ClassID:

207783

H01L24/03 - page 21 - CPC Classification

Classification description:

Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto; Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto; Bonding areas ; Manufacturing methods related thereto Manufacturing methods

Recent Application in this class:
#6001
20050280149
2005-12-22

Semiconductor device

#6002
20050280112
2005-12-22

Semiconductor assembly having substrate with electroplated contact pads

#6003
20050280034
2005-12-22

Semiconductor device

#6004
20050277293
2005-12-15

Fabrication method of wafer level chip scale packages

#6005
20050277283
2005-12-15

Method for fabricating chip structure

#6006
20050277281
2005-12-15

Compliant interconnect and method of formation

#6007
20050277255
2005-12-15

Compound semiconductor device and manufacturing method thereof

#6008
20050277245
2005-12-15

Method for forming bump on electrode pad with use of double-layered film

#6009
20050275115
2005-12-15

Semiconductor device, circuit substrate, electro-optic device and electronic appliance

#6010
20050275100
2005-12-15

Capping of metal interconnects in integrated circuit electronic devices

#6011
20050275097
2005-12-15

Method of forming a solder bump and the structure thereof

#6012
20050275096
2005-12-15

Pre-doped reflow interconnections for copper pads

#6013
20050274979
2005-12-15

Compound semiconductor device and manufacturing method thereof

#6014
20050272257
2005-12-08

Semiconductor device with reduced contact resistance

#6015
20050272244
2005-12-08

Method for manufacturing circuit element, method for manufacturing electronic element, circuit substrate, electronic device, and electro-optical apparatus

#6016
20050272243
2005-12-08

Method of manufacturing semiconductor device

#6017
20050272242
2005-12-08

Formation method for conductive bump

#6018
20050272241
2005-12-08

Method for forming interconnects on thin wafers

#6019
20050269720
2005-12-08

Crack protection for silicon die

#6020
20050269704
2005-12-08

Semiconductor device with a barrier layer and a metal layer

#6021
20050269702
2005-12-08

Semiconductor device and method capable of scribing chips with high yield

#6022
20050269696
2005-12-08

Semiconductor device with slanting side surface for external connection

#6023
20050266674
2005-12-01

Screen printing method of forming conductive bumps

#6024
20050266672
2005-12-01

Wire-bonding method for chips with copper interconnects by introducing a thin layer

#6025
20050266669
2005-12-01

Method and apparatus to eliminate galvanic corrosion on copper doped aluminum bond pads on integrated circuits

#6026
20050263908
2005-12-01

Material for forming insulating film with low dielectric constant, low dielectric insulating film, method for forming low dielectric insulating film and semiconductor device

#6027
20050260794
2005-11-24

Method for fabrication of wafer level package incorporating dual compliant layers

#6028
20050258549
2005-11-24

Apparatus and method extending flip-chip pad structures for wirebonding on low-k dielectric silicon

#6029
20050258540
2005-11-24

Semiconductor device

#6030
20050258539
2005-11-24

Bump structure

#6031
20050258484
2005-11-24

Power composite integrated semiconductor device and manufacturing method thereof

#6032
20050258214
2005-11-24

Method for forming bump, semiconductor element having bumps and method of manufacturing the same, semiconductor device and method of manufacturing the same, circuit board, and electronic equipment

#6033
20050255686
2005-11-17

Method of manufacturing semiconductor device

#6034
20050253262
2005-11-17

Method of manufacturing different bond pads on the same substrate of an integrated circuit package

#6035
20050250323
2005-11-10

Under bump metallization layer to enable use of high tin content solder bumps

#6036
20050250304
2005-11-10

Method for fabricating connection regions of an integrated circuit, and integrated circuit having connection regions

#6037
20050248027
2005-11-10

Circuit method integrating the power distribution functions of the circuits and leadframes into the chip surface

#6038
20050248002
2005-11-10

Fill for large volume vias

#6039
20050245066
2005-11-03

Methods of forming solder bumps on exposed metal pads

#6040
20050245059
2005-11-03

Method for making an interconnect pad

#6041
20050242446
2005-11-03

INTEGRATED CIRCUIT PACKAGE WITH DIFFERENT HARDNESS BUMP PAD AND BUMP AND MANUFACTURING METHOD THEREFOR

#6042
20050242436
2005-11-03

Display device and manufacturing method of the same

#6043
20050242427
2005-11-03

FCBGA package structure

#6044
20050242426
2005-11-03

Semiconductor package having a first conductive bump and a second conductive bump and methods for manufacturing the same

#6045
20050242418
2005-11-03

Structure of package

#6046
20050242393
2005-11-03

Semiconductor device

#6047
20050239277
2005-10-27

Method for manufacturing an interconnect

#6048
20050239275
2005-10-27

Compliant multi-composition interconnects

#6049
20050233571
2005-10-20

Flip chip package, semiconductor package with bumps and method for manufacturing semiconductor package with bumps

#6050
20050230847
2005-10-20

Bonding pad structure and method of forming the same

#6051
20050230807
2005-10-20

Power semiconductor module

#6052
20050230783
2005-10-20

High performance system-on-chip discrete components using post passivation process

#6053
20050230782
2005-10-20

Semiconductor device having a refractory metal containing film and method for manufacturing the same

#6054
20050224992
2005-10-13

Method and apparatus to eliminate galvanic corrosion on copper doped aluminum bond pads on integrated circuits

#6055
20050224991
2005-10-13

Bump for semiconductor package, semiconductor package applying the bump, and method for fabricating the semiconductor package

#6056
20050224990
2005-10-13

Methods for forming aluminum-containing p-contacts for group III-nitride light emitting diodes

#6057
20050224987
2005-10-13

Structure and method for contact pads having double overcoat-protected bondable metal plugs over copper-metallized integrated circuits

#6058
20050224984
2005-10-13

Structure and method for contact pads having a protected bondable metal plug over copper-metallized integrated circuits

#6059
20050224976
2005-10-13

Method of fabricating electrical connection terminal of embedded chip

#6060
20050224972
2005-10-13

Circuit device and method of manufacturing the circuit device

#6061
20050224968
2005-10-13

Wafer level mounting frame for ball grid array packaging, and method of making and using the same

#6062
20050224966
2005-10-13

Interconnections for flip-chip using lead-free solders and having reaction barrier layers

#6063
20050221601
2005-10-06

Semiconductor device comprising through-electrode interconnect

#6064
20050221581
2005-10-06

Wafer stacking using interconnect structures of substantially uniform height

#6065
20050218916
2005-10-06

Semiconductor device with electrode pads for test probe

#6066
20050218510
2005-10-06

Use of palladium in IC manufacturing with conductive polymer bump

#6067
20050218497
2005-10-06

Through electrode, spacer provided with the through electrode, and method of manufacturing the same

#6068
20050218483
2005-10-06

Method and semiconductor device having copper interconnect for bonding

#6069
20050215048
2005-09-29

Structure and method for contact pads having an overcoat-protected bondable metal plug over copper-metallized integrated circuits

#6070
20050215045
2005-09-29

Methods of forming bumps using barrier layers as etch masks

#6071
20050212149
2005-09-29

Adhesion by plasma conditioning of semiconductor chip surfaces

#6072
20050212133
2005-09-29

Under bump metallization layer to enable use of high tin content solder bumps

#6073
20050212128
2005-09-29

Copper interconnect

#6074
20050212126
2005-09-29

Semiconductor device and method of manufacturing the same

#6075
20050211749
2005-09-29

Bumpless die and heat spreader lid module bonded to bumped die carrier

#6076
20050208751
2005-09-22

Solder bump structure and method for forming a solder bump

#6077
20050208748
2005-09-22

Method for forming robust solder interconnect structures by reducing effects of seed layer underetching

#6078
20050208747
2005-09-22

Method of routing an electrical connection on a semiconductor device and structure therefor

#6079
20050206007
2005-09-22

Structure and method for contact pads having a recessed bondable metal plug over of copper-metallized integrated circuits

#6080
20050205993
2005-09-22

Semiconductor device with recessed post electrode

#6081
20050205968
2005-09-22

Multi-chip package (MCP) with a conductive bar and method for manufacturing the same

#6082
20050200029
2005-09-15

Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument

#6083
20050200014
2005-09-15

Bump and fabricating process thereof

#6084
20050200009
2005-09-15

Method and apparatus for bonding a wire

#6085
20050199934
2005-09-15

Electronic component having an integrated passive electronic component and associated production method

#6086
20050194684
2005-09-08

Packaged semiconductor device

#6087
20050194683
2005-09-08

Bonding structure and fabrication thereof

#6088
20050194670
2005-09-08

Semiconductor device and manufacturing method of the same

#6089
20050194564
2005-09-08

Titanium stripping solution

#6090
20050191836
2005-09-01

Method to prevent passivation layer peeling in a solder bump formation process

#6091
20050191772
2005-09-01

Manufacturing method of semiconductor device

#6092
20050189637
2005-09-01

Semiconductor device and manufacturing method thereof

#6093
20050186771
2005-08-25

Manufacturing method for semiconductor device and semiconductor device

#6094
20050186708
2005-08-25

Method of manufacturing semiconductor device

#6095
20050184358
2005-08-25

High performance system-on-chip using post passivation process

#6096
20050184305
2005-08-25

Semiconductor light emitting device

#6097
20050181538
2005-08-18

Semiconductor device for wire-bonding and flip-chip bonding package and manufacturing method thereof

#6098
20050179131
2005-08-18

Semiconductor device and manufacturing method thereof

#6099
20050179114
2005-08-18

Semiconductor device and method of manufacturing the same

#6100
20050178423
2005-08-18

Microelectronic assembly having thermoelectric elements to cool a die and a method of making the same

#6101
20050176235
2005-08-11

Manufacturing method of semiconductor device

#6102
20050176234
2005-08-11

BUMPING PROCESS OF LIGHT EMITTING DIODE

#6103
20050176233
2005-08-11

Wafer-level chip scale package and method for fabricating and using the same

#6104
20050176231
2005-08-11

Bumping process of light emitting diode

#6105
20050173809
2005-08-11

Wafer-level package and method for production thereof

#6106
20050173801
2005-08-11

Electrode pad section for external connection

#6107
20050173798
2005-08-11

Semiconductor device and method of manufacturing the same

#6108
20050173788
2005-08-11

Semiconductor package with wire bonded stacked dice and multi-layer metal bumps

#6109
20050170634
2005-08-04

High performance system-on-chip discrete components using post passivation process

#6110
20050167826
2005-08-04

Bumpless wafer scale device and board assembly

#6111
20050167780
2005-08-04

High Q factor integrated circuit inductor

#6112
20050164484
2005-07-28

Method of fabricating a pad over active circuit I.C. with meshed support structure

#6113
20050164483
2005-07-28

Method of forming solder bump with reduced surface defects

#6114
20050164428
2005-07-28

Flip chip packaging process employing improved probe tip design

#6115
20050161834
2005-07-28

Adhesion by plasma conditioning of semiconductor chip

#6116
20050161795
2005-07-28

Room temperature metal direct bonding

#6117
20050160575
2005-07-28

Method of manufacturing high performance copper inductors with bond pads

#6118
20050158980
2005-07-21

Method of forming segmented ball limiting metallurgy

#6119
20050158978
2005-07-21

Hermetic passivation structure with low capacitance

#6120
20050156320
2005-07-21

Integrated device including connections on a separate wafer

#6121
20050156276
2005-07-21

Fuse structure for semiconductor integrated circuit with improved insulation film thickness uniformity and moisture resistance

#6122
20050151269
2005-07-14

UBM for fine pitch solder ball and flip-chip packaging method using the same

#6123
20050151250
2005-07-14

Semiconductor device and manufacturing method thereof

#6124
20050151228
2005-07-14

Semiconductor chip and manufacturing method for the same, and semiconductor device

#6125
20050150933
2005-07-14

System and method for increasing the strength of a bond made by a small diameter wire in ball bonding

#6126
20050146042
2005-07-07

Method of forming a bonding pad structure

#6127
20050146041
2005-07-07

Semiconductor device and method for manufacturing the same

#6128
20050146030
2005-07-07

Solder ball pad structure

#6129
20050146012
2005-07-07

Method of fabricating a pad over active circuit I.C. with frame support structure

#6130
20050142693
2005-06-30

Semiconductor device with intermediate connector

#6131
20050140027
2005-06-30

Method and device for manufacturing bonding pads for chip scale packaging

#6132
20050140004
2005-06-30

Semiconductor device and method of fabricating the same

#6133
20050136664
2005-06-23

Novel process for improved hot carrier injection

#6134
20050127530
2005-06-16

Structure and method for fabricating a bond pad structure

#6135
20050127529
2005-06-16

Structure and method for reinforcing a bond pad on a chip

#6136
20050127517
2005-06-16

Semiconductor device

#6137
20050127512
2005-06-16

Semiconductor device and the method of producing the same

#6138
20050127508
2005-06-16

Solder bump structure for flip chip package and method for manufacturing the same

#6139
20050127496
2005-06-16

Bonding pads with dummy patterns in semiconductor devices and methods of forming the same

#6140
20050124164
2005-06-09

Fine particle film forming apparatus and method and semiconductor device and manufacturing method for the same

#6141
20050121803
2005-06-09

Internally reinforced bond pads

#6142
20050121711
2005-06-09

Chip and wafer integration process using vertical connections

#6143
20050116341
2005-06-02

Selective deposition of solder ball contacts

#6144
20050116340
2005-06-02

Semiconductor device and method of manufacturing the same

#6145
20050112800
2005-05-26

Semiconductor device and method of fabricating the same

#6146
20050112799
2005-05-26

Method of copper/copper surface bonding using a conducting polymer for application in IC chip bonding

#6147
20050112794
2005-05-26

Bond pad

#6148
20050106851
2005-05-19

Wire bonding process for copper-metallized integrated circuits

#6149
20050106329
2005-05-19

Method of applying a pattern of particles to a substrate

#6150
20050104215
2005-05-19

Barrier layers for tin-bearing solder joints

#6151
20050104210
2005-05-19

Use of palladium in IC manufacturing with conductive polymer bump

#6152
20050104188
2005-05-19

Optimum padset for wire bonding RF technologies with high-Q inductors

#6153
20050104187
2005-05-19

Redistribution of substrate interconnects

#6154
20050103636
2005-05-19

Method for selective electroplating of semiconductor device I/O pads using a titanium-tungsten seed layer

#6155
20050101146
2005-05-12

Method for forming bond pad openings

#6156
20050101106
2005-05-12

Method of manufacturing a semiconductor device

#6157
20050099259
2005-05-12

Inductor formed in an integrated circuit

#6158
20050098903
2005-05-12

Semiconductor device having a bond pad and method therefor

#6159
20050098888
2005-05-12

Method and semiconductor device having copper interconnect for bonding

#6160
20050098869
2005-05-12

Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument

#6161
20050098849
2005-05-12

Semiconductor device

#6162
20050098605
2005-05-12

Apparatus and method for low pressure wirebond

#6163
20050095847
2005-05-05

Semiconductor device and manufacturing method thereof

#6164
20050095836
2005-05-05

Bond pad scheme for Cu process

#6165
20050093160
2005-05-05

Semiconductor device and method for fabricating the same

#6166
20050090102
2005-04-28

Method of copper/copper surface bonding using a conducting polymer for application in IC chip bonding

#6167
20050090090
2005-04-28

Method of fabricating ultra thin flip-chip package

#6168
20050090039
2005-04-28

Method of copper/copper surface bonding using a conducting polymer for application in IC chip bonding

#6169
20050090037
2005-04-28

Method of copper/copper surface bonding using a conducting polymer for application in IC chip bonding

#6170
20050090026
2005-04-28

Method of manufacturing a semiconductor device

#6171
20050090025
2005-04-28

Method of manufacturing a semiconductor device

#6172
20050087863
2005-04-28

Method for forming a bump, semiconductor device and method of fabricating same, semiconductor chip, circuit board, and electronic instrument

#6173
20050085062
2005-04-21

Processes and tools for forming lead-free alloy solder precursors

#6174
20050085061
2005-04-21

Method of forming bumps

#6175
20050084986
2005-04-21

Semiconductor test board having laser patterned conductors

#6176
20050082669
2005-04-21

Electronic circuit device and porduction method therefor

#6177
20050082347
2005-04-21

Self-locking wire bond structure and method of making the same

#6178
20050079651
2005-04-14

Wirebond structure and method to connect to a microelectronic die

#6179
20050077619
2005-04-14

Microelectronic assembly having thermoelectric elements to cool a die and a method of making the same

#6180
20050077529
2005-04-14

Light-emitting diode chip package body and packaging method thereof

#6181
20050074966
2005-04-07

Local multilayered metallization

#6182
20050074959
2005-04-07

Method of fabricating a wire bond pad with Ni/Au metallization

#6183
20050073057
2005-04-07

Semiconductor electronic device and method of manufacturing thereof

#6184
20050073056
2005-04-07

Semiconductor device with electrode pad having probe mark

#6185
20050070085
2005-03-31

Reliable metal bumps on top of I/O pads after removal of test probe marks

#6186
20050070083
2005-03-31

Wafer-level moat structures

#6187
20050070050
2005-03-31

Method of mounting wafer on printed wiring substrate

#6188
20050070049
2005-03-31

Method for fabricating wafer-level chip scale packages

#6189
20050067709
2005-03-31

Reinforced bond pad

#6190
20050067707
2005-03-31

Semiconductor device with multilayered metal pattern

#6191
20050067700
2005-03-31

Semiconductor device and method of manufacturing the same

#6192
20050067635
2005-03-31

Method of manufacturing electronic component, method of manufacturing electro-optical device, electronic component, and electro-optical device

#6193
20050064625
2005-03-24

Method for mounting passive components on wafer

#6194
20050064624
2005-03-24

Method of manufacturing wafer level chip size package

#6195
20050062170
2005-03-24

I/C chip suitable for wire bonding

#6196
20050054190
2005-03-10

Semiconductor device and method of manufacturing the same

#6197
20050054188
2005-03-10

Semiconductor device which employs an interlayer insulating film of a low mechanical strength and a highly reliable metal pad, and a method of manufacturing the same

#6198
20050054155
2005-03-10

Semiconductor device having fuse circuit on cell region and method of fabricating the same

#6199
20050054154
2005-03-10

Solder bump structure and method for forming the same

#6200
20050048798
2005-03-03

Method for chemical etch control of noble metals in the presence of less noble metals

#6201
20050048755
2005-03-03

Method of forming a bond pad

#6202
20050048695
2005-03-03

Super high density module with integrated wafer level packages

#6203
20050046025
2005-03-03

Pad structures including insulating layers having a tapered surface

#6204
20050046002
2005-03-03

Chip stack package and manufacturing method thereof

#6205
20050042872
2005-02-24

Process for forming lead-free bump on electronic component

#6206
20050042853
2005-02-24

Active area bonding compatible high current structures

#6207
20050042786
2005-02-24

Process for making contact with and housing integrated circuits

#6208
20050040523
2005-02-24

Semiconductor wafer, semiconductor device and method of manufacturing the same, circuit board, and electronic equipment

#6209
20050040033
2005-02-24

Method of metal sputtering for integrated circuit metal routing

#6210
20050037539
2005-02-17

Method for producing a semiconductor package, with a rerouted electrode formed on a resin projection portion

#6211
20050037536
2005-02-17

Semiconductor packaging structure and method for forming the same

#6212
20050035468
2005-02-17

Semiconductor electronic device and method of manufacturing thereof

#6213
20050035466
2005-02-17

Wire bonding method for copper interconnects in semiconductor devices

#6214
20050034526
2005-02-17

Semiconductor sensor and method of plating semiconductor devices

#6215
20050032658
2005-02-10

Composition for removing photoresist and method of forming a bump electrode in a semiconductor device using the composition

#6216
20050032387
2005-02-10

Asymmetric plating

#6217
20050032349
2005-02-10

Low fabrication cost, fine pitch and high reliability solder bump

#6218
20050032348
2005-02-10

Method of wafer bumping for enabling a stitch wire bond in the absence of discrete bump formation

#6219
20050032229
2005-02-10

PROBE TIP DESIGN APPLIED IN A FLIP CHIP PACKAGING PROCESS

#6220
20050029668
2005-02-10

Apparatus and method for packaging circuits

#6221
20050029650
2005-02-10

Method for fabricating semiconductor components with thinned substrate, back side contacts and circuit side contacts

#6222
20050029630
2005-02-10

Manufacturing method for semiconductor device, semiconductor device, and electronic apparatus

#6223
20050028362
2005-02-10

Method for producing a semiconductor device in chip format

#6224
20050026450
2005-02-03

Inhibition of tin oxide formation in lead free interconnect formation

#6225
20050026438
2005-02-03

Semiconductor processing methods

#6226
20050026416
2005-02-03

ENCAPSULATED PIN STRUCTURE FOR IMPROVED RELIABILITY OF WAFER

#6227
20050026413
2005-02-03

Bonding structure with pillar and cap

#6228
20050026335
2005-02-03

Method of fabricating semiconductor device and semiconductor device

#6229
20050023700
2005-02-03

Pad over active circuit system and method with meshed support structure

#6230
20050023680
2005-02-03

Semiconductor device with strain relieving bump design

#6231
20050023678
2005-02-03

CHIP STRUCTURE WITH BUMPS AND A PROCESS FOR FABRICATING THE SAME

#6232
20050023669
2005-02-03

Semiconductor wafer, semiconductor device, method for manufacturing the semiconductor device, circuit board, and electronic apparatus

#6233
20050020052
2005-01-27

Method for fabricating thermal compliant semiconductor chip wiring structure for chip scale packaging

#6234
20050017358
2005-01-27

Semiconductor component having conductors with wire bondable metalization layers

#6235
20050017355
2005-01-27

Wafer level processing method and structure to manufacture two kinds of interconnects, gold and solder, on one wafer

#6236
20050017343
2005-01-27

Method of forming redistribution bump and semiconductor chip and mount structure fabricated using the same

#6237
20050014356
2005-01-20

Method for forming a bond pad interface

#6238
20050014355
2005-01-20

Under-bump metallization layers and electroplated solder bumping technology for flip-chip

#6239
20050014310
2005-01-20

Stencil mask design method and under bump metallurgy for C4 solder bump

#6240
20050012225
2005-01-20

Wafer-level chip scale package and method for fabricating and using the same

#6241
20050012214
2005-01-20

Semiconductor device including a diffusion layer

#6242
20050012211
2005-01-20

Under-bump metallugical structure

#6243
20050012144
2005-01-20

Semiconductor device

#6244
20050009318
2005-01-13

Conductive connection forming methods, oxidation reducing methods, and integrated circuits formed thereby

#6245
20050009317
2005-01-13

Wafer level bumping process

#6246
20050009314
2005-01-13

Method for forming a bonding pad of a semiconductor device including a plasma treatment

#6247
20050009313
2005-01-13

Manufacturing method for semiconductor device

#6248
20050009289
2005-01-13

Aluminum cap with electroless nickel/immersion gold

#6249
20050006792
2005-01-13

Semiconductor device and method of manufacturing the same

#6250
20050006778
2005-01-13

Semiconductor device having aluminum and metal electrodes and method for manufacturing the same

#6251
20050006766
2005-01-13

Semiconductor device and method of manufacturing the same

#6252
20050006765
2005-01-13

Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument

#6253
20050006762
2005-01-13

Method of manufacturing a semiconductor device including a protruding electrode bonded to a lead electrode

#6254
20050006759
2005-01-13

Bump electrodes having multiple under ball metallurgy (UBM) layers

#6255
20050006742
2005-01-13

High frequency semiconductor module, high frequency semiconductor device and manufacturing method for the same

#6256
20050006672
2005-01-13

Method of fabricating semiconductor memory device and semiconductor memory device driver

#6257
20050003677
2005-01-06

Activation plate for electroless and immersion plating of integrated circuits

#6258
20050003649
2005-01-06

Semiconductor device and manufacturing method thereof

#6259
20050003584
2005-01-06

System and method for increasing the strength of a bond made by a small diameter wire in ball bonding

#6260
20050001329
2005-01-06

Semiconductor device having a plurality of semiconductor chips and method for manufacturing the same

#6261
20050001320
2005-01-06

Semiconductor device, stacked semiconductor device, methods of manufacturing them, circuit board, and electronic instrument

#6262
20050001314
2005-01-06

Semiconductor device

#6263
20050001313
2005-01-06

Semiconductor device with under bump metallurgy and method for fabricating the same

#6264
20050000821
2005-01-06

Anodes for electroplating operations, and methods of forming materials over semiconductor substrates

#6265
20050000727
2005-01-06

Method and apparatus for maintaining a separation between contacts

#6266
18949173
2025-12-02

Acentric non-round electrical interconnections

#6267
17953697
2024-01-09

Bonding process with inhibited oxide formation

#6268
17138255
2022-11-01

Bonding process with inhibited oxide formation

#6269
17035385
2021-11-02

Structure of semiconductor device and method for bonding two substrates

#6270
16986497
2021-10-26

PCB for bare die mount and process therefore

#6271
16876394
2021-06-22

Semiconductor die with hybrid wire bond pads

#6272
16507057
2020-09-29

Method of transferring different types of micro devices

#6273
16450536
2020-07-07

Semiconductor structure and method for forming the same

#6274
16291457
2020-07-14

Three-dimensional device with bonded structures including a support die and methods of making the same

#6275
16255413
2020-05-26

Three-dimensional semiconductor chip containing memory die bonded to both sides of a support die and methods of making the same

#6276
16176078
2019-12-31

Patterning polymer layer to reduce stress

#6277
16038372
2019-05-28

Protective layers for high-yield printed electronic devices

#6278
16007463
2020-07-21

Flip-chip wire bondless power device

#6279
15981929
2019-07-30

Method of manufacturing integrated fan-out package

#6280
15940878
2019-07-09

Molded cavity fanout package without using a carrier and method of manufacturing the same

#6281
15928340
2019-07-16

Three-dimensional memory device containing bonded chip assembly with through-substrate via structures and method of making the same

#6282
15907034
2019-10-01

Wafer edge partial die engineered for stacked die yield

#6283
15901366
2019-02-19

Semiconductor device and manufacturing method thereof

#6284
15865328
2018-10-30

Repackaged reconditioned die method and assembly

#6285
15853839
2018-11-27

Method for binding micro device to conductive pad

#6286
15853512
2019-05-21

Interconnect structures for preventing solder bridging, and associated systems and methods

#6287
15843951
2019-04-02

Semiconductor device including optional pad interconnect

#6288
15843615
2018-12-04

Bond pad structure for semiconductor device packaging

#6289
15795281
2018-12-25

Integrated fan-out package, redistribution circuit structure, and method of fabricating the same

#6290
15789120
2018-08-21

Semiconductor package with grounding device and related methods

#6291
15764584
2021-10-12

Resist composition

#6292
15719861
2019-01-01

Chamfering for stress reduction on passivation layer

#6293
15706767
2018-12-18

Electronic apparatus

#6294
15703144
2018-05-22

Method for manufacturing memory having stacked integrated circuit chip

#6295
15692067
2018-12-18

Interconnect structure and method

#6296
15678642
2018-12-25

Vertically stacked wafers and methods of forming same

#6297
15671821
2018-10-16

Semiconductor device and method for manufacturing the same

#6298
15671357
2018-09-11

Signal isolator having inductive and capacitive signal coupling

#6299
15582370
2018-05-08

Fan-out wafer level integration for photonic chips

#6300
15492953
2018-06-26

Wafer level package with EMI shielding