207728 ⎘
Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body Via connections in a multilevel interconnection structure
PACKAGE WITH SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
#2102THREE DIMENSIONAL HETEROGENEOUS INTEGRATION WITH DOUBLE-SIDED SEMICONDUCTOR DIES AND METHODS OF FORMING THE SAME
#2103INCORPORATION OF SUPERLATTICE SEMI-METALS FOR SCALED INTERCONNECTS
#2104SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING SEMICONDUCTOR DEVICE
#2105SPLIT VIA STRUCTURES COUPLED TO CONDUCTIVE LINES FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION
#2106PLUG IN A METAL LAYER
#2107SEMICONDUCTOR STRUCTURES WITH STACKED INTERCONNECTS
#2108METHODS OF FORMING MICROELECTRONIC DEVICES, AND RELATED MICROELECTRONIC DEVICES, MEMORY DEVICES, AND ELECTRONIC SYSTEMS
#2109Semiconductor Structures And Methods Of Forming The Same
#2110METAL FILL STRUCTURES FOR ISOLATORS TO MEET METAL DENSITY AND HIGH VOLTAGE ELECTRIC FIELD REQUIREMENTS
#2111INTEGRATED CIRCUIT PACKAGES AND METHODS
#2112Semiconductor memory device
#2113SEMICONDUCTOR DEVICES AND DATA STORAGE SYSTEMS INCLUDING THE SAME
#2114THREE-DIMENSIONAL MEMORY DEVICE CONTAINING MEMORY OPENING MONITORING AREA AND METHODS OF MAKING THE SAME
#2115SEMICONDUCTOR MEMORY DEVICE
#2116Semiconductor device and method
#2117SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME
#2118VERTICALLY INTEGRATED DEVICE STACK INCLUDING SYSTEM ON CHIP AND POWER MANAGEMENT INTEGRATED CIRCUIT
#2119TIE OFF DEVICE
#2120INTEGRATED CIRCUIT INCLUDING STANDARD CELLS AND METHOD OF DESIGNING THE SAME
#2121SEMICONDUCTOR PACKAGE WITH SEMICONDUCTOR CHIPS
#2122APPARATUS, SEMICONDUCTOR DEVICE, AND REDISTRIBUTION LAYER STRUCTURE THEREOF
#2123SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF
#2124Die interconnect substrate, an electrical device and a method for forming a die interconnect substrate
#2125SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE
#2126SEMICONDUCTOR STRUCTURE AND LAYOUT STRUCTURE
#2127HIGH DENSITY BACKSIDE CAPACITOR AND INDUCTOR
#2128LOCAL FRONTSIDE POWER RAIL WITH GLOBAL BACKSIDE POWER DELIVERY
#2129BURIED POWER RAIL DIRECTLY CONTACTING BACKSIDE POWER DELIVERY NETWORK
#2130SEMICONDUCTOR BACKSIDE TRANSISTOR INTEGRATION WITH BACKSIDE POWER DELIVERY NETWORK
#2131Three-dimensional semiconductor device
#2132SEMICONDUCTOR DEVICE INCLUDING VARIABLE RESISTANCE PATTERN AND ELECTRONIC SYSTEM INCLUDING THE SEMICONDUCTOR DEVICE
#2133SEMICONDUCTOR DEVICE INCLUDING CONNECTION PORTION BETWEEN STACKED STRUCTURES AND METHOD OF FABRICATING THE SAME
#2134DEEP LINES AND SHALLOW LINES IN SIGNAL CONDUCTING PATHS
#2135ISOLATOR
#2136INTERCONNECT STRUCTURE AND METHODS OF FORMING THE SAME
#2137STACKED FET CONTACT FORMATION
#2138INTEGRATED CIRCUIT (IC) DEVICE WITH METAL LAYER INCLUDING STAGGERED METAL LINES
#2139INTEGRATED CIRCUIT (IC) DEVICE WITH MULTILAYER METAL LINE
#2140SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#2141BURIED VIA THROUGH FRONT-SIDE AND BACK-SIDE METALLIZATION LAYERS WITH OPTIONAL CYLINDRICAL MIM CAPACITOR
#2142REDISTRIBUTION LAYERS, AND RELATED METHODS AND DEVICES
#2143Semiconductor device
#2144TRENCH PLUG HARDMASK FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION
#2145MIDDLE OF LINE DIELECTRIC LAYER ENGINEERING FOR VIA VOID PREVENTION
#2146LOCAL LINE EXTENSION FOR ENLARGED VIA-TO-LINE CONTACT AREA
#2147MIDDLE OF LINE DIELECTRIC LAYER ENGINEERING FOR VIA VOID PREVENTION
#2148MRAM DEVICE STRUCTURES AND METHODS OF FABRICATING THE SAME
#2149THREE-DIMENSIONAL MEMORY DEVICE WITH BACKSIDE SUPPORT PILLAR STRUCTURES AND METHODS OF FORMING THE SAME
#2150THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME
#2151COMPACT ELECTRICAL CONNECTION THAT CAN BE USED TO FORM AN SRAM CELL AND METHOD OF MAKING THE SAME
#2152SEMICONDUCTOR STRUCTURES AND MANUFACTURING METHOD THEREOF
#2153Semiconductor device, method of and system for manufacturing semiconductor device
#2154DIAGONAL BACKSIDE POWER AND SIGNAL ROUTING FOR AN INTEGRATED CIRCUIT
#2155REVERSE EMBEDDED POWER STRUCTURE FOR GRAPHICAL PROCESSING UNIT CHIPS AND SYSTEM-ON-CHIP DEVICE PACKAGES
#2156POWER DELIVERY NETWORK HAVING SUPER VIAS IN AN INTEGRATED CIRCUIT
#2157SEMICONDUCTOR DEVICE INCLUDING PARALLEL CONFIGURATION
#21583D semiconductor devices and structures with electronic circuit units
#2159SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
#2160INTEGRATED CIRCUIT DEVICE
#2161SEMICONDUCTOR STORAGE DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#2162VTFET CIRCUIT WITH OPTIMIZED OUTPUT
#2163NON-PLANAR METAL-INSULATOR-METAL STRUCTURE
#2164DEVICE LAYER INTERCONNECTS
#2165SEMICONDUCTOR DEVICE
#2166SEMICONDUCTOR DEVICE STRUCTURE WITH CONDUCTIVE BUMPS
#2167SUBTRACTIVES LINES AND VIAS WITH WRAP-AROUND CONTACT
#2168INTEGRATED CIRCUIT (IC) DEVICE WITH HYBRID METAL LAYER
#2169FLEXIBLE WIRING ARCHITECTURE FOR MULTI-DIE INTEGRATION
#2170SEMICONDUCTOR DEVICE INCLUDING INSULATING STRUCTURE SURROUNDING THROUGH VIA AND METHOD FOR FORMING THE SAME
#2171INTEGRATED CIRCUIT, SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
#2172STRUCTURES WITH CONVEX CAVITY BOTTOMS
#2173HYBRID DAMASCENE INTERCONNECT STRUCTURE FOR SIGNAL AND POWER VIA CONNECTIONS
#2174SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
#2175SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#2176HETEROGENEOUS BONDING STRUCTURE AND METHOD FORMING SAME
#2177TSV testing
#2178Memory cell with top electrode via
#2179Ferroelectric memory cell
#2180Integrated circuit including three-dimensional memory device
#2181THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME
#2182THREE-DIMENSIONAL MEMORY DEVICE HAVING SOURCE-SELECT-GATE CUT STRUCTURES AND METHODS FOR FORMING THE SAME
#2183Semiconductor structure
#2184Three-dimensional semiconductor memory devices
#2185CONTROL GATE STRAP LAYOUT TO IMPROVE A WORD LINE ETCH PROCESS WINDOW
#2186CONTACT JUMPER FOR NON-SELF ALIGNED CONTACT DEVICES
#2187INTEGRATED RESISTOR
#2188Semiconductor device and method for manufacturing semiconductor device
#2189INTEGRATED CIRCUIT HAVING TRANSISTORS WITH DIFFERENT WIDTH SOURCE AND DRAIN TERMINALS
#2190Rectifier Device with Minimized Lateral Coupling
#2191Semiconductor structure and manufacturing method thereof
#2192Semiconductor package
#2193TSV as pad
#2194ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING THE SAME
#2195Chip package structure
#2196SEMICONDUCTOR STRUCTURES AND MANUFACTURING METHOD THEREOF
#2197Multi-layer line structure
#2198BACKSIDE CONTACT WITH FULL WRAP-AROUND CONTACT
#2199FULL WAFER DEVICE WITH BACK SIDE PASSIVE ELECTRONIC COMPONENTS
#2200SEMICONDUCTOR DEVICES AND METHODS OF FORMING THE SAME
#2201Structure and Method of Fabrication for High Performance Integrated Passive Device
#2202HYBRID CUT METAL GATE TO ACHIEVE MINIMUM CELL PITCHES, REDUCING ROUTING AND RISING THE YIELD
#2203FULL WAFER DEVICE WITH BACK SIDE INTERCONNECTS AND WAFER-SCALE INTEGRATION
#2204Semiconductor packages
#2205SEMICONDUCTOR STRUCTURE AND METHOD MAKING THE SAME
#2206Semiconductor device including deep vias
#2207SEMICONDUCTOR INTERCONNECTION STRUCTURE AND METHODS OF FORMING THE SAME
#2208SIDEWALL SPACER STRUCTURE ENCLOSING CONDUCTIVE WIRE SIDEWALLS TO INCREASE RELIABILITY
#2209Semiconductor device and manufacturing method thereof
#2210Method of manufacturing integrated circuit device with bonding structure
#2211CONNECTING STRUCTURE AND METHOD FOR FORMING THE SAME
#2212LINE EXTENSION FOR SKIP-LEVEL VIA LANDING
#2213FULL WAFER DEVICE WITH FRONT SIDE PASSIVE ELECTRONIC COMPONENTS
#2214Metal-insulator-metal structure
#2215THROUGH-SUBSTRATE-VIA WITH REENTRANT PROFILE
#2216ETCHING-DAMAGE-FREE INTERMETAL DIELECTRIC LAYER WITH THERMAL DISSIPATION FEATURE
#2217Large Surface VBPR for Robust Alignment in Advanced Technology Nodes
#2218Metal Contact Structure and Method of Forming the Same in a Semiconductor Device
#2219Enlarging contact area and process window for a contact via
#2220DUAL-PORT STATIC RANDOM ACCESS MEMORY
#2221Digital low-dropout voltage regulator
#2222SEMICONDUCTOR DEVICE
#2223Memory arrays and methods used in forming a memory array comprising strings of memory cells
#2224SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD OF THE SEMICONDUCTOR MEMORY DEVICE
#2225APPARATUSES AND METHODS INCLUDING STRUCTURES IN SCRIBE REGIONS OF SEMICONDUCTOR DEVICES
#2226Redistribution Layer Structures for Integrated Circuit Package
#2227TECHNIQUES TO MANUFACTURE INTER-LAYER VIAS
#2228LOCAL ENLARGED VIA-TO-BACKSIDE POWER RAIL
#2229VIA ANCHOR PROFILE CONTROL
#2230Bl-LAYER ALLOY LINER FOR INTERCONNECT METALLIZATION AND METHODS OF FORMING THE SAME
#2231Multi-wafer capping layer for metal arcing protection
#2232Semiconductor device with multi-layer etch stop structure
#2233SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF
#2234Magnetoresistive random access memory having a blocking layer on metal interconnection
#2235Vertical memory devices
#2236THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME
#2237BONDED ASSEMBLY CONTAINING CONDUCTIVE VIA STRUCTURES EXTENDING THROUGH WORD LINES IN A STAIRCASE REGION AND METHODS FOR MAKING THE SAME
#2238LANTHANUM NITRIDE AS A DRAM MOLYBDENUM LINER
#2239Layout of static random access memory periphery circuit
#2240SEMICONDUCTOR DEVICE WITH SHALLOW CONTACTS AND METHOD FOR FABRICATING THE SAME
#2241SEMICONDUCTOR DEVICE WITH SHALLOW CONTACTS AND METHOD FOR FABRICATING THE SAME
#2242SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
#2243Gate All-Around (GAA) Field Effect Transistors (FETS) Formed on Both Sides of a Substrate
#2244SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SAME
#2245Integrated circuit layout, integrated circuit, and method for fabricating the same
#2246METHODS OF FORMING MICROELECTRONIC DEVICES INCLUDING STAIR STEP STRUCTURES
#2247DIELECTRIC CAPS FOR POWER AND SIGNAL LINE ROUTING
#2248SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#2249FET SUBSTRATE TRIMMING WITH IMPROVED VIA PLACEMENT
#2250INTEGRATED CIRCUIT DEVICE INCLUDING INTERCONNECTION STRUCTURE
#2251SEMICONDUCTOR DEVICE
#2252SEMICONDUCTOR DEVICE AND DATA STORAGE SYSTEM INCLUDING THE SAME
#2253Advanced lithography and self-assembled devices
#2254DOUBLE-DECKED INTERCONNECT FEATURES
#2255Three-dimensional semiconductor device
#2256Semiconductor package with improved interposer structure
#2257SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#2258SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME
#2259SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
#2260METHODS OF FORMING MICROELECTRONIC DEVICES, AND RELATED MICROELECTRONIC DEVICES, MEMORY DEVICES, AND ELECTRONIC SYSTEMS
#2261SKIP VIA WITH LOCALIZED SPACER
#2262CONNECTING SEMICONDCUTOR DEVICE ASSEMBLY COMPONENTS USING INTERCONNECT DIES WITH SPACER COMPONENT COUPLED TO A PORTION OF AN INTERCONNECT DIE
#2263FOLDED STAIRCASE VIA ROUTING FOR MEMORY
#2264SEMICONDUCTOR DEVICE CIRCUITRY FORMED THROUGH VOLUMETRIC EXPANSION
#2265SEMICONDUCTOR ELEMENT AND METHOD FOR MANUFACTURING THE SAME
#2266STRESS MITIGATION FOR THREE-DIMENSIONAL METAL CONTACTS
#2267Conductive Via With Improved Gap Filling Performance
#2268Memory Arrays Comprising Strings Of Memory Cells And Methods Used In Forming A Memory Array Comprising Strings Of Memory Cells
#2269Memory Circuitry And Method Used In Forming Memory Circuitry
#2270SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE
#2271Memory devices
#22723D RAM SL/BL contact modulation
#2273Vertical memory devices and methods of manufacturing the same
#2274Semiconductor device and manufacturing method of the semiconductor device
#2275Metal-insulator-metal capacitors with thick intermediate electrode layers and methods of forming the same
#2276SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF
#2277METHOD OF MAKING SEMICONDUCTOR STRUCTURE INCLUDING BUFFER LAYER
#2278BACKSIDE CONTACT FOR SEMICONDUCTOR DEVICE
#2279PACKAGE ARCHITECTURE FOR QUASI-MONOLITHIC CHIP WITH BACKSIDE POWER
#2280Two-dimensional (2D) metal structure and method of forming the same
#2281BACK END OF LINE STRUCTURE FOR IMPROVED CURRENT DENSITY IN HR DEVICES
#2282SEMICONDUCTOR DEVICE AND AN ELECTRONIC SYSTEM INCLUDING THE SAME
#2283SEMICONDUCTOR DEVICE HAVING HIGH-VOLTAGE ISOLATION CAPACITOR
#2284SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD WITH HIGH-VOLTAGE ISOLATION CAPACITOR
#2285DUAL ETCH-STOP LAYER STRUCTURE
#2286SEMICONDUCTOR DEVICE
#2287SEMICONDUCTOR PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOF
#2288Semiconductor device
#2289MICROELECTRONIC DEVICES, MEMORY DEVICES, AND ELECTRONIC SYSTEMS
#2290MEMORY DEVICE
#2291Vertical memory structure with air gaps and method for preparing the same
#2292THREE-DIMENSIONAL MEMORY DEVICE INCLUDING TRENCH BRIDGES AND METHODS OF FORMING THE SAME
#2293THREE-DIMENSIONAL MEMORY DEVICE INCLUDING TRENCH BRIDGES AND METHODS OF FORMING THE SAME
#2294MEMORY DEVICE INCLUDING VERTICALLY STACKED PERIPHERAL REGIONS
#2295SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME
#2296METHOD FOR FORMING VIA STRUCTURE WITH LOW RESISTIVITY
#2297Semiconductor Device and Method of Manufacturing the Same
#2298DEEP TRENCH CAPACITOR STRUCTURE AND METHOD FOR FORMING THE SAME
#2299SEMICONDUCTOR PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREFOR
#2300SEMICONDUCTOR PACKAGE
#2301INTERCONNECT STRUCTURE
#2302Semiconductor memory structure and interconnect structure of semiconductor memory structure
#2303THREE DIMENSIONAL INTEGRATED CIRCUIT WITH MONOLITHIC INTER-TIER VIAS (MIV)
#2304SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
#2305SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#2306SEMICONDUCTOR STRUCTURE HAVING AIR GAP DIELECTRIC AND METHOD OF PREPARING THE SAME
#2307HETEROGENEOUS METAL LINE COMPOSITIONS FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION
#2308Contact over active gate structures with metal oxide-caped contacts to inhibit shorting
#2309NITRIDE-BASED SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#2310SOLID-STATE IMAGING DEVICE, METHOD FOR MANUFACTURING THE SAME, AND ELECTRONIC APPARATUS
#2311WIRING STRUCTURE WITH CONDUCTIVE FEATURES HAVING DIFFERENT CRITICAL DIMENSIONS, AND METHOD OF MANUFACTURING THE SAME
#2312WIRING STRUCTURE WITH CONDUCTIVE FEATURES HAVING DIFFERENT CRITICAL DIMENSIONS, AND METHOD OF MANUFACTURING THE SAME
#2313Semiconductor structure and method of manufacturing the same
#2314Interconnect structures
#2315SEMICONDUCTOR DEVICE, SEMICONDUCTOR SUBSTRATE AND MANUFACTURING METHOD THEREOF
#2316SELECTIVE DEPOSITION OF LINER AND BARRIER FILMS FOR RESISTANCE REDUCTION OF SEMICONDUCTOR DEVICES
#2317Via Resistance Reduction
#2318SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#2319INTEGRATED CIRCUIT DEVICE
#2320Semiconductor device and method for manufacturing the same
#2321Semiconductor device with cushion structure and method for fabricating the same
#2322Semiconductor device with cushion structure and method for fabricating the same
#2323SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
#2324MOLYBDENUM DEPOSITION IN FEATURES
#2325METHODS FOR FORMING MULTI-TIER TUNGSTEN FEATURES
#2326Memory device and semiconductor die, and method of fabricating memory device
#2327FERROELECTRIC MEMORY DEVICE WITH BLOCKING LAYER
#2328Semiconductor device
#2329Forming trench in IC chip through multiple trench formation and deposition processes
#2330Hyperchip
#2331FAN-OUT PACKAGE STRUCTURES WITH CASCADED OPENINGS IN ENHANCEMENT LAYER
#2332THROUGH-SUBSTRATE VIA FORMED USING A PARTIAL PLUG THAT STOPS BEFORE A SUBSTRATE
#2333INTERCONNECT LAYER AND METHOD FOR MANUFACTURING THE SAME
#23343D NAND memory device and method of forming the same
#2335Semiconductor device
#2336SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME
#2337SEMICONDUCTOR DEVICE AND DATA STORAGE SYSTEM INCLUDING THE SAME
#2338SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
#2339VIA FORMED USING A PARTIAL PLUG THAT EXTENDS INTO A SUBSTRATE
#2340INTERCONNECT STRUCTURES WITH VIAS HAVING VERTICAL AND HORIZONTAL SECTIONS
#2341Semiconductor device having shield patterns
#2342SEMICONDUCTOR DEVICE INCLUDING DUMMY DEEP TRENCH CAPACITORS AND A METHOD OF MANUFACTURING THEREOF
#2343METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES AND CORRESPONDING SEMICONDUCTOR PRODUCTS
#2344SUPERCONDUCTIVE INTERCONNECT STRUCTURE
#2345Forming Openings Through Carrier Substrate of IC Package Assembly for Fault Identification
#2346CONTINUOUS GATE AND FIN SPACER FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION
#2347METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE WITH MATERIAL IN MONOCRYSTALLINE PHASE
#2348Repackaging IC chip for fault identification
#2349THREE-DIMENSIONAL MEMORY ARRAY WITH DUAL-LEVEL PERIPHERAL CIRCUITS AND METHODS FOR FORMING THE SAME
#2350SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME
#2351THREE-DIMENSIONAL MEMORY DEVICES HAVING THROUGH ARRAY CONTACTS AND METHODS FOR FORMING THE SAME
#2352SEMICONDUCTOR DEVICE WITH CAPACITOR AND METHOD FOR FORMING THE SAME
#2353Self-aligned gate endcap (SAGE) architectures with gate-all-around devices
#2354Semiconductor device including source pad region and drain pad region configured to improve current uniformity and reduce resistance
#2355Hybrid manufacturing for integrated circuit devices and assemblies
#2356Power delivery for embedded bridge die utilizing trench structures
#2357Self-aligned buried power rail cap for semiconductor devices
#2358SEMICONDUCTOR DEVICE WITH BACKSIDE POWER RAIL AND METHODS OF FABRICATION THEREOF
#2359ELECTRONIC DEVICE
#2360Semiconductor device
#2361MICROELECTRONICS PACKAGE WITH VERTICALLY STACKED WAFER SLICES AND PROCESS FOR MAKING THE SAME
#2362ELECTRONIC DEVICE
#2363Ball grid array package design
#2364SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING THEREOF
#2365ETCH PROFILE CONTROL OF VIA OPENING
#2366Self-aligned contacts
#2367INTEGRATION OF FULLY ALIGNED VIA THROUGH SELECTIVE DEPOSITION AND RESISTIVITY REDUCTION
#2368WORD LINE STRUCTURES FOR THREE-DIMENSIONAL MEMORY ARRAYS
#2369MEMORY STRUCTURE AND METHOD OF FORMING THE SAME
#2370THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE, ELECTRONIC SYSTEM INCLUDING THE SAME, AND METHOD OF FABRICATING THE SAME
#2371Three-dimensional memory devices having through stair contacts and methods for forming the same
#2372THREE-DIMENSIONAL SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SAME
#2373PATCH ANTENNAS IN PACKAGES
#2374SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#2375Semiconductor Device and Method for Forming the Same
#2376HIGH CONNECTIVITY DEVICE STACKING
#2377UPPER CONDUCTIVE STRUCTURE HAVING MULTILAYER STACK TO DECREASE FABRICATION COSTS AND INCREASE PERFORMANCE
#2378SEAL RING FOR HYBRID-BOND
#2379SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
#2380SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
#2381SEMICONDUCTOR DEVICE
#2382NOVEL SELF-ALIGN VIA STRUCTURE BY SELECTIVE DEPOSITION
#2383Integrated circuit including supervia and method of making
#2384SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURING THEREOF
#2385ETCH STOP STRUCTURE FOR IC TO INCREASE STABILITY AND ENDURANCE
#2386Protection structures for bonded wafers
#2387BY-SITE-COMENSATED ETCH BACK FOR LOCAL PLANARIZATION/TOPOGRAPHY ADJUSTMENT
#2388THREE-DIMENSIONAL MEMORY DEVICES AND METHODS FOR FORMING THE SAME
#2389MICROELECTRONIC DEVICES, AND RELATED MEMORY DEVICES AND ELECTRONIC SYSTEMS
#2390Multiple power domains using nano-sheet structures
#2391Magnetic tunnel junction devices
#2392SEMICONDUCTOR CHIP
#2393THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
#2394Vertical memory devices
#2395Method of manufacturing three-dimensional memory device with vias connected to staircase structure
#2396THREE-DIMENSIONAL MEMORY DEVICE CONTAINING ETCH STOP METAL PLATES FOR BACKSIDE VIA STRUCTURES AND METHODS FOR FORMING THE SAME
#2397THREE-DIMENSIONAL MEMORY DEVICE CONTAINING ETCH STOP METAL PLATES FOR BACKSIDE VIA STRUCTURES AND METHODS FOR FORMING THE SAME
#2398Semiconductor device
#2399Semiconductor Devices Including Resistor Structures
#2400Display device