ClassID:

209446

H01L2224/0333 - CPC Classification

Classification description:

Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by; Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto; Bonding areas; Manufacturing methods related thereto; Manufacturing methods by local deposition of the material of the bonding area in solid form

Sub-classes:
Recent Application in this class:
#1
20190148344
2019-05-16

Multiple plated via arrays of different wire heights on same substrate

#2
20180301436
2018-10-18

Multiple bond via arrays of different wire heights on a same substrate

#3
20170018525
2017-01-19

METHOD AND PROCESS FOR EMIB CHIP INTERCONNECTIONS

#4
20160336286
2016-11-17

Conductive connections, structures with such connections, and methods of manufacture

#5
20160049390
2016-02-18

Multiple bond via arrays of different wire heights on a same substrate

#6
20150380377
2015-12-31

Multiple bond via arrays of different wire heights on a same substrate

#7
20150325543
2015-11-12

Conductive connections, structures with such connections, and methods of manufacture

#8
20150325507
2015-11-12

Conductive connections, structures with such connections, and methods of manufacture

#9
20140225259
2014-08-14

Semiconductor module system having encapsulated through wire interconnect (TWI)

#10
20120288997
2012-11-15

Method for fabricating stacked semiconductor system with encapsulated through wire interconnects (TWI)

#11
20120043670
2012-02-23

Semiconductor module system having stacked components with encapsulated through wire interconnects (TWI)

#12
20110024745
2011-02-03

System with semiconductor components having encapsulated through wire interconnects (TWI)

#13
20100155938
2010-06-24

Face-to-face (F2F) hybrid structure for an integrated circuit

#14
20100047934
2010-02-25

Method for fabricating semiconductor component having encapsulated through wire interconnect (TWI)

#15
20070246819
2007-10-25

Semiconductor components having encapsulated through wire interconnects (TWI)