209427 ⎘
Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by; Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto; Bonding areas; Manufacturing methods related thereto; Redistribution layers [RDL] for bonding areas Material of the insulating layers therebetween
DIE SIDE INTERCONNECT
#2SEMICONDUCTOR DEVICE AND A MANUFACTURING METHOD OF THE SEMICONDUCTOR DEVICE
#3SEMICONDUCTOR STRUCTURE HAVING DIELECTRIC PLUGS PENETRATING THROUGH A POLYMER LAYER
#4REDUCTION OF CRACKS IN PASSIVATION LAYER
#5POLYMER LAYERS EMBEDDED WITH METAL PADS FOR HEAT DISSIPATION
#6SEMICONDUCTOR STRUCTURE
#7SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE
#8ELECTRONIC DEVICES
#9SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES
#10ELECTRONIC DEVICES IN SEMICONDUCTOR PACKAGE CAVITIES
#11PACKAGE STRUCTURE
#12SEMICONDUCTOR STRUCTURE AND METHOD FOR WAFER SCALE CHIP PACKAGE
#13SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME
#14SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#15REDUCTION OF CRACKS IN PASSIVATION LAYER
#16Electronic devices in semiconductor package cavities
#17DIE AND PACKAGE STRUCTURE
#18Package structure
#19Integrated circuit structure
#20SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF
#21Semiconductor Device and Method of Forming Dummy vias in WLP
#22SEMICONDUCTOR STRUCTURE
#23SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE
#24RESIST PATTERNED REDISTRIBUTION WIRING ON COPPER POLYIMIDE VIA LAYER
#25Patterning Polymer Layer to Reduce Stress
#26SEMICONDUCTOR PACKAGE
#27SEMICONDUCTOR CHIP INCLUDING LOW-K DIELECTRIC LAYER
#28SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#29Reduction of cracks in passivation layer
#30Chip scale package structure and method of forming the same
#31Redistribution layer metallic structure and method
#32Redistribution layer and integrated circuit including redistribution layer
#33SEMICONDUCTOR PACKAGE AND METHOD OF FABRICATING THE SAME
#34Method of forming brass-coated metals in flip-chip redistribution layers
#35Integrated fan-out packaging
#36Polymer Layers Embedded with Metal Pads for Heat Dissipation
#37Integrated circuit structure and fabrication method thereof
#38Methods of forming microvias with reduced diameter
#39Die and package structure
#40Buffer layer(s) on a stacked structure having a via
#41Semiconductor device and method of manufacture
#42Method for fabricating semiconductor device with graphene layers
#43Method of fabricating a semiconductor device
#44Semiconductor device with graphene layers and method for fabricating the same
#45Electronic devices in semiconductor package cavities
#46Methods of forming microvias with reduced diameter
#47Semiconductor package
#48Semiconductor packaging structure
#49Post passivation interconnect
#50Package structure and method of forming the same
#51Semiconductor device and method for manufacturing semiconductor device
#52CURABLE POLYIMIDES
#53Semiconductor device and semiconductor package
#54PACKAGING STRUCTURES
#55Semiconductor package and manufacturing method thereof
#56Brass-coated metals in flip-chip redistribution layers
#57Semiconductor device
#58Method for manufacturing a semiconductor device including patterning a polymer layer to reduce stress
#59Redistribution layer metallic structure and method
#60Integrated fan-out packaging
#61Fingerprint sensor device and method
#62Embedded component package structure and manufacturing method thereof
#63Semiconductor chip including low-k dielectric layer
#64Semiconductor package and manufacturing method thereof
#65Polymer resin and compression mold chip scale package
#66Advanced info POP and method of forming thereof
#67Semiconductor device comprising semiconductor die and interposer and manufacturing method thereof
#68Semiconductor device and method to minimize stress on stack via
#69Method of manufacturing intergrated fan-out package with redistribution structure
#70Integrated fan-out package structures with recesses in molding compound
#71Fan-out interconnect structure and method for forming same
#72CHIP SCALE PACKAGE STRUCTURE AND METHOD OF FORMING THE SAME
#73Semiconductor devices and methods of forming the same
#74Redistribution layer (RDL) structure and method of manufacturing the same
#75Semiconductor package having multi-level and multi-directional shape narrowing vias
#76Redistribution layer metallic structure and method
#77Patterning polymer layer to reduce stress
#78Buffer layer(s) on a stacked structure having a via
#79Package structure and method of manufacturing the same
#80Package structure and method of forming the same
#81Fingerprint sensor device and method
#82Microelectronic device including non-homogeneous build-up dielectric
#83Semiconductor device including interconnection structure including copper and tin and semiconductor package including the same
#84Wafer level package (WLP) and method for forming the same
#85Semiconductor devices, semiconductor packages and methods of forming the same
#86Semiconductor device with improved thermal dissipation and manufacturing methods
#87Fabrication of solder balls with injection molded solder
#88Semiconductor package
#89Method of manufacturing a redistribution layer, redistribution layer and integrated circuit including the redistribution layer
#90Post passivation interconnect
#91Photosensitive resin composition, cured pattern production method, cured product, interlayer insulating film, cover coat layer, surface protective layer, and electronic component
#92PACKAGED SEMICONDUCTOR DEVICE AND METHOD FOR PREPARING THE SAME
#93Package structure with improvement layer and fabrication method thereof
#94Packaging structure and forming method thereof
#95Packaging structure and forming method thereof
#96Semiconductor device and method for manufacturing semiconductor device
#97Semiconductor structure and method for wafer scale chip package
#98Semiconductor device
#99System on package architecture including structures on die back side
#100Semiconductor device and method of manufacture
#101Redistribution layer metallic structure and method
#102Fingerprint sensor device and method
#103Resin composition
#104Resin composition
#105Package structure and method of manufacturing the same
#106Integrated fan-out packaging
#107Polymer resin and compression mold chip scale package
#108Methods for bump planarity control
#109Semiconductor device and method for manufacturing the same
#110Package assembly
#111Package structure and method of forming the same
#112Package structure and method of fabricating package structure
#113Semiconductor package and manufacturing method thereof
#114Package structure and its fabrication method
#115Polymer layers embedded with metal pads for heat dissipation
#116LAND GRID BASED MULTI SIZE PAD PACKAGE
#117Chip packaging method
#118Semiconductor package device and method of manufacturing the same
#119Fan-out semiconductor package
#120Low-temperature passivation of ferroelectric integrated circuits for enhanced polarization performance
#121Wafer level package (WLP) and method for forming the same
#122Integrated fan-out packages and methods of forming the same
#123Integrated fan-out package structures with recesses in molding compound
#124Semiconductor device and manufacturing method thereof
#125Package structure with TFTS and die covered RDL
#126Fluorescence based thermometry for packaging applications
#127Semiconductor package having exposed redistribution layer features and related methods of packaging and testing
#128System on package architecture including structures on die back side
#129Fabrication of solder balls with injection molded solder
#130Semiconductor device
#131Backside redistribution layer (RDL) structure
#132Cured film formed by curing photosensitive resin composition and method for manufacturing same
#133SEMICONDUCTOR DEVICE WITH COPPER MIGRATION STOPPING OF A REDISTRIBUTION LAYER
#134Post passivation interconnect and fabrication method therefor
#135Method for manufacturing redistribution layer
#136Fingerprint sensor device and method
#137Integrated fan-out packaging
#138Fabrication of solder balls with injection molded solder
#139Wafer level package and method
#140Semiconductor device and method of manufacture
#141Buffer layer(s) on a stacked structure having a via
#142LAND GRID BASED MULTI SIZE PAD PACKAGE
#143PHOTOSENSITIVE RESIN COMPOSITION AND ELECTRONIC COMPONENT
#144Composite bond structure in stacked semiconductor structure
#145Photosensitive resin composition, method for manufacturing cured resin film, and semiconductor device
#146Under bump metallurgy (UBM) and methods of forming same
#147Integrated fan-out package and method of fabricating the same
#148Chip-on-wafer package and method of forming same
#149Package assembly
#150SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE
#151Fan-out semiconductor package
#152Fan-out wafer level package structure
#153Electronic component package and electronic device including the same
#154Polymer resin and compression mold chip scale package
#155Advanced INFO POP and method of forming thereof
#156Semiconductor structure and manufacturing method thereof
#157Method of manufacturing a semiconductor device
#158Semiconductor device and method of manufacture
#159Fingerprint sensor device and method
#160SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
#161Method of manufacturing semiconductor devices and corresponding device
#162METHOD FOR MANUFACTURING A PACKAGE-ON-PACKAGE ASSEMBLY
#163Chip package having integrated capacitor
#164Semiconductor device having conductive bump with improved reliability
#165Semiconductor device and method for manufacturing semiconductor device
#166Semiconductor device having an encapsulated front side and interposer and manufacturing method thereof
#167Extrusion-resistant solder interconnect structures and methods of forming
#168Semiconductor device
#169Electronic component package and electronic device including the same
#170Post-passivation interconnect structure and method of forming same
#171Fabrication method of packaging substrate
#172Redistribution layer structure, semiconductor substrate structure, semiconductor package structure, chip structure, and method of manufacturing the same
#173SEMICONDUCTOR CHIP, SEMICONDUCTOR PACKAGE INCLUDING THE SAME, AND METHOD OF FABRICATING THE SAME
#174Wafer level package (WLP) and method for forming the same
#175Methods and apparatus for solder connections
#176Semiconductor device
#177Backside redistribution layer (RDL) structure
#178Semiconductor device
#179Semiconductor device and method of manufacturing same
#180Semiconductor device and method of manufacturing the semiconductor device
#181Semiconductor device
#182Integrated fan-out package structures with recesses in molding compound
#183Semiconductor device and its manufacturing method
#184Methods of forming connector pad structures, interconnect structures, and structures thereof
#185Under bump metallurgy (UBM) and methods of forming same
#186Semiconductor device and manufacturing method thereof
#187Semiconductor devices with ball strength improvement
#188Semiconductor device and manufacturing method thereof
#189MOSFET with reduced resistance
#190Semiconductor package
#191Fan-out interconnect structure and method for forming same
#192Semiconductor device and method to minimize stress on stack via
#193Chip-on-wafer package and method of forming same
#194CHIP PACKAGE AND MANUFACTURING METHOD THEREOF
#195Semiconductor device
#196Image sensor packages and methods of fabricating the same
#197Semiconductor device
#198Chip module and method for forming the same
#199Chip package and method for forming the same
#200Semiconductor device and manufacturing method for the same
#201Chip mounting
#202Substrate structure and method of manufacturing the same
#203Semiconductor device and its manufacturing method
#204Integrated fan-out package structures with recesses in molding compound
#2053D interconnect structure comprising through-silicon vias combined with fine pitch backside metal redistribution lines fabricated using a dual damascene type approach
#206Method of forming a semiconductor component comprising a second passivation layer having a first opening exposing a bond pad and a plurality of second openings exposing a top surface of an underlying first passivation layer
#207Semiconductor device
#208Chip-on-wafer package and method of forming same
#209Polymer layers embedded with metal pads for heat dissipation
#210Semiconductor device
#211Semiconductor device
#212Semiconductor device, method for manufacturing the same, circuit substrate, electro-optical apparatus, and electronic equipment
#213Metal pillar bump packaging strctures and fabrication methods thereof
#214Method of forming package assembly
#215Packaged semiconductor devices and packaging methods
#216Self-alignment structure for wafer level chip scale package
#217Backside redistribution layer (RDL) structure
#218Methods for manufacturing a chip arrangement, methods for manufacturing a chip package, a chip package and chip arrangements
#219Semiconductor device and method of forming patterned repassivation openings between RDL and UBM to reduce adverse effects of electro-migration
#220Crack stopping structure in wafer level packaging (WLP)
#221Compensating for warpage of a flip chip package by varying heights of a redistribution layer on an integrated circuit chip
#222Semiconductor devices with ball strength improvement
#223Dam structure for enhancing joint yield in bonding processes
#224Chip package and method for forming the same
#225Chip package
#226Chip package and method for forming the same
#227Semiconductor device having a through-substrate via
#228Pad defined contact for wafer level package
#229Bumps for chip scale packaging including under bump metal structures with different diameters
#230Flexible routing for chip on board applications
#231Compensating for warpage of a flip chip package by varying heights of a redistribution layer on an integrated circuit chip
#232Glass carrier with embedded semiconductor device and metal layers on the top surface
#233Self-aligned protection layer for copper post structure
#234Semiconductor device with dummy metal protective structure around semiconductor die for localized planarization of insulating layer
#235Extrusion-resistant solder interconnect structures and methods of forming
#236Methods for manufacturing a chip arrangement, methods for manufacturing a chip package, a chip package and chip arrangements
#237CTE ADAPTION IN A SEMICONDUCTOR PACKAGE
#238Methods and apparatus for solder connections
#239Semiconductor device and method of forming the same
#240Conductive bump structure on substrate and fabrication method thereof
#241Integrated circuit chip using top post-passivation technology and bottom structure technology
#242Methods and apparatus for solder on slot connections in package on package structures
#243Post-passivation interconnect structure AMD method of forming same
#244Package assembly and method of forming the same
#245Semiconductor device having a through-substrate via
#246Semiconductor device and method of forming patterned repassivation openings between RDL and UBM to reduce adverse effects of electro-migration
#247Bumps for Chip Scale Packaging
#248Methods of and semiconductor devices with ball strength improvement
#249PACKAGING SUBSTRATE AND FABRICATION METHOD THEREOF
#250Method of fabricating backside-illuminated image sensor
#251Method for manufacturing a circuit device
#252Self-aligned protection layer for copper post structure
#253Composite layered chip package
#254Backside-illuminated image sensor having a supporting substrate
#255Layered chip package and method of manufacturing same
#256Layered chip package and method of manufacturing same
#257Semiconductor device having a trace comprises a beveled edge
#258INTERPOSER FILMS USEFUL IN SEMICONDUCTOR PACKAGING APPLICATIONS, AND METHODS RELATING THERETO
#259WIRE WRAP COMPOSITIONS AND METHODS RELATING THERETO
#260COVERLAY COMPOSITIONS AND METHODS RELATING THERETO
#261THERMALLY AND DIMENSIONALLY STABLE POLYIMIDE FILMS AND METHODS RELATING THERETO
#262Thin film transistor compositions, and methods relating thereto
#263ASSEMBLIES COMPRISING A POLYIMIDE FILM AND AN ELECTRODE, AND METHODS RELATING THERETO
#264DEVICE MOUNTING BOARD AND METHOD OF MANUFACTURING THE SAME, SEMICONDUCTOR MODULE, AND MOBILE DEVICE
#265Semiconductor device and method of forming B-stage conductive polymer over contact pads of semiconductor die in Fo-WLCSP
#266CRACK REDUCTION AT METAL/ORGANIC DIELECTRIC INTERFACE
#267Semiconductor device and method of forming the same
#268Wafer level chip package and a method of fabricating thereof
#269Chip structure having redistribution layer
#270Semiconductor component having a second passivation layer having a first opening exposing a bond pad and a plurality of second openings exposing a top surface of an underlying first passivation layer
#271Method of fabricating stacked chips in a semiconductor package
#272Semiconductor device and method of bonding different size semiconductor die at the wafer level
#273Semiconductor device and manufacturing method of the same
#274Semiconductor device and method of forming protective structure around semiconductor die for localized planarization of insulating layer
#275Compliant printed circuit wafer level semiconductor package
#276Semiconductor device and manufacturing method of semiconductor device
#277Embedded package and method for manufacturing the same
#278SEMICONDUCTOR DEVICE
#279Semiconductor device and method of forming B-stage conductive polymer over contact pads of semiconductor die in Fo-WLCSP
#280Semi-conductor chip with compressible contact structure and electronic package utilizing same
#281Semiconductor device and method of forming RDL wider than contact pad along first axis and narrower than contact pad along second axis
#282Semiconductor device and method of forming RDL over contact pad with high alignment tolerance or reduced interconnect pitch
#283Method of manufacturing wafer level package
#284Wafer level package and methods of fabricating the same
#285MICROELECTRONIC ASSEMBLIES HAVING COMPLIANCY
#286Semiconductor device and method of forming protective coating material over semiconductor wafer to reduce lamination tape residue
#287Electronic device package and fabrication method thereof
#288Semiconductor device, method of manufacturing thereof, circuit board and electronic apparatus
#289Image sensor package and fabrication method thereof
#290Circuit component with conductive layer structure
#291PACKAGING BOARD AND MANUFACTURING METHOD THEREFOR, SEMICONDUCTOR MODULE AND MANUFACTURING METHOD THEREFOR, AND PORTABLE DEVICE
#292Method for establishing and closing a trench of a semiconductor component
#293Semiconductor device and method for manufacturing the same
#294Semiconductor device and method for making the same
#295Method of fabricating backside-illuminated image sensor
#296Microelectronic assemblies having compliant layers
#297METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND MASK
#298Method of manufacturing semiconductor device
#299Self-aligned protection layer for copper post structure
#300Semiconductor integrated circuit device