207728 ⎘
Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure
Extended via semiconductor structure and device
#3002INTERCONNECT STRUCTURE
#3003INTEGRATED CIRCUIT WITH GETTER LAYER FOR HYDROGEN ENTRAPMENT
#3004Semiconductor memory device
#3005SEMICONDUCTOR DEVICE AND DATA STORAGE SYSTEM INCLUDING THE SAME
#3006SEMICONDUCTOR MEMORY DEVICE
#3007Hybrid integrated circuit package
#3008Photonic semiconductor device and method
#3009LOGIC DRIVE BASED ON CHIP SCALE PACKAGE COMPRISING STANDARDIZED COMMODITY PROGRAMMABLE LOGIC IC CHIP AND MEMORY IC CHIP
#3010STRUCTURES AND METHODS FOR REDUCING THERMAL EXPANSION MISMATCH DURING INTEGRATED CIRCUIT PACKAGING
#3011Chemical direct pattern plating method
#3012Semiconductor devices including line identifier
#3013CONDUCTIVE STRUCTURES AND METHODS OF FABRICATION THEREOF
#3014Interconnection structure and manufacturing method thereof
#3015ENHANCED LINERLESS VIAS
#3016SEMICONDUCTOR CHIP AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME
#3017METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE INCLUDING INTERLAYER INSULATING FILMS HAVING DIFFERENT YOUNGS MODULUS
#3018Air gaps in memory array structures
#3019SEMICONDUCTOR STORAGE DEVICE
#3020METHOD OF FABRICATING A SEMICONDUCTOR DEVICE INCLUDING CONTACT PLUG AND SEMICONDUCTOR DEVICE
#3021Multi-dimensional photonic integrated circuits and memory structure having optical components mounted on multiple planes of a multi-dimensional package
#3022Buried power rail formation for vertical field effect transistors
#3023TRENCH ISOLATION FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION
#3024SEMICONDUCTOR DEVICE, NONVOLATILE MEMORY DEVICE INCLUDING THE SAME, AND ELECTRONIC SYSTEM INCLUDING THE SAME
#3025Metal-insulator-metal (MIM) capacitor module including a cup-shaped structure with a rounded corner region
#3026Metal-insulator-metal (MIM) capacitor including an insulator cup and laterally-extending insulator flange
#3027STANDARD CELL ARCHITECTURE WITHOUT POWER DELIVERY SPACE ALLOCATION
#3028INTERLAYER DIELECTRIC STACK OPTIMIZATION FOR WAFER BOW REDUCTION
#3029INTERCONNECTOR AND ELECTRONIC APPARATUS INCLUDING THE SAME
#3030SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SAME
#3031Semiconductor device structure and methods of forming the same
#3032Methods of forming a microelectronic device
#3033Semiconductor device with multi-stacking carrier structure
#3034Multi-stacking carrier structure and method for fabricating the same
#3035Method to create MIMcap designs across changing MIMcap structures
#30363D semiconductor device and structure
#3037Surface modification layer for conductive feature formation
#3038FORMATION METHOD OF SEMICONDUCTOR DEVICE WITH STACKED CONDUCTIVE STRUCTURES
#3039CIRCUIT INTERCONNECT STRUCTURE
#3040Memory arrays comprising strings of memory cells and methods used in forming a memory array comprising strings of memory cells
#3041Memory arrays comprising strings of memory cells and methods used in forming a memory array comprising strings of memory cells
#3042MULTIPORT MEMORY CELLS INCLUDING STACKED ACTIVE LAYERS
#3043THREE-DIMENSIONAL NON-VOLATILE MEMORY DEVICE WITH FILAMENT CONFINEMENT
#3044EMBEDDED MEMORY WITH FERROELECTRIC CAPACITORS & INDEPENDENT TOP PLATE LINES
#3045Semiconductor device and manufacturing method of semiconductor device
#3046INTEGRATED CIRCUIT DEVICE
#3047TRANSFORMERS BASED ON BURIED POWER RAIL TECHNOLOGY
#3048REPLACEMENT DEEP VIA AND BURIED OR BACKSIDE POWER RAIL WITH BACKSIDE INTERCONNECT STRUCTURE
#3049BACKSIDE POWER DELIVERY NETWORK AND SIGNAL ROUTING
#3050Semiconductor device for RF integrated circuit
#3051ISO-LEVEL VIAS FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION
#3052LINE FORMATION WITH SMALL TIP SPACING
#3053BACK-END-OF-LINE THIN FILM RESISTOR
#3054Interconnect structure for logic circuit
#3055SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
#3056ELECTRONIC DEVICES WITH A LOW DIELECTRIC CONSTANT
#3057STAGGERED VERTICALLY SPACED INTEGRATED CIRCUIT LINE METALLIZATION WITH DIFFERENTIAL VIAS & METAL-SELECTIVE DEPOSITION
#3058FILL OF VIAS IN SINGLE AND DUAL DAMASCENE STRUCTURES USING SELF-ASSEMBLED MONOLAYER
#3059Package structure with interposer encapsulated by an encapsulant
#3060BURIED POWER RAILS INTEGRATED WITH DECOUPLING CAPACITANCE
#3061INDUCTORS AND TRANSFORMERS FORMED BY BURIED POWER RAILS
#3062Configurable metal—insulator—metal capacitor and devices
#3063VIA FORMATION IN AN INTEGRATED CIRCUIT
#3064ISOLATION OF SEMICONDUCTOR DEVICES BY BURIED SEPARATION RAILS
#3065Metallization Process for an Integrated Circuit
#3066INTERCONNECT LINE STRUCTURES WITH METAL CHALCOGENIDE CAP MATERIALS
#3067DECOUPLED INTERCONNECTS
#3068SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR MEMORY DEVICE
#3069SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#3070Semiconductor device
#3071Method of manufacturing semiconductor device
#3072Semiconductor device
#3073Back end of line nanowire power switch transistors
#3074ANGLED VIA FOR TIP TO TIP MARGIN IMPROVEMENT
#3075Back-end-of-line passive device structure having common connection to ground
#3076Methods of manufacturing semiconductor packages
#3077Package and method of fabricating the same
#3078Memory device
#3079Method and apparatus for electromigration reduction
#3080SEMICONDUCTOR MEMORY DEVICE
#3081Multilayer-type on-chip inductor structure
#3082Apparatuses including device structures including pillar structures
#3083Redistribution substrate, method of fabricating the same, and semiconductor package including the same
#3084SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#3085TOP VIA INTERCONNECT STRUCTURE WITH TEXTURE SUPPRESSION LAYERS
#3086DOPANT-FREE INHIBITOR FOR AREA SELECTIVE DEPOSITIONS
#3087BARRIER LINER FREE INTERFACE FOR METAL VIA
#3088Through via structure
#3089Semiconductor wafer seal ring having protrusion extending into trench in semiconductor substrate
#3090VIA ALIGNMENT IN SINGLE DAMASCENE STRUCTURE
#3091Method and IC design with non-linear power rails
#3092Semiconductor device and a method of manufacturing the same
#3093DIELECTRIC PLANARIZATION USING A METAL OVERBURDEN WITH ETCH-STOP LAYERS
#3094ETCH STOP LAYER FOR BACKSIDE PROCESSING ARCHITECTURE
#3095METHOD FOR FORMING CONTACT STRUCTURE, SEMICONDUCTOR STRUCTURE AND MEMORY
#3096SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
#3097SUBSTRATE PACKAGE WITH GLASS DIELECTRIC
#3098Modified top electrode contact for MRAM embedding in advanced logic nodes
#3099Integrated circuit including standard cells, method of manufacturing the integrated circuit, and computing system for performing the method
#3100TOP ELECTRODE TO METAL LINE CONNECTION FOR MAGNETO-RESISTIVE RANDOM-ACCESS MEMORY STACK HEIGHT REDUCTION
#3101Guard Ring Design For Through Via
#3102Semiconductor device including vertical routing structure and method for manufacturing the same
#3103Package structure and method of manufacturing the same
#3104Semiconductor device having integral alignment marks with decoupling features and method for fabricating the same
#3105Semiconductor device and manufacturing method thereof
#3106Methods of forming microelectronic devices, and related microelectronic devices, memory devices, and electronic systems
#3107VIA MANUFACTURING METHOD
#3108INTERCONNECT STRUCTURE OF A SEMICONDUCTOR COMPONENT AND METHODS FOR PRODUCING THE STRUCTURE
#3109SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SEMICONDUCTOR DEVICE
#3110INTEGRATED CIRCUIT DEVICE
#3111DELAMINATION CONTROL OF DIELECTRIC LAYERS OF INTEGRATED CIRCUIT CHIPS
#3112BEOL INTERCONNECT SUBTRACTIVE ETCH SUPER VIA
#3113Semiconductor device structure with stacked conductive plugs and method for preparing the same
#3114Etch Back and Film Profile Shaping of Selective Dielectric Deposition
#3115ADVANCED METAL INTERCONNECT
#3116ACCURATE METAL LINE AND VIA HEIGHT CONTROL FOR TOP VIA PROCESS
#3117SEMICONDUCTOR INTERCONNECTION STRUCTURES AND METHODS OF FORMING THE SAME
#3118VIA PROFILE SHRINK FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION
#3119TOP VIA WITH PROTECTIVE LINER
#3120LINER-LESS VIA CONTACT
#3121SUBTRACTIVE LINE WITH DAMASCENE TOP VIA
#3122Semiconductor device
#3123METHOD OF FORMING LOW-RESISTIVITY RU ALD THROUGH A BI-LAYER PROCESS AND RELATED STRUCTURES
#3124Integrated structures comprising vertical channel material and having conductively-doped semiconductor material directly against lower sidewalls of the channel material
#3125Semiconductor device and manufacturing method thereof
#3126SEMICONDUCTOR COMPONENT INCLUDING BACK SIDE INPUT/OUTPUT SIGNAL ROUTING
#3127SEMICONDUCTOR DEVICE INCLUDING VIA STRUCTURE
#3128SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME
#3129SINGLE-DAMASCENE INTERCONNECT HAVING CONTROL OVER CORROSION, DIELECTRIC DAMAGE, CAPACITANCE, AND RESISTANCE
#3130BEOL TOP VIA WIRINGS WITH DUAL DAMASCENE VIA AND SUPER VIA REDUNDANCY
#3131Flexible transistors with near-junction heat dissipation
#3132Interconnection Structure for a Semiconductor Device
#3133DUAL-DAMASCENE FAV INTERCONNECTS WITH DIELECTRIC PLUG
#3134SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THEREOF
#3135TESTING STRUCTURE FOR AN INTEGRATED CHIP HAVING A HIGH-VOLTAGE DEVICE
#3136MAGNETORESISTIVE RANDOM-ACCESS MEMORY (MRAM) WITH PRESERVED UNDERLYING DIELECTRIC LAYER
#3137SEMICONDUCTOR MEMORY DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME
#3138Semiconductor memory devices and methods for fabricating the same
#3139Three dimensional memory device containing resonant tunneling barrier and high mobility channel and method of making thereof
#3140Semiconductor device and manufacturing method thereof including a conductive-material etching process to further adjust a via shape
#3141Semiconductor apparatus and equipment
#3142Method of forming semiconductor device including deep vias
#3143STACK TYPE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#3144Partial subtractive supervia enabling hyper-scaling
#3145SEMICONDUCTOR STRUCTURE, ELECTRONIC DEVICE, AND MANUFACTURE METHOD FOR SEMICONDUCTOR STRUCTURE
#3146Wet Cleaning with Tunable Metal Recess for Via Plugs
#3147METHOD OF FORMING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE
#3148REPLACEMENT CONDUCTIVE MATERIAL FOR INTERCONNECT FEATURES
#3149Reliability Macros for Contact Over Active Gate Layout Designs
#3150Monitoring copper corrosion in an integrated circuit device
#3151METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
#3152Vertical memory devices
#3153Four CPP wide memory cell with buried power grid, and method of fabricating same
#3154Dual damascene structure in forming source/drain contacts
#3155Semiconductor device and method for manufacturing the same
#3156SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR DEVICE
#3157Forming Dielectric Film With High Resistance to Tilting
#3158Graphene liners and caps for semiconductor structures
#3159Layouts for conductive layers in integrated circuits
#3160MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
#3161Interconnect Structures
#3162Stacked field-effect transistors with a shielded output
#3163Semiconductor device with integrated metal-insulator-metal capacitors
#3164CELL HAVING STACKED PICK-UP REGION
#3165Seal ring between interconnected chips mounted on an integrated circuit
#3166Self-aligned contacts
#3167Conductive structures with barriers and liners of varying thicknesses
#3168INTERCONNECTION STRUCTURE AND METHODS OF FORMING THE SAME
#3169Semiconductor device structure and methods of forming the same
#3170SEMICONDUCTOR DEVICE STRUCTURE WITH PROTECTION CAP
#3171Memory devices including strings of memory cells, and related electronic systems
#3172SEMICONDUCTOR MEMORY DEVICES, ELECTRONIC SYSTEMS INCLUDING THE SAME AND FABRICATING METHODS OF THE SAME
#3173SEMICONDUCTOR STRUCTURE AND METHOD OF FABRICATING THE SAME
#3174Via Structures
#3175Die interconnect substrate, an electrical device and a method for forming a die interconnect substrate
#3176INTERCONNECTS FORMED USING INTEGRATED DAMASCENE AND SUBTRACTIVE ETCH PROCESSING
#3177Maskless alignment scheme for BEOL memory array manufacturing
#3178Semiconductor device and fabrication method thereof
#3179MEMORY CELL ARRAY INCLUDING PARTITIONED DUAL LINE STRUCTURE AND DESIGN METHOD THEREOF
#3180DAMASCENE INTERCONNECT SPACER TO FACILITATE GAP FILL
#3181Electronic fuse structure embedded in top via
#3182Contact over active gate structures for advanced integrated circuit structure fabrication
#31833D NAND flash memory devices, and related electronic systems
#3184Memory arrays and methods used in forming a memory array comprising strings of memory cells
#3185INTEGRATED CIRCUIT INTERCONNECT STRUCTURES INCLUDING COPPER-FREE VIAS
#31863D NAND MEMORY DEVICE AND FORMING METHOD THEREOF
#3187Method for preparing semiconductor device structure with silicide portion between conductive plugs
#3188Preparation method for leads of semiconductor structure, and semiconductor structure
#3189DUMMY PATTERN STRUCTURE FOR REDUCING DISHING
#3190Semiconductor device structure with stacked conductive plugs and method for preparing the same
#3191Semiconductor structures and methods of forming the same
#3192Integrated circuit device and method of manufacturing the same
#3193Logic drive based on standardized commodity programmable logic semiconductor IC chips
#3194DUAL DAMASCENE FULLY-ALIGNED VIA INTERCONNECTS WITH DUAL ETCH LAYERS
#3195Power delivery for embedded bridge die utilizing trench structures
#3196Integrated Circuitry, Memory Circuitry Comprising Strings Of Memory Cells, And Method Of Forming Integrated Circuitry
#3197SEMICONDUCTOR INTERCONNECT STRUCTURES AND METHODS OF FORMATION
#3198SELF-ALIGNED DOUBLE PATTERNING (SADP) INTEGRATION WITH WIDE LINE SPACING
#3199INTERCONNECT SUBSTRATE, METHOD OF MANUFACTURING THE SAME, AND SEMICONDUCTOR APPARATUS
#3200FULLY-ALIGNED AND DIELECTRIC DAMAGE-LESS TOP VIA INTERCONNECT STRUCTURE
#3201Three-dimensional memory device having staircase structure and method for forming the same
#3202INTERCONNECTS WITH LINER THAT RESONATES DURING MICROWAVE ANNEAL
#3203Backside metal-insulator-metal (MIM) capacitors extending through backside interlayer dielectric (BILD) layer or semiconductor layer and partly through dielectric layer
#3204Semiconductor device with early buried power rail (BPR) and backside power distribution network (BSPDN)
#3205Semiconductor device and layout method of the same
#3206GATE LINE PLUG STRUCTURES FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION
#3207Localized high density substrate routing
#3208Skip level vias in metallization layers for integrated circuit devices
#3209SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
#3210Integrated inductor with inductor wire formed in an integrated circuit layer stack
#3211INTEGRATED INDUCTOR INCLUDING MULTI-COMPONENT VIA LAYER INDUCTOR ELEMENT
#3212HIGH ASPECT RATIO VIA FILL PROCESS EMPLOYING SELECTIVE METAL DEPOSITION AND STRUCTURES FORMED BY THE SAME
#3213SEMICONDUCTOR DEVICE WITH POLYGONAL INDUCTIVE DEVICE
#3214FIN PATTERNING FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION
#3215DIFFUSION PREVENTION SPACER
#3216SEMICONDUCTOR STRUCTURE AND METHOD FOR FABRICATING SAME
#3217DEVICES INCLUDING CAPACITOR COUPLING POWER PATH TO GROUND PATH AND ASSOCIATED COMPONENTS AND SYSTEMS
#3218Interconnect including integrally formed capacitor
#3219Semiconductor device including interconnection structure including MXene and method of manufacturing the same
#32203D RAM SL/BL contact modulation
#3221SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
#3222Nitrogen plasma treatment for improving interface between etch stop layer and copper interconnect
#3223Integrated circuit and method of generating integrated circuit layout
#3224Memory device, semiconductor device, and manufacturing method thereof
#3225Interconnect substrate having groove around pad
#3226Device layout design for improving device performance
#3227COPPER INTERCONNECTS WITH AN EMBEDDED DIELECTRIC CAP BETWEEN LINES
#3228Semiconductor device, circuit board structure and manufacturing method thereof
#3229Semiconductor memory device and erasing method of the semiconductor memory device
#3230CONVERTIBLE INTERCONNECT BARRIER
#3231NON-VOLATILE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
#3232Method of manufacturing a semiconductor device
#3233HYBRID METHOD FOR FORMING SEMICONDUCTOR INTERCONNECT STRUCTURE
#3234LAYER STRUCTURES FOR MAKING DIRECT METAL-TO-METAL BONDS AT LOW TEMPERATURES IN MICROELECTRONICS
#3235Semiconductor structure with a bit line in a different configuration than a local interconnect line
#3236Etch method for opening a source line in flash memory
#3237Memory device including multiple decks of memory cells and pillars extending through the decks
#3238Fin Field Effect Transistor (FinFET) Device Structure with Interconnect Structure
#3239TOP VIA STRUCTURE MADE WITH BI-LAYER TEMPLATE
#3240Method of manufacturing semiconductor device
#3241Semiconductor device and manufacturing method thereof
#3242Structure And Method For Finfet Device With Contact Over Dielectric Gate
#3243Integrated circuit, system and method of forming the same
#3244Semiconductor device and method for manufacturing same
#3245SEMICONDUCTOR MEMORY DEVICE, METHOD FOR FABRICATING THE SAME AND ELECTRONIC SYSTEM INCLUDING THE SAME
#3246Methods for forming conductive vias, and associated devices and systems
#3247Middle-end-of-line strap for standard cell
#3248PIC die with optical deflector for ambient light
#3249Mobile casino jackpot payment reporting system with secure form reporting to customer
#3250Semiconductor device and semiconductor package
#3251RECESSED VERTICAL INTERCONNECTS FOR DEVICE MINIATURIZATION
#3252Metal capping layer and methods thereof
#3253Strap-cell architecture for embedded memory
#3254Inverted integrated circuit and method of forming the same
#3255Semiconductor device with multiple polarity groups
#3256Semiconductor device with airgap spacer formation from backside of wafer
#32573D CIRCUIT STRUCTURE WITH STAIRSTEP CONTACT CONFIGURATION
#3258Method for forming photonic integrated package
#3259Semiconductor device having a carbon containing insulation layer formed under the source/drain
#3260Integrated circuits (ICs) employing directly coupled metal lines between vertically-adjacent interconnect layers for reduced coupling resistance, and related methods
#3261GALLIUM NITRIDE TRANSISTORS WITH RELIABILITY ENHANCEMENTS
#3262Structures for Three-Dimensional CMOS Integrated Circuit Formation
#3263SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SEMICONDUCTOR DEVICE
#3264SEMICONDUCTOR DEVICES
#3265Integrated circuit packages with ring-shaped substrates
#3266Semiconductor device and method forming the same
#3267LOW VERTICAL RESISTANCE SINGLE DAMASCENE INTERCONNECT
#3268Middle-end-of-line strap for standard cell
#3269Semiconductor device
#3270INTERCONNECT STRUCTURES WITH NITROGEN-RICH DIELECTRIC MATERIAL INTERFACES FOR LOW RESISTANCE VIAS IN INTEGRATED CIRCUITS
#3271Staircase formation in three-dimensional memory device
#3272Self-aligned contacts in three-dimensional memory devices and methods for forming the same
#3273Semiconductor device
#3274Heterogeneous metal line compositions for advanced integrated circuit structure fabrication
#3275SIMULTANEOUS FILLING OF VARIABLE ASPECT RATIO SINGLE DAMASCENE CONTACT TO GATE AND TRENCH VIAS WITH LOW RESISTANCE BARRIERLESS SELECTIVE METALLIZATION
#3276Wire bond damage detector including a detection bond pad over a first and a second connected structures
#3277Dual color via patterning
#3278Buried power rails located in a base layer including first, second, and third etch stop layers
#3279SEMICONDUCTOR DEVICE
#3280ORGANIC FILM STRESS BUFFER FOR INTERFACE OF METAL AND DIELECTRIC
#3281Subtractive Skip-Level Power via Adjacent Recessed Damascene Signal Lines
#3282Manufacturing method of active device substrate
#3283SEMICONDUCTOR DEVICES AND DATA STORAGE SYSTEMS INCLUDING THE SAME
#3284Methods of forming microelectronic devices
#3285SEMICONDUCTOR CHIPS HAVING RECESSED REGIONS
#3286Capping layer for liner-free conductive structures
#3287SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING THEREOF
#3288Top via process with damascene metal
#3289GLASS SUBSTRATES HAVING PARTIALLY EMBEDDED CONDUCTIVE LAYERS FOR POWER DELIVERY IN SEMICONDUCTOR PACKAGES AND RELATED METHODS
#3290CAPACITOR STRUCTURE AND MANUFACTURING METHOD THEREOF
#3291Semiconductor devices
#3292Semiconductor structure with doped via plug
#3293Gate contact inside gate cut trench
#3294Backside electrical contacts to buried power rails
#3295Electronic Package with Components Mounted at Two Sides of a Layer Stack
#32963D MEMORY DEVICE
#3297Semiconductor package and method of manufacturing the same
#3298Semiconductor package structure and method for manufacturing the same
#3299Standard cell design architecture for reduced voltage droop utilizing reduced contacted gate poly pitch and dual height cells
#3300Semiconductor devices and methods of manufacturing