ClassID:

210911

H01L2224/80905 - CPC Classification

Classification description:

Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by; Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected by connecting a bonding area directly to another bonding area, i.e. connectorless bonding, e.g. bumpless bonding Combinations of bonding methods provided for in at least two different groups from  - 

Sub-classes:
Recent Application in this class:
#1
20250357457
2025-11-20

THREE DIMENSIONAL (3D) CHIPLET AND METHODS FOR FORMING THE SAME

#2
20250349624
2025-11-13

SEMICONDUCTOR PACKAGE AND METHOD OF FORMING SAME

#3
20250273632
2025-08-28

3D TRENCH CAPACITOR FOR INTEGRATED PASSIVE DEVICES

#4
20240387419
2024-11-21

DIRECT HYBRID BOND PAD HAVING TAPERED SIDEWALL

#5
20240363566
2024-10-31

ELECTRONIC DEVICES AND METHODS OF MANUFACTURING ELECTRONIC DEVICES

#6
20240088103
2024-03-14

3D TRENCH CAPACITOR FOR INTEGRATED PASSIVE DEVICES

#7
20230420437
2023-12-28

THREE DIMENSIONAL (3D) CHIPLET AND METHODS FOR FORMING THE SAME

#8
20230411344
2023-12-21

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

#9
20230360950
2023-11-09

GANG-FLIPPING OF DIES PRIOR TO BONDING

#10
20230040030
2023-02-09

Semiconductor Package and Method of Forming Same

#11
20220384327
2022-12-01

Semiconductor device and method of manufacture

#12
20220320035
2022-10-06

DIRECT BONDING METHODS AND STRUCTURES

#13
20220278063
2022-09-01

Semiconductor device and method of manufacturing

#14
20220173038
2022-06-02

BONDING ALIGNMENT MARKS AT BONDING INTERFACE

#15
20220115358
2022-04-14

3D trench capacitor for integrated passive devices

#16
20220059482
2022-02-24

Semiconductor devices having adjoined via structures formed by bonding and methods for forming the same

#17
20210296283
2021-09-23

3D trench capacitor for integrated passive devices

#18
20210143115
2021-05-13

Bonded assembly containing a dielectric bonding pattern definition layer and methods of forming the same

#19
20210134748
2021-05-06

Semiconductor devices having adjoined via structures formed by bonding and methods for forming the same

#20
20210072653
2021-03-11

Bonding alignment marks at bonding interface

#21
20210005561
2021-01-07

Semiconductor device and method of manufacturing

#22
20200388563
2020-12-10

Semiconductor device and method of manufacture

#23
20200343236
2020-10-29

Multi-chip package with offset 3D structure

#24
20200159133
2020-05-21

Bonding alignment marks at bonding in interface

#25
20200118915
2020-04-16

Semiconductor device packaging structure having through interposer vias and through substrate vias

#26
20200075521
2020-03-05

Serializer-deserializer die for high speed signal interconnect

#27
20190326273
2019-10-24

Multi-chip package with offset 3D structure

#28
20190244947
2019-08-08

Method of manufacturing semiconductor device packaging structure having through interposer vias and through substrate vias

#29
20190237429
2019-08-01

Hybrid wafer-to-wafer bonding and methods of surface preparation for wafers comprising an aluminum metalization

#30
20190164919
2019-05-30

Semiconductor device and method of manufacturing

#31
20190131255
2019-05-02

Seal ring for bonded dies

#32
20180350775
2018-12-06

3D chip sharing clock interconnect layer

#33
20180005977
2018-01-04

Method for forming hybrid bonding with through substrate via (TSV)

#34
20150228535
2015-08-13

Bonded processed semiconductor structures and carriers

#35
20150021789
2015-01-22

Hybrid bonding with through substrate via (TSV)

#36
20130256907
2013-10-03

Bonded processed semiconductor structures and carriers

#37
20130153093
2013-06-20

Treatment, before the bonding of a mixed Cu-oxide surface, by a plasma containing nitrogen and hydrogen

#38
20120013013
2012-01-19

Methods of forming bonded semiconductor structures using a temporary carrier having a weakened ion implant region for subsequent separation along the weakened region

#39
20110086468
2011-04-14

ASSEMBLY OF SEMICONDUCTOR CHIPS/WAFERS