207728 ⎘
Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure
Memory arrays and methods used in forming a memory array comprising strings of memory cells
#5702Transistors including two-dimensional materials
#5703Layout of static random access memory periphery circuit
#5704Semiconductor device package and method of manufacturing the same
#5705Semiconductor package
#5706BARRIER MATERIALS BETWEEN BUMPS AND PADS
#5707Methods for reducing dual damascene distortion
#5708Integrated circuit device and method of manufacturing the same
#5709Semiconductor device and oscillator
#5710Multifunctional molecules for selective polymer formation on conductive surfaces and structures resulting therefrom
#5711Three-dimensional memory device containing horizontal and vertical word line interconnections and methods of forming the same
#5712Graphene enabled selective barrier layer formation
#5713Semiconductor devices and methods of forming the same
#5714Interconnect structures with low-aspect-ratio contact vias
#5715Semiconductor structure and manufacturing method thereof
#5716Semiconductor package and semiconductor device
#5717Semiconductor chip including low-k dielectric layer
#5718Interconnect device and method
#5719Semiconductor structure and manufacturing method thereof
#5720Sensor package and method
#5721Barrier-Less Structures
#5722Semiconductor device and fabrication method thereof
#5723Semiconductor device with air spacer and method for preparing the same
#5724Capacitor device and manufacturing method therefor
#5725Semiconductor device with air gap structure and method for preparing the same
#5726Integrated assemblies comprising vertically-stacked decks
#5727Semiconductor package including stacked semiconductor chips
#5728Pad structure and manufacturing method thereof in semiconductor device
#5729Semiconductor device and method for forming the same
#5730Prevention of contact bottom void in semiconductor fabrication
#5731Subtractive plug and tab patterning with photobuckets for back end of line (BEOL) spacer-based interconnects
#5732Interconnect structure having fully aligned vias
#5733Self-aligned top via scheme
#5734Metal contact structure and method of forming the same in a semiconductor device
#5735FinFET device with contact over dielectric gate
#5736Dual metal gate structure having portions of metal gate layers in contact with a gate dielectric
#5737Semiconductor circuit with metal structure and manufacturing method
#5738Three-dimensional vertical NOR flash thin-film transistor strings
#5739Vertical memory devices and methods of manufacturing the same
#5740Interconnect structure of three-dimensional memory device
#5741Die stacks and methods forming same
#5742Package structure and manufacturing method thereof
#5743Semiconductor structure and manufacturing method thereof
#5744Vertical semiconductor devices
#5745Method of testing wafer
#5746Helmet structures for semiconductor interconnects
#5747Semiconductor device, package structure including a heat dissipation element having a conductive base and a plurality of antenna patterns and method of fabricating the semiconductor device
#5748Semiconductor interconnect structure with double conductors
#5749Semiconductor apparatus and equipment
#5750Semiconductor device
#5751Vertical interconnect elevator based on through silicon vias
#5752Semiconductor device including via and wiring
#5753Semiconductor device and method for manufacturing same
#5754Semiconductor device
#5755Dual metal silicide structures for advanced integrated circuit structure fabrication
#5756Semiconductor structure and formation method thereof
#5757Top via interconnects with wrap around liner
#5758MULTI-HEIGHT INTERCONNECT TRENCHES FOR RESISTANCE AND CAPACITANCE OPTIMIZATION
#5759Semiconductor structure having air gap dielectric and the method of preparing the same
#5760COMPOSITION FOR COBALT PLATING COMPRISING ADDITIVE FOR VOID-FREE SUBMICRON FEATURE FILLING
#5761Antenna package structure and antenna packaging method
#5762Tape, encapsulating process and optical device
#5763Interconnect layout for semiconductor device
#5764Memory device and semiconductor die, and method of fabricating memory device
#5765Nonvolatile memory device having a vertical structure and a memory system including the same
#5766Three-dimensional semiconductor device
#5767Three-dimensional semiconductor memory device
#5768Nonvolatile memory device and method for fabricating the same
#5769Three-dimensional memory device containing a silicon nitride ring in an opening in a memory film and method of making the same
#5770Vertical memory devices
#5771Microelectronic packages with high integration microelectronic dice stack
#5772Package structure and assembly structure
#5773Adhesive bonding composition and electronic components prepared from the same
#5774Electronic apparatus and manufacturing method thereof
#5775Integrated circuit device with through interconnect via and methods of manufacturing the same
#5776Adjustable via dimension and chamfer angle
#5777Semiconductor device
#5778Wiring structure having an intermediate layer between an upper conductive structure and conductive structure
#5779Semiconductor package
#5780Methods for forming self-aligned interconnect structures
#5781Interconnect structure having an etch stop layer over conductive lines
#5782Memory cell with top electrode via
#5783Capacitor Structure
#5784Wafer structure with capacitive chip interconnection, method for manufacturing the same, and chip structure with capacitive chip interconnection
#5785Multi-die package structures including redistribution layers
#5786Semiconductor device with guard ring
#5787Three-dimensional memory device including self-aligned dielectric isolation regions for connection via structures and method of making the same
#5788Integrated circuit having a high cell density
#5789Interconnect and memory structures formed in the BEOL
#5790Method of forming a multi-level interconnect structure in a semiconductor device
#5791Semiconductor device and method of manufacturing the same
#5792Semiconductor memory device and manufacturing method of the semiconductor memory device
#5793Semiconductor device and method for fabricating the same
#5794Semiconductor device and method for fabricating the same
#5795Semiconductor memory device
#5796Method, apparatus and system for wide metal line for SADP routing
#5797Magnetic memory cell
#5798Three-dimensional semiconductor memory device and manufacturing method of the three-dimensional semiconductor memory device
#5799Three-dimensional semiconductor devices
#5800Semiconductor memory device and manufacturing method thereof
#5801Semiconductor memory device
#5802Semiconductor structure and method for manufacturing the same
#5803Package structure, chip structure and method of fabricating the same
#5804Coupled line structures for wideband applications
#5805Semiconductor structure and fabrication method thereof
#5806Random cut patterning
#5807Methods and apparatus for forming dual metal interconnects
#5808Dual-gate trench IGBT with buried floating P-type shield
#5809Self-aligned contacts in three-dimensional memory devices and methods for forming the same
#5810Metallization layer formation process
#5811Semiconductor structure and manufacturing method thereof
#5812Semiconductor devices including contact plugs
#5813Integrated circuit having a single damascene wiring network
#5814Method of forming semiconductor device having a dual material redistribution line and semiconductor device
#5815Fin field effect transistor (FinFET) device structure with interconnect structure
#58163D semiconductor device and structure
#5817Power amplifier with shielded transmission lines
#5818Semiconductor structure and associated fabricating method
#5819Plugs for interconnect lines for advanced integrated circuit structure fabrication
#5820High density capacitor implemented using FinFET
#5821Semiconductor device
#5822Semiconductor structure
#5823Package structure with reinforcement structures in a redistribution circuit structure and manufacturing method thereof
#5824Standard cell and an integrated circuit including the same
#5825Interconnect structures having lines and vias comprising different conductive materials
#5826Etch stop layer-based approaches for conductive via fabrication and structures resulting therefrom
#5827Semiconductor device and method of manufacturing a semiconductor device
#5828Semiconductor device with elongated pattern
#5829Method for manufacturing an interconnect structure having a selectively formed bottom via
#5830Integrated circuit package and method
#5831Three-dimensional logic circuit
#5832Magnetoresistive random access memory device and method of manufacturing the same
#5833Semiconductor devices
#5834Three-dimensional semiconductor memory device
#5835Memory cell structure of a three-dimensional memory device
#5836Semiconductor storage device
#5837Semiconductor package
#5838Chip package structure
#5839Semiconductor device
#5840Semiconductor device
#5841Interconnection structure and method of manufacturing the same, and electronic device including the interconnection structure
#5842Integrated circuit device and method of manufacturing the same
#5843Semiconductor device with through-substrate via and its method of manufacture
#5844Interconnect structure and manufacturing method for the same
#5845Semiconductor device including a passivation spacer and method of fabricating the same
#5846Method of designing semiconductor device
#5847Pad limited configurable logic device
#5848Si-based CTE-matched substrate for laser diode packaging
#5849Semiconductor device including a plug
#5850Three-dimensional semiconductor memory device and method of fabricating the same
#5851Integrated circuit device
#5852Staircase formation in three-dimensional memory device
#5853SEMICONDUCTOR DEVICES
#5854INTEGRATED CIRCUIT AND METHOD OF FORMING AN INTEGRATED CIRCUIT
#5855Semiconductor device
#5856Package structure
#5857Chip package structure
#5858Semiconductor package including frame in which semiconductor chip is embedded
#5859Integrated circuit layout, integrated circuit, and method for fabricating the same
#5860Method of fabricating semiconductor device including dummy via anchored to dummy metal layer
#5861Component inter-digitated vias and leads
#5862Variable pitch and stack height for high performance interconnects
#5863Sidewall interconnect metallization structures for integrated circuit devices
#5864Wiring substrate and manufacturing method thereof
#5865Back end of line via to metal line margin improvement
#5866Sideways vias in isolation areas to contact interior layers in stacked devices
#5867Semiconductor die with conversion coating
#5868MEMORY DEVICES WITH A LOGIC REGION BETWEEN MEMORY REGIONS
#5869Staggered lines for interconnect performance improvement and processes for forming such
#5870Intermediate separation layers at the back-end-of-line
#5871SUBSTRATE FOR AN ELECTRONIC DEVICE
#5872Two-dimensional (2D) self-aligned contact (or via) to enable further device scaling
#5873Semiconductor device and a method of manufacturing the same
#5874Interconnect structure and method of forming the same
#5875Semiconductor device having opening and via hole and method for manufacturing the same
#5876Semiconductor structure
#5877Photonic integrated package and method forming same
#5878TSV testing method and apparatus
#5879Memory cell with top electrode via
#5880Capacitor structure and semiconductor structure
#5881Method and structure for dual sheet resistance trimmable thin film resistors
#5882Multi-tier three-dimensional memory device with dielectric support pillars and methods for making the same
#5883Three-dimensional flash memory device including channel structures having enlarged portions
#5884Three-dimensional memory device containing through-array contact via structures between dielectric barrier walls and methods of making the same
#5885Anti-fuse cell and chip having anti-fuse cells
#5886Tie off device
#5887SEMICONDUCTOR STRUCTURE AND METHOD MANUFACTURING THE SAME
#5888Methods of forming substrate interconnect structures for enhanced thin seed conduction
#5889Multi-package assemblies having foam structures for warpage control
#5890INTEGRATED CIRCUIT STRUCTURE
#5891Method for forming titanium nitride barrier with small surface grains in interconnects
#5892Method for forming semiconductor device structure with conductive line
#5893Semiconductor device having a stacked structure
#5894Three-dimensional memory device containing through-array contact via structures between dielectric barrier walls and methods of making the same
#5895Connection of several circuits of an electronic chip
#5896Semiconductor devices
#5897Semiconductor structure with doped via plug
#5898Self-aligned cut process for self-aligned via process window
#5899Copper interconnect structure with manganese barrier layer
#5900Method for forming lead wires in hybrid-bonded semiconductor devices
#5901High current integrated circuit-based transformer
#5902Semiconductor device
#5903Semiconductor device having conducting member for electrically coupling gate structure to underlying substrate of SOI structure
#5904Three-dimensional memory device with support structures in slit structures and method for forming the same
#5905SRAM cell and logic cell design
#5906Neuromorphic computing device
#5907Bonded die assembly containing a manganese-containing oxide bonding layer and methods for making the same
#5908Hybrid integrated circuit package and method
#5909Semiconductor device with die bumps aligned with substrate balls
#5910Passivation scheme for pad openings and trenches
#5911Semiconductor device and manufacturing method thereof
#5912Semiconductor device, associated method and layout
#5913Localized high density substrate routing
#5914Semiconductor device and fabrication method for the same
#5915Integrated circuit device with bonding structure and method of forming the same
#5916Back end of line (BEOL) time dependent dielectric breakdown (TDDB) mitigation within a vertical interconnect access (VIA) level of an integrated circuit (IC) device
#5917Large via buffer
#5918Integrated circuit structure of capacitive device
#5919Semiconductor structure and method for manufacturing the same
#5920Method for forming a semiconductor device structure having an electrical connection structure
#5921Semiconductor structure and fabrication method thereof
#5922Selective etching and controlled atomic layer etching of transition metal oxide films for device fabrication
#5923Replacement gate structures for advanced integrated circuit structure fabrication
#5924Three-dimensional memory device including a silicon-germanium source contact layer and method of making the same
#5925Staircase and contact structures for three-dimensional memory
#5926Three-dimensional semiconductor memory devices
#5927Semiconductor device package with stress buffering layer and method for manufacturing the same
#5928Semiconductor devices comprising planar waveguide transmission lines
#5929Pseudo-stripline using double solder-resist structure
#5930Chemical direct pattern plating method
#5931MULTI-LAYER INDUCTOR
#5932Integrated electronic device with a redistribution region and a high resilience to mechanical stresses and method for its preparation
#5933Semiconductor device including a porous dielectric layer, and method of forming the semiconductor device
#5934Metal via structure
#5935Semiconductor memory device
#5936Local interconnect with air gap
#5937Lids for integrated circuit packages with solder thermal interface materials
#5938Selective removal process to create high aspect ratio fully self-aligned via
#5939Semiconductor device structures
#5940Surface modified dielectric refill structure
#5941Vias with multiconnection via structures
#5942Drain and/or gate interconnect and finger structure
#5943Shield structure for backside through substrate vias (TSVs)
#5944Semiconductor structure and method of forming the same
#5945Semiconductor memory device
#5946Floating gate test structure for embedded memory device
#5947Inverter cell structure and forming method thereof
#5948Semiconductor device including a repeater/buffer at upper metal routing layers and methods of manufacturing the same
#5949Integrated circuit package and method
#5950Tri-layer CoWoS structure
#5951COWOS structures and methods forming same
#5952Semiconductor package for wafer level packaging and manufacturing method thereof
#5953Air channel formation in packaging process
#5954Method for forming three-dimensional integrated wiring structure and semiconductor structure thereof
#5955IC with thin film resistor with metal walls
#5956Package structure and package-on-package structure
#5957Semiconductor structure and method of fabricating wiring structure
#5958Hermetic barrier for semiconductor device
#5959Metallization interconnect structure formation
#5960Semiconductor device with through silicon via structure
#5961Integrated circuit packages with asymmetric adhesion material regions
#5962Electronic device comprising an electronic chip mounted on top of a support substrate
#5963Integrated circuit package and method
#5964Semiconductor device and method for manufacturing the same
#5965Interconnection element and method of manufacturing the same
#5966Method and structure of metal cut
#5967Semiconductor device structure having protection caps on conductive lines
#5968Coaxial contacts for 3D logic and memory
#5969Semiconductor memory device and production method thereof
#5970Semiconductor device
#5971Semiconductor package
#5972Seal ring for hybrid-bond
#5973Power distribution network using buried power rail
#5974Applications of buried power rails
#5975Semiconductor device and method of manufacturing the same
#5976Integrated circuit structures with contoured interconnects
#5977Interconnect hub for dies
#5978Integrated-circuit devices and circuitry comprising the same
#5979Semiconductor packages having thermal through vias (TTV)
#5980Semiconductor device and method of manufacturing a semiconductor device
#5981Self-aligned contacts for 3D logic and memory
#5982Method to repair edge placement errors in a semiconductor device
#5983Interconnects with tight pitch and reduced resistance
#5984Metal interconnect structure and method for fabricating the same
#5985Interconnect structure
#5986Semiconductor device with embedded magnetic flux concentrator
#5987Air gap type semiconductor device package structure and fabrication method thereof
#5988Semiconductor device with multi-layered source/drain regions having different dopant concentrations and manufacturing method thereof
#5989Three-dimensional cross-point memory device containing inter-level connection structures and method of making the same
#5990Integrated circuit device and method of fabricating the same
#5991Three-dimensional semiconductor memory device
#5992THREE DIMENSIONAL MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME
#5993Semiconductor integrated circuit device
#5994Semiconductor structure and method for manufacturing a plurality thereof
#59953D integrated circuit
#5996Density-graded adhesion layer for conductors
#5997Method of forming stacked trench contacts and structures formed thereby
#5998Semiconductor device
#5999Multi-dimensional vertical switching connections for connecting circuit elements
#6000LOW RESISTIVITY FILMS CONTAINING MOLYBDENUM