209418 ⎘
Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by; Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto; Bonding areas; Manufacturing methods related thereto; Redistribution layers [RDL] for bonding areas Disposition of the redistribution layers
Sub-classes:SEMICONDUCTOR PACKAGE
#2INFO STRUCTURE WITH COPPER PILLAR HAVING REVERSED PROFILE
#3WRAP-AROUND SOURCE/DRAIN METHOD OF MAKING CONTACTS FOR BACKSIDE METALS
#4WAFER CHIP SCALE PACKAGE
#5MICROELECTRONIC ASSEMBLIES
#6SEMICONDUCTOR PACKAGES WITH PASS-THROUGH CLOCK TRACES AND ASSOCIATED SYSTEMS AND METHODS
#7Info structure with copper pillar having reversed profile
#8SEMICONDUCTOR CHIP INCLUDING LOW-K DIELECTRIC LAYER
#9MANUFACTURING METHOD OF SEMICONDUCTOR PACKAGE
#10Semiconductor packages with pass-through clock traces and associated systems and methods
#11SWITCHING POWER DEVICE AND PARALLEL CONNECTION STRUCTURE THEREOF
#12Wrap-around source/drain method of making contacts for backside metals
#13Wrap-around source/drain method of making contacts for backside metals
#14Semiconductor package with separate electric and thermal paths
#15Semiconductor device and semiconductor package
#16Info structure with copper pillar having reversed profile
#17Substrate structure of semiconductor device package and method of manufacturing the same
#18Device and Method for UBM/RDL Routing
#19Wafer chip scale package
#20Semiconductor devices and methods of manufacturing semiconductor devices
#21Semiconductor chip including low-k dielectric layer
#22Advanced info POP and method of forming thereof
#23Apparatuses including redistribution layers and related microelectronic devices
#24Methods of bonding the strip-shaped under bump metallization structures
#25Semiconductor component and semiconductor package
#26Multi-die package with bridge layer
#27Method for manufacturing electronic package
#28Three-layer package-on-package structure and method forming same
#29Manufacturing method of semiconductor package
#30Eliminate sawing-induced peeling through forming trenches
#31Semiconductor devices having a plurality of first and second conductive strips
#32Microelectronic assemblies
#33Stack packages including bridge dies
#34Scheme for connector site spacing and resulting structures
#35Device and method for UBM/RDL routing
#36INTERCONNECT STRUCTURE FOR A MICROELECTRONIC DEVICE
#37Apparatuses comprising semiconductor dies in face-to-face arrangements
#38Info structure with copper pillar having reversed profile
#39Methods for bump planarity control
#403D Chip-on-wager-on-substrate structure with via last process
#41Methods of packaging semiconductor devices including placing semiconductor devices into die caves
#42Eliminate sawing-induced peeling through forming trenches
#43Integrated circuit stacking approach
#44Methods of manufacturing a multi-device package
#45Method for manufacturing a semiconductor component and a semiconductor component
#46Substrate-free system in package design
#47Chip on package structure and method
#48Electronic component package
#49Multi-device packages and related microelectronic devices
#50Fluorescence based thermometry for packaging applications
#51Semicondcutor package and manufacturing method thereof
#52Electronic package and method for manufacturing the same
#53Three-layer package-on-package structure and method forming same
#54Wrap-around source/drain method of making contacts for backside metals
#55Eliminate sawing-induced peeling through forming trenches
#56SEMICONDUCTOR DEVICE PACKAGE WITH STRESS RELIEF LAYER
#57Info structure with copper pillar having reversed profile
#58SEMICONDUCTOR STACKING STRUCTURE AND METHOD FOR MANUFACTURING THEREOF
#59Active chip on carrier or laminated chip having microelectronic element embedded therein
#60HIGH DENSITY PACKAGE ON PACKAGE DEVICES CREATED THROUGH A SELF ASSEMBLY MONOLAYER ASSISTED LASER DIRECT STRUCTURING PROCESS ON MOLD COMPOUND
#61Interconnect structure for a microelectronic device
#62Package structures
#63Info structure with copper pillar having reversed profile
#64Semiconductor structure having a composite barrier layer
#65Composite bond structure in stacked semiconductor structure
#66Package structure and method of forming the same
#67Electronic component package
#68Semicondcutor structure and semiconductor manufacturing process thereof
#69Chip-on-wafer package and method of forming same
#70Integrated circuit package stack
#713D chip-on-wafer-on-substrate structure with via last process
#72Electronic component package and electronic device including the same
#73Device and Method for UBM/RDL Routing
#74Advanced INFO POP and method of forming thereof
#75Integrated fan-out package and method of fabricating the same
#76Three-layer Package-on-Package structure and method forming same
#77Manufacturing method of package structure
#78Chip on package structure and method
#79Method of fabricating a carrier-less silicon interposer using photo patterned polymer as substrate
#80Electronic component package
#81Integrated system and method of making the integrated system
#82Integrated fan-out package, integrated fan-out package array, and method of manufacturing integrated fan-out packages
#83Methods of packaging semiconductor devices including placing semiconductor devices into die caves
#84Electronic component package having electronic component within a frame on a redistribution layer
#85Wafer level chip scale package having continuous through hole via configuration and fabrication method thereof
#86Methods for making multi-die package with bridge layer
#87Eliminate sawing-induced peeling through forming trenches
#88Microelectronic packages having embedded sidewall substrates and methods for the producing thereof
#89Electronic component package and electronic device including the same
#90Electronic component package and method of manufacturing the same
#91Electronic component package and method of manufacturing the same
#92Wafer-level packaging sensing device and method for forming the same
#93CHIP PACKAGE AND MANUFACTURING METHOD THEREOF
#94SEMICONDUCTOR PACKAGE AND METHOD FOR MANUFACTURING SAME
#95Semiconductor package assemblies with system-on-chip (SOC) packages
#96Scheme for connector site spacing and resulting structures
#97Apparatus and method for verification of bonding alignment
#98Three dimensional integrated circuits stacking approach
#99Semiconductor device and its manufacturing method
#1003D chip-on-wafer-on-substrate structure with via last process
#101Semiconductor device and method of manufacturing the same
#102Methods of manufacturing a multi-device package
#103Methods of packaging semiconductor devices and structures thereof
#104Semiconductor structure with composite barrier layer under redistribution layer and manufacturing method thereof
#105INTEGRATED DEVICE PACKAGE COMPRISING AN ELECTROMAGNETIC (EM) PASSIVE DEVICE IN AN ENCAPSULATION LAYER, AND AN EM SHIELD
#106Chip on package structure and method
#107Eliminate sawing-induced peeling through forming trenches
#108Semiconductor packaging structure and manufacturing method thereof
#109Chip-on-wafer package and method of forming same
#110Laminated chip having microelectronic element embedded therein
#111IC-package interconnect for millimeter wave systems
#112Semiconductor device and manufacturing method for the same
#113Chip using triple pad configuration and packaging method thereof
#114Semiconductor device comprising a conductive film joining a diode and switching element
#115Multi-die package with bridge layer and method for making the same
#116Three dimensional integrated circuits stacking approach
#117COPPER WIRE THROUGH SILICON VIA CONNECTION
#118Electronic component
#119Semiconductor package assemblies with system-on-chip (SOC) packages
#120Semiconductor device and method for making the device
#121Package with UBM and methods of forming
#122Scheme for connector site spacing and resulting structures
#123Semiconductor manufacturing for forming bond pads and seal rings
#124Semiconductor device and method of forming double-sided fan-out wafer level package
#125Semiconductor device redistribution layer with narrow trace width relative to passivation layer opening
#126Package structure and fabrication method thereof
#127Integrated system and method of making the integrated system
#128Packaging structural member
#129Microelectronic packages having embedded sidewall substrates and methods for the producing thereof
#130Advanced structure for info wafer warpage reduction
#131Integrated circuit having electromagnetic shielding capability and manufacturing method thereof
#132Methods of packaging semiconductor devices and structures thereof
#133Microelectronic packages having sidewall-deposited heat spreader structures and methods for the fabrication thereof
#134Semiconductor structure with composite barrier layer under redistribution layer and manufacturing method thereof
#1353D chip-on-wafer-on-substrate structure with via last process
#1363D chip-on-wafer-on-substrate structure with via last process
#137SEMICONDUCTOR DEVICE
#138SCRIBE LINE STRUCTURE AND METHOD OF FORMING SAME
#139Metal pillar bump packaging strctures and fabrication methods thereof
#140Chip package and method thereof
#141Carrier-less silicon interposer using photo patterned polymer as substrate
#142Semiconductor device with shielding layer in post-passivation interconnect structure
#143Chip package and fabrication method thereof
#144Active chip on carrier or laminated chip having microelectronic element embedded therein
#145Three dimensional integrated circuits stacking approach
#146Integrated system and method of making the integrated system
#147Electronic components assembly
#148Integrated circuit chip using top post-passivation technology and bottom structure technology
#149Method of testing through silicon VIAS (TSVs) of three dimensional integrated circuit (3DIC)
#150Methods of packaging semiconductor devices and structures thereof
#151Chip package and fabrication method thereof
#152Shielding techniques for an integrated circuit
#153Test structures for through silicon vias (TSVs) of three dimensional integrated circuit (3DIC)
#154SEMICONDUCTOR DEVICE
#155Active chip on carrier or laminated chip having microelectronic element embedded therein
#156Chip package with heavily doped region and fabrication method thereof
#157Chip package with heavily doped regions and fabrication method thereof
#158Integrated circuit chip using top post-passivation technology and bottom structure technology
#159Packaging structural member
#160Display device
#161Electronic device package
#162Integrated circuit dies having alignment marks and methods of forming same
#163Assembly structure for connecting multiple dies into a system-in-package chip and the method thereof