ClassID:

207728

H01L23/5226 - page 7 - CPC Classification

Classification description:

Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure

Recent Application in this class:
#1801
20240234299
2024-07-11

STACKED VIA STRUCTURE

#1802
20240234298
2024-07-11

Semiconductor substrate structure and method of manufacturing the same

#1803
20240234297
2024-07-11

VIA STRUCTURE WITHOUT LINER INTERFACE

#1804
20240234296
2024-07-11

SEMICONDUCTOR DEVICE HAVING HIGH BREAKDOWN VOLTAGE CAPACITOR

#1805
20240234203
2024-07-11

SEMICONDUCTOR DEVICE HAVING LOW DIELECTRIC CAPACITANCE AND GOOD ELECTRICAL BREAKDOWN PERFORMANCE, AND METHOD FOR MANUFACTURING THE SAME

#1806
20240224825
2024-07-04

LOW RESISTANCE CROSSPOINT ARCHITECTURE

#1807
20240224533
2024-07-04

INTEGRATED CIRCUIT DEVICE INCLUDING VERTICAL MEMORY DEVICE

#1808
20240224516
2024-07-04

String driver assemblies including two-dimensional materials, and related memory devices

#1809
20240222508
2024-07-04

FINFET Devices with Backside Power Rail and Backside Self-Aligned Via

#1810
20240222460
2024-07-04

SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME

#1811
20240222422
2024-07-04

MULTISTACK METAL-INSULATOR-METAL (MIM) STRUCTURE USING SPACER FORMATION PROCESS FOR HETEROGENEOUS INTEGRATION WITH DISCRETE CAPACITORS

#1812
20240222368
2024-07-04

3D SEMICONDUCTOR DEVICES AND STRUCTURES WITH METAL LAYERS

#1813
20240222358
2024-07-04

DEEP TRENCH CAPACITOR FUSE STRUCTURE FOR HIGH VOLTAGE BREAKDOWN DEFENSE AND METHODS FOR FORMING THE SAME

#1814
20240222328
2024-07-04

PACKAGE ARCHITECTURE WITH MEMORY CHIPS HAVING DIFFERENT PROCESS REGIONS

#1815
20240222326
2024-07-04

PACKAGE ARCHITECTURE WITH MEMORY CHIPS HAVING DIFFERENT PROCESS REGIONS

#1816
20240222325
2024-07-04

SEMICONDUCTOR ASSEMBLIES USING EDGE STACKING AND METHODS OF MANUFACTURING THE SAME

#1817
20240222299
2024-07-04

SEMICONDUCTOR PACKAGE AND METHOD FOR MANUFACTURING THE SAME

#1818
20240222275
2024-07-04

NON-VOLATILE MEMORY DEVICE, METHOD FOR FABRICATING THE SAME AND ELECTRONIC SYSTEM INCLUDING THE SAME

#1819
20240222274
2024-07-04

HYBRID INTEGRATION OF BACK-END-OF-LINE LAYERS FOR DISAGGREGATED TECHNOLOGIES

#1820
20240222273
2024-07-04

SEMICONDUCTOR PACKAGE

#1821
20240222272
2024-07-04

DOUBLE INTERCONNECTS FOR STITCHED DIES

#1822
20240222269
2024-07-04

SEMICONDUCTOR DEVICE INCLUDING RECESSED INTERCONNECT STRUCTURE

#1823
20240222268
2024-07-04

SEMICONDUCTOR DEVICE HAVING CONTACT PLUG

#1824
20240222267
2024-07-04

SEMICONDUCTOR DEVICES AND ELECTRONIC SYSTEMS INCLUDING THE SAME

#1825
20240222266
2024-07-04

Semiconductor structure and manufacturing method thereof

#1826
20240222265
2024-07-04

THIN FILM TRANSISTOR ARRAY SUBSTRATE, MANUFACTURING METHOD, AND DISPLAY PANEL

#1827
20240222228
2024-07-04

DEVICES IN A SILICON CARBIDE LAYER COUPLED WITH DEVICES IN A GALLIUM NITRIDE LAYER

#1828
20240222189
2024-07-04

MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE

#1829
20240221821
2024-07-04

INTEGRATED CIRCUIT STRUCTURES HAVING TWO-TRANSISTOR GAIN CELL

#1830
20240219634
2024-07-04

PHOTONIC SILICON-INSULATOR-SILICON MODULATOR AND METHODS FOR FORMING THE SAME

#1831
20240215261
2024-06-27

SEMICONDUCTOR PACKAGES

#1832
20240215256
2024-06-27

INTEGRATED CIRCUIT STRUCTURES HAVING BACKSIDE CAPACITORS

#1833
20240215254
2024-06-27

MEMORY DEVICE AND METHOD OF FORMING THE SAME

#1834
20240213305
2024-06-27

METAL-INSULATOR-METAL STRUCTURE AND METHODS OF FABRICATION THEREOF

#1835
20240213304
2024-06-27

MIM CAPACITOR STRUCTURE AND FABRICATING METHOD OF THE SAME

#1836
20240213246
2024-06-27

SEMICONDUCTOR DEVICE, INTEGRATED CIRCUIT AND METHODS OF MANUFACTURING THE SAME

#1837
20240213243
2024-06-27

FORK SHEET DEVICE WITH WRAPPED SOURCE AND DRAIN CONTACT TO PREVENT NFET TO PFET CONTACT SHORTAGE IN A TIGHT SPACE

#1838
20240213229
2024-06-27

MICRO LED STRUCTURE AND MICRO LED PANEL

#1839
20240213223
2024-06-27

SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE

#1840
20240213196
2024-06-27

Power Semiconductor Devices Including Multiple Layer Metallization

#1841
20240213195
2024-06-27

SEMICONDUCTOR STRUCTURE WITH HYBRID BONDING AND METHOD FOR MANUFACTURING THE SAME

#1842
20240213187
2024-06-27

SEMICONDUCTOR PACKAGE AND METHOD FOR MANUFACTURING THE SAME

#1843
20240213180
2024-06-27

INTERCONNECT STRUCTURE AND FORMING METHOD THEREOF

#1844
20240213164
2024-06-27

TSV-TYPE EMBEDDED MULTI-DIE INTERCONNECT BRIDGE ENABLING WITH THERMAL COMPRESSION NON-CONDUCTIVE FILM (TC-NCF) PROCESS

#1845
20240213162
2024-06-27

SEMICONDUCTOR DEVICE WITH ADJUSTMENT LAYERS AND METHOD FOR FABRICATING THE SAME

#1846
20240213160
2024-06-27

SEMICONDUCTOR DEVICE HAVING A REINFORCING INSULATING LAYER CORRESPONDING TO A VIA

#1847
20240213158
2024-06-27

LOW RESISTANCE BOTTOM ELECTRODE VIA

#1848
20240213157
2024-06-27

GRAPHENE BARRIER LAYER

#1849
20240213156
2024-06-27

LIQUID METAL WELLS FOR INTERCONNECT ARCHITECTURES

#1850
20240213155
2024-06-27

Semiconductor device with fine metal lines for BEOL structure and method of manufacturing the same

#1851
20240213151
2024-06-27

TSV SEMICONDUCTOR DEVICE INCLUDING INDUCTIVE COMPENSATION LOOPS

#1852
20240213150
2024-06-27

Memory devices and related methods of forming a memory device

#1853
20240213149
2024-06-27

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

#1854
20240213148
2024-06-27

DEVICE FOR DETECTING AN ELECTROMAGNETIC RADIATION INCLUDING A THERMAL DETECTOR OVER A READOUT SUBSTRATE AN ACTIVE ELECTRONIC ELEMENT OF WHICH IS LOCATED THE CLOSEST TO THE THERMAL DETECTOR

#1855
20240213147
2024-06-27

THREE-DIMENSIONAL MEMORY DEVICE WITH SELF-ALIGNED MEMORY BLOCK ISOLATION AND METHODS FOR FORMING THE SAME

#1856
20240213146
2024-06-27

SEMICONDUCTOR DEVICE

#1857
20240213145
2024-06-27

THREE-DIMENSIONAL MEMORY DEVICE CONTAINING INTEGRATED CONTACT-AND-SUPPORT ASSEMBLIES AND METHODS OF MAKING THE SAME

#1858
20240213140
2024-06-27

INTEGRATED CIRCUIT STRUCTURES HAVING BACKSIDE HIGH

#1859
20240213110
2024-06-27

EMBEDDED DIE PACKAGING OF POWER SEMICONDUCTOR DEVICES

#1860
20240213105
2024-06-27

MITIGATING SURFACE DAMAGE OF PROBE PADS IN PREPARATION FOR DIRECT BONDING OF A SUBSTRATE

#1861
20240213096
2024-06-27

CONTACT FEATURES OF SEMICONDUCTOR DEVICES

#1862
20240213095
2024-06-27

SUBTRACTIVE PLUG AND TAB PATTERNING WITH PHOTOBUCKETS FOR BACK END OF LINE (BEOL) SPACER-BASED INTERCONNECTS

#1863
20240213034
2024-06-27

VIA CONNECTION TO A PARTIALLY FILLED TRENCH

#1864
20240212753
2024-06-27

THREE-DIMENSIONAL MEMORY DEVICES AND FABRICATING METHODS THEREOF

#1865
20240206177
2024-06-20

SEMICONDUCTOR DEVICE

#1866
20240206165
2024-06-20

MEMORY DEVICE AND FABRICATION METHOD THEREOF

#1867
20240206160
2024-06-20

SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SEMICONDUCTOR MEMORY DEVICE

#1868
20240204039
2024-06-20

DEVICE HAVING AN IN-SUBSTRATE INDUCTOR AND METHOD FOR MAKING THE INDUCTOR

#1869
20240203982
2024-06-20

DECOUPLING CAPACITOR INSIDE BACKSIDE POWER DISTRIBUTION NETWORK POWERVIA TRENCH

#1870
20240203904
2024-06-20

STRESS MODULATING PATTERN CONTAINING BONDING DIELECTRIC LAYER

#1871
20240203883
2024-06-20

INTEGRATED CIRCUIT DEVICE

#1872
20240203879
2024-06-20

LOW-RESISTANCE VIA TO BACKSIDE POWER RAIL

#1873
20240203874
2024-06-20

VERTICAL INTERCONNECT ELEVATOR BASED ON THROUGH SILICON VIAS

#1874
20240203872
2024-06-20

SEMICONDUCTOR DEVICE

#1875
20240203870
2024-06-20

FLEXIBLE MOL AND/OR BEOL STRUCTURE

#1876
20240203869
2024-06-20

INTEGRATED CIRCUIT DEVICES WITH HYBRID METAL LINES

#1877
20240203868
2024-06-20

SERIAL DIRECTED SELF-ASSEMBLY (DSA) PROCESSES FOR FORMING METAL LAYER WITH CUT

#1878
20240203867
2024-06-20

SKIP VIA WITH DISCONTINUOUS DIELECTRIC CAP

#1879
20240203866
2024-06-20

INTEGRATED CIRCUITS (ICs) EMPLOYING DIRECTLY COUPLED METAL LINES BETWEEN VERTICALLY-ADJACENT INTERCONNECT LAYERS FOR REDUCED COUPLING RESISTANCE, AND RELATED METHODS

#1880
20240203833
2024-06-20

SEMICONDUCTOR CHIP AND METHOD OF MANUFACTURING THE SAME

#1881
20240203816
2024-06-20

HEAT DISSIPATION STRUCTURES FOR BONDED WAFERS

#1882
20240203792
2024-06-20

SELF-ALIGNED BACKSIDE GATE CONTACTS

#1883
20240203790
2024-06-20

Cu3Sn VIA METALLIZATION IN ELECTRICAL DEVICES FOR LOW-TEMPERATURE 3D-INTEGRATION

#1884
20240203787
2024-06-20

SEMICONDUCTOR DEVICE WITH A LINER LAYER AND METHOD FOR FABRICATING THE SAME

#1885
20240203493
2024-06-20

SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF

#1886
20240201458
2024-06-20

OPTICAL INTEGRATED CIRCUIT STRUCTURE INCLUDING EDGE COUPLING PROTECTIVE FEATURES AND METHOD OF FORMING SAME

#1887
20240196611
2024-06-13

THREE-DIMENSIONAL MEMORY DEVICE INCLUDING CAPPED HOLLOW TUBE-SHAPED DRAIN REGIONS AND METHODS OF MAKING THE SAME

#1888
20240194745
2024-06-13

SEMICONDUCTOR DEVICE HAVING A SHIELDING LAYER AND A METHOD OF FABRICATING THE SEMICONDUCTOR DEVICE

#1889
20240194734
2024-06-13

SEMICONDUCTOR DEVICE INCLUDING VERTICAL TRANSISTOR WITH BACK SIDE POWER STRUCTURE

#1890
20240194730
2024-06-13

Interconnect Layout for Semiconductor Device

#1891
20240194682
2024-06-13

LOCAL INTERCONNECT STRUCTURE

#1892
20240194672
2024-06-13

MULTI-PITCH PATTERNING THROUGH ONE-STEP FLOW

#1893
20240194664
2024-06-13

POWER CELL FOR SEMICONDUCTOR DEVICES

#1894
20240194650
2024-06-13

MULTI-WAFER INTEGRATION

#1895
20240194642
2024-06-13

SEMICONDUCTOR PACKAGE

#1896
20240194624
2024-06-13

SEMICONDUCTOR CHIP AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME

#1897
20240194619
2024-06-13

PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOF

#1898
20240194601
2024-06-13

POWER TAP CELL FOR FRONT SIDE POWER RAIL CONNECTION TO BSPDN

#1899
20240194598
2024-06-13

METAL INTERCONNECTION STRUCTURE OF SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME

#1900
20240194597
2024-06-13

WIRING STRUCTURE AND SEMICONDUCTOR DEVICE INCLUDING THE SAME

#1901
20240194595
2024-06-13

SEMICONDUCTOR DEVICES

#1902
20240194593
2024-06-13

SEMICONDCUTOR DEVICES AND METHODS OF FORMING THE SAME

#1903
20240194591
2024-06-13

PACKAGE STRUCTURE AND METHOD OF FORMING THE SAME

#1904
20240194590
2024-06-13

Interconnection structure having air gap and method for manufacturing the same

#1905
20240194589
2024-06-13

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE

#1906
20240194588
2024-06-13

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

#1907
20240194587
2024-06-13

Interconnects with Sidewall Barrier Layer Divot Fill

#1908
20240194586
2024-06-13

SEMICONDUCTOR STRUCTURE WITH BACKSIDE METALLIZATION LAYERS

#1909
20240194585
2024-06-13

SUPER VIA WITH SIDEWALL SPACER

#1910
20240194559
2024-06-13

THERMAL DISSIPATION IN SEMICONDUCTOR DEVICES

#1911
20240194552
2024-06-13

FAN OUT PACKAGE WITH INTEGRATED PERIPHERAL DEVICES AND METHODS

#1912
20240194543
2024-06-13

SEMICONDUCTOR DEVICE

#1913
20240194525
2024-06-13

Vias for Cobalt-Based Interconnects and Methods of Fabrication Thereof

#1914
20240194524
2024-06-13

SEMICONDUCTOR DEVICE WITH A LINER LAYER

#1915
20240194523
2024-06-13

SELECTIVE DEPOSITION OF A PROTECTIVE LAYER TO REDUCE INTERCONNECT STRUCTURE CRITICAL DIMENSIONS

#1916
20240194522
2024-06-13

SURFACE MODIFICATION LAYER FOR CONDUCTIVE FEATURE FORMATION

#1917
20240194266
2024-06-13

SEMICONDUCTOR DEVICE AND DATA STORAGE SYSTEM INCLUDING SEMICONDUCTOR DEVICE

#1918
20240194263
2024-06-13

THREE-DIMENSIONAL MEMORY DEVICES WITH LATERAL BLOCK ISOLATION STRUCTURES AND METHODS OF FORMING THE SAME

#1919
20240194262
2024-06-13

THREE-DIMENSIONAL MEMORY DEVICES WITH LATERAL BLOCK ISOLATION STRUCTURES AND METHODS OF FORMING THE SAME

#1920
20240194261
2024-06-13

SEMICONDUCTOR MEMORY DEVICE

#1921
20240194260
2024-06-13

MEMORY DEVICE STRUCTURE AND FABRICATION METHOD

#1922
20240194255
2024-06-13

STRUCTURES FOR THREE-TERMINAL MEMORY CELLS

#1923
20240188446
2024-06-06

MRAM device with wrap-around top electrode

#1924
20240186403
2024-06-06

DUAL METAL GATE STRUCTURES FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION

#1925
20240186312
2024-06-06

Static random access memory device

#1926
20240186291
2024-06-06

SEMICONDUCTOR DIE STACK STRUCTURE

#1927
20240186290
2024-06-06

SEMICONDUCTOR PACKAGE

#1928
20240186257
2024-06-06

SEMICONDUCTOR DEVICE

#1929
20240186249
2024-06-06

INTEGRATED CIRCUIT DEVICE WITH INTERCONNECTS MADE OF LAYERED TOPOLOGICAL MATERIALS

#1930
20240186244
2024-06-06

SEMICONDUCTOR DEVICE STRUCTURE WITH ENERGY REMOVABLE STRUCTURE AND METHOD FOR PREPARING THE SAME

#1931
20240186243
2024-06-06

SEMICONDUCTOR DEVICE STRUCTURE WITH ENERGY REMOVABLE STRUCTURE AND METHOD FOR PREPARING THE SAME

#1932
20240186242
2024-06-06

Wire Structure for Low Resistance Interconnects

#1933
20240186239
2024-06-06

MICROELECTRONIC DEVICES WITH MULTIPLE STEP CONTACTS EXTENDING TO STEPPED TIERS, AND RELATED METHODS

#1934
20240186238
2024-06-06

Techniques to inhibit delamination from flowable gap-fill dielectric

#1935
20240186237
2024-06-06

THREE-DIMENSIONAL MEMORY DEVICE WITH WORD LINE SIDE-CONTACT VIA STRUCTURES AND METHODS FOR FORMING THE SAME

#1936
20240186231
2024-06-06

SEMICONDUCTOR PACKAGE INCLUDING A REDISTRIBUTION STRUCTURE

#1937
20240186180
2024-06-06

Integrated circuit structure with backside dielectric layer having air gap

#1938
20240186178
2024-06-06

WORDLINE CONTACT FORMATION FOR NAND DEVICE

#1939
20240186177
2024-06-06

ASYMMETRIC SKIP-LEVEL VIA STRUCTURE

#1940
20240185918
2024-06-06

THREE-DIMENSIONAL MEMORY DEVICES AND FABRICATING METHODS THEREOF

#1941
20240179918
2024-05-30

THREE-DIMENSIONAL SEMICONDUCTOR DEVICE HAVING A SUPPORT PATTERN IN CONTACT WITH A SIDE SURFACE OF A CONTACT PLUG

#1942
20240179916
2024-05-30

THREE-DIMENSIONAL MEMORY DEVICE WITH SELF-ALIGNED WORD LINE CONTACT VIA STRUCTURES AND METHOD OF MAKING THE SAME

#1943
20240179904
2024-05-30

STAIRLESS THREE-DIMENSIONAL MEMORY DEVICE CONTAINING MEANDERING DIELECTRIC ISOLATION STRUCTURE AND METHODS OF FORMING THE SAME

#1944
20240179897
2024-05-30

THREE-DIMENSIONAL MEMORY DEVICE CONTAINING ENGINEERED CHARGE STORAGE ELEMENTS AND METHODS FOR FORMING THE SAME

#1945
20240178219
2024-05-30

DEVICE WITH PLASMA INDUCED DAMAGE (PID) PROTECTION

#1946
20240178215
2024-05-30

Integrated circuit and manufacturing method thereof

#1947
20240178214
2024-05-30

Layout designs of integrated circuits having backside routing tracks

#1948
20240178145
2024-05-30

LITHOGRAPHIC CAVITY FORMATION TO ENABLE EMIB BUMP PITCH SCALING

#1949
20240178140
2024-05-30

THREE-DIMENSIONAL MEMORY DEVICE WITH SELF-ALIGNED WORD LINE CONTACT VIA STRUCTURES AND METHOD OF MAKING THE SAME

#1950
20240178134
2024-05-30

MICROELECTRONIC DEVICES AND RELATED MEMORY DEVICES

#1951
20240178133
2024-05-30

PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOF

#1952
20240178132
2024-05-30

VIA STRUCTURE HAVING LOW INTERFACE RESISTANCE

#1953
20240178131
2024-05-30

SEMICONDUCTOR DEVICE HAVING THROUGH-VIA STRUCTURE

#1954
20240178130
2024-05-30

STAIRLESS THREE-DIMENSIONAL MEMORY DEVICE AND METHOD OF MAKING THE SAME BY FORMING REPLACEMENT WORD LINES

#1955
20240178129
2024-05-30

STAIRLESS THREE-DIMENSIONAL MEMORY DEVICE AND METHOD OF MAKING THEREOF BY FORMING REPLACEMENT WORD LINES THROUGH MEMORY OPENINGS

#1956
20240178128
2024-05-30

SEMICONDUCTOR DEVICE STRUCTURE INCLUDING FORKSHEET TRANSISTORS AND METHODS OF FORMING THE SAME

#1957
20240178127
2024-05-30

ISOLATED SUPER VIA TO MIDDLE METAL LINE LEVEL

#1958
20240178103
2024-05-30

Chip Stacked Structure and Manufacturing Method Thereof, Chip Package Structure, and Electronic Device

#1959
20240178091
2024-05-30

Integrated circuit package and method

#1960
20240178071
2024-05-30

Dual metal silicide structures for advanced integrated circuit structure fabrication

#1961
20240178063
2024-05-30

SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THEREOF

#1962
20240178061
2024-05-30

INTEGRATED CIRCUIT DEVICE

#1963
20240178057
2024-05-30

SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF, SOLID-STATE IMAGING DEVICE, AND ELECTRONIC APPARATUS

#1964
20240178053
2024-05-30

INTEGRATED CIRCUIT INCLUDING A PASSIVE COMPONENT IN AN INTERCONNECTION PART, AND CORRESPONDING MANUFACTURING METHOD

#1965
20240172445
2024-05-23

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF, AND ELECTRONIC SYSTEM INCLUDING THE SEMICONDUCTOR DEVICE

#1966
20240172427
2024-05-23

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

#1967
20240172409
2024-05-23

MEMORY DEVICE WITH ALTERNATING METAL LINES

#1968
20240172371
2024-05-23

SEMICONDUCTOR PACKAGES AND METHOD FOR FABRICATING THE SAME

#1969
20240170584
2024-05-23

SEMICONDUCTOR STRUCTURE HAVING DEEP TRENCH CAPACITOR AND METHOD OF MANUFACTURING THEREOF

#1970
20240170530
2024-05-23

INTEGRATED CIRCUIT DEVICE AND METHOD OF MANUFACTURING THE SAME

#1971
20240170457
2024-05-23

STACKED INTEGRATED CIRCUITS WITH REDISTRIBUTION LINES

#1972
20240170426
2024-05-23

ADVANCED INTERCONNECTION FOR WAFER ON WAFER PACKAGING

#1973
20240170404
2024-05-23

SUBTRACTIVE SKIP VIA

#1974
20240170399
2024-05-23

SEMICONDUCTOR DEVICE WITH LINES AND VIAS WITH VARIABLE HEIGHT FOR LOCAL RC OPTIMIZATION

#1975
20240170397
2024-05-23

INTERCONNECT LEVEL WITH HIGH RESISTANCE LAYER AND METHOD OF FORMING THE SAME

#1976
20240170396
2024-05-23

PACKAGE STRUCTURE WITH INTERPOSER ENCAPSULATED BY AN ENCAPSULANT

#1977
20240170395
2024-05-23

STAGGERED SIGNAL LINE INTERCONNECT STRUCTURE

#1978
20240170394
2024-05-23

INTEGRATED CIRCUIT INTERCONNECT LEVEL COMPRISING MULTI-HEIGHT LINES & SELF-ALIGNED VIAS

#1979
20240170393
2024-05-23

THREE DIMENSIONAL (3D) MEMORY DEVICE AND FABRICATION METHOD

#1980
20240170392
2024-05-23

WRAP AROUND METAL VIA STRUCTURE

#1981
20240170382
2024-05-23

SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE

#1982
20240170066
2024-05-23

Memory Circuitry And Methods Used In Forming Memory Circuitry

#1983
20240167163
2024-05-23

ANTI-DIFFUSION SUBSTRATE STRUCTURE AND MANUFACTURING METHOD THEREOF

#1984
20240164103
2024-05-16

NONVOLATILE MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME

#1985
20240164102
2024-05-16

Semiconductor storage device

#1986
20240164101
2024-05-16

THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME

#1987
20240162332
2024-05-16

Trench contact structures for advanced integrated circuit structure fabrication

#1988
20240162172
2024-05-16

SEMICONDUCTOR DIE PACKAGE AND METHODS OF FORMATION

#1989
20240162153
2024-05-16

GAN-BASED, LATERAL-CONDUCTION, ELECTRONIC DEVICE WITH IMPROVED METALLIC LAYERS LAYOUT

#1990
20240162150
2024-05-16

Method of manufacturing semiconductor device

#1991
20240162149
2024-05-16

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE

#1992
20240162145
2024-05-16

RESISTOR WITHIN A VIA

#1993
20240162143
2024-05-16

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

#1994
20240162142
2024-05-16

DIAGONAL VIA MANUFACTURING METHOD

#1995
20240162141
2024-05-16

Sideways vias in isolation areas to contact interior layers in stacked devices

#1996
20240162140
2024-05-16

ELECTRONIC PACKAGE, MANUFACTURING METHOD FOR THE SAME, AND ELECTRONIC STRUCTURE

#1997
20240162139
2024-05-16

METHOD AND STRUCTURE OF FORMING BARRIER-LESS SKIP VIA WITH SUBTRACTIVE METAL PATTERNING

#1998
20240162138
2024-05-16

METHOD FOR FORMING CONDUCTIVE VIA, CONDUCTIVE VIA AND PASSIVE DEVICE

#1999
20240162104
2024-05-16

SEMICONDUCTOR DEVICE, SEMICONDUCTOR PACKAGE, AND SEMICONDUCTOR CHIP MANUFACTURING METHOD

#2000
20240162097
2024-05-16

PROCESS MONITORING STRUCTURES FOR VIA ETCH PROCESSES FOR SEMICONDUCTOR DEVICES

#2001
20240162094
2024-05-16

SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME

#2002
20240162090
2024-05-16

SELF-ALIGNED DOUBLE PATTERNING WITH MANDREL MANIPULATION

#2003
20240159823
2024-05-16

SEMICONDUCTOR DEVICE HAVING DEFECT DETECTION CIRCUIT

#2004
20240159599
2024-05-16

TEMPERATURE MONITORING DEVICE AND METHOD

#2005
20240155842
2024-05-09

SEMICONDUCTOR MEMORY DEVICE

#2006
20240155840
2024-05-09

NONVOLATILE MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME

#2007
20240155827
2024-05-09

MEMORY CELL AND SEMICONDUCTOR MEMORY DEVICE WITH THE SAME

#2008
20240154015
2024-05-09

SEMICONDUCTOR DEVICE WITH BACKSIDE INTERCONNECTION AND METHOD FOR FORMING THE SAME

#2009
20240154009
2024-05-09

SEMICONDUCTOR STRUCTURE HAVING A BACKSIDE CONTACT WITH BACKSIDE SIDEWALL SPACERS

#2010
20240153942
2024-05-09

Multi-bit structure

#2011
20240153941
2024-05-09

SEMICONDUCTOR STRUCTURE

#2012
20240153915
2024-05-09

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

#2013
20240153877
2024-05-09

MICROELECTRONIC DEVICES INCLUDING STAIRCASE STRUCTURES, AND RELATED MEMORY DEVICES AND ELECTRONIC SYSTEMS

#2014
20240153874
2024-05-09

Metal Gate Interconnect for Forksheet and Related Semiconductor Structures

#2015
20240153871
2024-05-09

SUBSTRATE INTEGRATED WITH PASSIVE DEVICES AND MANUFACTURING METHOD THEREOF

#2016
20240153870
2024-05-09

Selective Formation of Conductor Nanowires

#2017
20240153869
2024-05-09

3D VIRTUAL GROUND MEMORY AND MANUFACTURING METHODS FOR SAME

#2018
20240153868
2024-05-09

INTERCONNECT STRUCTURE WITH SKIPVIA

#2019
20240153867
2024-05-09

DIAGONAL WIRING LEVEL WITH SKIP-LEVEL VIA CONNECTIONS

#2020
20240153866
2024-05-09

INTERCONNECT WITH METAL VIA STRUCTURES

#2021
20240153865
2024-05-09

METAL VIA MULTI-LEVELS

#2022
20240153864
2024-05-09

METALLIZATION LEVELS WITH SKIP VIA AND DIELECTRIC LAYER

#2023
20240153847
2024-05-09

METHODS, APPARATUSES, INTEGRATED CIRCUITS, AND CIRCUIT BOARDS FOR POWER CONVERSION WITH REDUCED PARASITICS

#2024
20240153566
2024-05-09

THREE-DIMENSIONAL NOR MEMORY STRUCTURE

#2025
20240147867
2024-05-02

MAGNETOELECTRIC LOGIC WITH MAGNETIC TUNNEL JUNCTIONS

#2026
20240147738
2024-05-02

Memory device and method of forming the same

#2027
20240147727
2024-05-02

MICROELECTRONIC DEVICES INCLUDING STAIRCASE STRUCTURES, AND RELATED MEMORY DEVICES

#2028
20240147723
2024-05-02

THREE-DIMENSIONAL MEMORY DEVICE CONTAINING DOPED SOURCE-CHANNEL INTERFACE STRUCTURE AND METHOD OF MAKING THE SAME

#2029
20240147720
2024-05-02

THREE-DIMENSIONAL MEMORY DEVICE

#2030
20240145569
2024-05-02

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

#2031
20240145528
2024-05-02

Chip-On-Interposer Assembly Containing A Decoupling Capacitor

#2032
20240145481
2024-05-02

SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

#2033
20240145412
2024-05-02

SEMICONDUCTOR DEVICE

#2034
20240145391
2024-05-02

COBALT BASED INTERCONNECTS AND METHODS OF FABRICATION THEREOF

#2035
20240145388
2024-05-02

Integrated circuit devices having improved contact plug structures therein

#2036
20240145387
2024-05-02

SEMICONDUCTOR DEVICE INCLUDING A CONTACT PLUG

#2037
20240145384
2024-05-02

SEMICONDUCTOR DEVICE HAVING CONTACT PLUG

#2038
20240145383
2024-05-02

INTEGRATED RING STRUCTURES

#2039
20240145381
2024-05-02

PROTECTION LINER ON INTERCONNECT WIRE TO ENLARGE PROCESSING WINDOW FOR OVERLYING INTERCONNECT VIA

#2040
20240145380
2024-05-02

BARRIER STRUCTURE ON INTERCONNECT WIRE TO INCREASE PROCESSING WINDOW FOR OVERLYING VIA

#2041
20240145379
2024-05-02

STACKED VIA STRUCTURES AND METHODS FOR FORMING THE SAME

#2042
20240145378
2024-05-02

VIA WITH SACRIFICIAL STRESS BARRIER RING

#2043
20240145376
2024-05-02

DECOUPLING CAPACITANCE IN BACKSIDE INTERCONNECT

#2044
20240145327
2024-05-02

Semiconductor device, semiconductor package, and methods of manufacturing the same

#2045
20240145321
2024-05-02

Substrate integrated with passive devices and manufacturing method thereof

#2046
20240145304
2024-05-02

INTERCONNECT STRUCTURE AND METHOD FOR FORMING THE SAME

#2047
20240145299
2024-05-02

Structure and method to improve FAV RIE process margin and electromigration

#2048
20240145297
2024-05-02

VIA-FIRST SELF-ALIGNED INTERCONNECT FORMATION PROCESS

#2049
20240145296
2024-05-02

STAIRCASE FORMATION IN THREE-DIMENSIONAL MEMORY DEVICE

#2050
20240145257
2024-05-02

Cross-wafer RDLs in constructed wafers

#2051
20240143888
2024-05-02

INTEGRATED CIRCUIT AND METHOD OF FORMING THE SAME

#2052
20240138152
2024-04-25

THREE-DIMENSIONAL MEMORY DEVICE AND METHOD

#2053
20240138151
2024-04-25

THREE-DIMENSIONAL MEMORY DEVICE AND METHOD OF MAKING THEREOF USING ETCH STOP STRUCTURES LOCATED BETWEEN TIERS

#2054
20240138145
2024-04-25

Memory Arrays Comprising Strings Of Memory Cells And Methods Used In Forming A Memory Array Comprising Strings Of Memory Cells

#2055
20240138135
2024-04-25

MEMORY CELL STRUCTURE

#2056
20240136418
2024-04-25

Semiconductor device

#2057
20240136314
2024-04-25

STACKED CHIP AND FABRICATION METHOD OF STACKED CHIP

#2058
20240136291
2024-04-25

LOW-STRESS PASSIVATION LAYER

#2059
20240136287
2024-04-25

Local VDD And VSS Power Supply Through Dummy Gates with Gate Tie-Downs and Associated Benefits

#2060
20240136285
2024-04-25

Microelectronic devices, memory devices, and electronic systems

#2061
20240136284
2024-04-25

SEMICONDUCTOR DIE, SEMICONDUCTOR DEVICE AND METHOD FOR FORMING SEMICONDUCTOR DEVICE

#2062
20240136282
2024-04-25

DEVICE AND METHOD OF MANUFACTURING THE SAME

#2063
20240136281
2024-04-25

SELF-ALIGNED ZERO TRACK SKIP

#2064
20240136278
2024-04-25

STRIPPED REDISTRUBUTION-LAYER FABRICATION FOR PACKAGE-TOP EMBEDDED MULTI-DIE INTERCONNECT BRIDGE

#2065
20240136277
2024-04-25

TOP GATE RECESSED CHANNEL CMOS THIN FILM TRANSISTOR AND METHODS OF FABRICATION

#2066
20240136276
2024-04-25

SEMICONDUCTOR DEVICE HAVING HIGH BREAKDOWN VOLTAGE CAPACITOR

#2067
20240136203
2024-04-25

Photonic integrated package and method forming same

#2068
20240130134
2024-04-18

Semiconductor memory device and manufacturing method thereof

#2069
20240130131
2024-04-18

VERTICAL MEMORY DEVICE

#2070
20240130123
2024-04-18

SEMICONDUCTOR DEVICE, ELECTRONIC SYSTEM INCLUDING THE SAME, AND METHOD OF FABRICATING THE SAME

#2071
20240130122
2024-04-18

THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME

#2072
20240128332
2024-04-18

SEMICONDUCTOR DEVICES

#2073
20240128331
2024-04-18

BOTTOM ENHANCED LINER-LESS VIA CONTACT FOR REDUCED MOL RESISTANCE

#2074
20240128277
2024-04-18

Contact structure and display device including the same

#2075
20240128252
2024-04-18

SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR DEVICE

#2076
20240128219
2024-04-18

SEMICONDUCTOR DIE INCLUDING STRESS-RESISTANT BONDING STRUCTURES AND METHODS OF FORMING THE SAME

#2077
20240128216
2024-04-18

CRUCIFORM BONDING STRUCTURE FOR 3D-IC

#2078
20240128214
2024-04-18

Integrated circuit structure

#2079
20240128191
2024-04-18

POWER DISTRIBUTION NETWORK WITH BACKSIDE POWER RAIL

#2080
20240128186
2024-04-18

BONDED STRUCTURES WITH INTEGRATED PASSIVE COMPONENT

#2081
20240128023
2024-04-18

DECOUPLING CAPACITORS BASED ON DUMMY THROUGH-SILICON-VIAS

#2082
20240127864
2024-04-18

THREE-DIMENSIONAL MEMORY DEVICE INCLUDING LATERALLY SEPARATED SOURCE LINES AND METHOD OF MAKING THE SAME

#2083
20240121965
2024-04-11

VERTICALLY STACKED FeFETS WITH COMMON CHANNEL

#2084
20240121919
2024-04-11

Method and apparatus for managing heat distribution in a semiconductor device

#2085
20240120332
2024-04-11

3D semiconductor devices and structures with metal layers

#2086
20240120319
2024-04-11

SEMICONDUCTOR PACKAGE

#2087
20240120318
2024-04-11

SEMICONDUCTOR PACKAGE

#2088
20240120278
2024-04-11

SEMICONDUCTOR DEVICE

#2089
20240120277
2024-04-11

CHIP STRUCTURE

#2090
20240120276
2024-04-11

THREE-DIMENSIONAL SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE INCLUDING INTER-DIE INTERFACE

#2091
20240120274
2024-04-11

SEMICONDUCTOR DEVICE

#2092
20240120273
2024-04-11

DEVICE WITH GATE-TO-DRAIN VIA AND RELATED METHODS

#2093
20240120272
2024-04-11

SEMICONDUCTOR DEVICE STRUCTURE AND METHODS OF FORMING THE SAME

#2094
20240120271
2024-04-11

SKIP VIA WITH LATERAL LINE CONNECTION

#2095
20240119996
2024-04-11

Memory package and a memory module including the memory package

#2096
20240114810
2024-04-04

RESISTIVE MEMORY DEVICE INCLUDING A SILICON OXIDE BASE SPACER AND METHODS FOR FORMING THE SAME

#2097
20240114693
2024-04-04

SELF-ALIGNED PATTERNING OF PLATE LINES IN THREE-DIMENSIONAL FERROELECTRIC CAPACITORS

#2098
20240114687
2024-04-04

INTERCONNECT STRUCTURES OF THREE-DIMENSIONAL MEMORY DEVICES

#2099
20240113231
2024-04-04

Composite and transistor

#2100
20240113105
2024-04-04

FORMING METAL GATE CUTS USING MULTIPLE PASSES FOR DEPTH CONTROL