208382 ⎘
Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof; Multistep manufacturing processes therefor; Types of semiconductor device ; Multistep manufacturing processes therefor; Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by variation of the electric current supplied or the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. two-terminal devices; Diodes Breakdown diodes
LOW CAPACITANCE TRANSIENT VOLTAGE SUPPRESSOR PROTECTION DEVICE
#2SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE
#3Low capacitance transient voltage suppressor with a mos-triggered silicon controlled rectifier as high-side steering diode
#4TVS diode and assembly having asymmetric breakdown voltage
#5TRANSIENT-VOLTAGE-SUPPRESSION DIODE STRUCTURE AND MANUFACTURING METHOD THEREOF
#6TVS Diode and Assembly Having Asymmetric Breakdown Voltage
#7Low capacitance transient voltage suppressor including a punch-through silicon controlled rectifier as low-side steering diode
#8Low capacitance transient voltage suppressor including a punch-through silicon controlled rectifier as low-side steering diode
#9Bidirectional Zener diode and method for manufacturing bidirectional Zener diode
#10Charge carrier extraction inverse diode
#11High voltage breakover diode having comparable forward breakover and reverse breakdown voltages
#12Method of forming a protecting element comprising a first high concentration impurity region separated by an insulating region of a substrate
#13Semiconductor device comprising a diode and a method for producing such a device
#14Programmable poly fuse using a P-N junction breakdown
#15Protecting element having first and second high concentration impurity regions separated by insulating region
#16Bidirectional protection component
#17Asymmetrical bidirectional protection component
#18Bidirectional voltage-regulator diode
#19Method for reducing dislocation threading using a suppression implant
#20Programmable poly fuse
#21Method for reducing dislocation threading using a suppression implant
#22Protective device
#23Electrostatic discharge circuitry with separate power rails