ClassID:

210772

H01L2224/80012 - CPC Classification

Classification description:

Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by; Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected by connecting a bonding area directly to another bonding area, i.e. connectorless bonding, e.g. bumpless bonding; Pre-treatment of the bonding area; Cleaning the bonding area, e.g. oxide removal step, desmearing Mechanical cleaning, e.g. abrasion using hydro blasting, brushes, ultrasonic cleaning, dry ice blasting, gas-flow

Recent Application in this class:
#1
20250336883
2025-10-30

APPARATUS AND BONDING PROCESS FOR WAFER BONDING

#2
20250246575
2025-07-31

Apparatus and Bonding Process for Wafer Bonding

#3
20250105204
2025-03-27

HETEROGENEOUS CHIP STACKING METHOD

#4
20250105202
2025-03-27

HETEROGENEOUS CHIP STACKING DEVICE

#5
20250105186
2025-03-27

HETEROGENEOUS CHIP STACKING STRUCTURE

#6
20240421117
2024-12-19

BONDING APPARATUS, BONDING METHOD AND ARTICLE MANUFACTURING METHOD

#7
20240021572
2024-01-18

DIE PROCESSING

#8
20240006301
2024-01-04

SEMICONDUCTOR PACKAGE

#9
20230275062
2023-08-31

BONDING APPARATUS, BONDING SYSTEM, AND BONDING METHOD

#10
20230087198
2023-03-23

HYBRID BONDING APPARATUS AND HYBRID BONDING METHOD USING THE SAME

#11
20210233888
2021-07-29

Die processing

#12
20200321307
2020-10-08

Die processing

#13
20190371761
2019-12-05

Die processing

#14
20190189588
2019-06-20

Die processing

#15
20180308819
2018-10-25

Die processing

#16
20170221856
2017-08-03

Method for bonding substrates together, and substrate bonding device

#17
20170179066
2017-06-22

BULK SOLDER REMOVAL ON PROCESSOR PACKAGING

#18
20160358882
2016-12-08

Wafer bonding process and structure

#19
20160293567
2016-10-06

Hybrid bonding system and cleaning method thereof

#20
20140015088
2014-01-16

Three-dimensional integrated structure capable of detecting a temperature rise

#21
20130153093
2013-06-20

Treatment, before the bonding of a mixed Cu-oxide surface, by a plasma containing nitrogen and hydrogen

#22
20130020718
2013-01-24

MEMS devices and methods of forming same

#23
20080194077
2008-08-14

Method of low temperature wafer bonding through Au/Ag diffusion

#24
20070117258
2007-05-24

Method for the molecular bonding of microelectronic components to a polymer film