207728 ⎘
Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure
CMOS device with double-sided terminals and method of making the same
#10802Through silicon vias for semiconductor devices and manufacturing method thereof
#10803Packaging substrate and method for manufacturing same
#10804Copper based nitride liner passivation layers for conductive copper structures
#10805Integrated circuit package with printed circuit layer
#10806Memory devices with magnetic random access memory (MRAM) cells and associated structures for connecting the MRAM cells
#10807Semiconductor devices having compact footprints
#10808Circuit structures and methods of fabrication with enhanced contact via electrical connection
#10809Wide pin for improved circuit routing
#10810Manganese oxide hard mask for etching dielectric materials
#10811Semiconductor devices with multilayer flex interconnect structures
#10812SEMICONDUCTOR DEVICE HAVING INSULATING LAYERS CONTAINING OXYGEN AND A BARRIER LAYER CONTAINING MANGANESE
#10813Electronic device
#10814Package substrates with multiple dice
#10815Semiconductor package with single sided substrate design and manufacturing methods thereof
#10816Three dimension structure memory
#10817Dual damascene dual alignment interconnect scheme
#10818Three-dimensional vertically interconnected structure and fabricating method thereof
#10819INTEGRATED CIRCUIT PACKAGE WITH AN INTERPOSER FORMED FROM A REUSABLE CARRIER SUBSTRATE
#10820IINTEGRATED CIRCUIT PACKAGE USING SILICON-ON-OXIDE INTERPOSER SUBSTRATE WITH THROUGH-SILICON VIAS
#10821Structure and method for making crack stop for 3D integrated circuits
#10822Semiconductor device having metal interconnections
#10823High frequency switch module
#10824Contact plug penetrating a metallic transistor
#10825Low-stress vias
#10826OPTICAL WIRING SUBSTRATE, MANUFACTURING METHOD OF OPTICAL WIRING SUBSTRATE AND OPTICAL MODULE
#10827Semiconductor device
#10828Semiconductor package having embedded semiconductor elements
#10829Multichip integration with through silicon via (TSV) die embedded in package
#10830Providing a void-free filled interconnect structure in a layer of package substrate
#10831Composite reconstituted wafer structures
#10832Interconnect structures containing nitrided metallic residues
#10833Interconnect with hybrid metallization
#10834Interconnect structures containing nitrided metallic residues
#10835Composite reconstituted wafer structures
#10836Composite reconstituted wafer structures
#10837Vertical electronic fuse
#10838Through substrate via structures and methods of forming the same
#10839Semiconductor device having groove-shaped via-hole
#10840CONTACT LINER AND METHODS OF FABRICATION THEREOF
#10841Interconnect structure and method of making same
#10842Conductive via structures for routing porosity and low via resistance, and processes of making
#10843Systems and methods for stacked semiconductor memory devices
#10844Reliable packaging and interconnect structures
#10845Semiconductor method and device of forming a fan-out PoP device with PWB vertical interconnect units
#10846HIGH THERMAL PERFORMANCE 3D PACKAGE ON PACKAGE STRUCTURE
#10847Electrical fuse structure and method of formation
#10848Semiconductor interconnect structures
#10849Semiconductor device having a multilayer interconnection structure
#10850Semiconductor device and manufacturing method thereof
#10851Through-vias for wiring layers of semicondutor devices
#10852Semiconductor device and fabrication method
#10853Semiconductor device with air gap and method of fabricating the same
#10854Semiconductor device having groove-shaped via-hole
#10855SEMICONDUCTOR DEVICE INCLUDING COPPER WIRING AND VIA WIRING HAVING LENGTH LONGER THAN WIDTH THEREOF AND METHOD OF MANUFACTURING THE SAME
#10856Wiring substrate and semiconductor device
#10857Chip-on-film package and device assembly including the same
#10858Semiconductor apparatus
#10859Conductive structures, systems and devices including conductive structures and related methods
#10860Multilevel interconnect structures and methods of fabricating same
#10861Semiconductor packages and methods of fabricating the same
#10862Semiconductor device having groove-shaped via-hole
#10863Semiconductor device having groove-shaped via-hole
#10864Semiconductor device having groove-shaped via-hole
#10865Semiconductor device having groove-shaped via-hole
#10866Semiconductor packages including a heat spreader and methods of forming the same
#10867Semiconductor device having groove-shaped via-hole
#10868Semiconductor devices and methods of manufacturing the same
#10869Through-wafer via device and method of manufacturing the same
#10870Semiconductor device having groove-shaped via-hole
#10871Semiconductor device having groove-shaped via-hole
#10872Semiconductor device having groove-shaped via-hole
#10873Semiconductor device having groove-shaped via-hole
#10874Method for making a photolithography mask intended for the formation of contacts, mask and integrated circuit corresponding thereto
#10875Stacked structure having a protective layer between an insulation layer and wiring
#10876Semiconductor device and semiconductor system including the same
#10877Methods of forming a barrier system containing an alloy of metals introduced into the barrier system, and an integrated circuit product containing such a barrier system
#10878Semiconductor device, method for manufacturing same, and electronic component
#10879Forming array contacts in semiconductor memories
#10880Semiconductor device
#10881THROUGH-SUBSTRATE VIA WITH A FUSE STRUCTURE
#10882Interlayer conductor structure and method
#10883Wafer level chip scale packaging intermediate structure apparatus and method
#10884Stress tuning for reducing wafer warpage
#10885Interconnect structure for stacked device
#10886Method and apparatus for back end of line semiconductor device processing
#10887Interconnect structure with kinked profile
#10888Semiconductor structure
#10889Dual damascene gap filling process
#10890Stubby pads for channel cross-talk reduction
#10891Patterning approach for improved via landing profile
#10892Interconnect structure and method of forming same
#10893Semiconductor device and manufacturing method having copper interconnects with metal film, barrier metal, and metal caps
#10894Semiconductor Device
#10895Conductive line system and process
#10896System and method for optimization of an imaged pattern of a semiconductor device
#10897Semiconductor device
#10898Nonvolatile semiconductor memory device and method of manufacturing the same
#10899Interconnect structure for connecting dies and methods of forming the same
#10900Layout for reticle and wafer scanning electron microscope registration or overlay measurements
#10901Semiconductor device and method of forming repassivation layer with reduced opening to contact pad of semiconductor die
#10902Semiconductor integrated circuit
#10903Mitigating electromigration effects using parallel pillars
#10904Method of fabricating an air gap using a damascene process and structure of same
#10905Semiconductor component comprising copper metallizations
#10906Method of preventing a pattern collapse
#10907Semiconductor device using carbon nanotube, and manufacturing method thereof
#10908Method of forming stacked trench contacts and structures formed thereby
#10909Stacked packages having through hole vias
#10910Semiconductor device and method for manufacturing the semiconductor device
#10911Thermally-optimized metal fill for stacked chip systems
#10912Power MOS transistor with improved metal contact
#10913Bumpless build-up layer package with pre-stacked microelectronic devices
#10914Integrated circuit interconnects and methods of making same
#10915Semiconductor device and method of forming micro-vias partially through insulating material around bump interconnect
#10916Semiconductor devices including WiSX
#10917Integrated circuits and methods of forming the same with multi-level electrical connection
#10918Device bond pads over process control monitor structures in a semiconductor die
#10919Tapered sidewall conductive lines and formation thereof
#10920Semiconductor device and method of embedding bumps formed on semiconductor die into penetrable adhesive layer to reduce die shifting during encapsulation
#10921Elongated via structures
#10922Interconnection structure for an integrated circuit
#10923Stacked multilayer structure and manufacturing method thereof
#10924THREE-DIMENSIONAL MONOLITHIC ELECTRONIC-PHOTONIC INTEGRATED CIRCUIT
#10925Semiconductor device and method of fabricating the same
#10926INTERCONNECT STRUCTURE AND METHOD OF MAKING SAME
#10927Semiconductor devices having through silicon vias and methods of fabricating the same
#10928Non-lithographic formation of three-dimensional conductive elements
#10929MRAM with sidewall protection and method of fabrication
#10930Techniques for enhancing fracture resistance of interconnects
#10931Integrated circuit package with active interposer
#10932Mitigating pattern collapse
#10933Through silicon vias for semiconductor devices and manufacturing method thereof
#10934Chip with through silicon via electrode and method of forming the same
#10935PAD STRUCTURES AND WIRING STRUCTURES IN A VERTICAL TYPE SEMICONDUCTOR DEVICE
#10936Method of manufacturing semiconductor device
#10937Semiconductor device
#10938Forming vias and trenches for self-aligned contacts in a semiconductor structure
#10939Semiconductor devices and methods of manufacture thereof
#10940Three dimensional stacked structure for chips
#10941Method of manufacturing interconnection and semiconductor device
#10942Semiconductor device including passivation layer encapsulant
#10943Ultrathin buried die module and method of manufacturing thereof
#10944Cobalt based interconnects and methods of fabrication thereof
#10945Package on package (PoP) bonding structures
#10946Capacitor in Post-Passivation structures and methods of forming the same
#10947Modified via bottom for BEOL via efuse
#10948Method for forming a dual damascene structure of a semiconductor device, and a semiconductor device therewith
#10949Surface modified TSV structure and methods thereof
#10950Semiconductor devices comprising interconnect structures and methods of fabrication
#10951Barrier for through-silicon via
#10952Semiconductor device including contact plug and method of manufacturing the same
#10953Semiconductor device
#10954Interconnect structure and fabrication method
#10955INTERCONNECT STRUCTURE AND FORMING METHOD THEREOF
#10956Method for fabricating interconnect structure
#10957Semiconductor device
#10958Protecting layer in a semiconductor structure
#10959Semiconductor device with a multilayer wire
#10960Semiconductor constructions and methods of forming interconnects
#10961Implementing enhanced power supply distribution and decoupling utilizing TSV exclusion zone
#10962Semiconductor interconnect structures
#10963Crosstalk polarity reversal and cancellation through substrate material tuning
#10964Data transfer across power domains
#10965Clock distribution network for 3D integrated circuit
#10966Semiconductor devices having guard ring structure and methods of manufacture thereof
#10967Semiconductor device including two groove-shaped patterns that include two bent portions
#10968Semiconductor device including two groove-shaped patterns
#10969Strained transistor structure
#10970Through-substrate via formation with improved topography control
#10971Method of manufacturing an enhanced electromigration performance hetero-junction bipolar transistor
#10972Semiconductor memory device including a slit
#10973Low resistance stacked annular contact
#10974Semiconductor structure and manufacturing method of the same
#10975Interconnect with titanium—oxide diffusion barrier
#10976Integrated circuit chips having vertically extended through-substrate vias therein
#10977Nitride semiconductor device
#10978BEOL structures incorporating active devices and mechanical strength
#10979Photoactive compound gradient photoresist
#10980Semiconductor device having a high frequency external connection electrode positioned within a via hole
#10981Semiconductor structures and methods of manufacturing the same
#10982Self-enclosed asymmetric interconnect structures
#10983Packaging substrate, method for manufacturing same, and chip packaging body having same
#10984Semiconductor device and method of manufacturing the same
#10985Beol structures incorporating active devices and mechanical strength
#10986Bond pad structure and method of manufacturing the same
#10987System of chip package build-up
#10988TSV formation
#10989Semiconductor package and method of mounting semiconductor die to opposite sides of TSV substrate
#10990Embedded chip packages and methods for manufacturing an embedded chip package
#10991CD control
#10992Dual hard mask lithography process
#10993Semiconductor structure and method of generating masks for making integrated circuit
#10994Cooling channels in 3DIC stacks
#10995Enhanced electrochemical deposition filling
#10996Three dimensional stacked semiconductor structure and method for manufacturing the same
#10997Semiconductor device and method of forming non-linear interconnect layer with extended length for joint reliability
#10998Semiconductor device
#10999Semiconductor device having a self-forming barrier layer at via bottom
#11000Circuit boards, methods of fabricating the same, and semiconductor packages including the circuit boards
#11001Contact and via interconnects using metal around dielectric pillars
#11002Directed self assembly of block copolymers to form vias aligned with interconnects
#11003Localized high density substrate routing
#11004Chip-size, double side connection package and method for manufacturing the same
#11005Electrical fuse and method of fabricating the same
#11006Reliable interconnect for semiconductor device
#11007Encapsulated damascene interconnect structure for integrated circuits
#11008Mold chase for integrated circuit package assembly and associated techniques and configurations
#11009Method for forming a vertical electrical connection in a layered semiconductor structure
#11010Interconnect structures comprising flexible buffer layers
#11011Encapsulated metal interconnect
#11012PACKAGE SUBSTRATE AND METHOD OF FABRICATING THE SAME
#11013Apparatus and method for high density multi-chip structures
#11014SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
#11015Post passivation interconnect structures and methods for forming the same
#11016Semiconductor device with protective layer over exposed surfaces of semiconductor die
#11017Electronic fuse vias in interconnect structures
#11018Gate contact structure over active gate and method to fabricate same
#11019Apparatuses including scalable drivers and methods
#11020Semiconductor interconnect structure having enhanced performance and reliability
#11021Semiconductor device having barrier metal layer
#11022E-fuse structures and methods of manufacture
#11023Semiconductor package including a substrate and an interposer
#11024Overlay-tolerant via mask and reactive ion etch (RIE) technique
#11025Semiconductor device and manufacturing method thereof
#11026Interconnect structure and method
#11027Semiconductor device and fabricating method thereof
#11028Semiconductor device with low resistance wiring and manufacturing method for the device
#11029Patterned graphene structures on silicon carbide
#11030Semiconductor package with interposer
#11031Multi-level vertical plug formation with stop layers of increasing thicknesses
#11032Self-aligned interconnection for integrated circuits
#11033Forming array contacts in semiconductor memories
#11034Semiconductor device and method for fabricating the same
#11035Method to improve fine Cu line reliability in an integrated circuit device
#11036Substrate structure and method for manufacturing same
#11037Semiconductor structure and method for fabricating semiconductor layout
#11038Apparatus, system, and method for wireless connection in integrated circuit packages
#11039ELECTRONIC STRUCTURE CONTAINING A VIA ARRAY AS A PHYSICAL UNCLONABLE FUNCTION
#11040Stacked multilayer structure and manufacturing method thereof
#11041Semiconductor devices comprising GSG interconnect structures
#11042Method for forming an electrical connection between metal layers
#11043Method for forming an electrical connection between metal layers
#11044Semiconductor device and method of fabricating the same
#11045Two-track cross-connect in double-patterned structure using rectangular via
#11046Semiconductor device and method for fabricating the same
#11047Semiconductor devices having through electrodes and methods of fabricating the same
#11048Method of fabricating a profile control in interconnect structures
#11049Method and structure of forming backside through silicon via connections
#11050SRAM cell connection structure
#11051Trap rich layer with through-silicon-vias in semiconductor devices
#11052Bonding method using porosified surfaces for making stacked structures
#11053Metallization of fluorocarbon-based dielectric for interconnects
#11054Integrated circuit interconnects and methods of making same
#11055Semiconductor device with embedded interconnect pad
#11056Copper contact plugs with barrier layers
#11057Ternary tungsten boride nitride films and methods for forming same
#11058Low cost anti-fuse structure and method to make same
#11059Semiconductor package with single sided substrate design and manufacturing methods thereof
#11060Integrated circuit device having through-silicon-via structure
#11061Vertical type semiconductor device and method for manufacturing the same
#11062Method for forming interlayer connectors in a three-dimensional stacked IC device
#11063Semiconductor substrate and method of fabricating the same
#11064Hybrid interconnect scheme including aluminum metal line in low-k dielectric
#11065Semiconductor device and fabricating process for the same
#11066Low cost anti-fuse structure
#11067Method of forming vertical electronic fuse interconnect structures including a conductive cap
#11068Multi-chip package and method of manufacturing the same
#11069Methods and structures for multiport memory devices
#11070Package substrates with multiple dice
#11071Hybrid package transmission line circuits
#11072Voids in interconnect structures and methods for forming the same
#11073Semiconductor devices and methods of manufacturing the same
#11074Semiconductor device with output circuit and pad
#11075Apparatus, system, and method for wireless connection in integrated circuit packages
#11076Semiconductor device
#11077Semiconductor memory device, memory system including the same and method of manufacturing the same
#11078Calibration kits for RF passive devices
#11079Dual damascene dual alignment interconnect scheme
#11080Through-silicon via and fabrication method thereof
#11081Semiconductor devices, methods of manufacture thereof, and methods of forming resistors
#11082Via density and placement in radio frequency shielding applications
#11083Three dimensional memory structure
#11084Integrated circuit including wire structure, related method and design structure
#11085Re-distribution Layer Via Structure and Method of Making Same
#11086Semiconductor processing method and semiconductor structure
#11087Capacitor for interposers and methods of manufacture thereof
#11088SPACER FOR ENHANCING VIA PATTERN OVERLAY TOLERENCE
#11089Substrate-less stackable package with wire-bond interconnect
#11090INTERCONNECT WITH TITANIUM-OXIDE DIFFUSION BARRIER
#11091METHODS OF FORMING CONDUCTIVE CONTACTS FOR A SEMICONDUCTOR DEVICE
#11092Semiconductor packages including molding layers
#11093Semiconductor interconnect structure
#11094Semiconductor package including an antenna formed in a groove within a sealing element
#11095Semiconductor device
#11096Semiconductor device having mesh-pattern wirings
#11097Elongated via structures
#11098Fabrication of semiconductor device including chemical mechanical polishing
#110993D integrated circuit system with connecting via structure and method for forming the same
#11100Semiconductor devices including conductive features with capping layers and methods of forming the same