207737 ⎘
Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body layout of the interconnection structure Cross-sectional geometry
Semiconductor structure and process for forming plug including layer with pulled back sidewall part
#4802Backside cavity formation in semiconductor devices
#4803Semiconductor devices and methods of manufacturing the same
#4804Air-gap scheme for BEOL process
#4805Cavity formation in interface layer in semiconductor devices
#4806Semiconductor structure and manufacturing method thereof
#4807Semiconductor structures having an insulative island structure
#4808Semiconductor device
#4809Memory device and method for manufacturing the same
#4810Method of forming high density, high shorting margin, and low capacitance interconnects by alternating recessed trenches
#4811Semiconductor devices including a contact structure and methods of manufacturing the same
#4812Semiconductor arrangement and method of making the same
#4813Semiconductor device and method of manufacturing the same
#4814SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#4815Semiconductor device including line patterns
#4816Patterning method for low-k inter-metal dielectrics and associated semiconductor device
#4817Die package with openings surrounding end-portions of through package vias (TPVs) and package on package (PoP) using the die package
#4818Stress reduction apparatus
#4819Semiconductor devices
#4820Integration of heat spreader for beol thermal management
#4821Contact for high-k metal gate device
#4822Semiconductor memory devices
#4823Copper via with barrier layer and cap layer
#4824Semiconductor devices including a capping layer
#4825Semiconductor devices
#4826Semiconductor device and method of manufacturing the same
#4827Semiconductor device and a method of manufacturing the same
#4828Stacked interconnect structure and method of making the same
#4829Methods of forming wiring structures including a plurality of metal layers
#4830Semiconductor constructions and methods of forming intersecting lines of material
#4831Spasers to speed up CMOS processors
#4832Non-volatile memory device having vertical structure and method of operating the same
#4833SEMICONDUCTOR DEVICE HAVING BURIED WORDLINES
#4834Methods for patterning a target layer through fosse trenches using reverse sacrificial spacer lithography
#4835MIS (Metal-Insulator-Semiconductor) contact structures for semiconductor devices
#4836Semiconductor device with air gap and method for fabricating the same
#4837Semiconductor device structure and method for forming the same
#4838Semiconductor device structure and method for forming the same
#4839Semiconductor device
#4840Structure and formation method of damascene structure
#4841Semiconductor device allowing metal layer routing formed directly under metal pad
#4842Twisted array design for high speed vertical channel 3D NAND memory
#4843Semiconductor device and manufacturing method thereof
#4844Stacked damascene structures for microelectronic devices
#4845Semiconductor device with nano-gaps and method for manufacturing the same
#4846Semiconductor device including conductive via with buffer layer at tapered portion of conductive via
#48473D memory structure and method for manufacturing the same
#4848SEMICONDUCTOR DEVICE, SEMICONDUCTOR MEMORY DEVICE, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
#4849SRAM memory cell and SRAM memory with conductive interconnect
#4850Semiconductor device and method of manufacturing the same
#4851FinFETs having step sided contact plugs and methods of manufacturing the same
#4852Self-aligned via and air gap
#4853Semiconductor device including stripe structures
#4854System-on-chip devices and methods of designing a layout therefor
#4855Copper etching integration scheme
#4856Semiconductor device and method of manufacturing the same
#4857Systems and methods to enhance passivation integrity
#4858Interconnect structure having large self-aligned vias
#4859Semiconductor Devices And Fabrication Methods With Improved Word Line Resistance and Reduced Salicide Bridge Formation
#4860Metal oxide layered structure and methods of forming the same
#4861Self-aligned integrated line and via structure for a three-dimensional semiconductor device
#4862Reduced height M1 metal lines for local on-chip routing
#4863Magnetic sidewalls for write lines in field-induced MRAM and methods of manufacturing them
#4864Etchstop layers and capacitors
#4865Angled ion beam processing of heterogeneous structure
#4866Semiconductor device including a buffer layer structure for reducing stress
#4867Folded ballistic conductor interconnect line
#4868MICROELECTRONIC TRANSISTOR CONTACTS AND METHODS OF FABRICATING THE SAME
#4869Semiconductor devices and methods for forming the same
#4870Non-planar I/O and logic semiconductor devices having different workfunction on common substrate
#4871Metal wiring of semiconductor device and method for manufacturing the same
#4872Convex shaped thin-film transistor device having elongated channel over insulating layer in a groove of a semiconductor substrate
#4873Method of manufacturing semiconductor device
#4874Semiconductor device with reduced via resistance
#4875CHIP PACKAGE AND FABRICATION METHOD THEREOF
#4876Power gating for three dimensional integrated circuits (3DIC)
#4877Semiconductor device with reduced via resistance
#4878Flip chip scheme and method of forming flip chip scheme
#4879Interconnect structure with misaligned metal lines coupled using different interconnect layer
#4880Chip package having a laser stop structure
#4881Electric contact structure having a diffusion barrier for an electronic device and method for manufacturing the electric contact structure
#4882Subtractive etch interconnects
#4883Semiconductor device with multi-layer metallization
#4884SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
#4885Semiconductor device with electro-static discharge protection device above semiconductor device area
#4886Integrated device package comprising photo sensitive fill between a substrate and a die
#4887Semiconductor device
#4888Three-dimensional semiconductor memory device
#4889Semiconductor apparatus
#4890Optimized wires for resistance or electromigration
#4891Integrated circuit and layered circuit provided therewith
#4892SEMICONDUCTOR PACKAGE
#4893Different scaling ratio in FEOL/ MOL/ BEOL
#4894Integrated circuit device
#4895Integrated circuit device
#4896Electronic component and method for producing the same
#4897Low-k dielectric pore sealant and metal-diffusion barrier formed by doping and method for forming the same
#4898Method of forming through-hole in silicon substrate, method of forming electrical connection element penetrating silicon substrate and semiconductor device manufactured thereby
#4899Self-aligned via process flow
#4900Semiconductor apparatus, method of manufacturing semiconductor apparatus, method of designing semiconductor apparatus, and electronic apparatus
#4901Semiconductor devices and methods of manufacture thereof having guard ring structure
#4902MULTI-LAYER TRANSMISSION LINE STRUCTURE FOR MISALIGNMENT RELIEF
#4903Semiconductor device
#4904Method for manufacturing copper layer
#4905Electrically conductive interconnect including via having increased contact surface area
#4906Semiconductor device and method
#4907Oversized contacts and vias in layout defined by linearly constrained topology
#4908SEMICONDUCTOR DEVICE
#4909Semiconductor structures and fabrication method thereof
#4910Power semiconductor module and method for manufacturing the same
#4911Semiconductor structure and manufacturing method of the same
#4912Vertical type memory device
#4913Integrated circuit with elongated coupling
#4914Power overlay structure having wirebonds and method of manufacturing same
#4915Methods of forming an interconnect structure using a self-ending anodic oxidation
#4916Semiconductor device
#4917Electronic component
#4918Graphene wiring and method for manufacturing the same
#4919Wiring and method for manufacturing the same
#4920Fine line space resolution lithography structure for integrated circuit features using double patterning technology
#4921Semiconductor chip including integrated circuit including at least five gate level conductive structures having particular spatial and electrical relationship and method for manufacturing the same
#4922Semiconductor device and a method of manufacturing the same
#4923Through-silicon via access device for integrated circuits
#4924Semiconductor device
#4925Metal cap apparatus and method
#4926Method for producing a conductor line
#4927Capacitor having a graphene structure, semiconductor device including the capacitor and method of forming the same
#4928Method of forming a pattern
#4929Semiconductor device
#4930Semiconductor device and method of manufacturing the same
#4931Semiconductor device with reduced via resistance
#4932Semiconductor device with coils in different wiring layers
#4933Semiconductor device having an airgap defined at least partially by a protective structure
#4934Method of semiconductor integrated circuit fabrication
#4935Method of preventing pattern collapse
#4936Metal line structure and method
#4937Techniques for creating a local interconnect using a SOI wafer
#4938Wafer-to-wafer bonding structure
#4939Semiconductor chip, semiconductor package and fabricating method thereof
#4940Semiconductor constructions
#4941Interconnects with fully clad lines
#4942Hybrid copper structure for advance interconnect usage
#4943Method of forming semiconductor device having a conductive via structure
#4944Transformer comprising a rounded coil
#4945Interconnect structure and method of forming the same
#4946Insulator void aspect ratio tuning by selective deposition
#4947Combination interconnect structure and methods of forming same
#4948Semiconductor Device and Method of Forming a Dampening Structure to Improve Board Level Reliability
#4949Interconnect structure with footing region
#4950Non-hierarchical metal layers for integrated circuits
#4951Semiconductor device
#4952Semiconductor devices comprising interconnect structures and methods of fabrication
#4953Power gating for three dimensional integrated circuits (3DIC)
#4954Method to etch cu/Ta/TaN selectively using dilute aqueous Hf/hCl solution
#4955SEMICONDUCTOR DEVICES INCLUDING BULB-SHAPED TRENCHES
#4956Method of forming a copper layer using physical vapor deposition
#4957Metal pad offset for multi-layer metal layout
#4958Systems and methods for high-speed, low-profile memory packages and pinout designs
#4959Wafer having pad structure
#4960Semiconductor device and method of producing semiconductor device
#4961Systems and methods to enhance passivation integrity
#4962Trench structure for high performance interconnection lines of different resistivity and method of making same
#4963Patterning method for low-k inter-metal dielectrics and associated semiconductor device
#4964BACK END OF LINE (BEOL) LOCAL OPTIMIZATION TO IMPROVE PRODUCT PERFORMANCE
#4965Semiconductor device and a method increasing a resistance value of an electric fuse
#4966Semiconductor device and manufacturing method thereof
#4967Semiconductor arrangement comprising metal cap and dielectric layer defining air gap
#4968Method of fabricating conductive line of a semiconductor device
#4969Pattern between pattern for low profile substrate
#4970Semiconductor device
#4971Semiconductor device and a method of manufacturing the same and designing the same
#4972Semiconductor device
#4973Interconnect structure having large self-aligned vias
#4974INTERCONNECT STRUCTURE AND METHOD FOR FABRICATING ON-CHIP INTERCONNECT STRUCTURES BY IMAGE REVERSAL
#4975Semiconductor chip including integrated circuit including four transistors of first transistor type and four transistors of second transistor type with electrical connections between various transistors and methods for manufacturing the same
#4976Reduced height M1 metal lines for local on-chip routing
#4977Forming array contacts in semiconductor memories
#4978Controlled metal extrusion opening in semiconductor structure and method of forming
#4979Semiconductor device with thin redistribution layers
#4980Semiconductor devices and methods of manufacturing the same
#4981Semiconductor chip including region having integrated circuit transistor gate electrodes formed by various conductive structures of specified shape and position and method for manufacturing the same
#4982Method of forming high density, high shorting margin, and low capacitance interconnects by alternating recessed trenches
#4983Functional block stacked 3DIC and method of making same
#4984Grounding dummy gate in scaled layout design
#4985Semiconductor device and a method of manufacturing the same
#4986Semiconductor device with improved contact structure and method of forming same
#4987Semicondutor device with copper plugs having different resistance values
#4988System and method for 3D integrated circuit stacking
#4989Ultrathin superlattice of MnO/Mn/MnN and other metal oxide/metal/metal nitride liners and caps for copper low dielectric constant interconnects
#4990Semiconductor device including landing pad
#4991Semiconductor device and method of manufacturing the same
#4992Semiconductor device and method of manufacturing the same
#4993Interconnect structures for substrate
#4994Duplicate layering and routing
#4995Integrated circuits including selectively deposited metal capping layers on copper lines and methods for fabricating the same
#4996Power semiconductor device and method for fabricating the same
#4997Metal-containing films as dielectric capping barrier for advanced interconnects
#4998SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
#4999Thickened stress relief and power distribution layer
#5000Method for providing electrical connections to spaced conductive lines
#5001Method of forming integrated circuit with conductive line having line-ends
#5002INTEGRATED CIRCUIT DEVICE AND METHOD FOR MANUFACTURING THE SAME
#5003Interconnect structure for semiconductor devices
#5004High speed differential wiring in glass ceramic MCMS
#5005High speed differential wiring in glass ceramic MCMS
#5006Electrically conductive device and manufacturing method thereof
#5007Interconnect structure and method of forming same
#5008Semiconductor apparatus, method of manufacturing semiconductor apparatus, method of designing semiconductor apparatus, and electronic apparatus
#5009Semiconductor device
#5010Interconnects having sealing structures to enable selective metal capping layers
#5011Semiconductor device, manufacturing method thereof, and electronic apparatus
#5012Interconnects with fully clad lines
#5013Semiconductor device and manufacturing method for the same
#5014Method of manufacturing semiconductor device and semiconductor device
#5015Semiconductor device and method of manufacturing the same
#5016Systems and methods to enhance passivation integrity
#5017Crack stopping structure in wafer level packaging (WLP)
#5018Semiconductor devices including multiple interconnection structures
#5019Semiconductor devices, methods of manufacture thereof, and inter-metal dielectric (IMD) structures
#5020Resistive random access memory
#5021Singulated semiconductor structure
#5022SOC design with critical technology pitch alignment
#5023Semiconductor component and method of manufacture
#5024Semiconductor device comprising capacitive element
#5025Graphene-metal E-fuse
#5026High performance refractory metal / copper interconnects to eliminate electromigration
#5027Hybrid graphene-metal interconnect structures
#5028Semiconductor method and device of forming a fan-out PoP device with PWB vertical interconnect units
#5029Interconnection wires of semiconductor devices
#5030Semiconductor integrated circuit device
#5031Forming array contacts in semiconductor memories
#5032Semiconductor device and method of manufacturing the same
#5033Multiple-patterned semiconductor device channels
#5034Semiconductor device channels
#5035Multiple-patterned semiconductor device channels
#5036Semiconductor device channels
#5037APPARATUS AND METHOD FOR MITIGATING DYNAMIC IR VOLTAGE DROP AND ELECTROMIGRATION AFFECTS
#5038Interconnect structure with kinked profile
#5039Chemical direct pattern plating interconnect metallization and metal structure produced by the same
#5040Semiconductor device with vias on a bridge connecting two buses
#5041Semiconductor integrated circuit
#5042Interconnect structure and method of forming the same
#5043Method of preventing a pattern collapse
#5044Elongated via structures
#5045Method for providing electrical connections to spaced conductive lines
#5046Flattened substrate surface for substrate bonding
#5047Mitigating pattern collapse
#5048Semiconductor device and method of providing z-interconnect conductive pillars with inner polymer core
#5049Copper etching integration scheme
#5050Semiconductor device
#5051Method of manufacturing semiconductor device
#5052Semiconductor devices, methods of manufacture thereof, and packaged semiconductor devices
#5053Semiconductor device with a multilayer wire
#5054Semiconductor devices having guard ring structure and methods of manufacture thereof
#5055Low resistance stacked annular contact
#5056Semiconductor device and manufacturing method thereof
#5057Packaged semiconductor assemblies and methods for manufacturing such assemblies
#5058Interconnect structures for substrate
#5059Semiconductor structures and methods of manufacturing the same
#5060Pad structure
#5061Integrated circuit formed using spacer-like copper deposition
#5062Method for forming a vertical electrical connection in a layered semiconductor structure
#5063Encapsulated metal interconnect
#5064Method of manufacturing semiconductor device
#5065ESD protection device with improved bipolar gain using cutout in the body well
#5066Forming array contacts in semiconductor memories
#5067Method to improve fine Cu line reliability in an integrated circuit device
#5068Conductive line of semiconductor device
#5069Semiconductor device
#5070Metal wiring of semiconductor device and method for manufacturing the same
#5071RF CMOS transistor design
#5072Low cost anti-fuse structure and method to make same
#5073Low cost anti-fuse structure
#5074Semiconductor devices and methods of manufacture thereof
#5075Semiconductor devices and methods of manufacturing the same
#5076Semiconductor device with electro-static discharge protection device above semiconductor device area
#5077Dual-metal self-aligned wires and vias
#5078Capacitor for interposers and methods of manufacture thereof
#5079Curvilinear wiring structure to reduce areas of high field density in an integrated circuit
#5080Method to resolve hollow metal defects in interconnects
#5081METHODS OF FORMING CONDUCTIVE CONTACTS FOR A SEMICONDUCTOR DEVICE
#5082Semiconductor device having a copper wire within an interlayer dielectric film
#5083INTERCONNECTION OF SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF
#5084Semiconductor interconnect structure
#5085Structure for monitoring stress induced failures in interlevel dielectric layers of solder bump integrated circuits
#5086Elongated via structures
#5087Integrated circuit power grid with improved routing resources and bypass capacitance
#5088Method for producing a conductor line
#5089Rigid interconnect structures in package-on-package assemblies
#5090Method for fabricating a coil by way of a rounded trench
#5091Guard ring design structure for semiconductor devices
#5092Interconnect structure having smaller transition layer via
#5093Semiconductor method and device of forming a fan-out PoP device with PWB vertical interconnect units
#5094Semiconductor devices having contacts with intervening spacers and method for fabricating the same
#5095Semiconductor device including a stress buffer material formed above a low-k metallization system
#5096Interconnect structures
#5097Semiconductor device having non-planar interface between a plug layer and a contact layer
#5098Dual-metal self-aligned wires and vias
#5099Stress reduction apparatus with an inverted cup-shaped layer
#5100Inductors and wiring structures fabricated with limited wiring material