207728 ⎘
Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure
Method for manufacturing a contact pad, method for manufacturing a semiconductor device using same, and semiconductor device
#6902Interconnect structure without barrier layer on bottom surface of via
#69033D SRAM/ROM with several superimposed layers and reconfigurable by transistor rear biasing
#6904Antenna module
#6905Trench contact structures for advanced integrated circuit structure fabrication
#6906Capacitor structures and methods for fabricating the same
#6907RRAM memory cell with multiple filaments
#6908Three-dimensional semiconductor memory device and manufacturing method of the three-dimensional semiconductor memory device
#6909Three-dimensional semiconductor device
#6910Semiconductor device
#6911Seal-ring structure for stacking integrated circuits
#6912Electronic Component Package
#6913Via-Configurable Memory
#6914Vias and gaps in semiconductor interconnects
#6915TEST STRUCTURE FOR INLINE DETECTION OF INTERLAYER METAL DEFECTS
#6916Formation method of damascene structure
#6917Method for fabricating semiconductor device
#6918Etch-stop layer topography for advanced integrated circuit structure fabrication
#6919Method for forming a multi-level interconnect structure
#6920SUBSTRATE PACKAGE WITH GLASS DIELECTRIC
#6921Integrated circuit and method of manufacturing the same
#6922Heterojunction semiconductor device for reducing parasitic capacitance
#6923Drain and/or gate interconnect and finger structure
#6924Interconnect landing method for RRAM technology
#6925Semiconductor memory device and method of manufacturing the same
#6926Semiconductor memory device, semiconductor device, and method of manufacturing semiconductor device
#6927Layout of static random access memory periphery circuit
#6928Memory cell and method of manufacturing the same
#6929Method of forming an array of capacitors, a method of forming DRAM circuitry, and a method of forming an elevationally-elongated conductive structure of integrated circuitry
#69303DIC structure and method of fabricating the same
#6931Stacked chips comprising interconnects
#6932Semiconductor package
#6933Package structure and method of fabricating the same
#6934Vertically oriented metal silicide containing e-fuse device
#6935Interconnect structure for stacked die in a microelectronic device
#6936Integrated fan-out packages and methods of forming the same
#6937Semiconductor device, integrated fan-out package and method of forming the same
#6938Liner-free and partial liner-free contact/via structures
#6939Advanced metal connection with metal cut
#6940Semiconductor device and a manufacturing method thereof
#6941Vertically stacked transistors
#6942Void-free metallic interconnect structures with self-formed diffusion barrier layers
#6943Void-free metallic interconnect structures with self-formed diffusion barrier layers
#6944Multi-barrier deposition for air gap formation
#6945Inductors formed with through glass vias
#6946Flying and twisted bit line architecture for dual-port static random-access memory (DP SRAM)
#6947Flying and twisted bit line architecture for dual-port static random-access memory (DP SRAM)
#6948On-chip multiple-stage electrical overstress (EOS) protection device
#6949Fin cut and fin trim isolation for advanced integrated circuit structure fabrication
#6950Semiconductor device
#6951Semiconductor chip and semiconductor package including the same
#6952Semiconductor device structure and method for forming the same
#6953Silicon carbide semiconductor device having a metal adhesion and barrier structure and a method of forming such a semiconductor device
#6954Electrical device having conductive lines with air gaps therebetween and interconnects without exclusion zones
#6955Semiconductor device, electronic circuit having the same, and semiconductor device forming method
#6956Semiconductor device and method for fabricating thereof
#6957Structure and method for improving high voltage breakdown reliability of a microelectronic device
#6958Dual metal silicide structures for advanced integrated circuit structure fabrication
#6959Enhancement of iso-via reliability
#6960Semiconductor devices and methods of manufacturing the same
#6961Voltage controlled oscillator circuit, device, and method
#6962High density capacitor implemented using FinFET
#6963Staircase structures for three-dimensional memory device double-sided routing
#6964Staircase structures for three-dimensional memory device double-sided routing
#6965Vertical transistor contact for a memory cell with increased density
#6966Replacement metal COB integration process for embedded DRAM
#6967Interconnect techniques for electrically connecting source/drain regions of stacked transistors
#6968Manufacturing method of package on package structure
#6969Photonic semiconductor device and method
#6970Semiconductor memory device
#6971Stiffener build-up layer package
#6972Stiffener shield for device integration
#6973Embedded very high density (VHD) layer
#6974Partial barrier free vias for cobalt-based interconnects and methods of fabrication thereof
#6975Integrated circuit interconnect structures with air gaps
#6976Techniques to improve reliability in Cu interconnects using Cu intermetallics
#6977Techniques to improve reliability in Cu interconnects using Cu intermetallics
#6978Semiconductor device and method of manufacture
#6979Interconnect structures and methods of forming the same
#6980Method for manufacturing a semiconductor structure
#6981Semiconductor device having a multilayer structure
#6982Semiconductor device including through vias in molded columns
#6983Semiconductor package and method
#6984Chip package and method of fabricating the same
#69853D IC Decoupling capacitor structure and method for manufacturing the same
#6986Planarizing RDLS in RDL—First Processes Through CMP Process
#6987Semiconductor structure
#6988Semiconductor device having buffer structure surrounding through via
#6989Power electronics assemblies with CIO bonding layers and double sided cooling, and vehicles incorporating the same
#6990RF devices with enhanced performance and methods of forming the same
#6991Underfill control structures and method
#6992Methods of forming contact features in field-effect transistors
#6993Bonding support structure (and related process) for wafer stacking
#6994Method of fabricating redistribution circuit structure
#6995Fully self-aligned via with selective bilayer dielectric regrowth
#6996Semiconductor device with reduced via bridging risk
#6997Grating replication using helmets and topographically-selective deposition
#6998Protection structures for bonded wafers
#6999Semiconductor devices formed using multiple planarization processes
#7000Patterning methods for semiconductor devices and structures resulting therefrom
#7001Method and apparatus for back end of line semiconductor device processing
#7002Metal capping layer and methods thereof
#7003Integrated circuit with airgaps to control capacitance
#7004Cross-wafer RDLs in constructed wafers
#7005Photonic integrated package and method forming same
#7006Selective removal of an etching stop layer for improving overlay shift tolerance
#7007Using a self-assembly layer to facilitate selective formation of an etching stop layer
#7008Inverted pitch IC structure, layout method, and system
#7009Back end of line metallization structures
#7010Vertical architecture of thin film transistors
#7011Self-aligned gate endcap (SAGE) architectures with gate-all-around devices
#7012Capacitor bank structure and semiconductor package structure
#7013Three-dimensional semiconductor memory devices
#7014Three-dimensional semiconductor memory device
#7015Method for manufacturing monolithic three-dimensional (3D) integrated circuits
#7016Isolation walls for vertically stacked transistor structures
#7017Routing for three-dimensional integrated structures
#7018Semiconductor device
#70193DIC structure with protective structure and method of fabricating the same and package
#7020Semiconductor device
#7021Semiconductor device
#7022Package substrates having an electromagnetic bandgap structure and semiconductor packages employing the package substrates
#7023Semiconductor device and method of forming the same
#7024Three-dimensional integrated circuit structures
#7025Methods and apparatuses to form self-aligned caps
#7026Metal structures, devices, and methods
#7027Semiconductor device and method of manufacture
#7028Nitrogen assisted oxide gapfill
#7029Package structure having redistribution structure with photosensitive and non-photosensitive dielectric materials and fabricating method thereof
#7030Package structure, package-on-package structure and manufacturing method thereof
#7031Core fill to reduce dishing and metal pillar fill to increase metal density of interconnects
#7032Self-aligned quadruple patterning (SAQP) for routing layouts including multi-track jogs
#7033Semiconductor device having reduced capacitance between source and drain pads
#7034Cell architecture based on multi-gate vertical field effect transistor
#7035Semiconductor device and method of fabricating the same
#7036Devices including stack structures, and related methods and electronic systems
#7037Power grid and standard cell co-design structure and methods thereof
#7038Semiconductor memory device
#7039Offset pads over TSV
#7040LAYOUT TECHNIQUE FOR MIDDLE-END-OF-LINE
#7041Rotated metal-oxide-metal (RTMOM) capacitor
#7042TSV as pad
#7043CMOS based devices for harsh media
#7044Semiconductor device for use in harsh media
#7045Interconnect structure with fully self-aligned via pattern formation
#7046Metal loss prevention using implantation
#7047Semiconductor device and semiconductor device fabrication method
#7048Conductive feature formation and structure
#7049Semiconductor device structures
#7050Layout design for fanout patterns in self-aligned double patterning process
#7051Semiconductor device and method
#7052Formation of air gap spacers for reducing parasitic capacitance
#7053Hybrid high and low stress oxide embedded capacitor dielectric
#7054Semiconductor devices and manufacturing methods of the same
#7055Memory device and forming method thereof
#7056Method for forming dual-deck channel hole structure of three-dimensional memory device
#7057Deep trench via for three-dimensional integrated circuit
#7058RF functionality and electromagnetic radiation shielding in a component carrier
#7059Semiconductor package, package-on-package device, and method of fabricating the same
#7060BANDGAP REFERENCE DIODE USING THIN FILM TRANSISTORS
#7061Device layer interconnects
#7062Semiconductor device
#7063Method for creating a fully self-aligned via
#7064Structure and method for FinFET device with contact over dielectric gate
#7065Methods of forming integrated structures comprising vertical channel material and having conductively-doped semiconductor material directly against lower sidewalls of the channel material
#7066Semiconductor memory
#7067Semiconductor memory
#7068Semiconductor device and method for manufacturing semiconductor device
#7069Semiconductor devices
#7070Hybrid bonding with uniform pattern density
#7071Manufacturing method of semiconductor structure
#7072Package structure having redistribution layer structures
#7073Integrated circuitry, memory integrated circuitry, and methods used in forming integrated circuitry
#7074Semiconductor device and method of manufacturing the same
#7075Semiconductor device having a tapered protruding pillar portion
#7076ON-CHIP DIFFERENTIAL METAL-OXIDE-METAL/METAL-INSULATOR-METAL CAPACITOR WITH IMPROVED CIRCUIT ISOLATION
#7077Semiconductor packages having thermal through vias (TTV)
#7078Metal loss prevention using implantation
#7079Semiconductor via structure with lower electrical resistance
#7080SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#7081Conformal low temperature hermetic dielectric diffusion barriers
#7082Self-aligned hard masks with converted liners
#7083Interconnect structure
#7084Electrically isolated contacts in an active region of a semiconductor device
#7085Method of manufacturing an integrated inductor with protections caps on conductive lines
#7086INTEGRATED CIRCUIT CHIP PACKAGE HAVING REDUCED CONTACT PAD SIZE
#7087Gate tie-down enablement with inner spacer
#7088Packaged semiconductor device
#7089Through silicon via design for stacking integrated circuits
#7090Semiconductor memory device having plural chips connected by hybrid bonding method
#7091Package substrate with high-density interconnect layer having pillar and via connections for fan out scaling
#7092VIA PREFILL IN A FULLY ALIGNED VIA
#7093Vertical semiconductor devices and method of manufacturing the same
#7094Semiconductor device having interconnection structure
#7095Conductive cap-based approaches for conductive via fabrication and structures resulting therefrom
#7096Substrate processing method and device manufactured by using the same
#7097Airgap formation in BEOL interconnect structure using sidewall image transfer
#7098SEMICONDUCTOR STRUCTURES HAVING LOW RESISTANCE PATHS THROUGHOUT A WAFER
#7099Multilayer circuit substrate and manufacturing method thereof
#7100Vertical FET devices including a contact on protruding portions of a substrate
#7101Semiconductor device and method for manufacturing the same
#7102Integrated structures and methods of forming vertically-stacked memory cells
#7103Staircase formation in three-dimensional memory device
#7104Three-dimensional semiconductor device having a memory block and separation structures
#7105Structure with embedded memory device and contact isolation scheme
#7106Semiconductor device
#7107ELECTRONIC PACKAGE FOR HIGH-DATA RATE COMMUNICATION APPLICATIONS
#71083DIC structure and method of manufacturing the same
#7109Three-dimensional memory device containing hydrogen diffusion blocking structures and method of making the same
#7110Recessed metal interconnects to mitigate EPE-related via shorting
#7111Three-dimensional memory device containing hydrogen diffusion blocking structures and method of making the same
#7112BEOL embedded high density vertical resistor structure
#7113Fan out package-on-package with adhesive die attach
#7114Interconnects with variable space mandrel cuts formed by block patterning
#7115Method For Increasing The Verticality Of Pillars
#7116Method for creating a fully self-aligned via
#7117Metal interconnect structure and method for fabricating the same
#7118Semiconductor device and manufacturing method thereof
#7119Methods used in forming integrated circuitry including forming first, second, and third contact openings
#7120Semiconductor device including air gaps and method for fabricating the same
#7121Apparatus with multi-wafer based device comprising embedded active and/or passive devices and method for forming such
#7122Chip package structure
#7123METHOD AND APPARATUS FOR PROTECTING METAL INTERCONNECT FROM HALOGEN BASED PRECURSORS
#7124Redistribution layer structures for integrated circuit package
#7125Semiconductor device comprising air gaps having different configurations
#7126SEMICONDUCTOR DEVICE PACKAGE AND METHOD OF MANUFACTURING THE SAME
#7127Selective removal process to create high aspect ratio fully self-aligned via
#7128Methods of forming integrated circuits having parallel conductors
#7129Integrated circuits having parallel conductors
#7130Integrated circuit memory devices having impurity-doped dielectric regions therein and methods of forming same
#7131Through array contact (TAC) for three-dimensional memory devices
#7132Semiconductor device for avoiding short circuit between adjacent storage nodes and manufacturing method thereof
#7133Bifurcated memory die module semiconductor device
#7134Semiconductor assemblies using edge stacking and methods of manufacturing the same
#7135Semiconductor package
#7136Memory cell having multi-level word line
#7137Via for coupling attached component upper electrode to substrate
#7138Structure and method for interconnection
#7139Via contact resistance control
#7140Semiconductor device with multi-layered source/drain regions having different dopant concentrations and manufacturing method thereof
#7141Tunnel magnetoresistive effect element, magnetic memory, and built-in memory
#7142Memory devices
#7143Vertical memory devices
#7144Three-dimensional nor-type memory device and method of making the same
#7145Three-dimensional semiconductor memory device
#7146Apparatus for High Speed ROM Cells
#7147Metal zero contact via redundancy on output nodes and inset power rail architecture
#7148Semiconductor device including various peripheral areas having different thicknesses
#7149Method for manufacturing a multi-band antenna package structure
#7150Fan-out antenna packaging structure and preparation method thereof
#7151Fan-out antenna packaging structure and preparation method thereof
#7152Semiconductor device having antenna and manufacturing method thereof
#7153Structure and method for flexible power staple insertion
#7154Fan-out package with multi-layer redistribution layer structure
#7155Planarizing RDLs in RDL-first processes through CMP process
#7156Method of detecting delamination in an integrated circuit package structure
#7157Chamferless via structures
#7158Chamferless via structures
#7159Apparatus with multi-wafer based device and method for forming such
#7160Dual airgap structure
#7161Embedded MRAM in interconnects and method for producing the same
#7162Methods of forming backside self-aligned vias and structures formed thereby
#7163Semiconductor devices
#7164Semiconductor memory
#7165Method for forming staircase structure of three-dimensional memory device
#7166Memory circuit having resistive device coupled with supply voltage line
#7167Fin-based strap cell structure for improving memory performance
#7168Thin-film transistor embedded dynamic random-access memory with shallow bitline
#7169Semiconductor structure and method making the same
#7170Through-substrate vias with improved connections
#7171Packaged integrated circuit with interposing functionality and method for manufacturing such a packaged integrated circuit
#7172Self-aligned via interconnect structures
#7173Processes for reducing leakage and improving adhesion
#7174Three-dimensional semiconductor device and method of fabricating the same
#7175Vertical-transport field-effect transistors having gate contacts located over the active region
#7176Via patterning using multiple photo multiple etch
#7177Interconnect structure and method of forming the same
#7178Layout of sense amplifier
#7179Integrated circuit including standard cell and method and system for designing and manufacturing the same
#7180Method for making semiconductor device including vertically integrated optical and electronic devices and comprising a superlattice
#7181Three-dimensional vertical NOR flash thin-film transistor strings
#7182Three-dimensional memory device containing bidirectional taper staircases and methods of making the same
#7183Semiconductor memory device structure
#7184SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#7185Semiconductor devices and methods for manufacturing the same
#7186Output Driver Circuit Configurable with Via Layer to Support Multiple Standards
#7187Semiconductor device including semiconductor chip transmitting signals at high speed
#7188Tight pitch via structures enabled by orthogonal and non-orthogonal merged vias
#7189Self aligned via and pillar cut for at least a self aligned double pitch
#7190Self-aligned multiple patterning processes with layered mandrels
#7191Semiconductor device including vertically integrated optical and electronic devices and comprising a superlattice
#7192Semiconductor devices and contact plugs
#7193Thin-film negative differential resistance and neuronal circuit
#7194Semiconductor memory device having vertical supporter penetrating the gate stack structure and through dielectric pattern
#7195ROM chip manufacturing structures having shared gate electrodes
#7196Warping reduction in silicon wafers
#7197Integrated circuit device and method of manufacturing the same
#7198Self-aligned via
#7199STACKING MULTIPLE DIES HAVING DISSIMILAR INTERCONNECT STRUCTURE LAYOUT AND PITCH
#7200High density wafer level test module