207737 ⎘
Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body layout of the interconnection structure Cross-sectional geometry
Three-dimensional memory device and manufacturing method thereof
#3002Semiconductor device, circuit board structure and manufacturing method thereof
#3003Air channel formation in packaging process
#3004VIA RAIL SOLUTION FOR HIGH POWER ELECTROMIGRATION
#3005Method of fabricating a semiconductor device including multiple contacts
#3006Semiconductor storage device and manufacturing method thereof
#3007Semiconductor devices including line identifier
#3008Semiconductor structure with ultra thick metal and manufacturing method thereof
#3009Semiconductor devices and methods of manufacturing the same
#3010Back end of line integration for self-aligned vias
#3011Three-dimensional memory device including ferroelectric-metal-insulator memory cells and methods of making the same
#3012Three-dimensional memory device containing auxiliary support pillar structures and method of making the same
#3013Microelectronic devices with a polysilicon structure adjacent a staircase structure, and related methods
#3014Integrated assemblies and methods of forming integrated assemblies
#3015Integrated assemblies and methods of forming integrated assemblies
#3016Semiconductor device and manufacturing method of the same
#3017Integrated chip for standard logic performance improvement having a back-side through-substrate-via and method for forming the integrated chip
#3018Memory device
#3019Redistribution layer structures for integrated circuit package
#3020Memory Array Comprising Strings Of Memory Cells
#3021Semiconductor package and method of fabricating the same
#3022Semiconductor device and method for fabricating the same
#3023Wafer-level design and wiring pattern for a semiconductor package
#3024Semiconductor memory device
#3025Top via interconnect having a line with a reduced bottom dimension
#3026Memory Arrays Comprising Operative Channel-Material Strings And Dummy Pillars
#3027Microelectronic devices including stadium structures, and related methods, memory devices, and electronic systems
#3028Barrier-less prefilled via formation
#3029Three-dimensional memory arrays with layer selector transistors
#3030Semiconductor device including base pillar, connection pad, and insulation layer disposed on a substrate
#3031Semiconductor storage device
#3032Thermal dissipation in semiconductor devices
#3033Semiconductor package including test pad
#3034Subtractive RIE interconnect
#3035Integrated circuit including standard cell and method of manufacturing the integrated circuit
#3036Butted contacts and methods of fabricating the same in semiconductor devices
#3037Semiconductor memory device having a passivation film and a plurality of insulating patterns on a memory cell array
#3038SRAM device and manufacturing method thereof
#3039Semiconductor device with EMI protection structure and method for fabricating the same
#3040Semiconductor device with connecting structure having a doped layer and method for forming the same
#3041Semiconductor device
#3042Manufacturing method of semiconductor structure
#3043Interconnects with enlarged contact area
#3044Manufacturing method of semiconductor structure
#3045Three-dimensional flash memory including middle metallization layer and manufacturing method thereof
#3046Display device
#3047Three-dimensional memory device with backside interconnect structures
#3048Methods and apparatus for forming dual metal interconnects
#3049Contact formation method and related structure
#3050Method of forming shield structure for backside through substrate vias (TSVS)
#3051Semiconductor package and method of manufacturing the same
#3052Semiconductor structures and methods for forming the same
#3053Semiconductor device and manufacturing method thereof
#3054Stacked substrate structure with inter-tier interconnection
#3055Vertical memory devices
#3056Memory cell and method of forming the memory cell
#3057Semiconductor structure having buried power rail disposed between two fins and method of making the same
#3058Integrated circuit package with integrated voltage regulator
#3059Advanced node interconnect routing methodology
#3060Hybrid method for forming semiconductor interconnect structure
#3061Semiconductor die including edge ring structures and methods for making the same
#3062Via formation with robust hardmask removal
#3063Interconnects with tight pitch and reduced resistance
#3064Defect detection structures, semiconductor devices including the same, and methods of detecting defects in semiconductor dies
#3065Method for manufacturing a FinFET device with a backside power rail and a backside self-aligned via by etching an extended source trench
#3066Barrier layer for metal insulator metal capacitors
#3067Shared bit lines for memory cells
#3068Deposition of graphene on a dielectric surface for next generation interconnects
#3069WLCSP reliability improvement for package edges including package shielding
#3070Magnetic structures in integrated circuit package supports
#3071INVERTED, SELF-ALIGNED TOP-VIA STRUCTURES
#3072Three-dimensional memory devices having through array contacts and methods for forming the same
#3073Forksheet transistor architectures
#3074Package structure, chip structure and method of fabricating the same
#3075SEMICONDUCTOR MEMORY DEVICE
#3076INTERCONNECTION FABRIC FOR BURIED POWER DISTRIBUTION
#3077Semiconductor chip with stacked conductor lines and air gaps
#3078Staircase structure in three-dimensional memory device and method for forming the same
#3079Planar slab vias for integrated circuit interconnects
#3080Wiring structure and method for manufacturing the same
#3081Semiconductor device and a method of manufacturing the same
#3082Enlarging contact area and process window for a contact via
#3083Block-on-block memory array architecture using bi-directional staircases
#3084Semiconductor storage device
#3085Semiconductor device packages and methods of manufacturing the same
#3086Wiring formation method, method for manufacturing semiconductor device, and semiconductor device
#3087Methods of forming microelectronic devices, and related microelectronic devices, memory devices, and electronic systems
#3088Method of forming an interconnect structure with enhanced corner connection
#3089Semiconductor device package including stress buffering layer
#3090Semiconductor devices having a conductive pillar and methods of manufacturing the same
#3091Package structure and method of forming the same
#3092Semiconductor device and method of manufacturing a semiconductor device
#3093Protection structures in semiconductor chips and methods for forming the same
#3094Semiconductor device
#3095Inverted integrated circuit and method of forming the same
#3096Semiconductor device having an inter-layer via (ILV), and method of making same
#3097Chemical direct pattern plating method
#3098Semiconductor device including back side power supply circuit
#3099Contacts having a geometry to reduce resistance
#3100Semiconductor device with source and drain vias having different sizes
#3101Vertical memory devices
#3102Anti-fuse structure and method for fabricating same, as well as semiconductor device
#3103Semiconductor device including recessed interconnect structure
#3104Integrated circuit packages having mechanical brace standoffs
#3105Manufacturing method of carrier for semiconductor chip mounting thereon
#3106Metal heterojunction structure with capping metal layer
#3107SEMICONDCTOR DEVICE PACKAGE THERMAL CONDUIT
#3108SRAM cell word line structure with reduced RC effects
#3109Semiconductor device and manufacturing method thereof
#3110Method for fabricating semiconductor device
#3111SEMICONDUCTOR INTEGRATED CIRCUIT AND ELECTRONIC APPARATUS
#31123D NAND memory device and method of forming the same
#3113Semiconductor device with metal plug having rounded top surface
#3114Staircase formation in three-dimensional memory device
#3115Via-first process for connecting a contact and a gate electrode
#3116Semiconductor device, fabrication method for a semiconductor device and electronic apparatus
#3117Three-dimensional nonvolatile memory device and a method of fabricating the same
#3118Partial barrier free vias for cobalt-based interconnects and methods of fabrication thereof
#3119SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
#3120HYBRID INTERCONNECT WITH A RELIABILITY LINER IN WIDE FEATURES
#3121Microelectronic devices with symmetrically distributed staircase stadiums and related systems and methods
#3122Method of forming entangled inductor structures
#3123Trench contact structures for advanced integrated circuit structure fabrication
#3124Fin cut and fin trim isolation for advanced integrated circuit structure fabrication
#3125SEMICONDUCTOR STORAGE DEVICE
#3126Integrated assemblies, and methods of forming integrated assemblies
#3127Semiconductor arrangement and method of making
#3128Single-mask alternating line deposition
#3129Process for forming metal-insulator-metal structures
#3130Three-dimensional semiconductor device having a first main separation structure and a second main separation structure on a lower structure
#3131Semiconductor device having buried word line and method of manufacturing the same
#3132Semiconductor assembly and method of manufacturing the same
#3133Semiconductor device and method of fabricating the same
#3134Methods for fabricating microelectronic devices with contacts to conductive staircase steps, and related devices and systems
#3135Semiconductor device having inter-metal dielectric patterns and method for fabricating the same
#3136Three-dimensional memory device containing horizontal and vertical word line interconnections and methods of forming the same
#3137Protection structures for bonded wafers
#3138Semiconductor structure and method for forming the same
#3139Semiconductor device and method of manufacture
#3140Contact over active gate structures for advanced integrated circuit structure fabrication
#3141Interconnect structures of three-dimensional memory devices
#3142Semiconductor device
#3143Semiconductor device
#3144Integrated circuit device and method of manufacturing the same
#3145Package grounding system
#3146EFuse structure with multiple links
#3147SEMICONDUCTOR DEVICE
#3148Apparatus with species on or in conductive material on elongate lines
#3149Semiconductor device
#3150Interconnect structures of three-dimensional memory devices
#3151Memory packages and methods of forming same
#3152Wiring structures having a metal pattern intersection portion
#3153Butted contacts and methods of fabricating the same in semiconductor devices
#3154Semiconductor device and manufacturing method thereof
#3155Semiconductor device and method of manufacture
#3156Conductive lines with subtractive cuts
#3157Removal or reduction of chamfer for fully-aligned via
#3158Barrier-less prefilled via formation
#3159Gate line plug structures for advanced integrated circuit structure fabrication
#3160Image sensor including silicon over germanium layer
#3161Three-dimensional semiconductor memory device
#3162Semiconductor memory device and method for manufacturing the same
#3163Die-to-die routing through a seal ring
#3164Interconnects with hybrid metal conductors
#3165Selective ILD deposition for fully aligned via with airgap
#3166Vertical thin-film transistor and application as bit-line connector for 3-dimensional memory arrays
#3167Semiconductor memory device
#3168Three-dimensional memory device with via structures surrounded by perforated dielectric moat structure and methods of making the same
#3169Semiconductor package structure and method for manufacturing the same
#3170METHOD FOR FORMING CONTACT STRUCTURE
#3171Poisoned metal layer with sloped sidewall for making dual damascene interconnect
#3172THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE
#3173Semiconductor device
#3174Photonic semiconductor device and method
#3175Semiconductor device package and method of manufacturing the same
#3176Tungsten structures and methods of forming the structures
#3177Semiconductor device with metal interconnection
#3178Bonding pads embedded in a dielectric diffusion barrier and having recessed metallic liners
#3179Skip level vias in metallization layers for integrated circuit devices
#3180Integrated circuits including multi-layer conducting lines
#3181Semiconductor device package and method of manufacturing the same
#3182Bi-layer alloy liner for interconnect metallization and methods of forming the same
#3183Mitigating pattern collapse
#3184TOOLS AND METHODS FOR SUBTRACTIVE METAL PATTERNING
#3185Semiconductor package and method of fabricating the same
#3186Semiconductor device containing metal-organic framework inter-line insulator structures and methods of manufacturing the same
#3187Methods of forming a conductive contact structure to an embedded memory device on an IC product and a corresponding IC product
#3188Manufacturing method of connection structure of semiconductor device
#31893D NAND memory device and method of forming the same
#3190Methods of forming a conductive contact structure to an embedded memory device on an IC product and a corresponding IC product
#3191Titanium-containing diffusion barrier for CMP removal rate enhancement and contamination reduction
#3192Transistors, arrays of transistors, arrays of memory cells individually comprising a capacitor and an elevationally-extending transistor, and methods of forming an array of transistors
#3193Semiconductor device, semiconductor package and method of manufacturing the same
#3194Memory device with a through hole structure, semiconductor device and method for manufacturing the same
#3195Semiconductor device having interconnection lines with different linewidths and metal patterns
#3196Semiconductor devices
#3197Three-dimensional semiconductor memory device
#3198Semiconductor device having symmetric conductive interconnection patterns
#3199Integrated circuits including via array and methods of manufacturing the same
#3200Tapered connectors for superconductor circuits
#3201Redistribution substrate, method of fabricating the same, and semiconductor package including the same
#3202Self-aligned contacts in three-dimensional memory devices and methods for forming the same
#3203Semiconductor device with reduced via resistance
#3204Nonvolatile memory device
#3205SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
#3206Power module assembly
#3207Semiconductor device including stack structure with flat region
#3208Semiconductor device with stacked wirings having respective pitches and ratios therebetween
#3209Semiconductor device and manufacturing method of the same
#3210Three-dimensional memory device with source contacts connected by an adhesion layer and methods for forming the same
#3211Integrated circuit packages with conductive element having cavities housing electrically connected embedded components
#3212Apparatus and method to increase effective capacitance with layout staples
#3213Semiconductor devices including contacts and conductive line interfaces with contacting sidewalls
#3214Electron beam probing techniques and related structures
#3215Semiconductor device and method of manufacturing the same
#3216Semiconductor device
#3217Magnetic memory devices
#3218Three-dimensional memory device containing a dummy memory film isolation structure and method of making thereof
#3219Semiconductor structure and manufacturing method thereof
#3220Interconnect structure with air-gaps
#3221Interconnection structure of integrated circuit semiconductor device
#3222Three-dimensional memory device containing structures for enhancing gate-induced drain leakage current and methods of forming the same
#3223Device structure
#3224Microelectronic devices including stair step structures, and related electronic devices and methods
#3225Method for preparing semiconductor device with air gap structure
#3226Three-dimensional memory arrays with layer selector transistors
#3227Semiconductor device and manufacturing method thereof
#3228Methods of forming memory devices including stair step structures
#3229Semiconductor device and manufacturing method thereof
#3230Semiconductor device and method of manufacturing the same
#3231Semiconductor devices including staircase structures
#3232Vertical 3D stack NOR device
#3233Semiconductor device and manufacturing method thereof
#3234INTEGRATED WORD LINE CONTACT STRUCTURES IN THREE-DIMENSIONAL (3D) MEMORY ARRAY
#3235Method of manufacturing a semiconductor structure
#3236Trench isolation for advanced integrated circuit structure fabrication
#3237Field plate structure to enhance transistor breakdown voltage
#3238Semiconductor memory device and manufacturing method of the semiconductor memory device
#3239Word line architecture for three dimensional NAND flash memory
#3240Three-dimensional memory device containing width-modulated connection strips and methods of forming the same
#3241Hybrid bonding contact structure of three-dimensional memory device
#3242Semiconductor devices
#3243Microelectronic devices with polysilicon fill material between opposing staircase structures, and related devices, systems, and methods
#3244Layout structures with multiple fingers of multiple lengths
#3245Conductive rail structure for semiconductor devices
#3246Trim wall protection method for multi-wafer stacking
#3247Planarization method of a capping insulating layer, a method of forming a semiconductor device using the same, and a semiconductor device formed thereby
#3248Three-dimensional semiconductor memory device
#3249Sidewall spacer to reduce bond pad necking and/or redistribution layer necking
#3250Integrated assemblies
#3251Three-dimensional semiconductor device including a through-via structure having a via liner having protruding portions
#3252Semiconductor device including an insulating material layer with concave-convex portions
#3253Methods for manufacturing a memory array having strings of memory cells comprising forming bridge material between memory blocks
#3254Methods used in forming a memory array comprising strings of memory cells
#3255Backside deep isolation structures for semiconductor device arrays
#3256Three-dimensional memory devices with backside isolation structures
#3257Semiconductor apparatus having stacked devices and method of manufacture thereof
#3258Power delivery network for CFET with buried power rails
#3259Back end of the line metal structure and method
#3260Middle-end-of-line strap for standard cell
#3261Semiconductor structure with a laminated layer
#3262Interconnect fabricated with flowable copper
#3263Via structure and methods thereof
#3264Interconnects having a via-to-line spacer for preventing short circuit events between a conductive via and an adjacent line
#3265Three-dimensional memory devices and fabrication methods thereof
#3266Three-dimensional memory devices having through array contacts and methods for forming the same
#3267PAD STRUCTURE
#3268Semiconductor device and manufacturing method of the same
#3269Semiconductor devices including a thick metal layer
#3270Semiconductor device package
#3271Semiconductor fuse structure and method of manufacturing a semiconductor fuse structure
#3272Fuse lines and plugs for semiconductor devices
#3273Semiconductor device having reduced capacitance between source and drain pads
#3274Semiconductor devices including resistor structures
#3275Three-dimensional memory devices and methods for forming the same
#3276SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
#3277Bump structure to prevent metal redeposit and to prevent bond pad consumption and corrosion
#3278Bottom barrier free interconnects without voids
#3279Terminal configuration and semiconductor device
#3280Integrated circuit structures having differentiated interconnect lines in a same dielectric layer
#3281Recessed inductor structure to reduce step height
#3282Via structure having a metal hump for low interface resistance
#3283Semiconductor memory device and manufacturing method thereof
#3284Semiconductor device and methods of forming the same
#3285Contact features and methods of fabricating the same in semiconductor devices
#3286Package structure and manufacturing method thereof
#3287Enhanced intermetal dielectric adhesion
#3288Staircase formation in three-dimensional memory device
#3289Three-dimensional memory device including contact-level bit-line-connection structures and methods of making the same
#3290Replacement gate structures for advanced integrated circuit structure fabrication
#3291Memory device
#3292Memory device with transistors above memory stacks and manufacturing method of the memory device
#3293Semiconductor device with multiple polarity groups
#3294Integrated Assemblies Having Barrier Material Between Silicon-Containing Material and Another Material Reactive with Silicon
#3295Semiconductor memory device
#3296SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR MEMORY DEVICE
#3297Semiconductor device and method of manufacturing same
#3298Method of manufacturing semiconductor device
#3299Semiconductor device and method of fabricating the same
#3300Trench walls, conductive structures having different widths and methods of making same