ClassID:

207737

H01L23/5283 - page 16 - CPC Classification

Classification description:

Details of semiconductor or other solid state devices; Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body layout of the interconnection structure Cross-sectional geometry

Recent Application in this class:
#4501
20170287930
2017-10-05

Three-dimensional semiconductor device with vertical and horizontal channels in stack structure having electrodes vertically stacked on the substrate

#4502
20170287858
2017-10-05

Semiconductor device with modified pad spacing structure

#4503
20170287853
2017-10-05

Fan-out semiconductor package for packaging semiconductor chip and capacitors

#4504
20170287833
2017-10-05

Three dimensional storage cell array with highly dense and scalable word line design approach

#4505
20170287784
2017-10-05

Vertical air gap subtractive etch back end metal

#4506
20170287775
2017-10-05

Interconnect structure having an etch stop layer over conductive lines

#4507
20170278860
2017-09-28

Semiconductor memory device and method of manufacturing the same

#4508
20170278797
2017-09-28

Semiconductor devices including a capping layer

#4509
20170278796
2017-09-28

Method for maximizing air gap in back end of the line interconnect through via landing modification

#4510
20170278795
2017-09-28

Advanced E-fuse structure with controlled microstructure

#4511
20170278793
2017-09-28

Advanced e-Fuse structure with hybrid metal controlled microstructure

#4512
20170278788
2017-09-28

Interconnect structure including air gaps enclosed between conductive lines and a permeable dielectric layer

#4513
20170278740
2017-09-28

Method of manufacturing an interconnect without dielectric exclusion zones by thermal decomposition of a sacrificial filler material

#4514
20170271365
2017-09-21

Semiconductor memory device and method of manufacturing the same

#4515
20170271362
2017-09-21

SEMICONDUCTOR MEMORY DEVICE

#4516
20170271360
2017-09-21

3D non-volatile memory array utilizing metal ion source

#4517
20170271349
2017-09-21

Semiconductor memory device

#4518
20170271263
2017-09-21

Semiconductor memory device

#4519
20170271262
2017-09-21

Semiconductor device and method for manufacturing semiconductor device

#4520
20170271261
2017-09-21

Three-dimensional memory device containing annular etch-stop spacer and method of making thereof

#4521
20170271259
2017-09-21

Semiconductor device and a method of manufacturing the same

#4522
20170271258
2017-09-21

High power MMIC devices having bypassed gate transistors

#4523
20170271230
2017-09-21

MANUFACTURING METHOD OF MOLDED PRODUCT AND MOLDED PRODUCT

#4524
20170264269
2017-09-14

Saw resonator having negative profile metal structure and manufacturing method thereof

#4525
20170263753
2017-09-14

Semiconductor device and method of manufacturing same

#4526
20170263739
2017-09-14

Switching device

#4527
20170263738
2017-09-14

Switching device

#4528
20170263651
2017-09-14

Semiconductor device, semiconductor wafer, module, electronic device, and manufacturing method the same

#4529
20170263636
2017-09-14

Stacked non-volatile semiconductor memory device with buried source line and method of manufacture

#4530
20170263635
2017-09-14

Semiconductor device having vertical channel between stacked electrode layers and insulating layers

#4531
20170263632
2017-09-14

Semiconductor memory device

#4532
20170263628
2017-09-14

Stacked type semiconductor memory device and method for manufacturing same

#4533
20170263626
2017-09-14

Semiconductor memory device and method of manufacturing the same

#4534
20170263625
2017-09-14

Semiconductor memory device and method for manufacturing the same

#4535
20170263558
2017-09-14

Semiconductor device and method for manufacturing same

#4536
20170263557
2017-09-14

Contacts having a geometry to reduce resistance

#4537
20170263556
2017-09-14

Conductive structures, systems and devices including conductive structures and related methods

#4538
20170263553
2017-09-14

Structure and method to self align via to top and bottom of tight pitch metal interconnect layers

#4539
20170263523
2017-09-14

Wafer-level chip-size package with redistribution layer

#4540
20170263497
2017-09-14

Semiconductor device

#4541
20170256563
2017-09-07

SEMICONDUCTOR MEMORY DEVICE

#4542
20170256562
2017-09-07

Semiconductor memory device and method for manufacturing same

#4543
20170256551
2017-09-07

Semiconductor device structures including staircase structures, and related methods and electronic systems

#4544
20170256495
2017-09-07

Hybrid metal interconnects with a bamboo grain microstructure

#4545
20170256494
2017-09-07

Hybrid metal interconnects with a bamboo grain microstructure

#4546
20170256490
2017-09-07

Low capacitance through substrate via structures

#4547
20170256446
2017-09-07

Semiconductor device including standard cell and electronic design automation method thereof

#4548
20170256445
2017-09-07

Interconnect structure and method

#4549
20170250244
2017-08-31

Monolayer thin film capacitor

#4550
20170250080
2017-08-31

Compensating for lithographic limitations in fabricating semiconductor interconnect structures

#4551
20170243825
2017-08-24

Low resistance contact structures for trench structures

#4552
20170243824
2017-08-24

Low resistance contact structures for trench structures

#4553
20170243818
2017-08-24

Semiconductor device having a wiring line with an end portion having rounded side surfaces and manufacturing method thereof

#4554
20170243650
2017-08-24

Word line decoder circuitry under a three-dimensional memory array

#4555
20170236931
2017-08-17

Semiconductor device comprising a temperature sensor, temperature sensor and method of manufacturing a semiconductor device comprising a temperature sensor

#4556
20170236780
2017-08-17

INTEGRATED CIRCUIT HAVING IMPROVED ELECTROMIGRATION PERFORMANCE AND METHOD OF FORMING SAME

#4557
20170236774
2017-08-17

Semiconductor module and semiconductor driving device

#4558
20170236752
2017-08-17

Integration of a self-forming barrier layer and a ruthenium metal liner in copper metallization

#4559
20170236746
2017-08-17

Multi-tier memory device with through-stack peripheral contact via structures and method of making thereof

#4560
20170236559
2017-08-17

Vertical non-volatile memory device and method of fabricating the same

#4561
20170229534
2017-08-10

Method of manufacturing a capacitor

#4562
20170229476
2017-08-10

Non-volatile memory device

#4563
20170229449
2017-08-10

Vertical field-effect-transistors having multiple threshold voltages

#4564
20170229421
2017-08-10

Semiconductor devices, methods of manufacture thereof, and packaged semiconductor devices

#4565
20170229397
2017-08-10

Patterning approach for improved via landing profile

#4566
20170229396
2017-08-10

Semiconductor device structure with graphene layer

#4567
20170229395
2017-08-10

Fuse structure having multiple air dummy fuses

#4568
20170229344
2017-08-10

Columnar interconnects and method of making them

#4569
20170222632
2017-08-03

Semiconductor device and electronic apparatus

#4570
20170222129
2017-08-03

Magnetic sidewalls for write lines in field-induced MRAM and methods of manufacturing them

#4571
20170222056
2017-08-03

Semiconductor device, semiconductor wafer, module, electronic device, and manufacturing method thereof

#4572
20170222006
2017-08-03

Semiconductor device and method of fabricating the same

#4573
20170221840
2017-08-03

Method of manufacturing semiconductor devices and corresponding device

#4574
20170221827
2017-08-03

Semiconductor device and manufacturing method thereof

#4575
20170221817
2017-08-03

Semiconductor device and method of producing semiconductor device

#4576
20170221815
2017-08-03

Interconnect structure having substractive etch feature and damascene feature

#4577
20170221812
2017-08-03

Interconnection structure and method of forming the same

#4578
20170213791
2017-07-27

Semiconductor device structure and method for forming the same

#4579
20170213789
2017-07-27

Semiconductor having protective lines

#4580
20170207226
2017-07-20

Semiconductor device

#4581
20170207221
2017-07-20

Three-dimensional (3D) semiconductor memory devices

#4582
20170207119
2017-07-20

Method of manufacturing semiconductor device

#4583
20170200736
2017-07-13

Semiconductor memory devices having separation structures

#4584
20170200735
2017-07-13

Semiconductor memory device and method of manufacturing the same

#4585
20170200716
2017-07-13

3D semiconductor device and structure

#4586
20170200692
2017-07-13

Power overlay structure and reconstituted semiconductor wafer having wirebonds

#4587
20170200676
2017-07-13

Three-dimensional (3D) semiconductor memory devices and methods of manufacturing the same

#4588
20170200643
2017-07-13

Advanced copper interconnects with hybrid microstructure

#4589
20170200639
2017-07-13

Method of manufacturing porous body, porous body, method of manufacturing device, device, method of manufacturing wiring structure, and wiring structure

#4590
20170194326
2017-07-06

Semiconductor memory device

#4591
20170194260
2017-07-06

Stacked multilayer structure and manufacturing method thereof

#4592
20170194259
2017-07-06

Interconnect structure with air-gaps

#4593
20170194258
2017-07-06

Copper etching integration scheme

#4594
20170194257
2017-07-06

Method for manufacturing a contact bump by thermal expansion of a patterned sacrificial layer underneath a galvanic layer

#4595
20170194256
2017-07-06

Junctionless back end of the line via contact

#4596
20170194255
2017-07-06

Electronic device and method for fabricating the same

#4597
20170194254
2017-07-06

Semiconductor memory device and method for manufacturing the same

#4598
20170194253
2017-07-06

Methods for reducing dual damascene distortion

#4599
20170194252
2017-07-06

Integrated circuit having a staggered fishbone power network

#4600
20170194245
2017-07-06

ON-CHIP VARIABLE CAPACITOR WITH GEOMETRIC CROSS-SECTION

#4601
20170194201
2017-07-06

Method for forming conductive structure using polishing process

#4602
20170194191
2017-07-06

Interconnect structure, interconnect layout structure, and manufacturing method thereof

#4603
20170193148
2017-07-06

Integrated circuit having a plurality of conductive segments

#4604
20170186799
2017-06-29

Stacked substrate structure with inter-tier interconnection

#4605
20170186744
2017-06-29

Semiconductor device having contact plug and method of forming the same

#4606
20170186707
2017-06-29

Structures to mitigate contamination on a back side of a semiconductor substrate

#4607
20170186691
2017-06-29

Techniques based on electromigration characteristics of cell interconnect

#4608
20170186686
2017-06-29

Semiconductor device and manufacturing method thereof

#4609
20170186682
2017-06-29

Self-aligned via forming to conductive line and related wiring structure

#4610
20170179154
2017-06-22

Through-memory-level via structures for a three-dimensional memory device

#4611
20170179153
2017-06-22

Through-memory-level via structures for a three-dimensional memory device

#4612
20170179152
2017-06-22

Through-memory-level via structures for a three-dimensional memory device

#4613
20170179150
2017-06-22

Semiconductor device

#4614
20170179122
2017-06-22

Semiconductor device with local interconnect structure and manufacturing method thereof

#4615
20170179031
2017-06-22

Electronic component of integrated circuitry and a method of forming a conductive via to a region of semiconductor material

#4616
20170179030
2017-06-22

Methods of forming metal pad structures over TSVS to reduce shorting of upper metal layers

#4617
20170179029
2017-06-22

Increased contact alignment tolerance for direct bonding

#4618
20170179028
2017-06-22

Three-dimensional semiconductor device

#4619
20170179027
2017-06-22

Memory device having cell over periphery structure and memory package including the same

#4620
20170179026
2017-06-22

Through-memory-level via structures for a three-dimensional memory device

#4621
20170179025
2017-06-22

VERTICAL MEMORY DEVICES AND METHODS OF MANUFACTURING THE SAME

#4622
20170178995
2017-06-22

Power semiconductor device and method for manufacturing same

#4623
20170170169
2017-06-15

Cmos compatible fuse or resistor using self-aligned contacts

#4624
20170170125
2017-06-15

Semiconductor memory device and method for manufacturing the same

#4625
20170170119
2017-06-15

Voidless contact metal structures

#4626
20170170118
2017-06-15

Local interconnect structure including non-eroded contact via trenches

#4627
20170170112
2017-06-15

Semiconductor device and manufacturing method of the same

#4628
20170170064
2017-06-15

Voidless contact metal structures

#4629
20170162563
2017-06-08

Semiconductor device and method of manufacturing semiconductor device having parallel contact holes between adjacent trenches

#4630
20170162527
2017-06-08

Electronic component package and electronic device including the same

#4631
20170162506
2017-06-08

Interconnect structure and method of forming same

#4632
20170162505
2017-06-08

Semiconductor device allowing metal layer routing formed directly under metal pad

#4633
20170162504
2017-06-08

Metal line structure and method

#4634
20170162436
2017-06-08

Nanowires for pillar interconnects

#4635
20170154892
2017-06-01

Electronic device and method for fabricating the same

#4636
20170154850
2017-06-01

Structure for stacked logic performance improvement

#4637
20170154847
2017-06-01

Semiconductor device having air gap structures and method of fabricating thereof

#4638
20170154842
2017-06-01

Integrated circuit package substrate

#4639
20170154839
2017-06-01

Heterojunction semiconductor device for reducing parasitic capacitance

#4640
20170154817
2017-06-01

Electronic device and method for fabricating the same

#4641
20170148797
2017-05-25

Semiconductor devices with layers commonly contacting fins and methods of manufacturing the same

#4642
20170148748
2017-05-25

Three-dimensional semiconductor devices having vertical structures of different lengths

#4643
20170148738
2017-05-25

Advanced copper interconnects with hybrid microstructure

#4644
20170148735
2017-05-25

Interconnect structure for semiconductor devices

#4645
20170146794
2017-05-25

METHOD FOR MANUFACTURING ELECTRO-OPTICAL DEVICE, ELECTRO-OPTICAL DEVICE, AND ELECTRONIC APPARATUS

#4646
20170146479
2017-05-25

Active CMOS sensor array for electrochemical biomolecular detection

#4647
20170141107
2017-05-18

Semiconductor device

#4648
20170141093
2017-05-18

Semiconductor apparatus installing passive device

#4649
20170141034
2017-05-18

Power line layout structure of semiconductor device and method for forming the same

#4650
20170141032
2017-05-18

Semiconductor device and manufacturing method thereof

#4651
20170141030
2017-05-18

Hybrid airgap structure with oxide liner

#4652
20170141005
2017-05-18

Method of treating a microelectronic substrate using dilute TMAH

#4653
20170133324
2017-05-11

Chemical direct pattern plating method

#4654
20170133321
2017-05-11

Apparatus and method for mitigating dynamic IR voltage drop and electromigration affects

#4655
20170133320
2017-05-11

Interconnect structure with misaligned metal lines coupled using different interconnect layer

#4656
20170133317
2017-05-11

Semiconductor device and method of fabricating the same

#4657
20170133265
2017-05-11

Method for making a dipole-based contact structure to reduce the metal-semiconductor contact resistance in MOSFETs

#4658
20170133261
2017-05-11

Deep trench isolation with tank contact grounding

#4659
20170132348
2017-05-11

Aware variable fill pattern generator

#4660
20170126221
2017-05-04

Buffer circuit, semiconductor integrated circuit device, oscillator, electronic apparatus, and base station

#4661
20170125443
2017-05-04

Contact window structure, pixel structure and method for manufacturing thereof

#4662
20170125439
2017-05-04

Vertical memory devices

#4663
20170125433
2017-05-04

3D NAND device with five-folded memory stack structure configuration

#4664
20170125360
2017-05-04

Semiconductor device including three-dimensional crack detection structure

#4665
20170125342
2017-05-04

Semiconductor constructions

#4666
20170117291
2017-04-27

Semiconductor memory device, structure and methods

#4667
20170117226
2017-04-27

Low resistance contact structures for trench structures

#4668
20170117222
2017-04-27

Vertical memory devices and methods of manufacturing the same

#4669
20170117219
2017-04-27

Inductor device and method of manufacturing the same

#4670
20170117218
2017-04-27

Contact via structure and fabricating method thereof

#4671
20170117217
2017-04-27

Isolation device

#4672
20170110569
2017-04-20

Semiconductor devices and methods of manufacturing the same

#4673
20170110461
2017-04-20

SRAM cell word line structure with reduced RC effects

#4674
20170110404
2017-04-20

Trench MOSFET with self-aligned body contact with spacer

#4675
20170110369
2017-04-20

ELECTRONIC DEVICE AND METHOD FOR PRODUCING SAME

#4676
20170104540
2017-04-13

Radio-frequency isolation using front side opening

#4677
20170104068
2017-04-13

Three-dimensionally integrated circuit devices including oxidation suppression layers

#4678
20170104000
2017-04-13

VERTICAL MEMORY DEVICES

#4679
20170098662
2017-04-06

Semiconductor device and manufacturing method thereof

#4680
20170098637
2017-04-06

CIRCUIT MODULE AND METHOD FOR MANUFACTURING THE SAME

#4681
20170098606
2017-04-06

Semiconductor structure with ultra thick metal and manufacturing method thereof

#4682
20170098605
2017-04-06

Interconnection structure and manufacturing method thereof

#4683
20170098602
2017-04-06

Enforcement of Semiconductor Structure Regularity for Localized Transistors and Interconnect

#4684
20170098574
2017-04-06

Integrated circuit with conductive line having line-ends

#4685
20170092605
2017-03-30

Semiconductor device and method of manufacturing semiconductor device

#4686
20170092592
2017-03-30

Hybrid interconnect structure and electronic device employing the same

#4687
20170084613
2017-03-23

Semiconductor memory device and method of fabricating the same

#4688
20170084601
2017-03-23

Transient voltage suppressor and manufacture method thereof

#4689
20170084536
2017-03-23

Semiconductor structure and method for forming the same

#4690
20170084534
2017-03-23

Electrically conductive interconnect including via having increased contact surface area

#4691
20170084533
2017-03-23

Interconnects through dielectric vias

#4692
20170077253
2017-03-16

Contacts for highly scaled transistors

#4693
20170077178
2017-03-16

NONVOLATILE STORAGE DEVICE, SEMICONDUCTOR ELEMENT, AND CAPACITOR

#4694
20170077130
2017-03-16

Semiconductor memory device

#4695
20170077124
2017-03-16

Three-dimensional semiconductor memory device and method for manufacturing the same

#4696
20170077058
2017-03-16

Semiconductor device including semiconductor chip, wiring, conductive material, and contact part

#4697
20170077049
2017-03-16

Surface mount high-frequency circuit

#4698
20170077030
2017-03-16

Metal on both sides with clock gated-power and signal routing underneath

#4699
20170077029
2017-03-16

Unidirectional metal on layer with ebeam

#4700
20170077027
2017-03-16

Semiconductor device

#4701
20170077013
2017-03-16

Semiconductor device

#4702
20170069719
2017-03-09

Method of forming body contact layouts for semiconductor structures

#4703
20170069576
2017-03-09

Semiconductor device and manufacturing method thereof

#4704
20170069574
2017-03-09

Semiconductor device allowing metal layer routing formed directly under metal pad

#4705
20170069573
2017-03-09

Method of preventing pattern collapse

#4706
20170069572
2017-03-09

Apparatus and method for placing stressors within an integrated circuit device to manage electromigration failures

#4707
20170069571
2017-03-09

Semiconductor device and method of manufacturing the same

#4708
20170069557
2017-03-09

Semiconductor device and electronic apparatus encapsulated in resin with embedded filler particles

#4709
20170062569
2017-03-02

SURFACE ENCAPSULATION FOR WAFER BONDING

#4710
20170062348
2017-03-02

Semiconductor device having air gap structures and method of fabricating thereof

#4711
20170062347
2017-03-02

Semiconductor devices having air spacers and methods of manufacturing the same

#4712
20170062344
2017-03-02

Metal interconnect structure and fabrication method thereof

#4713
20170062339
2017-03-02

Semiconductor device and fabrication method thereof

#4714
20170062338
2017-03-02

Integrated circuit structures comprising conductive vias and methods of forming conductive vias

#4715
20170062337
2017-03-02

Methods of forming semiconductor device structures including stair step structures

#4716
20170062329
2017-03-02

Semiconductor device having a conductive via structure

#4717
20170062324
2017-03-02

Semiconductor devices including conductive lines and methods of forming the semiconductor devices

#4718
20170062284
2017-03-02

Silicon on porous silicon

#4719
20170053918
2017-02-23

Forming CMOSFET structures with different contact liners

#4720
20170053871
2017-02-23

Semiconductor device and semiconductor device manufacturing method

#4721
20170053870
2017-02-23

Interconnection structure and methods of fabrication the same

#4722
20170053837
2017-02-23

Forming CMOSFET structures with different contact liners

#4723
20170047369
2017-02-16

Semiconductor apparatus, method of manufacturing semiconductor apparatus, method of designing semiconductor apparatus, and electronic apparatus

#4724
20170047342
2017-02-16

Semiconductor device having channel holes

#4725
20170047333
2017-02-16

Device having an inter-layer via (ILV), and method of making same

#4726
20170047328
2017-02-16

Semiconductor device with surrounding gate transistors in a NAND circuit

#4727
20170040444
2017-02-09

Heterojunction semiconductor device for reducing parasitic capacitance

#4728
20170040418
2017-02-09

Field effect transistors and methods of forming same

#4729
20170040296
2017-02-09

Multi-layer semiconductor devices fabricated using a combination of substrate and via structures and fabrication techniques

#4730
20170040261
2017-02-09

Semiconductor device and a method of increasing a resistance value of an electric fuse

#4731
20170040259
2017-02-09

Semiconductor device including source/drain contact having height below gate stack

#4732
20170040216
2017-02-09

Damascene wires with top via structures

#4733
20170040212
2017-02-09

Method of manufacturing semiconductor device including copper interconnections

#4734
20170040211
2017-02-09

Desmear with metalized protective film

#4735
20170033161
2017-02-02

Metal line connection for improved RRAM reliability, semiconductor arrangement comprising the same, and manufacture thereof

#4736
20170033096
2017-02-02

ESD protection device with improved bipolar gain using cutout in the body well

#4737
20170033052
2017-02-02

Semiconductor device and a method of manufacturing the same

#4738
20170033048
2017-02-02

Semiconductor devices

#4739
20170033044
2017-02-02

Semiconductor device and method for fabricating the same

#4740
20170033005
2017-02-02

Method of manufacturing a semiconductor device having groove-shaped via-hole

#4741
20170032834
2017-02-02

Electronic device

#4742
20170025368
2017-01-26

Conductive seal ring for power bus distribution

#4743
20170025354
2017-01-26

Contact Plug Extension for Bit Line Connection

#4744
20170025352
2017-01-26

Antifuse structure in via hole in interplayer dielectric

#4745
20170025351
2017-01-26

Semiconductor device with through-substrate via covered by a solder ball

#4746
20170018566
2017-01-19

SEMICONDUCTOR MEMORY DEVICE

#4747
20170018518
2017-01-19

Method of producing a semiconductor device with through-substrate via covered by a solder ball

#4748
20170018514
2017-01-19

Transmission line for 3D integrated circuit

#4749
20170018504
2017-01-19

Semiconductor device having structure for improving voltage drop and device including the same

#4750
20170018502
2017-01-19

Method of manufacturing semiconductor device and semiconductor device

#4751
20170018501
2017-01-19

VIA STRUCTURES FOR THERMAL DISSIPATION

#4752
20170018500
2017-01-19

Structure with conductive plug and method of forming the same

#4753
20170018499
2017-01-19

Necked interconnect fuse structure for integrated circuits

#4754
20170018463
2017-01-19

Dipole-based contact structure to reduce metal-semiconductor contact resistance in MOSFETs

#4755
20170016851
2017-01-19

Integrated biosensor

#4756
20170012005
2017-01-12

Guard ring method for semiconductor devices

#4757
20170012004
2017-01-12

Semiconductor device and method of producing semiconductor device

#4758
20170011998
2017-01-12

Semiconductor interconnect structures

#4759
20170011997
2017-01-12

Thickened stress relief and power distribution layer

#4760
20170011996
2017-01-12

Semiconductor device having interconnection structure

#4761
20170011995
2017-01-12

Memory device and method of forming the same

#4762
20170011961
2017-01-12

Semiconductor package structure and method of the same

#4763
20170011957
2017-01-12

Silicon-on-insulator device and intermetallic dielectric layer structure thereof and manufacturing method

#4764
20170005037
2017-01-05

Method to reduce resistance for a copper (CU) interconnect landing on multilayered metal contacts, and semiconductor structures formed therefrom

#4765
20170004999
2017-01-05

SELF-ALIGNED VIA PROCESS FLOW

#4766
20160380065
2016-12-29

Semiconductor structures with field effect transistor(s) having low-resistance source/drain contact(s)

#4767
20160379931
2016-12-29

Method for fabricating semiconductor device having a patterned metal layer embedded in an interlayer dielectric layer

#4768
20160379927
2016-12-29

Optimized wires for resistance or electromigration

#4769
20160379893
2016-12-29

Integrated circuit (IC) with offset gate sidewall contacts and method of manufacture

#4770
20160379891
2016-12-29

Wiring structure and method of forming the same, and semiconductor device including the wiring structure

#4771
20160379877
2016-12-29

Optimized wires for resistance or electromigration

#4772
20160379871
2016-12-29

Interconnect structure having an etch stop layer over conductive lines

#4773
20160372479
2016-12-22

Methods and apparatuses having strings of memory cells including a metal source

#4774
20160372477
2016-12-22

Static random access memory (SRAM) device

#4775
20160372463
2016-12-22

High quality deep trench oxide

#4776
20160372431
2016-12-22

Semiconductor device allowing metal layer routing formed directly under metal pad

#4777
20160372375
2016-12-22

Superimposed transistors with auto-aligned active zone of the upper transistor

#4778
20160372366
2016-12-22

Interconnects having sealing structures to enable selective metal capping layers

#4779
20160365378
2016-12-15

Flat pad structure for integrating complementary metal-oxide-semiconductor (CMOS) image sensor processes

#4780
20160365276
2016-12-15

Method of forming an interconnect structure for a semiconductor device

#4781
20160358928
2016-12-08

Self-aligned flash memory device with word line having reduced height at outer edge opposite to gate stack

#4782
20160358903
2016-12-08

Oversized contacts and vias in layout defined by linearly constrained topology

#4783
20160358902
2016-12-08

Integrated circuit with elongated coupling

#4784
20160358860
2016-12-08

Contacts to semiconductor substrate and methods of forming same

#4785
20160358855
2016-12-08

Nonvolatile memory device and method for fabricating the same

#4786
20160358820
2016-12-08

Via formation using sidewall image transfer process to define lateral dimension

#4787
20160351499
2016-12-01

SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE

#4788
20160351496
2016-12-01

Semiconductor structure and fabrication method thereof

#4789
20160351456
2016-12-01

TEST PATTERN STRUCTURE FOR MONITORING SEMICONDUCTOR FABRICATION PROCESS

#4790
20160343873
2016-11-24

Thin film transistor and manufacturing method thereof

#4791
20160343763
2016-11-24

Semiconductor device, fabrication method for a semiconductor device and electronic apparatus

#4792
20160343762
2016-11-24

Semiconductor device, fabrication method for a semiconductor device and electronic apparatus

#4793
20160343667
2016-11-24

Methods related to a sputtered titanium tungsten layer formed over a copper interconnect stack structure

#4794
20160343643
2016-11-24

Semiconductor lead frame, semiconductor package, and manufacturing method thereof

#4795
20160343587
2016-11-24

Wiring board, semiconductor device, and manufacturing methods thereof

#4796
20160336991
2016-11-17

Radio frequency isolation using substrate opening

#4797
20160336990
2016-11-17

Radio frequency isolation cavity formation using sacrificial material

#4798
20160336279
2016-11-17

Substrate opening formation in semiconductor devices

#4799
20160336278
2016-11-17

Cavity formation in semiconductor devices

#4800
20160336277
2016-11-17

Semiconductor device and method for manufacturing the same