ClassID:

207072

H01L21/02455 - CPC Classification

Classification description:

Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof; Manufacture or treatment of semiconductor devices or of parts thereof; Forming layers; Forming inorganic semiconducting materials on a substrate; Intermediate layers between substrates and deposited layers; Materials Group 13/15 materials

Recent Application in this class:
#1
20230361241
2023-11-09

METHOD FOR MANUFACTURING OPTOELECTRONIC DEVICES

#2
20220367174
2022-11-17

Semiconductor substrate and method of manufacturing thereof

#3
20220285154
2022-09-08

Method for manufacturing diamond substrate

#4
20220108883
2022-04-07

METHOD FOR FLATTENING A SURFACE ON AN EPITAXIAL LATERAL GROWTH LAYER

#5
20220068631
2022-03-03

Semiconductor substrate, semiconductor device, and method for forming semiconductor structure

#6
20200258986
2020-08-13

High percentage silicon germanium graded buffer layers with lattice matched Ga(As-P) interlayers

#7
20200185515
2020-06-11

Semiconductor structure comprising III-N material

#8
20200176558
2020-06-04

Method of forming III-V on insulator structure on semiconductor substrate

#9
20200141027
2020-05-07

III-V or II-VI compound semiconductor films on graphitic substrates

#10
20200118816
2020-04-16

Method for printing wide bandgap semiconductor materials

#11
20190259608
2019-08-22

Systems and methods of dislocation filtering for layer transfer

#12
20190252184
2019-08-15

Single-crystal rare earth oxide grown on III-V compound

#13
20190228965
2019-07-25

Fabrication of compound semiconductor structures

#14
20190181220
2019-06-13

Method of forming III-V on insulator structure on semiconductor substrate

#15
20190172966
2019-06-06

Nanostructured substrates for improved lift-off of III-V thin films

#16
20190088476
2019-03-21

Buffer layers having composite structures

#17
20180254332
2018-09-06

High-electron-mobility transistors with counter-doped dopant diffusion barrier

#18
20180248028
2018-08-30

High-electron-mobility transistors with heterojunction dopant diffusion barrier

#19
20180158927
2018-06-07

Pseudomorphic InGaAs on GaAs for gate-all-around transistors

#20
20170345654
2017-11-30

Fabrication of compound semiconductor structures

#21
20170345646
2017-11-30

Single-crystal rare earth oxide grown on III-V compound

#22
20170256405
2017-09-07

Selective nanoscale growth of lattice mismatched materials

#23
20170256404
2017-09-07

Buffer layers having composite structures

#24
20170229303
2017-08-10

Method for removing native oxide and residue from a III-V group containing surface

#25
20170069491
2017-03-09

Stress assisted wet and dry epitaxial lift off

#26
20170040438
2017-02-09

Conversion of strain-inducing buffer to electrical insulator

#27
20170033183
2017-02-02

Strained group IV channels

#28
20160379820
2016-12-29

Compound finFET device including oxidized III-V fin isolator

#29
20160369423
2016-12-22

III-V or II-VI compound semiconductor films on graphitic substrates

#30
20160343811
2016-11-24

Method for forming group III/V conformal layers on silicon substrates

#31
20160307774
2016-10-20

Utilization of angled trench for effective aspect ratio trapping of defects in strain-relaxed heteroepitaxy of semiconductor films

#32
20160189959
2016-06-30

Type III-V and type IV semiconductor device formation

#33
20160141391
2016-05-19

Method for reducing contact resistance in MOS

#34
20160141175
2016-05-19

Method for removing native oxide and residue from a III-V group containing surface

#35
20160111337
2016-04-21

Strained stacked nanosheet FETS and/or quantum well stacked nanosheet

#36
20160064284
2016-03-03

Method for fabricating a semiconductor structure

#37
20150380497
2015-12-31

Group III-V device with a selectively modified impurity concentration

#38
20150340228
2015-11-26

GERMANIUM-CONTAINING SEMICONDUCTOR DEVICE AND METHOD OF FORMING

#39
20150325650
2015-11-12

III-V semiconductor device having self-aligned contacts

#40
20150311292
2015-10-29

Utilization of angled trench for effective aspect ratio trapping of defects in strain relaxed heteroepitaxy of semiconductor films

#41
20150287600
2015-10-08

Hybrid III-V technology to support multiple supply voltages and off state currents on same chip

#42
20150279679
2015-10-01

Multiple-threshold voltage devices and method of forming same

#43
20150243773
2015-08-27

III-V semiconductor device having self-aligned contacts

#44
20150145001
2015-05-28

Selective nanoscale growth of lattice mismatched materials

#45
20150137317
2015-05-21

SEMICONDUCTOR WAFER, METHOD OF PRODUCING A SEMICONDUCTOR WAFER AND METHOD OF PRODUCING A COMPOSITE WAFER

#46
20150130017
2015-05-14

Semiconductor device comprising epitaxially grown semiconductor material and an air gap

#47
20140339686
2014-11-20

Group III-V device with a selectively modified impurity concentration

#48
20140339605
2014-11-20

Group III-V device with a selectively reduced impurity concentration

#49
20140339505
2014-11-20

Virtual substrates by having thick, highly relaxed metamorphic buffer layer structures by hydride vapor phase epitaxy

#50
20140315374
2014-10-23

Selective epitaxial growth of semiconductor materials with reduced defects

#51
20140242768
2014-08-28

REDUCING WAFER DISTORTION THROUGH A HIGH CTE LAYER

#52
20140242759
2014-08-28

Reducing wafer distortion through a high CTE layer

#53
20140203326
2014-07-24

Methods of forming hetero-layers with reduced surface roughness and bulk defect density of non-native surfaces and the structures formed thereby

#54
20130256760
2013-10-03

Method for forming group III/V conformal layers on silicon substrates

#55
20130126896
2013-05-23

III-V semiconductor structures and methods for forming the same

#56
20130087831
2013-04-11

Selective epitaxial growth of semiconductor materials with reduced defects

#57
20130069208
2013-03-21

Group III-V device structure having a selectively reduced impurity concentration

#58
20120142168
2012-06-07

III-V compound crystal and semiconductor electronic circuit element

#59
20120132921
2012-05-31

Reducing wafer distortion through a high CTE layer

#60
20120028444
2012-02-02

Defect-free hetero-epitaxy of lattice mismatched semiconductors

#61
20110315954
2011-12-29

Semiconductor nanocrystal, method of manufacture thereof and articles including the same

#62
20110284863
2011-11-24

III-V semiconductor structures and methods for forming the same

#63
20110126891
2011-06-02

Solar Cell Element, Color Sensor and Method of Manufacturing Light Emitting Element and Light Receiving Element

#64
20110062492
2011-03-17

High-Quality Hetero-Epitaxy by Using Nano-Scale Epitaxy Technology

#65
20110027973
2011-02-03

METHOD OF FORMING LED STRUCTURES

#66
20100327316
2010-12-30

Method for manufacturing an III-V engineered substrate and the III-V engineered substrate thereof

#67
20100295080
2010-11-25

Light emitting device and light emitting device package having the same

#68
20100289116
2010-11-18

Selective epitaxial growth of semiconductor materials with reduced defects

#69
20100213577
2010-08-26

SEMICONDUCTOR ELECTRONIC DEVICE AND PROCESS OF MANUFACTURING THE SAME

#70
20100184278
2010-07-22

Method for epitaxial growth

#71
20100090313
2010-04-15

III-V compound crystal and semiconductor electronic circuit element

#72
20090142869
2009-06-04

Method of producing semiconductor optical device

#73
20070272944
2007-11-29

Semiconductor member, manufacturing method thereof, and semiconductor device

#74
20070259510
2007-11-08

Semiconductor device, semiconductor layer and production method thereof

#75
20060281328
2006-12-14

Compound semiconductor substrate, epitaxial substrate, processes for producing compound semiconductor substrate, and epitaxial substrate

#76
20060246688
2006-11-02

Semiconductor film manufacturing method and substrate manufacturing method

#77
20060113635
2006-06-01

Semiconductor member, manufacturing method thereof, and semiconductor device

#78
20060001018
2006-01-05

III-V and II-VI compounds as template materials for growing germanium containing film on silicon

#79
20050124143
2005-06-09

Defect reduction in semiconductor materials

#80
20050026392
2005-02-03

Method for depositing III-V semiconductor layers on a non-III-V substrate

#81
14755520
2016-11-15

III-V device structure with multiple threshold voltage

#82
14659060
2016-06-14

Method of removing threading dislocation defect from a fin feature of III-V group semiconductor material

#83
13975524
2014-09-30

Self-aligned and lateral-assembly method for integrating heterogeneous material structures on the same plane