207783 ⎘
Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto; Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto; Bonding areas ; Manufacturing methods related thereto Manufacturing methods
Approach to high temperature wafer processing
#5702Semiconductor connection component
#5703Method for forming metal pad in semiconductor device
#5704Manufacturing method of semiconductor device
#5705Semiconductor device and method of manufacturing the same
#5706Semiconductor device electronic component, circuit board, and electronic device
#5707Optical semiconductor device and method of manufacturing the same
#5708Method of making wafer level package structure by grinding the backside thereof and then forming metal layer on the ground side
#5709Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument
#5710Metal pad or metal bump over pad exposed by passivation layer
#5711Technique for efficiently patterning an underbump metallization layer using a dry etch process
#5712Planar bond pad design and method of making the same
#5713Bonding pad on IC substrate and method for making the same
#5714Technique for forming a copper-based contact layer without a terminal metal
#5715ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING THE ELECTRONIC DEVICE
#5716Self-assembled interconnection particles
#5717Semiconductor package with ferrite shielding structure
#5718Semiconductor device
#5719Method of forming solder bump with reduced surface defects
#5720Semiconductor element and a producing method for the same, and a semiconductor device and a producing method for the same
#5721Method for forming high reliability bump structure
#5722Integrated circuit pad with separate probing and bonding areas
#5723Multi-component integrated circuit contacts
#5724Method of realizing thermosonic wire bonding between metal wires and copper pads by depositing a thin film to surface of semiconductor chip with copper pads
#5725Process for making a semiconductor device having a roughened surface
#5726Method and structure for reduction of soft error rates in integrated circuits
#5727Electronic parts packaging structure and method of manufacturing the same
#5728Semiconductor device
#5729Semiconductor sensor and manufacturing method therefor
#5730Ball-limiting metallurgies, solder bump compositions used therewith, packages assembled thereby, and methods of assembling same
#5731Semiconductor device and manufacturing method of the same
#5732Under bump metallization design to reduce dielectric layer delamination
#5733Arrangement for electrically connecting semiconductor circuit arrangements to an external contact device and method for producing the same
#5734Circuitry component and method for forming the same
#5735Ultrathin semiconductor circuit having contact bumps
#5736Method for fabricating board on chip (BOC) semiconductor package with circuit side polymer layer
#5737Manufacturing method for packaged semiconductor device
#5738Grid array connection device and method
#5739Post passivation structure for a semiconductor device and packaging process for same
#5740Semiconductor device and manufacturing method of the same
#5741Method of manufacturing semiconductor device
#5742Semiconductor device having through electrode and method of manufacturing the same
#5743Electronic board, method of manufacturing the same, and electronic device
#5744Electronic board, method of manufacturing the same, and electronic device
#5745Low stress chip attachment with shape memory materials
#5746Wafer and single chip having circuit rearranged structure and method for fabricating the same
#5747Semiconductor device and manufacturing method therefor
#5748Semiconductor device with a diffusion barrier film having a spacing for stress relief of solder bump
#5749Die stacking recessed pad wafer design
#5750METHOD FOR FORMING BUMPS
#5751Semiconductor device and manufacturing method thereof
#5752Method and circuit structure employing a photo-imaged solder mask
#5753Semiconductor element and manufacturing method thereof
#5754Method for mounting an electronic part on a substrate using a liquid containing metal particles
#5755Structure and method for bond pads of copper-metallized integrated circuits
#5756Capacitor device, semiconductor devioce, and setting method of terminal capacitance of pad electrode thereof
#5757Offset solder bump method and apparatus
#5758Flip chip light emitting diode and method of manufacturing the same
#5759Method of reducing process steps in metal line protective structure formation
#5760Semiconductor device and method of fabricating the same
#5761Semiconductor device including wire bonding pads and pad layout method
#5762Solder ball pad surface finish structure of circuit board and fabrication method thereof
#5763Fabrication method of under bump metallurgy structure
#5764Circuit device and method of manufacturing thereof
#5765Bond pad structure comprising multiple bond pads with metal overlap
#5766Terminal pad structures and methods of fabricating same
#5767Semiconductor device with passivation layer covering wiring layer
#5768Conductive bump structure for semiconductor device and fabrication method thereof
#5769Post bump passivation for soft error protection
#5770Multiple etch-stop layer deposition scheme and materials
#5771Alignment key structure in a semiconductor device and method of forming the same
#5772Methods for applying front side and edge protection material to electronic devices at the wafer level, devices made by the methods, and systems including the devices
#5773Semiconductor device having a plurality of semiconductor chips and method for manufacturing the same
#5774Solder bumps in flip-chip technologies
#5775Techniques for improving bond pad performance
#5776Method for fabricating connection regions of an integrated circuit, and integrated circuit having connection regions
#5777Substrate for producing a soldering connection to a second substrate
#5778Semiconductor device including an under electrode and a bump electrode
#5779Apparatus for conducting heat in a flip-chip assembly
#5780Bumping process and bump structure
#5781Method of forming low stress multi-layer metallurgical structures and high reliable lead free solder termination electrodes
#5782Integrated circuit system for bonding
#5783Semiconductor chip mounting body and manufacturing method thereof
#5784Method for fabricating semiconductor components with through wire interconnects
#5785Semiconductor device and fabrication method thereof
#5786Method of assembling soldered packages utilizing selective solder deposition by self-assembly of nano-sized solder particles
#5787Copper interconnect post for connecting a semiconductor chip to a substrate and method of fabricating the same
#5788Semiconductor device
#5789Semiconductor device suitable for a ferroelectric memory and manufacturing method of the same
#5790Method for manufacturing semiconductor device, and method and structure for implementing semicondutor device
#5791Package structure of semiconductor and wafer-level formation thereof
#5792Wafer-level package for integrated circuits
#5793Aluminum cap with electroless nickel/immersion gold
#5794Manufacturing method for semiconductor device, semiconductor device, and electronic apparatus
#5795Semiconductor device and semiconductor-device manufacturing method
#5796Wafer level chip scale package having a gap and method for manufacturing the same
#5797Method for Manufacturing Gold Bumps
#5798METHODS AND SYSTEMS FOR IMPROVING MICROELECTRONIC I/O CURRENT CAPABILITIES
#5799Top via pattern for bond pad structure
#5800Integrated device and electronic system
#5801Semiconductor device and method of producing the same, and power conversion apparatus incorporating this semiconductor device
#5802Front-end processing of nickel plated bond pads
#5803Material for forming insulating film with low dielectric constant, low dielectric insulating film, method for forming low dielectric insulating film and semiconductor device
#5804Semiconductor device with via hole for electric connection
#5805METHOD OF FORMING REDISTRIBUTION BUMP AND SEMICONDUCTOR CHIP AND MOUNT STRUCTURE FABRICATED USING THE SAME
#5806Semiconductor package and method for manufacturing the same
#5807Semiconductor device
#5808FINE PAD PITCH ORGANIC CIRCUIT BOARD WITH PLATING SOLDER AND METHOD FOR FABRICATING THE SAME
#5809LOCAL MULTILAYERED METALLIZATION
#5810Method for manufacturing flip-chip type semiconductor device featuring nickel electrode pads, and plating apparatus used in such method
#5811Semiconductor package having an optical device and a method of making the same
#5812Solder bump and related intermediate structure having primary and secondary portions and method of manufacturing same
#5813System for different bond pads in an integrated circuit package
#5814Semiconductor device having a plastic housing and external connections and method for producing the same
#5815Application of impressed-current cathodic protection to prevent metal corrosion and oxidation
#5816Semiconductor device production method and semiconductor device
#5817MULTI-CHIP BALL GRID ARRAY PACKAGE
#5818Microelectronic assemblies having compliancy
#5819Inductor formed in an integrated circuit
#5820Integrated connection arrangements
#5821High reflectivity p-contacts for group lll-nitride light emitting diodes
#5822Semiconductor device and manufacturing method thereof
#5823Semiconductor device and method of producing the same, and power conversion apparatus incorporating this semiconductor device
#5824Semiconductor device and manufacturing process therefor
#5825Accurate relative alignment and epoxy-free attachment of optical elements
#5826Apparatus and method for bonding wires
#5827Methods for patterning dielectric material, and methods for aligning semiconductor fabrication molds and semiconductor substrates
#5828METHOD OF FORMING CHIP-TYPE LOW-K DIELECTRIC LAYER
#5829Method of forming a wear-resistant dielectric layer
#5830Forming a cap above a metal layer
#5831Structure and method for bonding an IC chip
#5832Semiconductor device and fabrication method thereof
#5833Efficient method of forming and assembling a microelectronic chip including solder bumps
#5834Manufacturing Method of Semiconductive Element and Ink Jet Head Substrate
#5835Novel method for copper wafer wire bonding
#5836Semiconductor device featuring probe area definition mark for defining probe area in electrode pad, and proof test system for proving proper contact of test probe with probe area
#5837Bump structure of semiconductor device and method of manufacturing the same
#5838Chip scale package and method for manufacturing the same
#5839Method for depositing an adhesion-promoting layer on a metallic layer of a chip
#5840Elevated bond-pad structure for high-density flip-clip packaging and a method of fabricating the structures
#5841Semiconductor device and method of fabricating the same
#5842Semiconductor device and method of manufacturing the same
#5843Apparatus for plating a semiconductor wafer and plating solution bath used therein
#5844Semiconductor element with under bump metallurgy structure and fabrication method thereof
#5845Method of manufacturing semiconductor device and method of treating electrical connection section
#5846Under bump metallurgy in integrated circuits
#5847Electronic component with semiconductor chip and semiconductor wafer with contact pads, and method for the production thereof
#5848Semiconductor integrated circuit and method of manufacturing the same
#5849Method and apparatus for providing structural support for interconnect pad while allowing signal conductance
#5850Manufacturing method of semiconductor device, semiconductor device, circuit board, electro-optic device, and electronic apparatus
#5851Method for fabricating semiconductor component with thinned substrate having pin contacts
#5852Interconnect structures with bond-pads and methods of forming bump sites on bond-pads
#5853Method of metal sputtering for integrated circuit metal routing
#5854Copper-containing C4 ball-limiting metallurgy stack for enhanced reliability of packaged structures and method of making same
#5855Method for fabricating module of semiconductor chip
#5856Electronic parts packaging structure
#5857Electronic device
#5858On-chip circuit pad structure
#5859Method of forming pad and fuse in semiconductor device
#5860Semiconductor integrated device and method for manufacturing same
#5861Semiconductor device and method for manufacturing the same
#5862Method of forming a bonding pad structure
#5863Copper interconnect
#5864Semiconductor device and fabrication method thereof
#5865Power semiconductor device
#5866Method of manufacturing semiconductor device
#5867Method for wafer stacking using copper structures of substantially uniform height
#5868Method for constructing contact formations
#5869Ball limiting metallurgy split into segments
#5870Arrangement of input/output pads on an integrated circuit
#5871Semiconductor device manufacturing method, semiconductor device, laminated semiconductor device, circuit substrate, and electronic apparatus
#5872Electronic component and semiconductor device, method of making the same and method of mounting the same, circuit board, and electronic instrument
#5873Semiconductor device with a guard-ring structure and a field plate formed of polycrystalline silicon film embedded in an insulating film
#5874Method of manufacturing a semiconductor device
#5875Solder bump composition for flip chip
#5876Method for re-routing lithography-free microelectronic devices
#5877Protection of an integrated capacitor
#5878Semiconductor device having a bonding pad structure including an annular contact
#5879Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument
#5880Semiconductor device and manufacturing method thereof
#5881Bonding structure and fabrication thereof
#5882Three-dimensional device fabrication method
#5883Semiconductor device and the method of producing the same
#5884Micro-hole plating method, gold bump fabrication method and semiconductor device fabrication method using the micro-hole plating method, semiconductor device
#5885Reinforced solder bump structure and method for forming a reinforced solder bump
#5886Semiconductor device and manufacturing method of semiconductor device
#5887Method and apparatus for polymer dielectric surface recovery by ion implantation
#5888Methods for aligning semiconductor fabrication molds and semiconductor substrates
#5889Semiconductor device and manufacturing method thereof
#5890Forming an intermediate layer in interconnect joints and structures formed thereby
#5891Semiconductor device having low-k dielectric film in pad region and method for manufacture thereof
#5892High surface area aluminum bond pad for through-wafer connections to an electronic package
#5893Semiconductor device with a via hole having a diameter at the surface larger than a width of a pad electrode
#5894Semiconductor device with penetrating electrode
#5895Method for forming solder bumps of increased height
#5896Method of fabricating a high Q factor integrated circuit inductor
#5897Active area bonding compatible high current structures
#5898Integration type semiconductor device and method for manufacturing the same
#5899Semiconductor device with crack-resistant multilayer copper wiring
#5900Microelectronic assembly having thermoelectric elements to cool a die and a method of making the same
#5901Electronic component and semiconductor device, method of making the same and method of mounting the same, circuit board, and electronic instrument
#5902Structure and method for contact pads having an overcoat-protected bondable metal plug over copper-metallized integrated circuits
#5903Bumping process
#5904Bumping process and structure thereof
#5905Fabrication method of a wafer structure
#5906Method for fabricating semiconductor components
#5907LED with self aligned bond pad
#5908Semiconductor device and method of fabricating the same
#5909Manufacturing method of solid-state image sensing device
#5910Bumping process and structure thereof
#5911Semiconductor device and manufacturing method of the same
#5912UBM STRUCTURE FOR IMPROVING RELIABILITY AND PERFORMANCE
#5913Compliant interconnects for semiconductors and micromachines
#5914Semiconductor device and method of manufacturing the same
#5915Method for fabricating packaged die
#5916Structure and method for contact pads having a recessed bondable metal plug over of copper-metallized integrated circuits
#5917Semiconductor device having aluminum electrode and metallic electrode
#5918Method of forming a bond pad on an I/C chip and resulting structure
#5919Resist sidewall spacer for C4 BLM undercut control
#59203D interconnect with protruding contacts
#5921Contour structures to highlight inspection regions
#5922Method of forming bump that may reduce possibility of losing contact pad material
#5923Method of manufacturing a substrate with through electrodes
#5924Redistribution layer of wafer and the fabricating method thereof
#5925Method for forming an electrode
#5926Electronic parts packaging structure and method of manufacturing the same
#5927Structure and method for fabricating a bond pad structure
#5928Semiconductor device and fabrication method thereof
#5929Copper interconnect
#5930Semiconductor substrate thinning method for manufacturing thinned die
#5931Method of forming electrode for semiconductor device
#5932Semiconductor element including a wet prevention film
#5933Top layers of metal for integrated circuits
#5934Wafer scale integration packaging and method of making and using the same
#5935Semiconductor device packaged into chip size and manufacturing method thereof
#5936Interconnection structure of integrated circuit chip
#5937Pad structure to prompt excellent bondability for low-k intermetal dielectric layers
#5938Semiconductor device and fabrication process thereof
#5939Wire bond pads
#5940Method for producing bumps on an electrical component
#5941Method for forming a redistribution layer in a wafer structure
#5942Copper interconnect
#5943Copper interconnect
#5944Copper interconnect
#5945Copper interconnect for semiconductor device
#5946Semiconductor device and manufacturing method thereof
#5947Microelectronic device chip including hybrid Au bump, package of the same, LCD apparatus including microelectronic device chip and method of fabricating microelectronic device chip
#5948Bump structure
#5949Packaging with metal studs formed on solder pads
#5950Bump structure of semiconductor package and method for fabricating the same
#5951Method for producing semiconductor chips using thin film technology, and semiconductor chip using thin film technology
#5952Method of manufacturing a semiconductor device
#5953Semiconductor device and method for manufacturing the same
#5954Semiconductor device with reduced contact resistance
#5955Integrated semiconductor circuit and method for producing an integrated semiconductor circuit
#5956Semiconductor device and method for fabricating the same
#5957Semiconductor chip packages and methods for fabricating the same
#5958Semiconductor device, method and apparatus for testing same, and method for manufacturing semiconductor device
#5959Through-wafer interconnects for photoimager and memory wafers
#5960Semiconductor and method for producing a semiconductor
#5961Low temperature methods of forming back side redistribution layers in association with through wafer interconnects, semiconductor devices including same, and assemblies
#5962Electronic devices at the wafer level having front side and edge protection material and systems including the devices
#5963Dense intermetallic compound layer
#5964Methods for forming molds
#5965Stretchable semiconductor elements and stretchable electrical circuits
#5966Semiconductor device and manufacturing method of the same
#5967Wafer level package, multi-package stack, and method of manufacturing the same
#5968Semiconductor device with sidewall wiring
#5969Methods of forming lead free solder bumps
#5970Method for fabricating semiconductor package with circuit side polymer layer
#5971Method for processing base
#5972Process for protecting solder joints and structure for alleviating electromigration and joule heating in solder joints
#5973Interconnect assemblies and methods
#5974Method of manufacturing semiconductor device with two-step etching of layer
#5975Metal pad of semiconductor device and method for bonding the metal pad
#5976Front-end processing of nickel plated bond pads
#5977Hermetic chip in wafer form
#5978Structure of gold bumps and gold conductors on one IC die and methods of manufacturing the structures
#5979Method for fabricating pad redistribution layer
#5980Device having contact pad with a conductive layer and a conductive passivation layer
#5981Semiconductor package having protective layer for re-routing lines and method of manufacturing the same
#5982Structure and formation method of conductive bumps
#5983Semiconductor device and method of manufacturing a semiconductor device
#5984Damascene patterning of barrier layer metal for C4 solder bumps
#5985Method of manufacturing semiconductor device
#5986Semiconductor structure that includes a cooling structure formed on a semiconductor surface and method of manufacturing the same
#5987Light extraction from a semiconductor light emitting device via chip shaping
#5988Methods of forming electronic structures including conductive shunt layers and related structures
#5989Method for forming robust solder interconnect structures by reducing effects of seed layer underetching
#5990Stacked semiconductor chips
#5991Bond pad structure for copper metallization having increased reliability and method for fabricating same
#5992Semiconductor device and a method of manufacturing the semiconductor device
#5993Semiconductor component and assembly having female conductive members
#5994Under bump metallurgy process on passivation opening
#5995Method for ultra thinning bumped wafers for flip chip
#5996Highly compliant plate for wafer bonding
#5997Multi-component integrated circuit contacts
#5998Semiconductor device and method of producing the same, and power conversion apparatus incorporating this semiconductor device
#5999Method for producing a semiconductor circuit, and corresponding semiconductor circuit
#6000Electronic assembly with carbon nanotube contact formations or interconnections