207728 ⎘
Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure
Interconnect structures for integrated circuits and their formation
#11102Methods for fabricating and forming semiconductor device structures including damascene structures
#11103On-chip capacitors and methods of assembling same
#11104Multi-level stack having multi-level contact and method
#11105Semiconductor package with through silicon via interconnect and method for fabricating the same
#11106Apparatuses including scalable drivers and methods
#111073D interconnect structure comprising fine pitch single damascene backside metal redistribution lines combined with through-silicon vias
#11108Interconnect structure having smaller transition layer via
#11109Ultrathin buried die module and method of manufacturing thereof
#11110Bonding pad structure with dense via array
#11111Interconnect structure and method for forming the same
#11112Semiconductor package
#11113PCB based RF-power package window frame
#11114Element array with a plurality of electromechanical conversion devices
#11115Thin film transistor array substrate
#11116Semiconductor method and device of forming a fan-out PoP device with PWB vertical interconnect units
#11117Semiconductor device and method of forming micro-vias partially through insulating material over bump interconnect conductive layer for stress relief
#11118Adaptive patterning for panelized packaging
#11119Adaptive patterning for panelized packaging
#11120Semiconductor device
#11121Through-silicon via with a non-continuous dielectric layer
#11122Method of fabricating integrated optoelectronic interconnects with side mounted transducer
#11123Plasma protection diode for a HEMT device
#11124Processes for forming integrated circuits and integrated circuits formed thereby
#11125Semiconductor device and method of forming non-linear interconnect layer with extended length for joint reliability
#11126Method of forming double pattern in a structure
#11127Method for fabricating a physical unclonable interconnect function array
#11128Three-dimensional semiconductor device comprising an inter-die connection on the basis of functional molecules
#11129Dual hard mask lithography process
#11130Metal fuse structure for improved programming capability
#11131Semiconductor device having non-planar interface between a plug layer and a contact layer
#11132Semiconductor package including an organic substrate and interposer having through-semiconductor vias
#11133Semiconductor structure having aluminum layer with high reflectivity
#11134Stress reduction apparatus with an inverted cup-shaped layer
#11135Semiconductor devices having through-vias and methods for fabricating the same
#11136Semiconductor device and method of forming a vertical interconnect structure for 3-D FO-WLCSP
#11137Semiconductor device having groove-shaped via-hole
#11138Meander line resistor structure
#11139Semiconductor device including stacked semiconductor chips
#11140Three dimensional structure memory
#11141Microelectronic device having metal interconnection levels connected by programmable vias
#11142Memory device
#11143Semiconductor device including a first wiring having a bending portion a via
#11144Microelectronic devices and methods for manufacturing microelectronic devices
#11145Semiconductor devices with nonconductive vias
#11146MULTI-CHIP PACKAGE AND METHOD OF MANUFACTURING THE SAME
#11147Integrating through substrate vias into middle-of-line layers of integrated circuits
#11148Back-end electrically programmable fuse
#11149Semiconductor device having groove-shaped via-hole
#11150Semiconductor device having groove-shaped via-hole
#11151Metal Layout of an Integrated Power Transistor and the Method Thereof
#11152Semiconductor device including two groove-shaped patterns
#11153Electrically conductive device and manufacturing method thereof
#11154Structure and method for a transformer with magnetic features
#11155Electrical fuse structure and method of fabricating same
#11156Semiconductor device having groove-shaped via-hole
#11157Strained transistor structure
#11158Adaptive patterning for panelized packaging
#11159Multilayer connection structure
#11160Three-dimensional semiconductor devices
#11161Semiconductor chips having redistributed power/ground lines directly connected to power/ground lines of internal circuits and methods of fabricating the same
#11162Semiconductor chip having plural penetration electrode penetrating therethrough
#11163SEMICONDUCTOR CHIP AND STACKED SEMICONDUCTOR PACKAGE HAVING THE SAME
#11164Interconnects for stacked non-volatile memory device and method
#11165Semiconductor device and method for manufacturing the same
#11166Semiconductor device and manufacturing method thereof
#11167Systems and methods for stacked semiconductor memory devices
#11168Trap rich layer with through-silicon-vias in semiconductor devices
#11169Method of protecting against via failure and structure therefor
#11170Multilayer interconnects with an extension part
#11171Semiconductor device
#11172Methods and apparatus to improve reliability of isolated vias
#11173Redundant via structure for metal fuse applications
#11174E-fuses containing at least one underlying tungsten contact for programming
#11175Wiring structure in a semiconductor device, method of forming the wiring structure, semiconductor device including the wiring structure and method of manufacturing the semiconductor device
#11176Semiconductor devices and methods of manufacturing the same
#11177Barrier for through-silicon via
#11178Semiconductor device
#11179Low energy etch process for nitrogen-containing dielectric layer
#11180Semiconductor device and method
#11181IC scan cell coupled to TSV top and bottom contacts
#11182Through substrate via structures and methods of forming the same
#11183Semiconductor device with damascene bit line and method for fabricating the same
#11184ELECTRONIC DEVICE AND METHOD FOR PRODUCING SAME
#11185Three-dimensional vertically interconnected structure
#11186Interconnect structure with an electromigration and stress migration enhancement liner
#11187Process for forming package-on-package structures
#11188HIGH THERMAL PERFORMANCE 3D PACKAGE ON PACKAGE STRUCTURE
#11189Semiconductor device and method of manufacturing the same
#11190Wafer level chip scale package and method of manufacturing the same
#11191Semiconductor device and manufacturing method of the same
#11192Package-on-package system with through vias and method of manufacture thereof
#11193Power semiconductor module with integrated thick-film printed circuit board
#11194Semiconductor device and method of manufacturing the same
#11195Semiconductor device and method of forming stacked vias within interconnect structure for Fo-WLCSP
#11196Semiconductor interconnect structure having enhanced performance and reliability
#11197Rectangular via for ensuring via yield in the absence of via redundancy
#11198Semiconductor device, semiconductor wafer and manufacturing method of semiconductor device
#11199Methods of forming semiconductor devices having capacitor and via contacts
#11200Method for forming carbon nanotubes and carbon nanotube film forming apparatus
#11201Package systems including passive electrical components
#11202Semiconductor device and method of forming repassivation layer with reduced opening to contact pad of semiconductor die
#11203Semiconductor device
#11204Method for manufacturing semiconductor device using anisotropic etching
#11205Semiconductor devices having through electrodes and methods of fabricating the same
#11206INTEGRATED CIRCUIT INCLUDING FRONT SIDE AND BACK SIDE ELECTRICAL INTERCONNECTS
#11207NON-VOLATILE MEMORY DEVICE HAVING VERTICAL STRUCTURE AND METHOD OF OPERATING THE SAME
#11208Bond pad structure to reduce bond pad corrosion
#11209Methods of forming interconnects
#11210Conductive routings in integrated circuits using under bump metallization
#11211Multi-chip wafer level package
#11212Trap rich layer with through-silicon-vias in semiconductor devices
#11213Interconnecting mechanism for 3D integrated circuit
#11214SEMICONDUCTOR DEVICE COMPRISING VARIABLE-SIZED CONTACT, METHOD OF FORMING SAME, AND APPARATUS COMPRISING SAME
#11215Packaged microelectronic elements having blind vias for heat dissipation
#11216Semiconductor device
#11217MRAM with sidewall protection and method of fabrication
#11218Via structure
#11219Low stress vias
#11220Photoactive compound gradient photoresist
#11221CONDUCTOR CONTACT STRUCTURE AND FORMING METHOD, AND PHOTOMASK PATTERN GENERATING METHOD FOR DEFINING SUCH CONDUCTOR CONTACT STRUCTURE
#11222Implementing integrated circuit mixed double density and high performance wire structure
#11223Integrated thermoelectric generator
#11224Composite semiconductor device with integrated diode
#11225Semiconductor package and method of manufacturing the same
#11226Stacked packages having through hole vias
#11227SEMICONDUCTOR DEVICE
#11228Package interconnects
#11229INTERCONNECT STRUCTURE WITH IMPROVED DIELECTRIC LINE TO VIA ELECTROMIGRATION RESISTANT INTERFACIAL LAYER AND METHOD OF FABRICATING SAME
#11230Overlapping contacts for semiconductor device
#11231Method and material for forming a double exposure lithography pattern
#11232Via structure for integrated circuits
#11233Method of manufacturing a semiconductor device and semiconductor device
#11234Single exposure in multi-damascene process
#11235Nanoscale interconnects fabricated by electrical field directed assembly of nanoelements
#11236E-fuse structures and methods of manufacture
#11237Semiconductor memory device and method for manufacturing same
#11238Methods for via structure with improved reliability
#11239Semiconductor structure formed by double patterning technique
#11240Reliable packaging and interconnect structures
#11241Semiconductor device having groove-shaped via-hole
#11242Gap filling method for dual damascene process
#11243Electromagnetic shield and associated methods
#11244Semiconductor device having through silicon vias and manufacturing method thereof
#11245Non-hierarchical metal layers for integrated circuits
#11246Three-dimensional semiconductor memory devices having double cross point array and methods of fabricating the same
#11247Conductive structures, systems and devices including conductive structures and related methods
#11248Methods of forming through-substrate interconnects
#11249Semiconductor integrated circuit with multi-cut via and automated layout method for the same
#11250Device-manufacturing scheme for increasing the density of metal patterns in inter-layer dielectrics
#11251BEOL structures incorporating active devices and mechanical strength
#11252BEOL compatible FET structrure
#11253SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF, DISPLAY APPARATUS AND ELECTRONIC APPARATUS
#11254Interposer test structures and methods
#11255Semiconductor memory device, method of manufacturing the same and method of forming contact structure
#11256Copper-filled trench contact for transistor performance improvement
#11257Semiconductor device and manufacturing method thereof
#11258On-chip interconnects with reduced capacitance and method of afbrication
#11259Bonding pad structure for a backside illuminated image sensor device and method of manufacturing the same
#11260Wetting wave front control for reduced air entrapment during wafer entry into electroplating bath
#11261EMBEDDED CAPACITOR DEVICE AND METHODS OF FABRICATION
#11262Finger metal oxide metal capacitor structures
#11263Semiconductor device
#11264Semiconductor device having groove-shaped via-hole
#11265Semiconductor device having groove-shaped via-hole
#11266Multilayer interconnect structure and method for integrated circuits
#11267Semiconductor device having groove-shaped via-hole
#11268System comprising a semiconductor device and structure
#11269Semiconductor device having groove-shaped via-hole
#11270Interconnects for stacked non-volatile memory device and method
#11271Microelectronic devices with through-silicon vias and associated methods of manufacturing
#11272Semiconductor device, manufacturing method thereof, solid-state imaging device, and electronic apparatus
#11273Method of forming an interconnect structure having an enlarged region
#11274Semiconductor device
#11275Semiconductor device having a multilayer interconnection structure
#11276Semiconductor device and method of embedding bumps formed on semiconductor die into penetrable adhesive layer to reduce die shifting during encapsulation
#11277Self-aligned nano-structures
#11278Method of forming metal interconnections of semiconductor device
#11279Semiconductor device and a method of manufacturing the same
#11280Stacked via structure for metal fuse applications
#11281Semiconductor device
#11282Semiconductor device and a method of manufacturing the same
#11283Semiconductor device and method of manufacturing the same
#11284Semiconductor device and a method of manufacturing the same
#11285Semiconductor device and fabrication method therefor
#11286Semiconductor device, method for manufacturing the same, method for generating mask data, mask and computer readable recording medium
#11287Methods of patterning materials
#11288SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#11289SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#11290Electrochemical plating
#11291SEMICONDUCTOR DEVICE WITH RESISTANCE CIRCUIT
#11292Redundancy design with electro-migration immunity and method of manufacture
#11293Two-track cross-connect in double-patterned structure using rectangular via
#11294Semiconductor device with interconnection connecting to a via
#11295Semiconductor device comprising metallization layers of reduced interlayer capacitance by reducing the amount of etch stop materials
#11296SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING SEMICONDUCTOR DEVICE
#11297Method for manufacturing semiconductor device
#11298Vias between conductive layers to improve reliability
#11299Technique for reducing plasma-induced etch damage during the formation of vias in interlayer dielectrics by modified RF power ramp-up
#11300Semiconductor apparatus having power through holes connected to power pattern
#11301Anchored conductive via and method for forming
#11302Semiconductor structures having improved contact resistance
#11303Method to fabricate copper wiring structures and structures formed thereby
#11304SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#11305Semiconductor device and method of manufacturing a semiconductor device
#11306SEMICONDUCTOR DEVICE
#11307Semiconductor device manufacturing method and semiconductor device
#11308Semiconductor device
#11309WIRING STRUCTURE OF SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE WIRING STRUCTURE
#11310Semiconductor device
#113113D integration method using SOI substrates and structures produced thereby
#11312High performance on-chip vertical coaxial cable, method of manufacture and design structure
#11313Reduced number of masks for IC device with stacked contact levels
#11314Method for making multilayer connection structure
#11315Semiconductor device and manufacturing method thereof
#11316SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME
#11317Semiconductor device including capacitor
#11318Interconnect structure and method of making same
#11319Creation of vias and trenches with different depths
#11320Semiconductor packages and methods of fabricating the same
#11321Storage element, storage device, and signal processing circuit
#11322Semiconductor device with a line and method of fabrication thereof
#11323IC having viabar interconnection and related method
#11324Semiconductor device and method of manufacturing the same
#11325Redundancy design with electro-migration immunity and method of manufacture
#11326Creation of vias and trenches with different depths
#11327Interconnection structure for an integrated circuit
#11328Multilayer wiring substrate and method of manufacturing the same
#11329Semiconductor device comprising self-aligned contact bars and metal lines with increased via landing regions
#11330Integrated circuit package connected to a data transmission medium
#11331Anchored damascene structures
#11332Stacked package structure including insulating layer between two stacked packages
#11333Method for metal correlated via split for double patterning
#11334Metal containing sacrifice material and method of damascene wiring formation
#11335Semiconductor structures having improved contact resistance
#11336Thin film resistors and methods of manufacture
#11337SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME, AND ELECTRIC DEVICE
#11338Electromigration resistant via-to-line interconnect
#11339Semiconductor device and method of manufacturing the same
#11340Integrated circuit with protection from copper extrusion
#11341Accessing or interconnecting integrated circuits
#11342Interconnects for stacked non-volatile memory device and method
#11343Apparatus, system, and method for wireless connection in integrated circuit packages
#11344Through level vias and methods of formation thereof
#11345Sublithographic patterning employing image transfer of a controllably damaged dielectric sidewall
#11346Microelectronic device provided with an array of elements made from a conductive polymer with a positive temperature coefficient
#11347Interconnect structure for high frequency signal transmissions
#11348Slot-shielded coplanar strip-line compatible with CMOS processes
#11349Structure of power grid for semiconductor devices and method of making the same
#11350Power/ground layout for chips
#11351Semiconductor device and method of manufacturing the same
#11352Pad structure having contact bars extending into substrate and wafer having the pad structure
#11353Adhesive bonding composition and method of use
#11354Method for manufacturing a semiconductor device having an interconnect structure and a reinforcing insulating film
#11355Metal wiring structures for uniform current density in C4 balls
#11356Electronic component having encapsulated wiring board and method for manufacturing the same
#11357Methods and architectures for bottomless interconnect vias
#11358Electrical fuse structure and method of fabricating same
#11359Semiconductor device for effectively disperse heat generated from heat generating device
#11360Bumpless build-up layer package with pre-stacked microelectronic devices
#11361Carbon nanotube interconnection and manufacturing method thereof
#11362Methods of forming openings
#11363Power and ground routing of integrated circuit devices with improved IR drop and chip performance
#11364Semiconductor device and manufacturing method thereof
#11365Nonvolatile semiconductor memory device including pillars buried inside through holes
#11366Impedance controlled electrical interconnection employing meta-materials
#11367Seal ring structure with metal pad
#11368Monolithic microwave integrated circuit
#11369SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
#11370Devices formed with dual damascene process
#11371Method of forming a memory device
#11372Non-lithographic formation of three-dimensional conductive elements
#11373Method of chip package build-up
#11374Semiconductor device and manufacturing method thereof
#11375Semiconductor contact structure including a spacer formed within a via and method of manufacturing the same
#11376Semiconductor device and method of forming protective layer over exposed surfaces of semiconductor die
#11377System comprising a semiconductor device and structure
#11378Semiconductor device structures including damascene trenches with conductive structures and related method
#11379Semiconductor device including ultra low-K (ULK) metallization stacks with reduced chip-package interaction
#11380METHOD OF PRODUCING A DUAL DAMASCENE MULTILAYER INTERCONNECTION AND MULTILAYER INTERCONNECTION STRUCTURE
#11381Wiring board, semiconductor device, and manufacturing methods thereof
#11382SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE COMPRISING DIFFERENT LEVEL INTERCONNECTION LAYERS CONNECTED BY CONDUCTOR LAYERS INCLUDING CONDUCTOR LAYER FOR REDUNDANCY
#11383Semiconductor device having a multilayer structure
#11384Conductive via structures for routing porosity and low via resistance, and processes of making
#11385Metal thin film connection structure, manufacturing method thereof and array substrate
#11386Semiconductor integrated circuit with multi-cut via and automated layout method for the same
#11387Semiconductor apparatus
#11388ULTRA-LOW POWER SWNT INTERCONNECTS FOR SUB-THRESHOLD CIRCUITS
#11389Microelectronic packages having cavities for receiving microelectronic elements
#11390Semiconductor device
#11391SEMICONDUCTOR DEVICE AND METHOD OF FORMING SEMICONDUCTOR DEVICE
#11392Interconnect structure to reduce stress induced voiding effect
#11393Fluorine depleted adhesion layer for metal interconnect structure
#11394Semiconductor package and method of mounting semiconductor die to opposite sides of TSV substrate
#11395Semiconductor device and method of embedding bumps formed on semiconductor die into penetrable adhesive layer to reduce die shifting during encapsulation
#11396Semiconductor device and method of mounting semiconductor die to heat spreader on temporary carrier and forming polymer layer and conductive layer over the die
#11397SEMICONDUCTOR DEVICE
#11398Semiconductor device for preventing crack in pad region and fabricating method thereof
#11399Semiconductor device comprising variable-sized contact, method of forming same, and apparatus comprising same
#11400SEMICONDUCTOR DEVICE LAYOUT METHOD, A COMPUTER PROGRAM, AND A SEMICONDUCTOR DEVICE MANUFACTURE METHOD