207737 ⎘
Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body layout of the interconnection structure Cross-sectional geometry
Semiconductor device and method for manufacturing same
#3902MULTI-USE PACKAGE ARCHITECTURE
#3903Interconnect structure having an etch stop layer over conductive lines
#3904Layer stack of component carrier material with embedded components and common high temperature robust dielectric structure
#3905METAL-OXIDE SEMICONDUCTOR (MOS) DEVICE WITH THICK OXIDE
#3906Concurrent formation of memory openings and contact openings for a three-dimensional memory device
#3907Three-dimensional memory device containing replacement contact via structures and method of making the same
#3908Memory cell array with large gate widths
#3909Semiconductor device, fabrication method for a semiconductor device and electronic apparatus
#3910Semiconductor device and method for manufacturing the same
#3911Multi-tier three-dimensional memory device containing differential etch rate field oxides and method of making the same
#3912Semiconductor structure and fabrication method thereof
#3913Semiconductor device
#3914Vertical gate semiconductor device with steep subthreshold slope
#3915SUBSTRATE HAVING NON-THROUGH HOLE
#3916Selective ILD deposition for fully aligned via with airgap
#3917Memory devices including stair step or tiered structures and related methods
#3918SGT-including pillar-shaped semiconductor device and method for producing the same
#3919Semiconductor device with shielding structure for cross-talk reduction
#3920Interconnect structure with air gaps
#3921Semiconductor structure with ultra thick metal and manufacturing method thereof
#3922Semiconductor device including buried insulation layer and manufacturing method thereof
#3923Interconnect structure and method
#3924Method of manufacturing wafer level low melting temperature interconnections
#3925Gate cut and fin trim isolation for advanced integrated circuit structure fabrication
#3926Semiconductor devices with layers commonly contacting fins and methods of manufacturing the same
#3927Power distribution circuitry
#3928Increased contact alignment tolerance for direct bonding
#3929Methods for reducing dual damascene distortion
#3930Hybrid copper structure for advance interconnect usage
#3931Standard cell architecture for gate tie-off
#3932Display device
#3933Semiconductor package and method of manufacturing the same
#3934Trench MOSFET with self-aligned body contact with spacer
#3935Method and structure to construct cylindrical interconnects to reduce resistance
#3936CHIP ASSEMBLIES EMPLOYING SOLDER BONDS TO BACK-SIDE LANDS INCLUDING AN ELECTROLYTIC NICKEL LAYER
#3937Method for producing pillar-shaped semiconductor device
#3938Semiconductor integrated circuitry
#3939Semiconductor devices
#3940Methods of filling horizontally-extending openings of integrated assemblies
#3941SEMICONDUCTOR DEVICE
#3942Forming dual metallization interconnect structures in single metallization level
#3943Semiconductor device
#3944Transistor structure in low noise amplifier
#3945Skip via structures
#3946Display device having notched connection wiring
#3947Semiconductor device
#3948Power semiconductor device and method for manufacturing same
#3949Vertically-strained silicon device for use with a perpendicular magnetic tunnel junction (PMTJ)
#3950Contact structures and methods of making the contact structures
#3951Semiconductor devices including a capping layer
#3952Dissimilar material interface having lattices
#3953Pitch translation architecture for semiconductor package including embedded interconnect bridge
#3954THREE-DIMENSIONAL SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#3955Semiconductor devices including a stair step structure, and related methods
#3956Methods of forming staircase structures
#3957Structure and method using metal spacer for insertion of variable wide line implantation in SADP/SAQP integration
#3958Semiconductor device packages and stacked package assemblies including high density interconnections
#3959Semiconductor device packages and stacked package assemblies including high density interconnections
#3960Radio-frequency isolation cavities and cavity formation
#3961Topside radio-frequency isolation cavity configuration
#3962Forming dual metallization interconnect structures in single metallization level
#3963Semiconductor devices having electrically and optically conductive vias, and associated systems and methods
#3964SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF
#3965Method of fabricating a semiconductor package using an insulating polymer layer
#3966Semiconductor devices
#3967Inverted staircase contact for density improvement to 3D stacked devices
#3968VERTICAL MEMORY DEVICES
#3969SEMICONDUCTOR DEVICE AND METHOD WITH MULTIPLE REDISTRIBUTION LAYER AND FINE LINE CAPABILITY
#3970Field effect transistor and method of making
#3971Substrate structure and electronic device having coarse redistribution layer electrically connected to fine redistribution layer
#3972Semiconductor devices
#3973Apparatuses having an interconnect extending from an upper conductive structure, through a hole in another conductive structure, and to an underlying structure
#3974Interconnection structure and method for manufacturing same
#3975Selective ILD deposition for fully aligned via with airgap
#3976Method for fabricating a folded channel trench MOSFET
#3977Stack of layers for protecting against a premature breakdown of interline porous dielectrics within an integrated circuit
#3978Epitaxial source or drain structures for advanced integrated circuit structure fabrication
#3979Gate line plug structures for advanced integrated circuit structure fabrication
#3980Replacement gate structures for advanced integrated circuit structure fabrication
#3981Conductive pattern with tapered angle, display device including the same, and method of manufacturing conductive pattern
#3982Dual metal gate structures for advanced integrated circuit structure fabrication
#3983Differentiated voltage threshold metal gate structures for advanced integrated circuit structure fabrication
#3984Heterogeneous metal line compositions for advanced integrated circuit structure fabrication
#3985PITCH-DIVIDED INTERCONNECTS FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION
#3986Via sizing for IR drop reduction
#3987Interconnect structures and methods of forming the same
#3988BEOL integration with advanced interconnects
#3989Middle-end-of-line strap for standard cell
#3990Integrated circuit package substrate
#3991Dual metal silicide structures for advanced integrated circuit structure fabrication
#3992Prevention of contact bottom void in semiconductor fabrication
#3993Trench plug hardmask for advanced integrated circuit structure fabrication
#3994Fin cut and fin trim isolation for advanced integrated circuit structure fabrication
#3995Plugs for interconnect lines for advanced integrated circuit structure fabrication
#3996Method of forming semiconductor structure having layer with re-entrant profile
#3997Continuous gate and fin spacer for advanced integrated circuit structure fabrication
#3998Trench isolation for advanced integrated circuit structure fabrication
#3999Method for forming interconnect structure
#4000Contact over active gate structures for advanced integrated circuit structure fabrication
#4001Semiconductor structure and method for forming the same
#4002Semiconductor devices
#4003Semiconductor device and manufacturing method thereof
#4004Semiconductor device, layout design method for the same and method for fabricating the same
#4005Non-planar I/O and logic semiconductor devices having different workfunction on common substrate
#4006Semiconductor device
#4007Semiconductor device and forming method thereof
#4008Interconnect structure and method of forming the same
#4009Low aspect ratio interconnect
#4010THREE-DIMENSIONAL SEMICONDUCTOR DEVICE
#4011Patterning approach for improved via landing profile
#4012Semiconductor devices
#4013Two-Dimensional Via Pillar Structures
#4014Semiconductor device
#4015Via structure and methods thereof
#4016Method for forming an aligned mask
#4017Methods of forming semiconductor device structures
#4018Electronic device and method for fabricating the same
#4019Biconvex low resistance metal wire
#4020Construction of integrated circuitry and a method of forming an elevationally-extending conductor laterally between a pair of structures
#4021Semiconductor device and manufacturing method thereof
#4022Heterojunction semiconductor device for reducing parasitic capacitance
#4023Semiconductor devices including contact plugs
#4024FinFETs and methods of forming FinFETs
#4025Three-dimensional memory devices and fabricating methods thereof
#4026Semiconductor structure
#4027Metal on both sides with clock gated-power and signal routing underneath
#4028Integrated circuits including via array and methods of manufacturing the same
#4029Stair contact structure, manufacturing method of stair contact structure, and memory structure
#4030Method for forming conductive lines
#4031Conductive vias in semiconductor packages and methods of forming same
#4032Systems and methods to enhance passivation integrity
#4033Radio-frequency isolation using porous silicon
#4034Integrated circuit with conductive line having line-ends
#4035Electrically-verifiable fuses and method of fuse verification
#4036Method for producing pillar-shaped semiconductor device
#4037Semiconductor device with superior crack resistivity in the metallization system
#4038INTERCONNECTION STRUCTURE LINED BY ISOLATION LAYER
#4039Fuse structure having air dummy fuses and semiconductor device including the same
#4040Method of manufacturing semiconductor device with multi wire structure
#4041Techniques based on electromigration characteristics of cell interconnect
#4042Method for forming at least one electrical discontinuity in an integrated circuit, and corresponding integrated circuit
#4043Semiconductor device
#4044Semiconductor device with integrated capacitor and manufacturing method thereof
#4045Methods of forming semiconductor devices
#4046Array substrate and display device
#4047Memory cell structure of a three-dimensional memory device
#4048Semiconductor device having an inter-layer via (ILV), and method of making same
#4049Method of fabricating integrated circuit having staggered conductive features
#4050Interconnection structure and method for forming the same
#4051Integrated circuit having a high cell density
#4052Dense redistribution layers in semiconductor packages and methods of forming the same
#4053Semiconductor structure and manufacturing method thereof
#4054Laterally extended conductive bump buffer
#4055Semiconductor device and method of manufacturing the semiconductor device
#4056Fully aligned via in ground rule region
#4057Semiconductor device and a method of manufacturing the same
#4058High current lateral GaN transistors with scalable topology and gate drive phase equalization
#4059Integrated device comprising a capacitor and inductor structure comprising a shared interconnect for a capacitor and an inductor
#4060Semiconductor memory device
#4061Three-dimensional memory devices and methods for forming the same
#4062Three-dimensional NAND memory device with source line comprising metallic and semiconductor layers
#4063SRAM cell with T-shaped contact
#4064Connection structure of semiconductor device and manufacturing method thereof
#4065Package substrate and semiconductor package including the same
#4066Interconnection structure having top and bottom vias with a barrier layer therebetween and a dielectric spacer at the bottom via
#4067Stacked substrate structure with inter-tier interconnection
#4068Semiconductor device
#4069Semiconductor device and method for manufacturing the same
#4070Structure for standard logic performance improvement having a back-side through-substrate-via
#4071Interconnect structure for semiconductor device and methods of fabrication thereof
#4072Method for forming three-dimensional integrated wiring structure and semiconductor structure thereof
#4073Integrated assemblies having structures along a first pitch coupled with structures along a second pitch different from the first pitch, and methods of forming integrated assemblies
#4074Interconnect structure for semiconductor device and methods of fabrication thereof
#4075Integrated assemblies having structures along a first pitch coupled with structures along a second pitch different from the first pitch, and methods of forming integrated assemblies
#4076Integrated assemblies having structures along a first pitch coupled with structures along a second pitch different from the first pitch
#4077Structure and formation method of semiconductor device with self-aligned conductive features
#4078Integrated passive device and fabrication method using a last through-substrate via
#4079Method and IC design with non-linear power rails
#4080Three-dimensional memory device with straddling drain select electrode lines and method of making thereof
#4081Fence structure to prevent stiction in a MEMS motion sensor
#4082Hybrid bonding contact structure of three-dimensional memory device
#4083SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF
#4084Chip structure including heating element
#4085Word line decoder circuitry under a three-dimensional memory array
#4086Semiconductor device and method of producing semiconductor device
#4087Semiconductor device including dummy contact
#4088METHOD OF INCREASING EMBEDDED 3D METAL-INSULATOR-METAL (MIM) CAPACITOR CAPACITANCE DENSITY FOR WAFER LEVEL PACKAGING
#4089Semiconductor devices
#4090Semiconductor device
#4091Semiconductor structure and method for fabricating the same
#4092Semiconductor device and a corresponding method of manufacturing semiconductor devices
#4093Integrated electronic device with a redistribution region and a high resilience to mechanical stresses and method for its preparation
#4094Semiconductor device including dielectric layer
#4095Three-dimensional memory device having on-pitch drain select gate electrodes and method of making the same
#4096Three-dimensional memory device having on-pitch drain select gate electrodes and method of making the same
#4097Semiconductor package and method of manufacturing the same
#4098Semiconductor device
#4099Chip package interaction (CPI) back-end-of-line (BEOL) monitoring structure and method
#4100Interconnect structure
#4101Semiconductor device resistor including vias and multiple metal layers
#4102Semiconductor Chip Having Region Including Gate Electrode Features Formed In Part from Rectangular Layout Shapes on Gate Horizontal Grid and First-Metal Structures Formed In Part from Rectangular Layout Shapes on First-Metal Vertical Grid
#4103Semiconductor device including a buffer layer structure for reducing stress
#4104Method for forming semiconductor device structure with graphene layer
#4105Semiconductor device
#4106Semiconductor device and manufacturing method thereof
#4107Three-dimensional semiconductor device and method of fabricating the same
#4108Heterojunction semiconductor device for reducing parasitic capacitance
#4109Power gating for three dimensional integrated circuits (3DIC)
#4110Semiconductor device with shielding structure for cross-talk reduction
#4111Integrated circuit structure having gate contact and method of forming same
#4112Structure and method for improving high voltage breakdown reliability of a microelectronic device
#4113Self-aligned spacers and method forming same
#4114Metallization lines on integrated circuit products
#4115Semiconductor chip having region including gate electrode features formed in part from rectangular layout shapes on gate horizontal grid and first-metal structures formed in part from rectangular layout shapes on at least eight first-metal gridlines of first-metal vertical grid
#4116Semiconductor chip having region including gate electrode features of rectangular shape on gate horizontal grid and first-metal structures of rectangular shape on at least eight first-metal gridlines of first-metal vertical grid
#4117Semiconductor Chip Having Region Including Gate Electrode Features of Rectangular Shape on Gate Horizontal Grid and First-Metal Structures of Rectangular Shape on First-Metal Vertical Grid
#4118SEMICONDUCTOR APPARATUS
#4119VERTICAL MEMORY DEVICE
#4120Semiconductor device having shared power line connections and method of manufacturing the same
#4121Via rail solution for high power electromigration
#4122Methods of manufacturing a semiconductor device
#4123Step height reduction of memory element
#4124Wrapped contacts with enhanced area
#4125Method of manufacturing a semiconductor device including an LDMOS transistor
#4126Metal gate and contact plug design and method forming same
#4127Capacitor having multiple graphene structures
#4128Static random access memory (SRAM) device
#4129Semiconductor device having contact plug and method of forming the same
#4130Conductive vias in semiconductor packages and methods of forming same
#4131Integrated circuit structures comprising conductive vias and methods of forming conductive vias
#4132Semiconductor device and manufacturing method thereof
#4133Method of integrated circuit fabrication with dual metal power rail
#4134Chemical clean of semiconductor device
#4135Metal-oxide semiconductor (MOS) device with thick oxide
#4136Dynamic random access memory and method of manufacturing the same
#4137Vertical gate semiconductor device with steep subthreshold slope
#4138Integrated circuit packages with conductive element having cavities housing electrically connected embedded components
#4139Interconnection structure and method for forming the same
#4140Advanced copper interconnects with hybrid microstructure
#4141Mitigating pattern collapse
#4142Composite dielectric interface layers for interconnect structures
#4143Dielectric film for semiconductor fabrication
#4144IC structure with interface liner and methods of forming same
#4145Semiconductor device structure with resistive element
#4146Semiconductor device with coils in different wiring layers
#4147MULTI-LAYER BARRIER FOR CMOS UNDER ARRAY TYPE MEMORY DEVICE AND METHOD OF MAKING THEREOF
#4148Three dimensional storage cell array with highly dense and scalable word line design approach
#4149Method for contacting a metallic contact pad in a printed circuit board and printed circuit board
#4150Techniques for creating a local interconnect using a SOI wafer
#4151Vertical fin with a gate structure having a modified gate geometry
#4152Semiconductor device and method of manufacturing the same
#4153Vertical fin with a gate structure having a modified gate geometry
#4154SEMICONDUCTOR DEVICES
#4155Crack stop with overlapping vias
#4156Semiconductor device
#4157Surface nitridation in metal interconnects
#4158Selective recessing to form a fully aligned via
#4159Selective recessing to form a fully aligned via
#4160Semiconductor device
#4161Memory system and memory cell having dense layouts
#4162FinFET LDMOS devices with additional dynamic control
#4163Semiconductor structure
#4164Semiconductor device and manufacturing method thereof
#4165Metal patterning for internal cell routing
#4166Semiconductor device with inductive coupling and method of manufacturing the same
#4167Structure and formation method of interconnection structure of semiconductor device
#4168MIDDLE-OF-LINE LOCAL INTERCONNECT STRUCTURES WITH HYBRID FEATURES
#4169Multi-metal fill with self-align patterning
#41703D stacking semiconductor device
#4171Method of manufacturing semiconductor device, and semiconductor device
#4172BIOLOGICAL SENSING SYSTEM HAVING MICRO-ELECTRODE ARRAY
#4173Semiconductor device and method of forming the same
#4174Backside substrate openings in transistor devices
#4175Copper etching integration scheme
#4176Stacked multilayer structure and manufacturing method thereof
#4177Semiconductor device with multi-layer metallization
#4178Pre-spacer self-aligned cut formation
#4179Construction of integrated circuitry and a method of forming an elevationally-extending conductor laterally between a pair of structures
#4180Three-dimensional memory device having conductive support structures and method of making thereof
#4181Method of manufacturing a semiconductor device using reference pattern
#4182LOW RESISTANCE CONTACT STRUCTURES FOR TRENCH STRUCTURES
#4183Memory device and method for fabricating the same
#4184Semiconductor device having insulating layer higher than a top surface of the substrate, and method for reducing the difficulty of filling an insulating layer in a recess
#4185Semiconductor device
#4186FinFET device
#4187Semiconductor device and ball bonder
#4188Interconnecting dies by stitch routing
#4189Standard cell and an integrated circuit including the same
#4190THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
#4191Edge structure for multiple layers of devices, and method for fabricating the same
#4192Method for manufacturing a semiconductor device
#4193Semiconductor structure and fabrication method thereof
#4194LOW RESISTANCE CONTACT STRUCTURES FOR TRENCH STRUCTURES
#4195CMOS compatible fuse or resistor using self-aligned contacts
#4196Semiconductor device and method
#4197Semiconductor device having contacts with varying widths
#4198Structure and method for improving high voltage breakdown reliability of a microelectronic device
#4199Method for producing semiconductor device and semiconductor device
#4200Asymmetric stair structure and method for fabricating the same