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof; Manufacture or treatment of semiconductor devices or of parts thereof; Cleaning product to be cleaned Cleaning of wafer edges

Recent Application in this class:
#301
20070068899
2007-03-29

Apparatus for the removal of an edge polymer from a substrate and methods therefor

#302
20070068623
2007-03-29

Apparatus for the removal of a set of byproducts from a substrate edge and methods therefor

#303
20070066076
2007-03-22

Substrate processing method and apparatus using a combustion flame

#304
20070062647
2007-03-22

Method and apparatus for isolative substrate edge area processing

#305
20070049042
2007-03-01

Method of cleaning a wafer

#306
20070026670
2007-02-01

Method of reducing contamination by removing an interlayer dielectric from the substrate edge

#307
20070000873
2007-01-04

Substrate processing method and semiconductor device manufacturing method

#308
20060291855
2006-12-28

Substrate processing apparatus

#309
20060272676
2006-12-07

Cleaning method and a cleaning device for cleaning an edge portion and back face of a wafer

#310
20060270231
2006-11-30

Systems and methods for removing wafer edge residue and debris using a residue remover mechanism

#311
20060258177
2006-11-16

Method for treating a wafer edge

#312
20060254717
2006-11-16

Plasma processing apparatus

#313
20060234508
2006-10-19

Substrate processing apparatus and substrate processing method

#314
20060191634
2006-08-31

Apparatus for wafer patterning to reduce edge exclusion zone

#315
20060172538
2006-08-03

Wet etching the edge and bevel of a silicon wafer

#316
20060172526
2006-08-03

Method for preventing edge peeling defect

#317
20060170076
2006-08-03

Apparatus, system, and method for reducing integrated circuit peeling

#318
20060137994
2006-06-29

Method of wafer processing with edge seed layer removal

#319
20060094246
2006-05-04

Method of wafer patterning for reducing edge exclusion zone

#320
20060086461
2006-04-27

Etching apparatus and etching method

#321
20060073703
2006-04-06

Dynamic edge bead removal

#322
20060051967
2006-03-09

Wafer bevel polymer removal

#323
20060006545
2006-01-12

Semiconductor structure and fabrication therefor

#324
20060003591
2006-01-05

Multi-step EBR process for photoresist removal

#325
20060003570
2006-01-05

Method and apparatus for electroless capping with vapor drying

#326
20060003521
2006-01-05

Method of and apparatus for manufacturing semiconductor device

#327
20050263484
2005-12-01

Adjustable shielding plate for adjusting an etching area of a semiconductor wafer and related apparatus and methods

#328
20050257889
2005-11-24

Etching and cleaning methods and etching and cleaning apparatuses used therefor

#329
20050224794
2005-10-13

Semiconductor device manufacturing method

#330
20050208774
2005-09-22

Wet processing method and processing apparatus of substrate

#331
20050156140
2005-07-21

Tungsten metal removing solution and method for removing tungsten metal by use thereof

#332
20050109369
2005-05-26

Method to use a laser to perform the edge clean operation on a semiconductor wafer

#333
20050085163
2005-04-21

Method for preventing edge peeling defect

#334
20050064703
2005-03-24

Substrate processing method

#335
20050064700
2005-03-24

Method of plating a metal or metal compound on a semiconductor substrate that includes using the same main component in both plating and etching solutions

#336
20050061659
2005-03-24

Plating apparatus and plating method

#337
20050027089
2005-02-03

Solvent for treating polysilazane and method of treating polysilazane with the solvent

#338
20050026455
2005-02-03

Substrate processing apparatus and substrate processing method