ClassID:

207733

H01L23/5254 - CPC Classification

Classification description:

Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body with adaptable interconnections comprising anti-fuses, i.e. connections having their state changed from non-conductive to conductive the change of state resulting from the use of an external beam, e.g. laser beam or ion beam

Recent Application in this class:
#1
20240113015
2024-04-04

Anti-fuse and fuse structures for improving the functionality of qubit circuits

#2
20240105594
2024-03-28

ANTI-FUSE ELEMENT AND LIGHT-EMITTING DEVICE

#3
20220173047
2022-06-02

Method for fabricating semiconductor device with programmable unit

#4
20220173045
2022-06-02

Semiconductor device with programmable unit and method for fabricating the same

#5
20200027831
2020-01-23

FinFET fuses formed at tight pitch dimensions

#6
20190311904
2019-10-10

Array substrate, fabricating method thereof, and display device

#7
20190181090
2019-06-13

FinFET fuses formed at tight pitch dimensions

#8
20110163419
2011-07-07

Allotropic or morphologic change in silicon induced by electromagnetic radiation for resistance turning of integrated circuits

#9
20110133307
2011-06-09

Damage propagation barrier

#10
20110079875
2011-04-07

Anti-fuse and method for forming the same, unit cell of non volatile memory device with the same

#11
20100237461
2010-09-23

SEMICONDUCTOR PACKAGE SUBSTRATE INCLUDING FUSES, SEMICONDUCTOR DEVICE PACKAGE, SEMICONDUCTOR MODULE AND ELECTRONIC APPARATUS INCLUDING THE SAME

#12
20100155884
2010-06-24

MELTING FUSE OF SEMICONDUCTOR AND METHOD FOR FORMING THE SAME

#13
20100102921
2010-04-29

Electrical closing switch made from reactive composite materials

#14
20090278404
2009-11-12

Circuit arrangement and system for use in a motor vehicle

#15
20090206381
2009-08-20

Anti-fuse and method for forming the same, unit cell of nonvolatile memory device with the same

#16
20090155541
2009-06-18

Fuse and pad stress relief

#17
20080194064
2008-08-14

Programming of laser fuse

#18
20080157271
2008-07-03

SEMICONDUCTOR DEVICE HAVING ANTIFUSE AND METHOD OF MANUFACTURING THE SAME

#19
20080099877
2008-05-01

Damage propagation barrier and method of forming

#20
20080087982
2008-04-17

Semiconductor device with liquid repellant layer

#21
20070252131
2007-11-01

Method of interconnect formation using focused beams

#22
20070029639
2007-02-08

Method for making an edge intensive antifuse

#23
20070022599
2007-02-01

Edge intensive antifuse and method for making the same

#24
20070018280
2007-01-25

Antifuse structure and system for closing thereof

#25
20060145291
2006-07-06

Structure and programming of laser fuse

#26
20060141681
2006-06-29

Processing a memory link with a set of at least two laser pulses

#27
20050258506
2005-11-24

Arrangement and process for protecting fuses/anti-fuses

#28
20050093091
2005-05-05

Structure and programming of laser fuse

#29
20050051868
2005-03-10

Method of closing an antifuse using laser energy

#30
20050001285
2005-01-06

Edge intensive antifuse and method for making the same

#31
17410183
2025-09-02

Superconducting anti-fuse based field programmable gate array