208230 ⎘
Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor; Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape, relative sizes or dispositions of the semiconductor regions or junctions between the regions characterised by the particular shape of a junction between semiconductor regions
LATERALLY SILICON CARBIDE JUNCTION GATE FIELD EFFECT TRANSISTOR DEVICE AND MANUFACTURING METHOD THEREOF
#2BACK-GATE EFFECT CONTROL VIA DOPING
#3METHOD AND APPARATUS FOR USE IN IMPROVING LINEARITY OF MOSFETS USING AN ACCUMULATED CHARGE SINK-HARMONIC WRINKLE REDUCTION
#4PIN DIODES WITH MULTI-THICKNESS INTRINSIC REGIONS
#5SEMICONDUCTOR DEVICE
#6SEMICONDUCTOR STRUCTURES AND MANUFACTURING METHODS THEREFOR
#7WIDE BAND GAP SEMICONDUCTOR DEVICE WITH SURFACE INSULATING FILM
#8SEMICONDUCTOR DEVICE
#9SEMICONDUCTOR DEVICE
#10SUPER-JUNCTION POWER DEVICE HAVING ADJUSTABLE RESISTORS CONNECTED IN PARALLEL BETWEEN GATES AND SOURCES AND MANUFACTURING METHOD THEREOF
#11Transistor
#12LOW GATE CURRENT JUNCTION FIELD EFFECT TRANSISTOR DEVICE ARCHITECTURE
#13SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
#14Semiconductor devices with dissimlar materials and methods
#15NITRIDE SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
#16POWER SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING POWER SEMICONDUCTOR DEVICE
#17Power diode and method of manufacturing a power diode
#18Power semiconductor device
#19LDMOS TRANSISTOR AND METHOD OF FORMING THE LDMOS TRANSISTOR WITH IMPROVED RDS*CGD
#20Spiral transient voltage suppressor or Zener structure
#21SEMICONDUCTOR DEVICE HAVING A SUPER JUNCTION STRUCTURE AND METHOD OF MANUFACTURING THE SAME
#22Semiconductor device with reduced withstand voltage fluctuations
#23Semiconductor devices with dissimlar materials and methods
#24Diode
#25Power Schottky barrier diodes with high breakdown voltage and low leakage current
#26Magnetic-field free, nonreciprocal, solid state quantum device using quantum wave collapse and interference
#27Wide band gap semiconductor device with surface insulating film
#28Varactor with meander diffusion region
#29Passive element on a semiconductor base body
#30Spiral transient voltage suppressor or Zener structure
#31Nitride-based semiconductor layer sharing between transistors
#32Integrated circuit and semiconductor device including same
#33Semiconductor devices with dissimlar materials and methods
#34SEMICONDUCTOR DEVICE
#35High voltage semiconductor device having bootstrap diode
#36Semiconductor device having a super junction structure and method of manufacturing the same
#37PIN diodes with multi-thickness intrinsic regions
#38Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
#39Three-dimensional memory devices containing structures for controlling gate-induced drain leakage current and method of making the same
#40Power diode and method of manufacturing a power diode
#41USB type-C load switch ESD protection
#42Transistor with extended drain region
#43Varactor structure with relay conductive layers
#44Method for making JFET device, JFET device and layout structure thereof
#45Semiconductor device
#46Protection device
#47Semiconductor device and manufacturing method for same
#48Semiconductor structure and manufacturing method thereof
#49Semiconductor device with surface insulating film
#50MOSFET and power conversion circuit
#51Semiconductor device and method of manufacturing semiconductor device
#52Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
#53Diode, transistor and display device
#54III-nitride devices including a graded depleting layer
#55Methods and apparatuses including an active area of a tap intersected by a boundary of a well
#56Dielectric spaced diode
#57Metal oxide semiconductor (MOS) controlled devices and methods of making the same
#58Quantum structures using aperture channel tunneling through depletion region
#59Semiconductor device with surface insulating film
#60Semiconductor device having a super junction structure and method of manufacturing the same
#61Silicon carbide schottky diodes with tapered negative charge density
#62Semiconductor device with an IGBT region and a non-switchable diode region
#63LDMOS transistor and method of forming the LDMOS transistor with improved Rds*Cgd
#64FinFET device over convex insulating structure
#65Method and structure for forming vertical transistors with various gate lengths
#66Semiconductor device
#67Semiconductor device with diode region
#68Vertical tunnel field effect transistor (FET)
#69Wide bandgap semiconductor device
#70Wide bandgap semiconductor device including transistor cells and compensation structure
#71Insulated gate semiconductor device and method of manufacturing same
#72Metal-oxide semiconductor (MOS) device structure based on a poly-filled trench isolation region
#73METHOD OF FORMING A SEMICONDUCTOR DEVICE TERMINATION AND STRUCTURE THEREFOR
#74Metal oxide semiconductor (MOS) controlled devices and methods of making the same
#75Transistor with asymmetric spacers
#76Nanotube semiconductor devices
#77Method and system for object reconstruction
#78Vertical gallium nitride Schottky diode
#79SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
#80Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
#81Semiconductor device and method for manufacturing same
#82Field-effect transistors with airgaps
#83SILICIDE BLOCK INTEGRATION FOR CMOS TECHNOLOGY
#84III-nitride devices including a graded depleting layer
#85Semiconductor device with surface insulating film
#86Diode and method of manufacturing diode
#87Method of manufacturing semiconductor device
#88Semiconductor device
#89Transistor with asymmetric spacers
#90Semiconductor device, related manufacturing method, and related electronic device
#91Pseudo-resistor structure, a closed-loop operational amplifier circuit and a bio-potential sensor
#92Semiconductor device
#93Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
#94Semiconductor device and method of manufacturing semiconductor device
#95Elongated semiconductor structure planarization
#96High surge bi-directional transient voltage suppressor
#97Semiconductor device
#98Power diode and method of manufacturing a power diode
#99Termination structure for nanotube semiconductor devices
#100Semiconductor device and manufacturing method thereof
#101Semiconductor device with high voltage field effect transistor and junction field effect transistor
#102Bipolar semiconductor device with silicon alloy region in silicon well and method for making
#103Metal oxide semiconductor (MOS) controlled devices and methods of making the same
#104Semiconductor structure with doped layers on fins and fabrication method thereof
#105Transcap device architecture with reduced control voltage and improved quality factor
#106Semiconductor device and method for manufacturing the same
#107Semiconductor device and method for fabricating the same
#108Field-effect transistor structure having two-dimensional transition metal dichalcogenide
#109Insulated gate semiconductor device and method of manufacturing same
#110Metal-oxide semiconductor (MOS) device structure based on a poly-filled trench isolation region
#111Gate-less electrostatic discharge systems and methods for forming
#112Termination structure for gallium nitride Schottky diode including junction barriar diodes
#113STI-diode structure
#114Field-effect transistors with a body pedestal
#115Semiconductor device
#116Semiconductor Device and Transistor Cell Having a Diode Region
#117Tight integrated vertical transistor dual diode structure for electrostatic discharge circuit protector
#118Semiconductor device and method of manufacturing semiconductor device
#119High surge bi-directional transient voltage suppressor
#120Source/drain profile for FinFeT
#121Semi-metal tunnel field effect transistor
#122Tight integrated vertical transistor dual diode structure for electrostatic discharge circuit protector
#123Method of manufacturing a FinFET varactor
#124Semiconductor device and method for manufacturing semiconductor device
#125Nanosheet transistors with sharp junctions
#126Semiconductor device with lifetime killers and method of manufacturing the same
#127Junction barrier schottky diode with enhanced surge current capability
#128Semiconductor structure having a junction field effect transistor and a high voltage transistor and method for manufacturing the same
#129Power semiconductor device having trench gate type IGBT and diode regions
#130Power semiconductor device having trench gate type IGBT and diode regions
#131High voltage junction terminating structure of high voltage integrated circuit
#132Semiconductor Device with an IGBT Region and a Non-Switchable Diode Region
#133Semiconductor substrate and semiconductor device
#134Trench semiconductor device layout configurations
#135Method of manufacturing semiconductor device
#136Electrostatic discharge protection device
#137Forming a metal contact layer on silicon carbide and semiconductor device with metal contact structure
#138Semiconductor device with surface insulating film
#139Field-effect transistor
#140III-nitride devices including a graded depleting layer
#141Semiconductor devices and methods of manufacturing the same
#142Method and system for reproducing visual content
#143Nanowire semiconductor device structure and method of manufacturing
#144Semiconductor device and transistor cell having a diode region
#145Methods and apparatuses including an active area of a tap intersected by a boundary of a well
#146Nanosheet transistors with sharp junctions
#147Integrated circuit (IC) devices including cross gate contacts
#148Method of junction control for lateral bipolar junction transistor
#149Method of junction control for lateral bipolar junction transistor
#150Semiconductor device and method of manufacturing semiconductor device
#151Silicon carbide semiconductor device
#152Semiconductor device and method of manufacturing semiconductor device
#153Controlled ion implantation into silicon carbide using channeling and devices fabricated using controlled ion implantation into silicon carbide using channeling
#154USB type-C load switch ESD protection
#155Electrostatic discharge protection structure and fabricating method thereof
#156Semiconductor device and method of manufacturing the same
#157High speed Schottky rectifier
#158Semiconductor device and manufacturing method of the same
#159Nonvolatile memory having a shallow junction diffusion region
#160Semiconductor device and manufacturing method therefor
#161Method of manufacturing semiconductor structure
#162Schottky barrier diode and method of manufacturing the same
#163Semiconductor devices and methods for forming semiconductor devices
#164Semiconductor devices having segmented ring structures
#165FinFET varactor
#166Nano-heterostructure
#167Semiconductor device and method for manufacturing semiconductor device
#168DIODES AND FABRICATION METHODS THEREOF
#169Field-effect transistor and method of making the same
#170Integrated circuits with capacitors and methods for producing the same
#171Integrated circuit die having reduced defect group III-nitride layer and methods associated therewith
#172Latchup reduction by grown orthogonal substrates
#173Method for manufacturing a power semiconductor device
#174Structure and method for mitigating substrate parasitics in bulk high resistivity substrate technology
#175CMOS varactor with increased tuning range
#176Vertical sense devices in vertical trench MOSFET
#177Semiconductor device having an edge termination region comprising a first edge termination region of a second conductivity type adjacent to a second edge termination region of a first conductivity type
#178Termination structure for gallium nitride Schottky diode
#179Fin field effect transistor
#180Nonvolatile memory cells having lateral coupling structures and nonvolatile memory cell arrays including the same
#181Method and system for object reconstruction
#182Electrostatic discharge protection apparatus and applications thereof
#183Diode
#184Trench-based diode and method for manufacturing such a diode
#185Semiconductor device comprises two or more regions that have a same impurity concentration and differing carrier concentrations
#186Silicon carbide semiconductor device and method for manufacturing same
#187Compound semiconductor device
#188WIDE BANDGAP SEMICONDUCTOR DEVICE INCLUDING TRANSISTOR CELLS AND COMPENSATION STRUCTURE
#189POWER METAL-OXIDE-SEMICONDUCTOR DEVICE
#190Method for fabricating semiconductor device
#191Ultra high voltage device
#192Selective nanoscale growth of lattice mismatched materials
#193Silicon carbide semiconductor device
#194Semiconductor device and manufacturing method thereof
#195Semiconductor device comprising a diode and electrostatic discharge protection device
#196Producing a semiconductor device by epitaxial growth
#197Vertical tunnel field effect transistor (FET)
#198Electrostatic discharge protection device
#199Modified tunneling field effect transistors and fabrication methods
#200Semiconductor structure comprising an active semiconductor layer of the III-V type on a buffer layer stack and method for producing semiconductor structure
#201Power device on bulk substrate
#202Electrostatic discharge (ESD) protection device
#203Integration of III-V devices on Si wafers
#204Metallized junction FinFET structures
#205Implant structure for area reduction
#206Methods, apparatus and system for providing source-drain epitaxy layer with lateral over-growth suppression
#207Buried-channel MOSFET and a surface-channel MOSFET of a same type and fabrication method thereof
#208FinFET device using dummy fins for smooth profiling
#209Junction butting structure using nonuniform trench shape
#210Semiconductor device with protective element portion
#211Transistor device with reduced hot carrier injection effect
#212Fabrication of semiconductor junctions
#213Manufacture method of LTPS thin film transistor and LTPS thin film transistor
#214Semiconductor device and manufacturing method of the same
#215Semiconductor device with surface insulating film
#216Method of improving bipolar device signal to noise performance by reducing the effect of oxide interface trapping centers
#217Elongated semiconductor structure planarization
#218COMPACT MEMORY STRUCTURE INCLUDING TUNNELING DIODE
#219Semiconductor device and Zener diode having branch impurity regions
#220RF communications device with conductive trace and related switching circuits and methods
#221Semiconductor device
#222III-V fin on insulator
#223Methods of forming buried junction devices in silicon carbide using ion implant channeling and silicon carbide devices including buried junctions
#224Semiconductor device
#225Fast SCR structure for ESD protection
#226Nonvolatile memory devices having single-layered gates
#227Power semiconductor device having trench gate type IGBT and diode regions
#228Transistor structures having reduced electrical field at the gate oxide and methods for making same
#229Semiconductor device and transistor cell having a diode region
#230Method of forming a semiconductor device termination and structure therefor
#231Three-dimensional junction memory device and method reading thereof using hole current detection
#232Ultra high voltage device
#233Nanowire semiconductor device structure and method of manufacturing
#234CMOS device including a non-straight PN-boundary and methods for generating a layout of a CMOS device
#235LDMOS transistor and method of forming the LDMOS transistor with improved RDS*CGD
#236Diodes and fabrication methods thereof
#237TUNNEL FIELD EFFECT TRANSISTORS HAVING LOW TURN-ON VOLTAGE
#238Semiconductor devices and methods of manufacturing the same
#239Schottky diode having floating guard rings
#240Hetero-junction semiconductor device and method of manufacturing a hetero-junction semiconductor device
#241Metallized junction FinFET structures
#242Metallized junction FinFET structures
#243Method for fabricating semiconductor device
#244Integrated on-chip junction capacitor for power management integrated circuit device
#245Semiconductor structure having a junction field effect transistor and a high voltage transistor and method for manufacturing the same
#246Apparatus and methods for overvoltage switches with active leakage current compensation
#247Semiconductor device
#248Methods and apparatuses including an active area of a tap intersected by a boundary of a well
#249TRENCH SEMICONDUCTOR DEVICE LAYOUT CONFIGURATIONS
#250Ultra high voltage device
#251Semiconductor device and method of forming the same
#252Semiconductor device and manufacturing method thereof
#253Transistor including oxide semiconductor, semiconductor device including the transistor, and electronic device including the transistor
#254Semiconductor device and method for forming the same
#255Enhancement Mode High Electron Mobility Transistor and Manufacturing Method Thereof
#256Defect reduction using aspect ratio trapping
#257Cladding layer epitaxy via template engineering for heterogeneous integration on silicon
#258Tunnel field effect transistors having low turn-on voltage
#259Tunnelling field effect transistor
#260Compensation devices
#261Semiconductor device and manufacturing method thereof
#262Structure and formation method of FinFET device
#263Latchup reduction by grown orthogonal substrates
#264Junction barrier Schottky rectifier
#265Semiconductor structure and method for manufacturing the same
#266Super-junction trench MOSFETs with closed cell layout having shielded gate
#267Method of forming a BICMOS semiconductor chip that increases the betas of the bipolar transistors
#268Asymmetrical FinFET structure and method of manufacturing same
#269Semiconductor device
#270Output capacitance reduction in power transistors
#271Semiconductor junction formation
#272REDUCING LEAKAGE CURRENT IN SEMICONDUCTOR DEVICES
#273Nonvolatile memory devices having single-layered gates
#274Contactless damage inspection of perimeter region of semiconductor device
#275Silicon carbide semiconductor device
#276Transistor with performance boost by epitaxial layer
#277Layered structure of a P-TFET
#278Integrated enhancement mode and depletion mode device structure and method of making the same
#279Nanotube semiconductor devices
#280Methods and apparatuses including an active area of a tap intersected by a boundary of a well
#281Semiconductor device
#282SEMICONDUCTOR DEVICE
#283Semiconductor device and method of fabricating the same
#284Non-planar normally off compound semiconductor device
#285Fast and stable ultra low drop-out (LDO) voltage clamp device
#286Method for evaluating a semiconductor wafer
#287Substrate and manufacturing method thereof, and semiconductor device
#288Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink-harmonic wrinkle reduction
#289Minority carrier conversion structure
#290Structure and method for defect passivation to reduce junction leakage for finfet device
#291Vertical sense devices in vertical trench MOSFET
#292All around contact device and method of making the same
#293Semiconductor device having a wide-gap semiconductor layer in an insulating trench
#294High voltage depletion mode N-channel JFET
#295Semiconductor device and method of manufacturing the same
#296Method of preventing drain and read disturbances in non-volatile memory device
#297Semiconductor device including a super junction MOSFET
#298Semiconductor device with surface insulating film
#299Method of forming III-V channel
#300Device and method for bridging an electrical energy storage