ClassID:

207728

H01L23/5226 - page 24 - CPC Classification

Classification description:

Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure

Recent Application in this class:
#6901
20200035553
2020-01-30

Method for manufacturing a contact pad, method for manufacturing a semiconductor device using same, and semiconductor device

#6902
20200035546
2020-01-30

Interconnect structure without barrier layer on bottom surface of via

#6903
20200035302
2020-01-30

3D SRAM/ROM with several superimposed layers and reconfigurable by transistor rear biasing

#6904
20200028239
2020-01-23

Antenna module

#6905
20200027965
2020-01-23

Trench contact structures for advanced integrated circuit structure fabrication

#6906
20200027946
2020-01-23

Capacitor structures and methods for fabricating the same

#6907
20200027924
2020-01-23

RRAM memory cell with multiple filaments

#6908
20200027896
2020-01-23

Three-dimensional semiconductor memory device and manufacturing method of the three-dimensional semiconductor memory device

#6909
20200027893
2020-01-23

Three-dimensional semiconductor device

#6910
20200027886
2020-01-23

Semiconductor device

#6911
20200027860
2020-01-23

Seal-ring structure for stacking integrated circuits

#6912
20200027833
2020-01-23

Electronic Component Package

#6913
20200027828
2020-01-23

Via-Configurable Memory

#6914
20200027827
2020-01-23

Vias and gaps in semiconductor interconnects

#6915
20200027801
2020-01-23

TEST STRUCTURE FOR INLINE DETECTION OF INTERLAYER METAL DEFECTS

#6916
20200027788
2020-01-23

Formation method of damascene structure

#6917
20200027783
2020-01-23

Method for fabricating semiconductor device

#6918
20200027781
2020-01-23

Etch-stop layer topography for advanced integrated circuit structure fabrication

#6919
20200027780
2020-01-23

Method for forming a multi-level interconnect structure

#6920
20200027728
2020-01-23

SUBSTRATE PACKAGE WITH GLASS DIELECTRIC

#6921
20200021292
2020-01-16

Integrated circuit and method of manufacturing the same

#6922
20200020791
2020-01-16

Heterojunction semiconductor device for reducing parasitic capacitance

#6923
20200020779
2020-01-16

Drain and/or gate interconnect and finger structure

#6924
20200020745
2020-01-16

Interconnect landing method for RRAM technology

#6925
20200020716
2020-01-16

Semiconductor memory device and method of manufacturing the same

#6926
20200020702
2020-01-16

Semiconductor memory device, semiconductor device, and method of manufacturing semiconductor device

#6927
20200020700
2020-01-16

Layout of static random access memory periphery circuit

#6928
20200020699
2020-01-16

Memory cell and method of manufacturing the same

#6929
20200020694
2020-01-16

Method of forming an array of capacitors, a method of forming DRAM circuitry, and a method of forming an elevationally-elongated conductive structure of integrated circuitry

#6930
20200020684
2020-01-16

3DIC structure and method of fabricating the same

#6931
20200020670
2020-01-16

Stacked chips comprising interconnects

#6932
20200020638
2020-01-16

Semiconductor package

#6933
20200020633
2020-01-16

Package structure and method of fabricating the same

#6934
20200020631
2020-01-16

Vertically oriented metal silicide containing e-fuse device

#6935
20200020629
2020-01-16

Interconnect structure for stacked die in a microelectronic device

#6936
20200020628
2020-01-16

Integrated fan-out packages and methods of forming the same

#6937
20200020627
2020-01-16

Semiconductor device, integrated fan-out package and method of forming the same

#6938
20200020626
2020-01-16

Liner-free and partial liner-free contact/via structures

#6939
20200020625
2020-01-16

Advanced metal connection with metal cut

#6940
20200020610
2020-01-16

Semiconductor device and a manufacturing method thereof

#6941
20200020587
2020-01-16

Vertically stacked transistors

#6942
20200020581
2020-01-16

Void-free metallic interconnect structures with self-formed diffusion barrier layers

#6943
20200020577
2020-01-16

Void-free metallic interconnect structures with self-formed diffusion barrier layers

#6944
20200020568
2020-01-16

Multi-barrier deposition for air gap formation

#6945
20200020473
2020-01-16

Inductors formed with through glass vias

#6946
20200020392
2020-01-16

Flying and twisted bit line architecture for dual-port static random-access memory (DP SRAM)

#6947
20200020391
2020-01-16

Flying and twisted bit line architecture for dual-port static random-access memory (DP SRAM)

#6948
20200014200
2020-01-09

On-chip multiple-stage electrical overstress (EOS) protection device

#6949
20200013876
2020-01-09

Fin cut and fin trim isolation for advanced integrated circuit structure fabrication

#6950
20200013871
2020-01-09

Semiconductor device

#6951
20200013745
2020-01-09

Semiconductor chip and semiconductor package including the same

#6952
20200013736
2020-01-09

Semiconductor device structure and method for forming the same

#6953
20200013722
2020-01-09

Silicon carbide semiconductor device having a metal adhesion and barrier structure and a method of forming such a semiconductor device

#6954
20200013718
2020-01-09

Electrical device having conductive lines with air gaps therebetween and interconnects without exclusion zones

#6955
20200013716
2020-01-09

Semiconductor device, electronic circuit having the same, and semiconductor device forming method

#6956
20200013715
2020-01-09

Semiconductor device and method for fabricating thereof

#6957
20200013713
2020-01-09

Structure and method for improving high voltage breakdown reliability of a microelectronic device

#6958
20200013680
2020-01-09

Dual metal silicide structures for advanced integrated circuit structure fabrication

#6959
20200013671
2020-01-09

Enhancement of iso-via reliability

#6960
20200013668
2020-01-09

Semiconductor devices and methods of manufacturing the same

#6961
20200007080
2020-01-02

Voltage controlled oscillator circuit, device, and method

#6962
20200006467
2020-01-02

High density capacitor implemented using FinFET

#6963
20200006378
2020-01-02

Staircase structures for three-dimensional memory device double-sided routing

#6964
20200006377
2020-01-02

Staircase structures for three-dimensional memory device double-sided routing

#6965
20200006353
2020-01-02

Vertical transistor contact for a memory cell with increased density

#6966
20200006346
2020-01-02

Replacement metal COB integration process for embedded DRAM

#6967
20200006329
2020-01-02

Interconnect techniques for electrically connecting source/drain regions of stacked transistors

#6968
20200006308
2020-01-02

Manufacturing method of package on package structure

#6969
20200006304
2020-01-02

Photonic semiconductor device and method

#6970
20200006270
2020-01-02

Semiconductor memory device

#6971
20200006253
2020-01-02

Stiffener build-up layer package

#6972
20200006247
2020-01-02

Stiffener shield for device integration

#6973
20200006236
2020-01-02

Embedded very high density (VHD) layer

#6974
20200006230
2020-01-02

Partial barrier free vias for cobalt-based interconnects and methods of fabrication thereof

#6975
20200006228
2020-01-02

Integrated circuit interconnect structures with air gaps

#6976
20200006227
2020-01-02

Techniques to improve reliability in Cu interconnects using Cu intermetallics

#6977
20200006226
2020-01-02

Techniques to improve reliability in Cu interconnects using Cu intermetallics

#6978
20200006225
2020-01-02

Semiconductor device and method of manufacture

#6979
20200006224
2020-01-02

Interconnect structures and methods of forming the same

#6980
20200006223
2020-01-02

Method for manufacturing a semiconductor structure

#6981
20200006222
2020-01-02

Semiconductor device having a multilayer structure

#6982
20200006221
2020-01-02

Semiconductor device including through vias in molded columns

#6983
20200006220
2020-01-02

Semiconductor package and method

#6984
20200006219
2020-01-02

Chip package and method of fabricating the same

#6985
20200006218
2020-01-02

3D IC Decoupling capacitor structure and method for manufacturing the same

#6986
20200006209
2020-01-02

Planarizing RDLS in RDL—First Processes Through CMP Process

#6987
20200006208
2020-01-02

Semiconductor structure

#6988
20200006199
2020-01-02

Semiconductor device having buffer structure surrounding through via

#6989
20200006198
2020-01-02

Power electronics assemblies with CIO bonding layers and double sided cooling, and vehicles incorporating the same

#6990
20200006193
2020-01-02

RF devices with enhanced performance and methods of forming the same

#6991
20200006179
2020-01-02

Underfill control structures and method

#6992
20200006160
2020-01-02

Methods of forming contact features in field-effect transistors

#6993
20200006145
2020-01-02

Bonding support structure (and related process) for wafer stacking

#6994
20200006141
2020-01-02

Method of fabricating redistribution circuit structure

#6995
20200006140
2020-01-02

Fully self-aligned via with selective bilayer dielectric regrowth

#6996
20200006139
2020-01-02

Semiconductor device with reduced via bridging risk

#6997
20200006138
2020-01-02

Grating replication using helmets and topographically-selective deposition

#6998
20200006128
2020-01-02

Protection structures for bonded wafers

#6999
20200006125
2020-01-02

Semiconductor devices formed using multiple planarization processes

#7000
20200006123
2020-01-02

Patterning methods for semiconductor devices and structures resulting therefrom

#7001
20200006120
2020-01-02

Method and apparatus for back end of line semiconductor device processing

#7002
20200006116
2020-01-02

Metal capping layer and methods thereof

#7003
20200006115
2020-01-02

Integrated circuit with airgaps to control capacitance

#7004
20200006089
2020-01-02

Cross-wafer RDLs in constructed wafers

#7005
20200006088
2020-01-02

Photonic integrated package and method forming same

#7006
20200006083
2020-01-02

Selective removal of an etching stop layer for improving overlay shift tolerance

#7007
20200006060
2020-01-02

Using a self-assembly layer to facilitate selective formation of an etching stop layer

#7008
20200004914
2020-01-02

Inverted pitch IC structure, layout method, and system

#7009
20190393409
2019-12-26

Back end of line metallization structures

#7010
20190393356
2019-12-26

Vertical architecture of thin film transistors

#7011
20190393352
2019-12-26

Self-aligned gate endcap (SAGE) architectures with gate-all-around devices

#7012
20190393297
2019-12-26

Capacitor bank structure and semiconductor package structure

#7013
20190393241
2019-12-26

Three-dimensional semiconductor memory devices

#7014
20190393238
2019-12-26

Three-dimensional semiconductor memory device

#7015
20190393215
2019-12-26

Method for manufacturing monolithic three-dimensional (3D) integrated circuits

#7016
20190393214
2019-12-26

Isolation walls for vertically stacked transistor structures

#7017
20190393207
2019-12-26

Routing for three-dimensional integrated structures

#7018
20190393206
2019-12-26

Semiconductor device

#7019
20190393194
2019-12-26

3DIC structure with protective structure and method of fabricating the same and package

#7020
20190393177
2019-12-26

Semiconductor device

#7021
20190393169
2019-12-26

Semiconductor device

#7022
20190393164
2019-12-26

Package substrates having an electromagnetic bandgap structure and semiconductor packages employing the package substrates

#7023
20190393160
2019-12-26

Semiconductor device and method of forming the same

#7024
20190393159
2019-12-26

Three-dimensional integrated circuit structures

#7025
20190393157
2019-12-26

Methods and apparatuses to form self-aligned caps

#7026
20190393156
2019-12-26

Metal structures, devices, and methods

#7027
20190393153
2019-12-26

Semiconductor device and method of manufacture

#7028
20190393151
2019-12-26

Nitrogen assisted oxide gapfill

#7029
20190393150
2019-12-26

Package structure having redistribution structure with photosensitive and non-photosensitive dielectric materials and fabricating method thereof

#7030
20190393149
2019-12-26

Package structure, package-on-package structure and manufacturing method thereof

#7031
20190393147
2019-12-26

Core fill to reduce dishing and metal pillar fill to increase metal density of interconnects

#7032
20190393082
2019-12-26

Self-aligned quadruple patterning (SAQP) for routing layouts including multi-track jogs

#7033
20190386128
2019-12-19

Semiconductor device having reduced capacitance between source and drain pads

#7034
20190386103
2019-12-19

Cell architecture based on multi-gate vertical field effect transistor

#7035
20190386023
2019-12-19

Semiconductor device and method of fabricating the same

#7036
20190386021
2019-12-19

Devices including stack structures, and related methods and electronic systems

#7037
20190385999
2019-12-19

Power grid and standard cell co-design structure and methods thereof

#7038
20190385984
2019-12-19

Semiconductor memory device

#7039
20190385982
2019-12-19

Offset pads over TSV

#7040
20190385948
2019-12-19

LAYOUT TECHNIQUE FOR MIDDLE-END-OF-LINE

#7041
20190385947
2019-12-19

Rotated metal-oxide-metal (RTMOM) capacitor

#7042
20190385935
2019-12-19

TSV as pad

#7043
20190385923
2019-12-19

CMOS based devices for harsh media

#7044
20190385922
2019-12-19

Semiconductor device for use in harsh media

#7045
20190385910
2019-12-19

Interconnect structure with fully self-aligned via pattern formation

#7046
20190385909
2019-12-19

Metal loss prevention using implantation

#7047
20190385905
2019-12-19

Semiconductor device and semiconductor device fabrication method

#7048
20190385904
2019-12-19

Conductive feature formation and structure

#7049
20190385896
2019-12-19

Semiconductor device structures

#7050
20190385848
2019-12-19

Layout design for fanout patterns in self-aligned double patterning process

#7051
20190378962
2019-12-12

Semiconductor device and method

#7052
20190378909
2019-12-12

Formation of air gap spacers for reducing parasitic capacitance

#7053
20190378892
2019-12-12

Hybrid high and low stress oxide embedded capacitor dielectric

#7054
20190378857
2019-12-12

Semiconductor devices and manufacturing methods of the same

#7055
20190378853
2019-12-12

Memory device and forming method thereof

#7056
20190378849
2019-12-12

Method for forming dual-deck channel hole structure of three-dimensional memory device

#7057
20190378836
2019-12-12

Deep trench via for three-dimensional integrated circuit

#7058
20190378801
2019-12-12

RF functionality and electromagnetic radiation shielding in a component carrier

#7059
20190378795
2019-12-12

Semiconductor package, package-on-package device, and method of fabricating the same

#7060
20190378794
2019-12-12

BANDGAP REFERENCE DIODE USING THIN FILM TRANSISTORS

#7061
20190378790
2019-12-12

Device layer interconnects

#7062
20190378784
2019-12-12

Semiconductor device

#7063
20190378756
2019-12-12

Method for creating a fully self-aligned via

#7064
20190371933
2019-12-05

Structure and method for FinFET device with contact over dielectric gate

#7065
20190371816
2019-12-05

Methods of forming integrated structures comprising vertical channel material and having conductively-doped semiconductor material directly against lower sidewalls of the channel material

#7066
20190371813
2019-12-05

Semiconductor memory

#7067
20190371811
2019-12-05

Semiconductor memory

#7068
20190371798
2019-12-05

Semiconductor device and method for manufacturing semiconductor device

#7069
20190371782
2019-12-05

Semiconductor devices

#7070
20190371780
2019-12-05

Hybrid bonding with uniform pattern density

#7071
20190371741
2019-12-05

Manufacturing method of semiconductor structure

#7072
20190371734
2019-12-05

Package structure having redistribution layer structures

#7073
20190371728
2019-12-05

Integrated circuitry, memory integrated circuitry, and methods used in forming integrated circuitry

#7074
20190371727
2019-12-05

Semiconductor device and method of manufacturing the same

#7075
20190371726
2019-12-05

Semiconductor device having a tapered protruding pillar portion

#7076
20190371725
2019-12-05

ON-CHIP DIFFERENTIAL METAL-OXIDE-METAL/METAL-INSULATOR-METAL CAPACITOR WITH IMPROVED CIRCUIT ISOLATION

#7077
20190371694
2019-12-05

Semiconductor packages having thermal through vias (TTV)

#7078
20190371664
2019-12-05

Metal loss prevention using implantation

#7079
20190371663
2019-12-05

Semiconductor via structure with lower electrical resistance

#7080
20190371661
2019-12-05

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

#7081
20190371658
2019-12-05

Conformal low temperature hermetic dielectric diffusion barriers

#7082
20190371657
2019-12-05

Self-aligned hard masks with converted liners

#7083
20190371656
2019-12-05

Interconnect structure

#7084
20190371654
2019-12-05

Electrically isolated contacts in an active region of a semiconductor device

#7085
20190371653
2019-12-05

Method of manufacturing an integrated inductor with protections caps on conductive lines

#7086
20190371652
2019-12-05

INTEGRATED CIRCUIT CHIP PACKAGE HAVING REDUCED CONTACT PAD SIZE

#7087
20190363178
2019-11-28

Gate tie-down enablement with inner spacer

#7088
20190363080
2019-11-28

Packaged semiconductor device

#7089
20190363079
2019-11-28

Through silicon via design for stacking integrated circuits

#7090
20190363074
2019-11-28

Semiconductor memory device having plural chips connected by hybrid bonding method

#7091
20190363063
2019-11-28

Package substrate with high-density interconnect layer having pillar and via connections for fan out scaling

#7092
20190363048
2019-11-28

VIA PREFILL IN A FULLY ALIGNED VIA

#7093
20190363014
2019-11-28

Vertical semiconductor devices and method of manufacturing the same

#7094
20190363012
2019-11-28

Semiconductor device having interconnection structure

#7095
20190363008
2019-11-28

Conductive cap-based approaches for conductive via fabrication and structures resulting therefrom

#7096
20190363006
2019-11-28

Substrate processing method and device manufactured by using the same

#7097
20190363004
2019-11-28

Airgap formation in BEOL interconnect structure using sidewall image transfer

#7098
20190362977
2019-11-28

SEMICONDUCTOR STRUCTURES HAVING LOW RESISTANCE PATHS THROUGHOUT A WAFER

#7099
20190355889
2019-11-21

Multilayer circuit substrate and manufacturing method thereof

#7100
20190355822
2019-11-21

Vertical FET devices including a contact on protruding portions of a substrate

#7101
20190355812
2019-11-21

Semiconductor device and method for manufacturing the same

#7102
20190355745
2019-11-21

Integrated structures and methods of forming vertically-stacked memory cells

#7103
20190355738
2019-11-21

Staircase formation in three-dimensional memory device

#7104
20190355737
2019-11-21

Three-dimensional semiconductor device having a memory block and separation structures

#7105
20190355716
2019-11-21

Structure with embedded memory device and contact isolation scheme

#7106
20190355712
2019-11-21

Semiconductor device

#7107
20190355697
2019-11-21

ELECTRONIC PACKAGE FOR HIGH-DATA RATE COMMUNICATION APPLICATIONS

#7108
20190355696
2019-11-21

3DIC structure and method of manufacturing the same

#7109
20190355672
2019-11-21

Three-dimensional memory device containing hydrogen diffusion blocking structures and method of making the same

#7110
20190355665
2019-11-21

Recessed metal interconnects to mitigate EPE-related via shorting

#7111
20190355663
2019-11-21

Three-dimensional memory device containing hydrogen diffusion blocking structures and method of making the same

#7112
20190355661
2019-11-21

BEOL embedded high density vertical resistor structure

#7113
20190355659
2019-11-21

Fan out package-on-package with adhesive die attach

#7114
20190355658
2019-11-21

Interconnects with variable space mandrel cuts formed by block patterning

#7115
20190355621
2019-11-21

Method For Increasing The Verticality Of Pillars

#7116
20190355620
2019-11-21

Method for creating a fully self-aligned via

#7117
20190355618
2019-11-21

Metal interconnect structure and method for fabricating the same

#7118
20190348430
2019-11-14

Semiconductor device and manufacturing method thereof

#7119
20190348421
2019-11-14

Methods used in forming integrated circuitry including forming first, second, and third contact openings

#7120
20190348418
2019-11-14

Semiconductor device including air gaps and method for fabricating the same

#7121
20190348389
2019-11-14

Apparatus with multi-wafer based device comprising embedded active and/or passive devices and method for forming such

#7122
20190348386
2019-11-14

Chip package structure

#7123
20190348369
2019-11-14

METHOD AND APPARATUS FOR PROTECTING METAL INTERCONNECT FROM HALOGEN BASED PRECURSORS

#7124
20190348366
2019-11-14

Redistribution layer structures for integrated circuit package

#7125
20190348362
2019-11-14

Semiconductor device comprising air gaps having different configurations

#7126
20190348344
2019-11-14

SEMICONDUCTOR DEVICE PACKAGE AND METHOD OF MANUFACTURING THE SAME

#7127
20190348322
2019-11-14

Selective removal process to create high aspect ratio fully self-aligned via

#7128
20190348321
2019-11-14

Methods of forming integrated circuits having parallel conductors

#7129
20190348320
2019-11-14

Integrated circuits having parallel conductors

#7130
20190341400
2019-11-07

Integrated circuit memory devices having impurity-doped dielectric regions therein and methods of forming same

#7131
20190341399
2019-11-07

Through array contact (TAC) for three-dimensional memory devices

#7132
20190341385
2019-11-07

Semiconductor device for avoiding short circuit between adjacent storage nodes and manufacturing method thereof

#7133
20190341375
2019-11-07

Bifurcated memory die module semiconductor device

#7134
20190341367
2019-11-07

Semiconductor assemblies using edge stacking and methods of manufacturing the same

#7135
20190341354
2019-11-07

Semiconductor package

#7136
20190341346
2019-11-07

Memory cell having multi-level word line

#7137
20190341306
2019-11-07

Via for coupling attached component upper electrode to substrate

#7138
20190341299
2019-11-07

Structure and method for interconnection

#7139
20190341298
2019-11-07

Via contact resistance control

#7140
20190334029
2019-10-31

Semiconductor device with multi-layered source/drain regions having different dopant concentrations and manufacturing method thereof

#7141
20190333966
2019-10-31

Tunnel magnetoresistive effect element, magnetic memory, and built-in memory

#7142
20190333935
2019-10-31

Memory devices

#7143
20190333932
2019-10-31

Vertical memory devices

#7144
20190333930
2019-10-31

Three-dimensional nor-type memory device and method of making the same

#7145
20190333923
2019-10-31

Three-dimensional semiconductor memory device

#7146
20190333919
2019-10-31

Apparatus for High Speed ROM Cells

#7147
20190333911
2019-10-31

Metal zero contact via redundancy on output nodes and inset power rail architecture

#7148
20190333889
2019-10-31

Semiconductor device including various peripheral areas having different thicknesses

#7149
20190333883
2019-10-31

Method for manufacturing a multi-band antenna package structure

#7150
20190333881
2019-10-31

Fan-out antenna packaging structure and preparation method thereof

#7151
20190333879
2019-10-31

Fan-out antenna packaging structure and preparation method thereof

#7152
20190333877
2019-10-31

Semiconductor device having antenna and manufacturing method thereof

#7153
20190333853
2019-10-31

Structure and method for flexible power staple insertion

#7154
20190333851
2019-10-31

Fan-out package with multi-layer redistribution layer structure

#7155
20190333846
2019-10-31

Planarizing RDLs in RDL-first processes through CMP process

#7156
20190333829
2019-10-31

Method of detecting delamination in an integrated circuit package structure

#7157
20190333814
2019-10-31

Chamferless via structures

#7158
20190333813
2019-10-31

Chamferless via structures

#7159
20190333803
2019-10-31

Apparatus with multi-wafer based device and method for forming such

#7160
20190333801
2019-10-31

Dual airgap structure

#7161
20190326509
2019-10-24

Embedded MRAM in interconnects and method for producing the same

#7162
20190326405
2019-10-24

Methods of forming backside self-aligned vias and structures formed thereby

#7163
20190326355
2019-10-24

Semiconductor devices

#7164
20190326322
2019-10-24

Semiconductor memory

#7165
20190326312
2019-10-24

Method for forming staircase structure of three-dimensional memory device

#7166
20190326302
2019-10-24

Memory circuit having resistive device coupled with supply voltage line

#7167
20190326300
2019-10-24

Fin-based strap cell structure for improving memory performance

#7168
20190326296
2019-10-24

Thin-film transistor embedded dynamic random-access memory with shallow bitline

#7169
20190326200
2019-10-24

Semiconductor structure and method making the same

#7170
20190326199
2019-10-24

Through-substrate vias with improved connections

#7171
20190326188
2019-10-24

Packaged integrated circuit with interposing functionality and method for manufacturing such a packaged integrated circuit

#7172
20190326170
2019-10-24

Self-aligned via interconnect structures

#7173
20190326167
2019-10-24

Processes for reducing leakage and improving adhesion

#7174
20190326166
2019-10-24

Three-dimensional semiconductor device and method of fabricating the same

#7175
20190326165
2019-10-24

Vertical-transport field-effect transistors having gate contacts located over the active region

#7176
20190326164
2019-10-24

Via patterning using multiple photo multiple etch

#7177
20190326156
2019-10-24

Interconnect structure and method of forming the same

#7178
20190325943
2019-10-24

Layout of sense amplifier

#7179
20190325107
2019-10-24

Integrated circuit including standard cell and method and system for designing and manufacturing the same

#7180
20190319167
2019-10-17

Method for making semiconductor device including vertically integrated optical and electronic devices and comprising a superlattice

#7181
20190319044
2019-10-17

Three-dimensional vertical NOR flash thin-film transistor strings

#7182
20190319040
2019-10-17

Three-dimensional memory device containing bidirectional taper staircases and methods of making the same

#7183
20190319001
2019-10-17

Semiconductor memory device structure

#7184
20190318997
2019-10-17

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

#7185
20190318992
2019-10-17

Semiconductor devices and methods for manufacturing the same

#7186
20190318991
2019-10-17

Output Driver Circuit Configurable with Via Layer to Support Multiple Standards

#7187
20190318990
2019-10-17

Semiconductor device including semiconductor chip transmitting signals at high speed

#7188
20190318989
2019-10-17

Tight pitch via structures enabled by orthogonal and non-orthogonal merged vias

#7189
20190318960
2019-10-17

Self aligned via and pillar cut for at least a self aligned double pitch

#7190
20190318931
2019-10-17

Self-aligned multiple patterning processes with layered mandrels

#7191
20190317277
2019-10-17

Semiconductor device including vertically integrated optical and electronic devices and comprising a superlattice

#7192
20190312118
2019-10-10

Semiconductor devices and contact plugs

#7193
20190312066
2019-10-10

Thin-film negative differential resistance and neuronal circuit

#7194
20190312051
2019-10-10

Semiconductor memory device having vertical supporter penetrating the gate stack structure and through dielectric pattern

#7195
20190312031
2019-10-10

ROM chip manufacturing structures having shared gate electrodes

#7196
20190311995
2019-10-10

Warping reduction in silicon wafers

#7197
20190311992
2019-10-10

Integrated circuit device and method of manufacturing the same

#7198
20190311984
2019-10-10

Self-aligned via

#7199
20190311983
2019-10-10

STACKING MULTIPLE DIES HAVING DISSIMILAR INTERCONNECT STRUCTURE LAYOUT AND PITCH

#7200
20190311959
2019-10-10

High density wafer level test module